JP5204998B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

Info

Publication number
JP5204998B2
JP5204998B2 JP2007165106A JP2007165106A JP5204998B2 JP 5204998 B2 JP5204998 B2 JP 5204998B2 JP 2007165106 A JP2007165106 A JP 2007165106A JP 2007165106 A JP2007165106 A JP 2007165106A JP 5204998 B2 JP5204998 B2 JP 5204998B2
Authority
JP
Japan
Prior art keywords
film
circuit
substrate
region
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007165106A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008035498A (ja
JP2008035498A5 (enExample
Inventor
大輔 河江
正己 遠藤
義元 黒川
隆之 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2007165106A priority Critical patent/JP5204998B2/ja
Publication of JP2008035498A publication Critical patent/JP2008035498A/ja
Publication of JP2008035498A5 publication Critical patent/JP2008035498A5/ja
Application granted granted Critical
Publication of JP5204998B2 publication Critical patent/JP5204998B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Thin Film Transistor (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
JP2007165106A 2006-06-30 2007-06-22 半導体装置 Expired - Fee Related JP5204998B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007165106A JP5204998B2 (ja) 2006-06-30 2007-06-22 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006181885 2006-06-30
JP2006181885 2006-06-30
JP2007165106A JP5204998B2 (ja) 2006-06-30 2007-06-22 半導体装置

Publications (3)

Publication Number Publication Date
JP2008035498A JP2008035498A (ja) 2008-02-14
JP2008035498A5 JP2008035498A5 (enExample) 2010-07-22
JP5204998B2 true JP5204998B2 (ja) 2013-06-05

Family

ID=39124378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007165106A Expired - Fee Related JP5204998B2 (ja) 2006-06-30 2007-06-22 半導体装置

Country Status (1)

Country Link
JP (1) JP5204998B2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101570993B1 (ko) * 2008-09-23 2015-11-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치의 제조방법
JP5484109B2 (ja) * 2009-02-09 2014-05-07 三菱電機株式会社 電気光学装置
JP5784479B2 (ja) * 2010-12-28 2015-09-24 株式会社半導体エネルギー研究所 半導体装置
JP5916030B2 (ja) * 2012-02-14 2016-05-11 セイコーエプソン株式会社 温度センサー及び電気光学装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3637706B2 (ja) * 1996-11-27 2005-04-13 ソニー株式会社 ディジタル遅延回路およびそれを用いたディジタル制御発振回路
CA2224767A1 (en) * 1996-12-31 1998-06-30 Huang Chaogang Variable cmos vernier delay
JPH1115934A (ja) * 1997-06-24 1999-01-22 Nippon Steel Corp 無電池方式のｒｆｉｄ
JPH11168362A (ja) * 1997-12-02 1999-06-22 Oki Micro Design Miyazaki Co Ltd 遅延回路
JP3748857B2 (ja) * 2002-01-25 2006-02-22 松下電器産業株式会社 半導体集積回路とこれを搭載したデータキャリア

Also Published As

Publication number Publication date
JP2008035498A (ja) 2008-02-14

Similar Documents

Publication Publication Date Title
KR101373532B1 (ko) 반도체장치 및 상기 반도체장치를 구비하는 전자 장치
KR101381359B1 (ko) 클록 생성 회로 및 이 클록 생성 회로를 구비한 반도체장치
KR101383119B1 (ko) 반도체 장치 및 전자 장치
JP5204504B2 (ja) 半導体装置
JP5486778B2 (ja) 半導体装置
US7663447B2 (en) Oscillator circuit having a stable output signal resistant to power supply voltage fluctuation
JP5437590B2 (ja) 半導体装置
US20080164978A1 (en) Semiconductor device
KR101358951B1 (ko) 클록 동기 회로 및 그것을 구비한 반도체장치
JP5063256B2 (ja) クロック生成回路、クロック生成回路が有するカウンター回路、及び半導体装置
JP5204998B2 (ja) 半導体装置
JP5346459B2 (ja) 発振回路およびそれを備えた半導体装置
JP5438894B2 (ja) 半導体装置及び電子機器
JP4906093B2 (ja) 半導体装置
JP5348859B2 (ja) 受信回路及び半導体装置
HK1125504A (en) Clock signal generation circuit and semiconductor device

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100603

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100603

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120130

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120214

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120409

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20121030

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130111

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20130121

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130212

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130218

R150 Certificate of patent or registration of utility model

Ref document number: 5204998

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160222

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160222

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees