JP5198096B2 - 分析装置 - Google Patents

分析装置 Download PDF

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Publication number
JP5198096B2
JP5198096B2 JP2008058302A JP2008058302A JP5198096B2 JP 5198096 B2 JP5198096 B2 JP 5198096B2 JP 2008058302 A JP2008058302 A JP 2008058302A JP 2008058302 A JP2008058302 A JP 2008058302A JP 5198096 B2 JP5198096 B2 JP 5198096B2
Authority
JP
Japan
Prior art keywords
sample
unit
measurement
rack
sample container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008058302A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009216459A5 (enExample
JP2009216459A (ja
Inventor
孝明 長井
正治 芝田
雄一 濱田
大吾 福間
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2008058302A priority Critical patent/JP5198096B2/ja
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to EP09003330.9A priority patent/EP2098869B1/en
Priority to PCT/JP2009/054249 priority patent/WO2009110583A1/ja
Priority to EP09003331.7A priority patent/EP2098870B1/en
Priority to CN200980108092.2A priority patent/CN101965517B/zh
Priority to EP09003332.5A priority patent/EP2098872B1/en
Priority to EP19210298.6A priority patent/EP3650865B1/en
Priority to EP19208261.8A priority patent/EP3623817B1/en
Priority to CN200980108007.2A priority patent/CN101960312B/zh
Priority to PCT/JP2009/054247 priority patent/WO2009110581A1/ja
Priority to EP09717416.3A priority patent/EP2251697B1/en
Priority to EP09003329.1A priority patent/EP2098868B1/en
Priority to EP09717216.7A priority patent/EP2251696B1/en
Priority to EP09003328.3A priority patent/EP2098867B1/en
Publication of JP2009216459A publication Critical patent/JP2009216459A/ja
Priority to US12/875,913 priority patent/US8865072B2/en
Priority to US12/875,926 priority patent/US9417254B2/en
Publication of JP2009216459A5 publication Critical patent/JP2009216459A5/ja
Application granted granted Critical
Publication of JP5198096B2 publication Critical patent/JP5198096B2/ja
Priority to US14/489,141 priority patent/US9638709B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
JP2008058302A 2008-03-07 2008-03-07 分析装置 Expired - Fee Related JP5198096B2 (ja)

Priority Applications (17)

Application Number Priority Date Filing Date Title
JP2008058302A JP5198096B2 (ja) 2008-03-07 2008-03-07 分析装置
EP09003329.1A EP2098868B1 (en) 2008-03-07 2009-03-06 Analyzer and sample transportation method
EP09003331.7A EP2098870B1 (en) 2008-03-07 2009-03-06 Analyzer
CN200980108092.2A CN101965517B (zh) 2008-03-07 2009-03-06 分析装置及分析方法
EP09003332.5A EP2098872B1 (en) 2008-03-07 2009-03-06 Analyzer and method for aspirating specimen
EP19210298.6A EP3650865B1 (en) 2008-03-07 2009-03-06 Transportation device
EP19208261.8A EP3623817B1 (en) 2008-03-07 2009-03-06 Analyzer
CN200980108007.2A CN101960312B (zh) 2008-03-07 2009-03-06 分析装置及测定单元
PCT/JP2009/054247 WO2009110581A1 (ja) 2008-03-07 2009-03-06 分析装置および分析方法
EP09003328.3A EP2098867B1 (en) 2008-03-07 2009-03-06 Analyzer and transportation device
EP09003330.9A EP2098869B1 (en) 2008-03-07 2009-03-06 Analyzer and sample transportation method for analyzer
PCT/JP2009/054249 WO2009110583A1 (ja) 2008-03-07 2009-03-06 分析装置および測定ユニット
EP09717416.3A EP2251697B1 (en) 2008-03-07 2009-03-06 Analysis apparatus
EP09717216.7A EP2251696B1 (en) 2008-03-07 2009-03-06 Analysis apparatus and analysis method
US12/875,913 US8865072B2 (en) 2008-03-07 2010-09-03 Analysis apparatus and analysis method
US12/875,926 US9417254B2 (en) 2008-03-07 2010-09-03 Analysis apparatus and measurement unit
US14/489,141 US9638709B2 (en) 2008-03-07 2014-09-17 Analysis apparatus and analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008058302A JP5198096B2 (ja) 2008-03-07 2008-03-07 分析装置

Publications (3)

Publication Number Publication Date
JP2009216459A JP2009216459A (ja) 2009-09-24
JP2009216459A5 JP2009216459A5 (enExample) 2011-05-06
JP5198096B2 true JP5198096B2 (ja) 2013-05-15

Family

ID=41188480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008058302A Expired - Fee Related JP5198096B2 (ja) 2008-03-07 2008-03-07 分析装置

Country Status (1)

Country Link
JP (1) JP5198096B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2579044A4 (en) * 2010-05-31 2016-11-09 Arkray Inc ANALYSIS DEVICE, ANALYSIS SYSTEM AND ANALYSIS PROCEDURE
JP7053898B2 (ja) * 2019-01-25 2022-04-13 株式会社日立ハイテク 自動分析システムおよび検体の搬送方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3226233B2 (ja) * 1993-01-07 2001-11-05 株式会社東芝 自動分析装置
JP3056670B2 (ja) * 1995-06-16 2000-06-26 株式会社堀場製作所 検体の自動搬送装置
JP2939162B2 (ja) * 1995-08-16 1999-08-25 株式会社エイアンドティー 検体搬送システムにおける処理装置
JP3031237B2 (ja) * 1996-04-10 2000-04-10 株式会社日立製作所 検体ラックの搬送方法及び検体ラックを搬送する自動分析装置
JP3616744B2 (ja) * 2000-06-07 2005-02-02 シスメックス株式会社 検体搬送システム
JP4733315B2 (ja) * 2001-08-23 2011-07-27 シスメックス株式会社 検体検査システム及び搬送制御装置並びに方法
JP3604133B2 (ja) * 2002-03-29 2004-12-22 アロカ株式会社 ラック搬送装置
JP4071641B2 (ja) * 2003-01-17 2008-04-02 シスメックス株式会社 試料検査システム
JP4768410B2 (ja) * 2005-11-15 2011-09-07 シスメックス株式会社 撹拌装置及び試料分析装置

Also Published As

Publication number Publication date
JP2009216459A (ja) 2009-09-24

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