JP5198535B2 - Glass substrate cut surface inspection system - Google Patents

Description

  The present invention relates to a glass substrate cut surface inspection device, and more specifically, information on the cut surface of a glass substrate by three-dimensionally inspecting the cut surface of the glass substrate from various directions using an imaging optical system. It is related with the cut surface inspection apparatus of the glass substrate which can detect swiftly and correctly.

  In general, a glass substrate used in the field of manufacturing flat panel displays such as TFT-LCD (Thin Film Transistor Liquid Crystal Display), PDP (Plasma Display Panel), EL (Electro luminescence), etc. is a melt molding machine for glass liquid melted in a glass melting furnace After being manufactured, the film is cut according to the primary standard by a cutting apparatus such as a diamond wheel, the surface is coated with a protective film, and is transported to the processing line.

  In the glass substrate cutting process as described above, the degree of cutting differs depending on the state of the cutting machine, and defects occur on the cut surface, so it is important to obtain information on the cut surface. However, the cut surface of the glass substrate was observed with the naked eye using a microscope.

  As described above, the inspection of the cut surface of the glass substrate using the conventional microscope not only takes a long time, but also the inaccuracy of the inspection makes it impossible to obtain accurate information on the cut surface of the glass substrate. was there.

  In particular, since only one side of the cut surface of the glass substrate is inspected due to time constraints, three-dimensional observation is not performed on the cut surface of the glass substrate, and accurate information on the cut surface of the glass substrate is not obtained. Cannot be obtained, and it is difficult to utilize as data for feedback to the process.

Japanese Patent Laid-Open No. 06-258231 Japanese Patent Laid-Open No. 04-168351

  The present invention has been made in view of the above circumstances, and its object is to inspect the cut surface of the glass substrate in a three-dimensional manner using an image optical system, thereby providing information on the cut surface of the glass substrate, For example, the type and size of defects, the thickness of the glass substrate, the straightness of the cut surface of the glass substrate, the wheel depth of the cutting machine, etc. can be detected quickly and accurately. By making it possible to make use of the glass substrate, it is possible to easily implement process improvements such as judging when to replace the cutting machine wheel, and to improve the productivity and quality of the glass substrate. It is to provide a cut surface inspection device.

  In order to achieve the above object, the present invention is an apparatus for inspecting a cut surface of a glass substrate, and a fixing plate for fixing the glass substrate so that the cut surface of the glass substrate protrudes to one side; A first photographing means having a first camera located above the upper surface of the glass substrate and capturing an image by photographing the glass substrate perpendicularly to the upper surface toward the upper side of the cut surface; A third photographing means having a third camera which is located so as to face the cut surface and obtains an image by photographing the glass substrate perpendicularly to the cut surface; and installed adjacent to the cut surface of the glass substrate. The first and third imaging means mounted on the frame and the frame to which the first and third imaging means are respectively coupled are moved along the longitudinal direction of the cut surface, and the cut surface is moved. Can shoot And a frame moving means for moving the sea urchin said frame. Further, the frame is installed at a portion coupled with the third imaging unit, and the cutting plane is based on a position difference (Δd) value between the cutting planes calculated from the video obtained from the first imaging unit. And third adjusting means having a third focusing stage for moving the third imaging means in a direction perpendicular to the first photographing means.

  The apparatus for inspecting a cut surface of a glass substrate according to the present invention can three-dimensionally inspect the cut surface of the glass substrate using the first photographing means and the third photographing means. The type and size of the defect, the thickness of the glass substrate, the straightness of the cut surface of the glass substrate, the wheel depth of the cutting machine, etc. can be detected quickly and accurately. As a result, defect detection is efficiently performed, and by utilizing such information as data for feedback to the process, it is easy to improve the process such as judging the replacement time of the cutting machine wheel, and thus the glass substrate The effect of improving the productivity and quality can be obtained.

FIG. 1 is a side view showing an apparatus for inspecting a cut surface of a glass substrate according to the present invention. FIG. 2 is a plan view showing a glass substrate cut surface inspection apparatus according to the present invention. FIG. 3 is a cross-sectional view showing first to third cameras and first to third illuminations of the apparatus for inspecting a cut surface of a glass substrate according to the present invention. FIG. 4 is a side view showing the fourth illumination and the fourth reflecting mirror of the apparatus for inspecting a cut surface of a glass substrate according to the invention. FIG. 5 is a plan view for explaining focusing of the third camera by the apparatus for inspecting a cut surface of the glass substrate according to the invention. FIG. 6 is a view for explaining focusing of the third camera of the cut surface inspection apparatus for a glass substrate according to the present invention.

  Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 is a side view showing a glass substrate cut surface inspection apparatus according to the present invention, FIG. 2 is a plan view showing a glass substrate cut surface inspection apparatus according to the present invention, and FIG. 3 is a glass substrate cut surface according to the present invention. Sectional drawing which shows the camera and illumination of an inspection apparatus, FIG. 4 is a side view which shows the 4th illumination and the 4th reflective mirror of the cut surface inspection apparatus of the glass substrate by this invention.

  As shown in the figure, a glass substrate cutting surface inspection apparatus 100 according to the present invention includes a fixing plate 110 for adsorbing and fixing a glass substrate 1, and horizontal sides of the cutting surface 1 a of the glass substrate 1 in the vertical direction. The first, second, and third photographing means 120, 130, and 140 to be installed and the frame 151 on which the first, second, and third photographing means 120, 130, and 140 are installed are formed on the cut surface 1a of the glass substrate 1. And a main robot 150 as frame moving means for moving along the longitudinal direction.

The fixed plate 110 supports the glass substrate 1 so that the cut surface 1 a of the glass substrate 1 protrudes from one side of the fixed plate 110.
A plurality of vacuum holes (not shown) are formed on one side of the fixed plate 110 in contact with the glass substrate 1, and suction force is supplied to the vacuum holes from an external vacuum unit to attract the glass substrate 1. To do. Even when the glass substrate 1 is bent, the suction force is supplied to the vacuum holes sequentially from one side to the other side along the longitudinal direction of the fixed plate 110 so that the glass substrate 1 is entirely It is in close contact with the fixed plate 110.

  Further, the cut surface 1a is set to the reference position so that the distance between the cut surface 1a of the glass substrate 1 fixed to the fixing plate 110 and a third camera 141 of the third photographing unit 140 to be described later is kept constant. It is preferable that the plurality of guides 160 for supporting the guide plate 160 are installed at positions facing the fixing plate 110 so that the guides 160 can move horizontally and be fixed. With such a configuration, it is easy to fix the glass substrate 1 to the fixing plate 110 so that the cut surface 1a of the glass substrate 1 is located at the focal length of the third camera 141 of the third imaging unit 140. Focusing of the third camera 141 is facilitated.

  The first to third imaging means 120, 130, and 140 are installed on the frame 151 of the main robot 150, respectively.

  The first photographing means 120 includes a first camera 121 and a first illumination 122 respectively located above the upper surface of the glass substrate 1, and the first camera 121 is located above the cut surface 1 a, that is, on the glass substrate 1. The glass substrate 1 is photographed so as to be perpendicular to the glass substrate 1 toward the upper end where the upper surface and the cut surface 1a meet, and an upper profile image of the cut surface 1a is obtained. 121 is irradiated with light.

  The second photographing means 130 is installed to face the first photographing means 120 with respect to the cut surface 1 a of the glass substrate 1, and the second camera 131 and the second illumination 132 that are respectively located below the lower surface of the glass substrate 1. The second camera 131 has a glass so as to be perpendicular to the lower surface of the glass substrate 1 toward the lower side of the cut surface 1a, that is, the lower end where the lower surface of the glass substrate 1 meets the cut surface 1a. The substrate 1 is imaged to obtain a lower profile image of the cut surface 1a, and the second illumination 132 irradiates the imaging region of the second camera 131 with light.

  The 3rd imaging means 140 is provided with the 3rd camera 141 and the 3rd illumination 142 which are each located so that the cut surface 1a of the glass substrate 1 may be opposed, and the 3rd camera 141 is cut surface toward the cut surface 1a. The glass substrate 1 is photographed perpendicularly to 1 a to obtain a planar image of the cut surface 1 a, and the third illumination 142 irradiates the photographing part of the third camera 141 with light.

  The 1st-3rd illumination 122,132,142 of the 1st-3rd imaging means 120,130,140 is the same direction as the optical axis of the lens 123,133,143 of the 1st-3rd camera 121,131,141. It is preferable to irradiate light. For this purpose, as shown in FIG. 3, the first to third illuminations 122, 132, 142 are installed so as to irradiate light vertically to the first to third cameras 121, 131, 141. The light emitted from the third illuminations 122, 132, 142 is reflected by the first to third reflection mirrors 124, 134, 144 and is irradiated along the optical axes of the lenses 123, 133, 143. Therefore, the first to third cameras 121, 131, 141 accurately photograph the cut surface 1 a of the glass substrate 1 without being interfered with by the light emitted from the first to third illuminations 122, 132, 142. be able to.

  The main robot 150 is installed adjacent to the cut surface 1a of the glass substrate 1, and the frame 151 on which the first to third imaging units 120, 130, and 140 are installed includes the first to third imaging units 120, The main robot 130, 140 moves along the longitudinal direction of the cutting surface 1 a and is movable along the cutting surface 1 a so that the upper end, the lower end, and the entire cutting surface 1 a of the cutting surface 1 a are photographed. 150.

  The frame 151 is reciprocated along the cut surface 1a in the longitudinal direction of the main robot 150 by driving a motor (not shown). However, the driving device of the frame 151 is not limited to this, and a pneumatic cylinder may be used. .

  The frame 151 adjusts the positions of the first to third photographing means 120, 130, and 140 with respect to the cut surface 1 a of the glass substrate 1 to focus the first to third cameras 121, 131, and 141. 1st-3rd adjustment means 152,153,154 is comprised.

  The first adjusting unit 152 is installed at a portion where the frame 151 and the first photographing unit 120 are connected. Further, the first position adjusting stage 152a for moving the first photographing means 120 in a direction perpendicular to the cut surface 1a of the glass substrate 1 and the first photographing means 120 are fixed, and the first position adjusting stage 152a is fixed to the first position adjusting stage 152a. And a first focusing stage 152b for moving the first photographing means 120 in a direction horizontal to the cut surface 1a.

  With this configuration, the first adjustment unit 152 can easily adjust the position of the first imaging unit 120 with respect to the cut surface 1a of the glass substrate 1 by moving the first position adjustment stage 152a. The first camera 121 can be easily focused by moving the first focusing stage 152b.

  The second adjusting unit 153 is installed at a portion where the frame 151 and the second photographing unit 130 are connected. In addition, the second position adjusting stage 153a for moving the second image capturing unit 130 in a direction perpendicular to the cut surface 1a of the glass substrate 1 and the second image capturing unit 130 are fixed to the second position adjusting stage 153a. And a second focusing stage 153b for moving the second photographing means 130 in a direction horizontal to the cut surface 1a.

  With this configuration, the second adjustment unit 153 can easily adjust the position of the second imaging unit 130 with respect to the cut surface 1a of the glass substrate 1 by moving the second position adjustment stage 153a. The second camera 131 can be easily focused by moving the second focusing stage 153b.

  The third adjusting unit 154 is installed at a portion where the frame 151 and the third photographing unit 140 are connected. Further, a third position adjusting stage 154a for moving the third photographing means 140 in a direction horizontal to the cut surface 1a of the glass substrate 1 and the third photographing means 140 are fixed, and the third position adjusting stage 154a is fixed to the third position adjusting stage 154a. And a third focusing stage 154b for moving the third photographing means 140 in a direction perpendicular to the cut surface 1a.

  With such a configuration, the third adjusting unit 154 can easily adjust the position of the third imaging unit 140 with respect to the cut surface 1a of the glass substrate 1 by moving the third position adjusting stage 154a. By moving the third focusing stage 154b, the third camera 141 can be easily focused.

  The first to third position adjusting stages 152a, 153a, 154a of the first to third adjusting means 152, 153, 154 and the first to third focusing stages 152b, 153b, 154b are installed on the frame 151, respectively. However, it may be configured to reciprocate by compression or expansion of a pneumatic cylinder (not shown) instead of the motor.

  In addition, as shown in FIG. 4, the shape of the glass substrate 1 is clearer than the background in the images photographed by the first to third cameras 121, 131, 141 of the first to third photographing means 120, 130, 140. The glass substrate cut surface inspection device 100 reflects the fourth illumination 171 that emits light and the light emitted from the fourth illumination 171 to the periphery of the cut surface 1a of the glass substrate 1. And a fourth reflecting mirror 172. With this configuration, the light emitted from the fourth illumination 171 is reflected by the fourth reflecting mirror 172 and irradiated around the cut surface 1 a of the glass substrate 1, so that the first to third cameras 121, 131, 141 are used. In the photographed image, the background can be made different in brightness and color so that the shape of the glass substrate 1a can be more clearly distinguished from the background.

  In addition, air nozzles 180 for injecting air are respectively installed on the upper and lower surfaces of the glass substrate 1 in order to remove foreign substances attached to the periphery of the cut surface 1 a of the glass substrate 1.

  The air nozzle 180 is supplied with air from an external air supply unit (not shown) and sprays around the cut surface 1a of the glass substrate 1 to remove foreign matter, thereby the first to third photographing means 120, It is possible to prevent a foreign object from being captured in the images captured by the first to third cameras 121, 131, and 141 of 130 and 140, and to obtain a clear image of the cut surface 1 a of the glass substrate 1.

  On the other hand, the main robot 150 is provided with a linear scaler 192 for knowing the position of the frame 151 and a head 191 for reading data from the scaler 192.

  The operation of the glass substrate cut surface inspection apparatus 100 having such a structure will be described below.

  First, the glass substrate 1 is positioned on the fixed plate 110. At this time, the cut surface 1a is brought into close contact with the guide 160 fixed at a predetermined position. Therefore, when the cut surface 1a is placed at the reference position, the distance between the lens 143 of the third camera 141 of the third photographing unit 140 and the cut surface 1a is maintained constant, and the third camera 141 is focused. make it easier.

  The glass substrate 1 placed on the fixed plate 110 is attracted and fixed to the fixed plate 110 by a suction force supplied through a vacuum hole (not shown) of the fixed plate 110. At this time, even when the glass substrate 1 is bent, the suction force is sequentially supplied to the vacuum hole from one side on the fixed plate 110 to the other side along the longitudinal direction of the fixed plate 110. 1 is in close contact with the fixed plate 110 as a whole.

  When the glass substrate 1 is vacuum-sucked on the fixed plate 110, the first to third imaging means 120, 130, and 140 try to inspect with the frame 151 that moves along the cut surface 1 a in the longitudinal direction of the main robot 150. Is placed at the initial position of the cut surface 1a.

  When the first to third imaging means 120, 130, 140 are located at the initial position of the cut surface 1a to be inspected, the first to third adjustment means 152, 153, 154, that is, the first to third imaging means. 120, 130, 140 are the first to third cameras 121, 131 by adjusting the first to third position adjusting stages 152a, 153a, 154a and adjusting the first to third focusing stages 152b, 153b, 154b. , 141 is adjusted and focused.

  When the position adjustment and focusing of the first to third cameras 121, 131, and 141 are completed, the photographing process is performed. At this time, as shown in FIG. 5, since the cut surface 1a of the glass substrate 1 is not a horizontal plane but a wave-like wavefront, the focal plane of the third camera 141 that photographs the cut surface 1a does not coincide with the cut surface 1a. Occurs.

  In order to prevent such a phenomenon, as shown in FIGS. 5 and 6, even if the cut surface 1 a of the glass substrate 1 is curved, it is obtained by the third camera 141 in i step when focused. The image is compared with the image obtained in the i + 1 step that cannot be focused, and in these images, the value of Δd, which is the positional difference between the cut planes 1a, is calculated.

  Since Δd is a distance change amount between the lens 143 of the third camera 141 that captures the cut surface 1a and the cut surface 1a, the third focusing stage 154b is made to approach the cut surface 1a in the vertical direction by Δd. Thus, focusing of the third camera 141 is performed. At the same time, the first and second cameras 121 and 131 are moved along the first and second position adjustment stages 152a and 153a, respectively, so that the calibrated images in FIG. 6 are acquired.

  That is, using the amount of change from the reference position, the third camera 141 performs focusing, and the first and second cameras 121 and 131 calibrate the positions.

  As shown in FIG. 3, the first to third illuminations 122, 132, 142 of the first to third imaging units 120, 130, 140 are, for example, first to third via reflection mirrors 124, 134, 144. By irradiating light in the same direction as the optical axes of the lenses 123, 133, and 143 of the cameras 121, 131, and 141, the first to third cameras 121, 131, and 141 perform the first to third illuminations during shooting. The cut surface 1a of the glass substrate 1 can be accurately photographed without causing interference by the light irradiated from 122, 132, 142.

  On the other hand, as shown in FIG. 4, when the glass substrate 1 is placed on the fixed plate 110, the fourth reflecting mirror 172 moves toward the third photographing unit 140 in order to avoid interference. Further, when the glass substrate 1 is placed and fixed on the fixing plate 110, it returns to the upper side of the glass substrate 1.

  The fourth reflection mirror 172 returned to the upper side of the glass substrate 1 reflects the light emitted from the fourth illumination 171 to the periphery of the cut surface 1a of the glass substrate 1, thereby the first to third photographing means 120, 130. , 140 so that the shape of the glass substrate 1 can be further distinguished from the background in the images captured and acquired by the first to third cameras 121, 131, and 141.

  That is, the background above the upper surface of the glass substrate 1 where the fourth reflection mirror 172 is located is brightened by the light reflected from the fourth reflection mirror 172, and the background below the lower surface of the glass substrate 1 is the third illumination 142. And the light irradiated from the 4th illumination 171 is reflected by the side surface of the fixed plate 110, and can obtain the effect like the 4th reflective mirror 172.

  The air nozzle 180 is supplied with air from an external air supply unit (not shown) and sprays around the cut surface 1a of the glass substrate 1 to remove foreign matter, thereby the first to third photographing means 120, It is possible to prevent foreign objects from being photographed in the images photographed by the first to third cameras 121, 131, and 141 of 130 and 140. Therefore, a clear image of the cut surface 1a itself of the glass substrate 1 can be obtained.

  While preferred embodiments of the invention have been described above, various modifications will occur to those skilled in the art without departing from the scope of the claims.

DESCRIPTION OF SYMBOLS 1 Glass substrate 1a Cutting surface 100 of glass substrate Cutting surface inspection apparatus 110 Fixing plate 120 1st imaging | photography means 121 1st camera 122 1st illumination 123 1st camera lens 130 2nd imaging means 131 2nd camera 132 2nd illumination 133 Second camera lens 140 Third imaging means 141 Third camera 142 Third illumination 143 Third camera lens 150 Main robot 151 Frame 152 First adjustment means 153 Second adjustment means 154 Third adjustment means 152a to 154a First to second Position adjusting stages 152b to 154b of the third adjusting means Focusing stage 160 of the first to third adjusting means 160 Guide 171 Fourth illumination 172 Fourth reflecting mirror 180 Air nozzle

Claims (9)

An apparatus for inspecting a cut surface of a glass substrate,
A fixing plate for fixing the glass substrate such that the cut surface of the glass substrate protrudes on one side;
A first photographing means having a first camera located above the upper surface of the glass substrate and capturing an image by photographing the glass substrate perpendicularly to the upper surface toward the upper side of the cut surface;
A third photographing means having a third camera located so as to face the cut surface of the glass substrate and obtaining an image by photographing the glass substrate perpendicular to the cut surface;
A frame installed adjacent to the cut surface of the glass substrate and to which the first and third imaging means are respectively coupled;
Frame moving means for moving the first and third photographing means mounted on the frame along the longitudinal direction of the cut surface and moving the frame so as to photograph the cut surface;
The frame is
Based on a position difference (Δd) value between the cutting planes, which is installed in a portion coupled with the third imaging unit and calculated from the video obtained from the first imaging unit, in the direction perpendicular to the cutting plane. An apparatus for inspecting a cut surface of a glass substrate, comprising: third adjusting means having a third focusing stage for moving the third imaging means. The third adjusting means is
The apparatus further comprises a third position adjusting stage that is installed at a portion coupled to the third imaging unit and moves the third imaging unit in a direction horizontal to the cut surface of the glass substrate. The cut | disconnection surface inspection apparatus of the glass substrate of 1.   And a second photographing unit having a second camera located below the lower surface of the glass substrate and capturing an image by photographing the glass substrate perpendicularly to the lower surface toward the lower side of the cut surface. 2. The apparatus for inspecting a cut surface of a glass substrate according to claim 1, wherein the two photographing means are coupled to the frame.   A guide for guiding and supporting the cut surface so that a distance between the cut surface and the third camera of the third photographing means is kept constant before the glass substrate is fixed to the fixing plate. The apparatus for inspecting a cut surface of a glass substrate according to claim 1, wherein the apparatus is installed on one side of the fixed plate. The frame is
A first position adjusting stage, which is installed at a portion coupled with the first imaging means and moves the first imaging means in a direction perpendicular to the cut surface of the glass substrate, and the first imaging means are fixed. First adjusting means having a first focusing stage for moving the first photographing means in a direction parallel to the cut surface with respect to the first position adjusting stage;
A second position adjusting stage, which is installed at a portion coupled with the second imaging means and moves the second imaging means in a direction perpendicular to the cut surface of the glass substrate, and the second imaging means are fixed. Second adjusting means having a second focusing stage for moving the second photographing means in a direction horizontal to the cut surface with respect to the second position adjusting stage;
The glass substrate cut surface inspection apparatus according to claim 3, further comprising: First illumination for irradiating light to the imaging region of the first camera;
A second illumination for irradiating light to the imaging region of the second camera;
A third illumination that irradiates light to the imaging region of the third camera;
The glass substrate cut surface inspection apparatus according to claim 3, further comprising:   7. The light according to claim 6, wherein at least one of the first illumination, the second illumination, and the third illumination is irradiated along the optical axis of the camera lens. Glass substrate cut surface inspection device.   The glass substrate further includes a fourth reflection mirror disposed above the upper surface of the glass substrate, and a fourth illumination for irradiating light, and the light irradiated from the fourth illumination is reflected by the glass by the fourth reflection mirror. The apparatus for inspecting a cut surface of a glass substrate according to claim 6, wherein the device is reflected around the cut surface of the substrate.   2. The cutting of a glass substrate according to claim 1, further comprising a foreign matter removing unit for ejecting air onto the cut surface of the glass substrate to remove foreign matter attached to the cut surface and the periphery thereof. Surface inspection device.

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