JP5204998B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP5204998B2
JP5204998B2 JP2007165106A JP2007165106A JP5204998B2 JP 5204998 B2 JP5204998 B2 JP 5204998B2 JP 2007165106 A JP2007165106 A JP 2007165106A JP 2007165106 A JP2007165106 A JP 2007165106A JP 5204998 B2 JP5204998 B2 JP 5204998B2
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Japan
Prior art keywords
film
circuit
substrate
region
signal
Prior art date
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Expired - Fee Related
Application number
JP2007165106A
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English (en)
Japanese (ja)
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JP2008035498A (ja
JP2008035498A5 (enrdf_load_stackoverflow
Inventor
大輔 河江
正己 遠藤
義元 黒川
隆之 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2007165106A priority Critical patent/JP5204998B2/ja
Publication of JP2008035498A publication Critical patent/JP2008035498A/ja
Publication of JP2008035498A5 publication Critical patent/JP2008035498A5/ja
Application granted granted Critical
Publication of JP5204998B2 publication Critical patent/JP5204998B2/ja
Expired - Fee Related legal-status Critical Current
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Thin Film Transistor (AREA)
JP2007165106A 2006-06-30 2007-06-22 半導体装置 Expired - Fee Related JP5204998B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007165106A JP5204998B2 (ja) 2006-06-30 2007-06-22 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006181885 2006-06-30
JP2006181885 2006-06-30
JP2007165106A JP5204998B2 (ja) 2006-06-30 2007-06-22 半導体装置

Publications (3)

Publication Number Publication Date
JP2008035498A JP2008035498A (ja) 2008-02-14
JP2008035498A5 JP2008035498A5 (enrdf_load_stackoverflow) 2010-07-22
JP5204998B2 true JP5204998B2 (ja) 2013-06-05

Family

ID=39124378

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007165106A Expired - Fee Related JP5204998B2 (ja) 2006-06-30 2007-06-22 半導体装置

Country Status (1)

Country Link
JP (1) JP5204998B2 (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010035848A1 (en) * 2008-09-23 2010-04-01 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
JP5484109B2 (ja) * 2009-02-09 2014-05-07 三菱電機株式会社 電気光学装置
JP5784479B2 (ja) 2010-12-28 2015-09-24 株式会社半導体エネルギー研究所 半導体装置
JP5916030B2 (ja) * 2012-02-14 2016-05-11 セイコーエプソン株式会社 温度センサー及び電気光学装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3637706B2 (ja) * 1996-11-27 2005-04-13 ソニー株式会社 ディジタル遅延回路およびそれを用いたディジタル制御発振回路
CA2224767A1 (en) * 1996-12-31 1998-06-30 Huang Chaogang Variable cmos vernier delay
JPH1115934A (ja) * 1997-06-24 1999-01-22 Nippon Steel Corp 無電池方式のｒｆｉｄ
JPH11168362A (ja) * 1997-12-02 1999-06-22 Oki Micro Design Miyazaki Co Ltd 遅延回路
JP3748857B2 (ja) * 2002-01-25 2006-02-22 松下電器産業株式会社 半導体集積回路とこれを搭載したデータキャリア

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Publication number Publication date
JP2008035498A (ja) 2008-02-14

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