JP5249015B2 - 広帯域のウェーハ検査用反射光学システム - Google Patents

広帯域のウェーハ検査用反射光学システム Download PDF

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Publication number
JP5249015B2
JP5249015B2 JP2008504138A JP2008504138A JP5249015B2 JP 5249015 B2 JP5249015 B2 JP 5249015B2 JP 2008504138 A JP2008504138 A JP 2008504138A JP 2008504138 A JP2008504138 A JP 2008504138A JP 5249015 B2 JP5249015 B2 JP 5249015B2
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Prior art keywords
light
optical
wafer
optical subsystem
reflective
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JP2008504138A
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Japanese (ja)
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JP2008534963A5 (enExample
JP2008534963A (ja
Inventor
レンジ，スティーブン，アール
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KLA Corp
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KLA Corp
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G02B17/0605—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors
    • G02B17/061—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using two curved mirrors on-axis systems with at least one of the mirrors having a central aperture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/9563—Inspecting patterns on the surface of objects and suppressing pattern images
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2008504138A 2005-03-31 2006-03-21 広帯域のウェーハ検査用反射光学システム Active JP5249015B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/097,526 US7351980B2 (en) 2005-03-31 2005-03-31 All-reflective optical systems for broadband wafer inspection
US11/097,526 2005-03-31
PCT/US2006/010042 WO2006104748A1 (en) 2005-03-31 2006-03-21 All-reflective optical systems for broadband wafer inspection

Publications (3)

Publication Number Publication Date
JP2008534963A JP2008534963A (ja) 2008-08-28
JP2008534963A5 JP2008534963A5 (enExample) 2012-08-30
JP5249015B2 true JP5249015B2 (ja) 2013-07-31

Family

ID=36602393

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008504138A Active JP5249015B2 (ja) 2005-03-31 2006-03-21 広帯域のウェーハ検査用反射光学システム

Country Status (5)

Country Link
US (1) US7351980B2 (enExample)
EP (1) EP1869435A1 (enExample)
JP (1) JP5249015B2 (enExample)
IL (1) IL186168A (enExample)
WO (1) WO2006104748A1 (enExample)

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US8553337B2 (en) * 2007-11-12 2013-10-08 Cornell University Multi-path, multi-magnification, non-confocal fluorescence emission endoscopy apparatus and methods
JP5174697B2 (ja) 2008-01-31 2013-04-03 株式会社日立ハイテクノロジーズ 欠陥検査装置
JP5022959B2 (ja) * 2008-03-24 2012-09-12 株式会社日立製作所 反射屈折型対物レンズを用いた欠陥検査装置
DE112009000832T5 (de) * 2008-04-04 2011-07-28 Nanda Technologies GmbH, 85716 System und Verfahren zur optischen Inspektion
US8064148B2 (en) 2008-04-15 2011-11-22 Asml Holding N.V. High numerical aperture catadioptric objectives without obscuration and applications thereof
EP2169466B1 (en) * 2008-09-30 2017-06-07 ASML Holding N.V. Inspection apparatus and method for sphero-chromatic aberration correction
EP2400345B1 (en) 2010-06-22 2016-05-11 ASML Holding N.V. Catadioptric illumination system for metrology
US8575576B2 (en) * 2011-02-14 2013-11-05 Kla-Tencor Corporation Optical imaging system with laser droplet plasma illuminator
US20140118819A1 (en) * 2012-10-31 2014-05-01 Corning Incorporated Optical device, imaging system which incorporates the optical device and method implemented by the imaging system for imaging a specimen
CN102967887A (zh) * 2012-11-13 2013-03-13 深圳市华星光电技术有限公司 一种用于检测空卡匣的检测装置
US9075027B2 (en) 2012-11-21 2015-07-07 Kla-Tencor Corporation Apparatus and methods for detecting defects in vertical memory
TWI688760B (zh) * 2013-03-11 2020-03-21 美商克萊譚克公司 使用表面增強電場之缺陷偵測
US9599573B2 (en) 2014-12-02 2017-03-21 Kla-Tencor Corporation Inspection systems and techniques with enhanced detection
US10309907B2 (en) * 2015-03-04 2019-06-04 Kla-Tencor Corporation All reflective wafer defect inspection and review systems and methods
EP3411694A4 (en) * 2016-02-03 2019-09-04 Kla-Tencor Corporation WAFER DEFECT INSPECTION AND TESTING SYSTEMS
US10656098B2 (en) 2016-02-03 2020-05-19 Kla-Tencor Corporation Wafer defect inspection and review systems
US10168273B1 (en) 2017-07-01 2019-01-01 Kla-Tencor Corporation Methods and apparatus for polarizing reticle inspection
US11333621B2 (en) 2017-07-11 2022-05-17 Kla-Tencor Corporation Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction
US11317500B2 (en) 2017-08-30 2022-04-26 Kla-Tencor Corporation Bright and clean x-ray source for x-ray based metrology
US10959318B2 (en) 2018-01-10 2021-03-23 Kla-Tencor Corporation X-ray metrology system with broadband laser produced plasma illuminator
US11272607B2 (en) 2019-11-01 2022-03-08 Kla Corporation Laser produced plasma illuminator with low atomic number cryogenic target
US11259394B2 (en) 2019-11-01 2022-02-22 Kla Corporation Laser produced plasma illuminator with liquid sheet jet target
US11143604B1 (en) 2020-04-06 2021-10-12 Kla Corporation Soft x-ray optics with improved filtering
CN116685878A (zh) 2020-12-30 2023-09-01 Asml荷兰有限公司 用于清洁检查系统的设备和方法

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Also Published As

Publication number Publication date
IL186168A0 (en) 2008-01-20
US20060219930A1 (en) 2006-10-05
IL186168A (en) 2012-02-29
US7351980B2 (en) 2008-04-01
WO2006104748A1 (en) 2006-10-05
JP2008534963A (ja) 2008-08-28
EP1869435A1 (en) 2007-12-26

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