JP5240975B2 - 導電性カーボンナノチューブチップ、これを備えた走査型プローブ顕微鏡のプローブ、及び該導電性カーボンナノチューブチップの製造方法 - Google Patents
導電性カーボンナノチューブチップ、これを備えた走査型プローブ顕微鏡のプローブ、及び該導電性カーボンナノチューブチップの製造方法 Download PDFInfo
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- JP5240975B2 JP5240975B2 JP2007005075A JP2007005075A JP5240975B2 JP 5240975 B2 JP5240975 B2 JP 5240975B2 JP 2007005075 A JP2007005075 A JP 2007005075A JP 2007005075 A JP2007005075 A JP 2007005075A JP 5240975 B2 JP5240975 B2 JP 5240975B2
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims description 106
- 239000002041 carbon nanotube Substances 0.000 title claims description 106
- 229910021393 carbon nanotube Inorganic materials 0.000 title claims description 106
- 239000000523 sample Substances 0.000 title claims description 42
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 49
- 229910052707 ruthenium Inorganic materials 0.000 claims description 49
- 239000011247 coating layer Substances 0.000 claims description 48
- 239000000758 substrate Substances 0.000 claims description 46
- 238000000034 method Methods 0.000 claims description 23
- 238000000231 atomic layer deposition Methods 0.000 claims description 16
- 238000005530 etching Methods 0.000 claims description 2
- 238000005498 polishing Methods 0.000 claims description 2
- 238000005336 cracking Methods 0.000 claims 2
- 239000000463 material Substances 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 239000010410 layer Substances 0.000 description 6
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 6
- 238000005452 bending Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- 239000003054 catalyst Substances 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 238000010926 purge Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920003217 poly(methylsilsesquioxane) Polymers 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000005211 surface analysis Methods 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B26—HAND CUTTING TOOLS; CUTTING; SEVERING
- B26B—HAND-HELD CUTTING TOOLS NOT OTHERWISE PROVIDED FOR
- B26B13/00—Hand shears; Scissors
- B26B13/22—Hand shears; Scissors combined with auxiliary implements, e.g. with cigar cutter, with manicure instrument
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/08—Probe characteristics
- G01Q70/10—Shape or taper
- G01Q70/12—Nanotube tips
-
- A—HUMAN NECESSITIES
- A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
- A01G—HORTICULTURE; CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPS OR SEAWEED; FORESTRY; WATERING
- A01G3/00—Cutting implements specially adapted for horticultural purposes; Delimbing standing trees
- A01G3/02—Secateurs; Flower or fruit shears
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B17/00—Surgical instruments, devices or methods, e.g. tourniquets
- A61B17/32—Surgical cutting instruments
- A61B17/3201—Scissors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/08—Probe characteristics
- G01Q70/14—Particular materials
-
- A—HUMAN NECESSITIES
- A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
- A01G—HORTICULTURE; CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPS OR SEAWEED; FORESTRY; WATERING
- A01G3/00—Cutting implements specially adapted for horticultural purposes; Delimbing standing trees
- A01G3/02—Secateurs; Flower or fruit shears
- A01G2003/023—Secateurs; Flower or fruit shears with means for grasping or collecting the cut objects
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/875—Scanning probe structure with tip detail
- Y10S977/876—Nanotube tip
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/875—Scanning probe structure with tip detail
- Y10S977/879—Material
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- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nanotechnology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Radiology & Medical Imaging (AREA)
- Molecular Biology (AREA)
- Forests & Forestry (AREA)
- Surgery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Pathology (AREA)
- Environmental Sciences (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Medical Informatics (AREA)
- Ecology (AREA)
- Animal Behavior & Ethology (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Biodiversity & Conservation Biology (AREA)
- Analytical Chemistry (AREA)
- Carbon And Carbon Compounds (AREA)
Description
11,16 突出部、
15 カンチレバー、
20 カーボンナノチューブ(カーボンナノチューブチップ)、
21 カーボンナノチューブの下端、
30 ルテニウム被覆層。
Claims (13)
- 基板上に立設されたカーボンナノチューブチップと、
前記カーボンナノチューブチップの表面と、前記基板の前記カーボンナノチューブチップと繋がれた表面とを含む領域に直接接触して覆われたルテニウム被覆層と、
からなる導電性カーボンナノチューブチップ。 - 前記ルテニウム被覆層の厚さが5nm〜100nmである、請求項1に記載の導電性カーボンナノチューブチップ。
- 前記ルテニウム被覆層の厚さが10nm〜30nmである、請求項2に記載の導電性カーボンナノチューブチップ。
- 前記ルテニウム被覆層が原子層蒸着法により形成されてなる、請求項1〜3のいずれか1項に記載の導電性カーボンナノチューブチップ。
- 支持体に固定された第1の端部を有するカンチレバーと、
前記カンチレバーの第2の端部に立設されてなるカーボンナノチューブチップと、前記カーボンナノチューブチップの表面と前記カンチレバーの前記カーボンナノチューブチップと繋がれた表面とを含む領域に直接接触して覆われたルテニウム被覆層と、からなる導電性カーボンナノチューブチップと、
を含む、走査型プローブ顕微鏡のプローブ。 - 前記ルテニウム被覆層の厚さが5nm〜100nmである、請求項5に記載の走査型プローブ顕微鏡のプローブ。
- 前記ルテニウム被覆層の厚さが10nm〜30nmである、請求項6に記載の走査型プローブ顕微鏡のプローブ。
- 前記ルテニウム被覆層は、原子層蒸着法により形成されてなる、請求項5〜7のいずれか1項に記載の走査型プローブ顕微鏡のプローブ。
- 前記第2の端部に突出部が設けられ、前記カーボンナノチューブチップの一方の端部が前記突出部に固定されてなる、請求項5〜8のいずれか1項に記載の走査型プローブ顕微鏡のプローブ。
- 基板上にカーボンナノチューブチップを立設する段階(a)と、
前記カーボンナノチューブチップと前記基板の前記カーボンナノチューブチップと繋がれた表面とを含む領域に直接接触して覆われたルテニウム被覆層を原子層蒸着法により形成する段階(b)と、
からなる導電性カーボンナノチューブチップの製造方法。 - 前記段階(a)は、
前記基板をエッチングまたは研磨することにより突出部を形成し、
前記突出部の先端に前記カーボンナノチューブを設けることを含む、請求項10に記載の導電性カーボンナノチューブチップの製造方法。 - 前記段階(b)において、前記ルテニウム被覆層の厚さが5nm〜100nmである、請求項10または11に記載の導電性カーボンナノチューブチップの製造方法。
- 前記段階(b)において、前記ルテニウム被覆層の厚さが10nm〜30nmである、請求項12に記載の導電性カーボンナノチューブチップの製造方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020060004170A KR101159074B1 (ko) | 2006-01-14 | 2006-01-14 | 도전성 탄소나노튜브 팁, 이를 구비한 스캐닝 프로브마이크로스코프의 탐침 및 상기 도전성 탄소나노튜브 팁의제조 방법 |
KR10-2006-0004170 | 2006-01-14 |
Publications (2)
Publication Number | Publication Date |
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JP2007187665A JP2007187665A (ja) | 2007-07-26 |
JP5240975B2 true JP5240975B2 (ja) | 2013-07-17 |
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Family Applications (1)
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JP2007005075A Active JP5240975B2 (ja) | 2006-01-14 | 2007-01-12 | 導電性カーボンナノチューブチップ、これを備えた走査型プローブ顕微鏡のプローブ、及び該導電性カーボンナノチューブチップの製造方法 |
Country Status (3)
Country | Link |
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US (1) | US7507958B2 (ja) |
JP (1) | JP5240975B2 (ja) |
KR (1) | KR101159074B1 (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
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US7439731B2 (en) | 2005-06-24 | 2008-10-21 | Crafts Douglas E | Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures |
US7731503B2 (en) * | 2006-08-21 | 2010-06-08 | Formfactor, Inc. | Carbon nanotube contact structures |
US8130007B2 (en) * | 2006-10-16 | 2012-03-06 | Formfactor, Inc. | Probe card assembly with carbon nanotube probes having a spring mechanism therein |
US8354855B2 (en) * | 2006-10-16 | 2013-01-15 | Formfactor, Inc. | Carbon nanotube columns and methods of making and using carbon nanotube columns as probes |
WO2009001220A2 (en) * | 2007-06-26 | 2008-12-31 | Universitetet I Oslo | Functionalization of microscopy probe tips |
US8149007B2 (en) * | 2007-10-13 | 2012-04-03 | Formfactor, Inc. | Carbon nanotube spring contact structures with mechanical and electrical components |
US8496999B2 (en) * | 2008-03-24 | 2013-07-30 | The Board Of Trustees Of The Leland Stanford Junior University | Field-aided preferential deposition of precursors |
US7814565B2 (en) * | 2008-08-27 | 2010-10-12 | Snu R&Db Foundation | Nanostructure on a probe tip |
JP2010210449A (ja) * | 2009-03-11 | 2010-09-24 | Hitachi High-Technologies Corp | 導電性ナノチューブ探針、それを用いた電気特性評価装置及び走査型プローブ顕微鏡 |
JP2010223852A (ja) * | 2009-03-25 | 2010-10-07 | Toshiba Corp | 電気検査用プローブ及びその製造方法並びに半導体装置の製造方法 |
US8272124B2 (en) * | 2009-04-03 | 2012-09-25 | Formfactor, Inc. | Anchoring carbon nanotube columns |
US20100252317A1 (en) * | 2009-04-03 | 2010-10-07 | Formfactor, Inc. | Carbon nanotube contact structures for use with semiconductor dies and other electronic devices |
JP5452088B2 (ja) | 2009-06-15 | 2014-03-26 | 株式会社日立ハイテクノロジーズ | 微小接触式プローバ |
US8872176B2 (en) | 2010-10-06 | 2014-10-28 | Formfactor, Inc. | Elastic encapsulated carbon nanotube based electrical contacts |
KR101265776B1 (ko) * | 2011-10-24 | 2013-05-20 | 포항공과대학교 산학협력단 | 나노 전극 및 그 제조 방법 |
KR101356116B1 (ko) * | 2012-08-13 | 2014-01-28 | 한국과학기술원 | 금속 나노입자와 지지체 사이의 접착력 측정 방법 |
KR101580269B1 (ko) | 2015-05-19 | 2015-12-24 | 한국과학기술원 | 3차원 탐침 및 그 제조 방법 |
WO2017103789A1 (pt) * | 2015-12-14 | 2017-06-22 | Universidade Federal De Minas Gerais - Ufmg | Dispositivo metálico para microscopia por varredura por sonda e método de fabricação do mesmo |
US10141155B2 (en) * | 2016-12-20 | 2018-11-27 | Kla-Tencor Corporation | Electron beam emitters with ruthenium coating |
US10607806B2 (en) | 2017-10-10 | 2020-03-31 | Kla-Tencor Corporation | Silicon electron emitter designs |
US10395884B2 (en) | 2017-10-10 | 2019-08-27 | Kla-Tencor Corporation | Ruthenium encapsulated photocathode electron emitter |
KR102101854B1 (ko) * | 2018-09-28 | 2020-04-20 | 전북대학교산학협력단 | 원자간력현미경 팁 및 이의 제조 방법 |
KR102386384B1 (ko) * | 2020-07-20 | 2022-04-14 | 서울대학교산학협력단 | 원자힘현미경을 이용한 2차원 전이금속 칼코겐화합물의 결정립계 측정방법 |
Family Cites Families (8)
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---|---|---|---|---|
US7416699B2 (en) * | 1998-08-14 | 2008-08-26 | The Board Of Trustees Of The Leland Stanford Junior University | Carbon nanotube devices |
US6346189B1 (en) * | 1998-08-14 | 2002-02-12 | The Board Of Trustees Of The Leland Stanford Junior University | Carbon nanotube structures made using catalyst islands |
KR20010099655A (ko) * | 1998-09-28 | 2001-11-09 | 블라디미르 맨체프스키 | Mems 장치의 기능 소자로서의 탄소 나노튜브를제조하기 위한 방법 |
KR100398276B1 (ko) * | 1998-12-03 | 2003-09-19 | 다이켄카가쿠 코교 가부시키가이샤 | 전자장치의 표면신호조작용 프로우브 및 그 제조방법 |
JP2002131334A (ja) * | 2000-10-24 | 2002-05-09 | Nec Yamaguchi Ltd | プローブ針、プローブカード、及びプローブカードの作製方法 |
JP3811004B2 (ja) * | 2000-11-26 | 2006-08-16 | 喜萬 中山 | 導電性走査型顕微鏡用プローブ |
JP2002162337A (ja) * | 2000-11-26 | 2002-06-07 | Yoshikazu Nakayama | 集束イオンビーム加工による走査型顕微鏡用プローブ |
US20070285013A1 (en) * | 2004-04-13 | 2007-12-13 | Yoshifumi Amano | Plasma Display Panel and Driving Method Thereof |
-
2006
- 2006-01-14 KR KR1020060004170A patent/KR101159074B1/ko not_active IP Right Cessation
- 2006-08-31 US US11/513,197 patent/US7507958B2/en active Active
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Publication number | Publication date |
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US20070164214A1 (en) | 2007-07-19 |
KR20070075660A (ko) | 2007-07-24 |
KR101159074B1 (ko) | 2012-06-25 |
US7507958B2 (en) | 2009-03-24 |
JP2007187665A (ja) | 2007-07-26 |
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