JP5212345B2 - 部品搬送方法 - Google Patents

部品搬送方法 Download PDF

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Publication number
JP5212345B2
JP5212345B2 JP2009281321A JP2009281321A JP5212345B2 JP 5212345 B2 JP5212345 B2 JP 5212345B2 JP 2009281321 A JP2009281321 A JP 2009281321A JP 2009281321 A JP2009281321 A JP 2009281321A JP 5212345 B2 JP5212345 B2 JP 5212345B2
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Japan
Prior art keywords
component
test
transport
electronic
transport hand
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Expired - Fee Related
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JP2009281321A
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Japanese (ja)
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JP2010054521A5 (cg-RX-API-DMAC7.html
JP2010054521A (ja
Inventor
雅邦 塩澤
広明 藤森
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Seiko Epson Corp
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Seiko Epson Corp
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Priority to JP2009281321A priority Critical patent/JP5212345B2/ja
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Publication of JP2010054521A5 publication Critical patent/JP2010054521A5/ja
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  • Testing Of Individual Semiconductor Devices (AREA)
JP2009281321A 2009-12-11 2009-12-11 部品搬送方法 Expired - Fee Related JP5212345B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009281321A JP5212345B2 (ja) 2009-12-11 2009-12-11 部品搬送方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009281321A JP5212345B2 (ja) 2009-12-11 2009-12-11 部品搬送方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2008061452A Division JP4471011B2 (ja) 2008-03-11 2008-03-11 部品試験装置及び部品搬送方法

Publications (3)

Publication Number Publication Date
JP2010054521A JP2010054521A (ja) 2010-03-11
JP2010054521A5 JP2010054521A5 (cg-RX-API-DMAC7.html) 2011-04-28
JP5212345B2 true JP5212345B2 (ja) 2013-06-19

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ID=42070570

Family Applications (1)

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JP2009281321A Expired - Fee Related JP5212345B2 (ja) 2009-12-11 2009-12-11 部品搬送方法

Country Status (1)

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JP (1) JP5212345B2 (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013053991A (ja) 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS649378A (en) * 1987-07-01 1989-01-12 Mitsubishi Electric Corp Semiconductor testing apparatus
JP2000088918A (ja) * 1998-09-17 2000-03-31 Hitachi Ltd Ｉｃハンドラ
US6518745B2 (en) * 2000-10-10 2003-02-11 Mirae Corporation Device test handler and method for operating the same
JP2002148307A (ja) * 2000-11-08 2002-05-22 Hitachi Ltd Ｉｃハンドラーの搬送方法

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Publication number Publication date
JP2010054521A (ja) 2010-03-11

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