JP5250166B2 - Ｔｏｆ質量分析計用のイオン光学システム - Google Patents

Ｔｏｆ質量分析計用のイオン光学システム Download PDF

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JP5250166B2
JP5250166B2 JP2001268393A JP2001268393A JP5250166B2 JP 5250166 B2 JP5250166 B2 JP 5250166B2 JP 2001268393 A JP2001268393 A JP 2001268393A JP 2001268393 A JP2001268393 A JP 2001268393A JP 5250166 B2 JP5250166 B2 JP 5250166B2
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Prior art keywords
mass spectrometer
tof mass
spectrometer according
lens
plate
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JP2002141016A5 (enExample
JP2002141016A (ja
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アンドリユウ・アール・ボードラー
エマニユエル・ラプタキス
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クラトス・アナリテイカル・リミテツド
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/403—Time-of-flight spectrometers characterised by the acceleration optics and/or the extraction fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2001268393A 2000-09-06 2001-09-05 Ｔｏｆ質量分析計用のイオン光学システム Expired - Lifetime JP5250166B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0021902.2 2000-09-06
GBGB0021902.2A GB0021902D0 (en) 2000-09-06 2000-09-06 Ion optics system for TOF mass spectrometer

Publications (3)

Publication Number Publication Date
JP2002141016A JP2002141016A (ja) 2002-05-17
JP2002141016A5 JP2002141016A5 (enExample) 2008-09-11
JP5250166B2 true JP5250166B2 (ja) 2013-07-31

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JP2001268393A Expired - Lifetime JP5250166B2 (ja) 2000-09-06 2001-09-05 Ｔｏｆ質量分析計用のイオン光学システム

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US (2) US6888129B2 (enExample)
EP (1) EP1220288B1 (enExample)
JP (1) JP5250166B2 (enExample)
GB (2) GB0021902D0 (enExample)

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US7385186B2 (en) * 2005-05-13 2008-06-10 Applera Corporation Methods of operating ion optics for mass spectrometry
US7405396B2 (en) * 2005-05-13 2008-07-29 Applera Corporation Sample handling mechanisms and methods for mass spectrometry
GB2462065B (en) 2008-07-17 2013-03-27 Kratos Analytical Ltd TOF mass spectrometer for stigmatic imaging and associated method
WO2010111552A1 (en) * 2009-03-27 2010-09-30 Dh Technologies Development Pte. Ltd. Heated time of flight source
JP5403509B2 (ja) * 2009-04-17 2014-01-29 国立大学法人大阪大学 イオン源および質量分析装置
US8093565B2 (en) * 2010-01-28 2012-01-10 The United States of America as represented by the Adminstrator of the National Aeromautics and Space Administration Wind and temperature spectrometer with crossed small-deflection energy analyzer
EP2569800A4 (en) * 2010-05-11 2017-01-18 DH Technologies Development Pte. Ltd. An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer
GB2486628B (en) * 2010-08-02 2016-05-25 Kratos Analytical Ltd Methods and apparatuses for cleaning at least one surface of an ion source
CN103858205B (zh) * 2011-10-03 2016-10-12 株式会社岛津制作所 飞行时间型质量分析装置
JP2013101918A (ja) 2011-10-13 2013-05-23 Canon Inc 質量分析装置
GB201118270D0 (en) * 2011-10-21 2011-12-07 Shimadzu Corp TOF mass analyser with improved resolving power
US9312092B2 (en) * 2012-05-31 2016-04-12 Siemens Aktiengesellschaft Deflection plate and deflection device for deflecting charged particles
GB2533608B (en) * 2014-12-23 2019-08-28 Kratos Analytical Ltd A time of flight mass spectrometer
CN107895684B (zh) * 2017-12-14 2024-03-26 广州禾信康源医疗科技有限公司 离子源及质谱仪
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB2576077B (en) 2018-05-31 2021-12-01 Micromass Ltd Mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11373849B2 (en) 2018-05-31 2022-06-28 Micromass Uk Limited Mass spectrometer having fragmentation region
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201810824D0 (en) 2018-06-01 2018-08-15 Micromass Ltd An outer source assembly and associated components
GB2625377A (en) * 2022-12-16 2024-06-19 Thermo Fisher Scient Bremen Gmbh Interface Ion guide

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JPS6220231A (ja) * 1985-07-18 1987-01-28 Seiko Instr & Electronics Ltd Ｉｃｐ質量分析装置
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JPH09326243A (ja) * 1996-06-05 1997-12-16 Shimadzu Corp Ｍａｌｄｉ−ｔｏｆ質量分析装置
JPH10172506A (ja) * 1997-09-19 1998-06-26 United States Department Of Energ フォトイオン分光計
GB9807915D0 (en) * 1998-04-14 1998-06-10 Shimadzu Res Lab Europe Ltd Apparatus for production and extraction of charged particles
US5965884A (en) * 1998-06-04 1999-10-12 The Regents Of The University Of California Atmospheric pressure matrix assisted laser desorption
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GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer

Also Published As

Publication number Publication date
EP1220288B1 (en) 2019-05-22
GB2368715B (en) 2004-10-06
US7041970B2 (en) 2006-05-09
GB0120893D0 (en) 2001-10-17
US20020036262A1 (en) 2002-03-28
US6888129B2 (en) 2005-05-03
EP1220288A3 (en) 2005-08-31
GB2368715A (en) 2002-05-08
EP1220288A2 (en) 2002-07-03
US20040256549A1 (en) 2004-12-23
GB0021902D0 (en) 2000-10-25
JP2002141016A (ja) 2002-05-17

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