JP5100266B2 - エンコーダ - Google Patents

エンコーダ Download PDF

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Publication number
JP5100266B2
JP5100266B2 JP2007233660A JP2007233660A JP5100266B2 JP 5100266 B2 JP5100266 B2 JP 5100266B2 JP 2007233660 A JP2007233660 A JP 2007233660A JP 2007233660 A JP2007233660 A JP 2007233660A JP 5100266 B2 JP5100266 B2 JP 5100266B2
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JP
Japan
Prior art keywords
scanning
grating
scanning unit
scale body
light beams
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JP2007233660A
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English (en)
Japanese (ja)
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JP2008070363A (ja
JP2008070363A5 (https=
Inventor
カルステン・センディッヒ
ヴォルフガング・ホルツアプフェル
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Dr Johannes Heidenhain GmbH
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Dr Johannes Heidenhain GmbH
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Publication of JP2008070363A5 publication Critical patent/JP2008070363A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36—Forming the light into pulses
    • G01D5/38—Forming the light into pulses by diffraction gratings

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Body Structure For Vehicles (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Vehicle Body Suspensions (AREA)
JP2007233660A 2006-09-12 2007-09-10 エンコーダ Active JP5100266B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006042743.2 2006-09-12
DE102006042743A DE102006042743A1 (de) 2006-09-12 2006-09-12 Positionsmesseinrichtung

Publications (3)

Publication Number Publication Date
JP2008070363A JP2008070363A (ja) 2008-03-27
JP2008070363A5 JP2008070363A5 (https=) 2010-09-30
JP5100266B2 true JP5100266B2 (ja) 2012-12-19

Family

ID=38828495

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007233660A Active JP5100266B2 (ja) 2006-09-12 2007-09-10 エンコーダ

Country Status (6)

Country Link
US (1) US7710578B2 (https=)
EP (1) EP1901041B1 (https=)
JP (1) JP5100266B2 (https=)
CN (1) CN101144730B (https=)
AT (1) ATE496283T1 (https=)
DE (2) DE102006042743A1 (https=)

Families Citing this family (52)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006021484A1 (de) * 2006-05-09 2007-11-15 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
US7858922B2 (en) 2006-11-20 2010-12-28 Dr. Johannes Heidenhain Gmbh Position-measuring device
DE102007023300A1 (de) 2007-05-16 2008-11-20 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Anordnung derselben
DE102008007319A1 (de) * 2008-02-02 2009-08-06 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102008025870A1 (de) * 2008-05-31 2009-12-03 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102009029673A1 (de) 2009-09-22 2010-11-25 Carl Zeiss Smt Ag Manipulator zur Positionierung eines optischen Elementes in mehreren räumlichen Freiheitsgraden
DE102010029211A1 (de) * 2010-05-21 2011-11-24 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
NL2006743A (en) * 2010-06-09 2011-12-12 Asml Netherlands Bv Position sensor and lithographic apparatus.
DE102010041556A1 (de) 2010-09-28 2012-03-29 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage für die Mikrolithographie und Verfahren zur mikrolithographischen Abbildung
CN101979959A (zh) * 2010-11-02 2011-02-23 中国科学院长春光学精密机械与物理研究所 光电式微位移测量装置
DE102010063253A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011082156A1 (de) * 2010-12-16 2012-06-21 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102011076178B4 (de) 2011-05-20 2022-03-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US8604413B2 (en) * 2011-06-13 2013-12-10 Mitutoyo Corporation Optical encoder including displacement sensing normal to the encoder scale grating surface
DE102011082570A1 (de) * 2011-09-13 2013-03-14 Dr. Johannes Heidenhain Gmbh Rotatorische Positionsmesseinrichtung
TWI516746B (zh) * 2012-04-20 2016-01-11 賽格股份有限公司 在干涉編碼系統中執行非諧循環錯誤補償的方法、裝置及計算機程式產品，以及微影系統
US9983028B2 (en) 2012-04-26 2018-05-29 Nikon Corporation Measurement method and encoder device, and exposure method and device
DE102012212759B4 (de) 2012-07-20 2022-04-28 Dr. Johannes Heidenhain Gmbh Vorrichtung zur Messung der linearen Abmessung einer Probe
WO2014062972A1 (en) 2012-10-18 2014-04-24 Kla-Tencor Corporation Symmetric target design in scatterometry overlay metrology
DE102013224381A1 (de) * 2012-12-20 2014-06-26 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102013210999A1 (de) * 2013-06-13 2014-12-18 Dr. Johannes Heidenhain Gmbh Messeinrichtung
DE102013211758A1 (de) * 2013-06-21 2014-12-24 Dr. Johannes Heidenhain Gmbh Interferometer
DE102014208988A1 (de) 2013-09-11 2015-03-12 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
TWI627379B (zh) * 2013-10-07 2018-06-21 德商強那斯海登翰博士有限公司 光學位置測量裝置
DE102013220214A1 (de) * 2013-10-07 2015-04-09 Dr. Johannes Heidenhain Gmbh Anordnung zur Positionierung eines Werkzeugs relativ zu einem Werkstück
NO348955B1 (no) * 2014-02-28 2025-07-28 Pgs Geophysical As Optisk bevegelsessensor
DE102014211004A1 (de) 2014-06-10 2015-12-17 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
JP6341883B2 (ja) * 2014-06-27 2018-06-13 キヤノン株式会社 位置検出装置、位置検出方法、インプリント装置及び物品の製造方法
EP3207339B1 (en) * 2014-10-13 2019-07-24 Zygo Corporation Interferometric encoder systems
ES2618855T3 (es) * 2014-10-14 2017-06-22 Dr. Johannes Heidenhain Gmbh Dispositivo de medición de posición con dispositivo para la compensación de errores por dilatación térmica de una regla graduada
JP6386337B2 (ja) * 2014-10-23 2018-09-05 株式会社ミツトヨ 光学式エンコーダ
NL2015639A (en) 2014-11-28 2016-09-20 Asml Netherlands Bv Encoder, position measurement system and lithographic apparatus.
DE102015200293A1 (de) * 2015-01-13 2016-07-14 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
CN104614955B (zh) * 2015-03-06 2017-01-11 中国科学院光电技术研究所 一种复合光栅纳米光刻自动对准系统
JP2016205854A (ja) * 2015-04-16 2016-12-08 株式会社小野測器 リニアゲージセンサ
JP6702666B2 (ja) 2015-07-28 2020-06-03 株式会社ミツトヨ 変位検出装置
CN106813578B (zh) * 2015-11-30 2019-02-22 上海微电子装备（集团）股份有限公司 一种二维光栅测量系统
DE102016200847A1 (de) * 2016-01-21 2017-07-27 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Optische Positionsmesseinrichtung
JP6400036B2 (ja) * 2016-03-14 2018-10-03 キヤノン株式会社 位置検出装置、工作装置、および、露光装置
US10077991B2 (en) * 2016-09-27 2018-09-18 Mitutoyo Corporation Optical encoder configured to mitigate undesired interfering light components
US10274344B2 (en) * 2016-12-27 2019-04-30 Mitutoyo Corporation Displacement encoder
DE102017201257A1 (de) * 2017-01-26 2018-07-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
US10648838B2 (en) 2017-06-29 2020-05-12 Mitutoyo Corporation Contamination and defect resistant rotary optical encoder configuration including a rotary scale with yawed scale grating bars and structured illumination generating arrangement with a beam deflector configuration
DE102017219125A1 (de) * 2017-10-25 2019-04-25 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102018212719A1 (de) * 2018-07-31 2020-02-20 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Optische Positionsmesseinrichtung
CN111457843B (zh) * 2019-04-26 2021-07-30 上海微电子装备（集团）股份有限公司 位移测量装置、位移测量方法及光刻设备
CN112577431B (zh) * 2019-09-29 2022-02-08 上海微电子装备（集团）股份有限公司 光栅尺测量装置及测量方法
CN111610006B (zh) * 2020-06-11 2025-02-07 腾景科技股份有限公司 一种衍射光栅在线检测装置
DE102020209276A1 (de) 2020-07-23 2022-01-27 Dr. Johannes Heidenhain Gesellschaft Mit Beschränkter Haftung Optische Positionsmesseinrichtung
CN112504122B (zh) * 2020-12-03 2021-10-15 中国科学院西安光学精密机械研究所 星载双光栅准直器的指向光轴和光栅位姿标定系统及方法
CN114994938B (zh) * 2022-07-19 2022-10-25 中国科学院长春光学精密机械与物理研究所 色散增强光学元件及光谱合束、锁定、测量结构
CN120847763A (zh) * 2024-04-12 2025-10-28 阜时科技有限公司 一种光扫描方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8413955D0 (en) 1984-05-31 1984-07-04 Pa Consulting Services Displacement measuring apparatus
DE3905730C2 (de) 1989-02-24 1995-06-14 Heidenhain Gmbh Dr Johannes Positionsmeßeinrichtung
US5079418A (en) 1990-02-20 1992-01-07 Dr. Johannes Heidenhain Gmbh Position measuring apparatus with reflection
DE9007559U1 (https=) 1990-03-13 1992-09-24 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut
US5104225A (en) 1991-01-25 1992-04-14 Mitutoyo Corporation Position detector and method of measuring position
JP3082516B2 (ja) * 1993-05-31 2000-08-28 キヤノン株式会社 光学式変位センサおよび該光学式変位センサを用いた駆動システム
US5497226A (en) 1994-08-22 1996-03-05 Polaroid Corporation Quadrature diffractive encoder
JPH08178702A (ja) * 1994-12-27 1996-07-12 Canon Inc 光学式センサ
DE10022619A1 (de) 2000-04-28 2001-12-06 Heidenhain Gmbh Dr Johannes Abtasteinheit für eine optische Positionsmesseinrichtung
EP1319170B1 (de) * 2000-09-14 2005-03-09 Dr. Johannes Heidenhain GmbH Positionsmesseinrichtung
US7126696B2 (en) * 2003-09-30 2006-10-24 Mitutoyo Corporation Interferometric miniature grating encoder readhead using fiber optic receiver channels
JP4722474B2 (ja) * 2004-12-24 2011-07-13 株式会社ミツトヨ 変位検出装置
DE102005029917A1 (de) 2005-06-28 2007-01-04 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung

Also Published As

Publication number Publication date
DE502007006292D1 (de) 2011-03-03
ATE496283T1 (de) 2011-02-15
DE102006042743A1 (de) 2008-03-27
EP1901041A3 (de) 2008-06-25
US7710578B2 (en) 2010-05-04
JP2008070363A (ja) 2008-03-27
EP1901041A2 (de) 2008-03-19
US20080062432A1 (en) 2008-03-13
CN101144730B (zh) 2012-07-18
EP1901041B1 (de) 2011-01-19
CN101144730A (zh) 2008-03-19

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