JP5170939B2 - 試験装置、及び試験方法 - Google Patents

試験装置、及び試験方法 Download PDF

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Publication number
JP5170939B2
JP5170939B2 JP2004364984A JP2004364984A JP5170939B2 JP 5170939 B2 JP5170939 B2 JP 5170939B2 JP 2004364984 A JP2004364984 A JP 2004364984A JP 2004364984 A JP2004364984 A JP 2004364984A JP 5170939 B2 JP5170939 B2 JP 5170939B2
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JP
Japan
Prior art keywords
jitter
input signal
electronic device
deterministic
sine wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004364984A
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English (en)
Japanese (ja)
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JP2005181325A5 (enExample
JP2005181325A (ja
Inventor
雅裕 石田
隆弘 山口
ソーマ マニ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
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Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/737,716 external-priority patent/US7136773B2/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of JP2005181325A publication Critical patent/JP2005181325A/ja
Publication of JP2005181325A5 publication Critical patent/JP2005181325A5/ja
Application granted granted Critical
Publication of JP5170939B2 publication Critical patent/JP5170939B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • H04B3/462—Testing group delay or phase shift, e.g. timing jitter
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP2004364984A 2003-12-16 2004-12-16 試験装置、及び試験方法 Expired - Fee Related JP5170939B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US10/737,716 US7136773B2 (en) 2003-12-16 2003-12-16 Testing apparatus and testing method
US10/737,716 2003-12-16
US10/824,763 US7397847B2 (en) 2003-12-16 2004-04-14 Testing device for testing electronic device and testing method thereof
US10/824,763 2004-04-14

Publications (3)

Publication Number Publication Date
JP2005181325A JP2005181325A (ja) 2005-07-07
JP2005181325A5 JP2005181325A5 (enExample) 2011-02-03
JP5170939B2 true JP5170939B2 (ja) 2013-03-27

Family

ID=34798985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004364984A Expired - Fee Related JP5170939B2 (ja) 2003-12-16 2004-12-16 試験装置、及び試験方法

Country Status (2)

Country Link
JP (1) JP5170939B2 (enExample)
DE (1) DE102004061510A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7313496B2 (en) * 2005-02-11 2007-12-25 Advantest Corporation Test apparatus and test method for testing a device under test
JP4895551B2 (ja) * 2005-08-10 2012-03-14 株式会社アドバンテスト 試験装置および試験方法
US7596173B2 (en) * 2005-10-28 2009-09-29 Advantest Corporation Test apparatus, clock generator and electronic device
US8744798B2 (en) * 2007-06-12 2014-06-03 Tektronix International Sales Gmbh Signal generator and user interface for adding amplitude noise to selected portions of a test signal
US8090009B2 (en) * 2007-08-07 2012-01-03 Advantest Corporation Test apparatus
US7808252B2 (en) * 2007-12-13 2010-10-05 Advantest Corporation Measurement apparatus and measurement method
JP2010169504A (ja) 2009-01-22 2010-08-05 Anritsu Corp ジッタ伝達特性測定装置
JP7481881B2 (ja) 2020-03-31 2024-05-13 日本放送協会 ジッタ発生装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0850156A (ja) * 1994-08-05 1996-02-20 Anritsu Corp ジッタ耐力測定装置
US5793822A (en) * 1995-10-16 1998-08-11 Symbios, Inc. Bist jitter tolerance measurement technique
JP3857011B2 (ja) * 2000-02-29 2006-12-13 アンリツ株式会社 ディジタルハイパスフィルタおよびディジタルハイパスフィルタを用いたジッタ測定器
US7245657B2 (en) * 2001-07-13 2007-07-17 Anritsu Coporation Jitter resistance measuring instrument and method for enabling efficient measurement of jitter resistance characteristic and adequate evaluation
WO2003067273A1 (en) * 2002-02-06 2003-08-14 Fujitsu Limited Jitter tolerance diagnosing method, and jitter tolerance diagnosing device
JP4216198B2 (ja) * 2002-02-26 2009-01-28 株式会社アドバンテスト 測定装置、及び測定方法
US7054358B2 (en) * 2002-04-29 2006-05-30 Advantest Corporation Measuring apparatus and measuring method

Also Published As

Publication number Publication date
DE102004061510A1 (de) 2005-10-06
JP2005181325A (ja) 2005-07-07

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