JP5032451B2 - 波長可変レーザの試験方法、波長可変レーザの制御方法およびレーザ装置 - Google Patents

波長可変レーザの試験方法、波長可変レーザの制御方法およびレーザ装置 Download PDF

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JP5032451B2
JP5032451B2 JP2008308984A JP2008308984A JP5032451B2 JP 5032451 B2 JP5032451 B2 JP 5032451B2 JP 2008308984 A JP2008308984 A JP 2008308984A JP 2008308984 A JP2008308984 A JP 2008308984A JP 5032451 B2 JP5032451 B2 JP 5032451B2
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wavelength
value
tunable laser
controller
point
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JP2009177140A (ja
JP2009177140A5 (enExample
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務 石川
豊稔 町田
宏和 田中
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Sumitomo Electric Device Innovations Inc
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Sumitomo Electric Device Innovations Inc
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Priority to JP2008308984A priority Critical patent/JP5032451B2/ja
Priority to US12/342,869 priority patent/US7929581B2/en
Priority to CN2008101850436A priority patent/CN101471531B/zh
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Publication of JP2009177140A5 publication Critical patent/JP2009177140A5/ja
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JP2008308984A 2007-12-28 2008-12-03 波長可変レーザの試験方法、波長可変レーザの制御方法およびレーザ装置 Active JP5032451B2 (ja)

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Application Number Priority Date Filing Date Title
JP2008308984A JP5032451B2 (ja) 2007-12-28 2008-12-03 波長可変レーザの試験方法、波長可変レーザの制御方法およびレーザ装置
US12/342,869 US7929581B2 (en) 2007-12-28 2008-12-23 Testing method of wavelength-tunable laser, controlling method of wavelength-tunable laser and laser device
CN2008101850436A CN101471531B (zh) 2007-12-28 2008-12-26 波长可调激光器测量方法和控制方法以及激光装置

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JP2007339196 2007-12-28
JP2007339196 2007-12-28
JP2008308984A JP5032451B2 (ja) 2007-12-28 2008-12-03 波長可変レーザの試験方法、波長可変レーザの制御方法およびレーザ装置

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JP2009177140A JP2009177140A (ja) 2009-08-06
JP2009177140A5 JP2009177140A5 (enExample) 2010-08-26
JP5032451B2 true JP5032451B2 (ja) 2012-09-26

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Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5505011B2 (ja) * 2010-03-23 2014-05-28 住友電気工業株式会社 波長可変レーザ駆動回路
JP2011209371A (ja) * 2010-03-29 2011-10-20 Mitsubishi Electric Corp 光変調器
US9595804B2 (en) * 2011-07-22 2017-03-14 Insight Photonic Solutions, Inc. System and method of dynamic and adaptive creation of a wavelength continuous and prescribed wavelength versus time sweep from a laser
JP2014013823A (ja) * 2012-07-04 2014-01-23 Sumitomo Electric Ind Ltd 波長可変半導体レーザの制御方法
US9184561B2 (en) * 2013-09-30 2015-11-10 Sumitomo Electric Industries, Ltd. Method to determine operating conditions of wavelength tunable laser diode and to control optical transmitter providing wavelength tunable laser diode
JP6581024B2 (ja) * 2016-03-15 2019-09-25 株式会社東芝 分布帰還型半導体レーザ
CN105826811B (zh) * 2016-05-06 2020-10-23 华中科技大学 一种可调谐激光器的表征方法及装置
JP6815885B2 (ja) * 2017-02-14 2021-01-20 古河電気工業株式会社 波長可変光源の制御装置および制御方法
CN109412010B (zh) * 2018-12-14 2020-09-01 陕西聚力思创通信科技有限公司 一种延长激光稳频系统平均无故障工作时间的方法
CN111103055A (zh) * 2019-11-27 2020-05-05 上海传输线研究所（中国电子科技集团公司第二十三研究所） 一种光功率自动校准系统及方法
JP7488053B2 (ja) * 2020-02-06 2024-05-21 古河電気工業株式会社 レーザ装置およびその制御方法
JP7575290B2 (ja) * 2021-02-12 2024-10-29 古河電気工業株式会社 レーザ装置
JP7575289B2 (ja) * 2021-02-12 2024-10-29 古河電気工業株式会社 波長可変レーザ素子の制御方法、波長可変レーザ素子、およびレーザ装置
CN117433645B (zh) * 2023-10-30 2024-06-18 重庆航伟光电科技有限公司 一种半导体激光器波长测量方法、装置、芯片及终端
CN119803339B (zh) * 2024-12-26 2025-10-17 南京航空航天大学 一种半导体高深宽比微尺寸结构深度测量方法及系统
CN119651338B (zh) * 2025-02-19 2025-05-02 成都光创联科技有限公司 可调激光器波长锁定方法、装置、设备及存储介质

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6116589A (ja) * 1984-07-02 1986-01-24 Omron Tateisi Electronics Co 半導体レ−ザの動作温度設定装置
JPS6123378A (ja) * 1984-07-11 1986-01-31 Omron Tateisi Electronics Co 半導体レ−ザのモ−ドホツプ検出回路
SE519081C3 (sv) * 1998-01-21 2003-02-19 Altitun Ab Förfarande och anordning för optimering av lasrars operationspunkt, jämte anordning
JP2001156387A (ja) * 1999-11-24 2001-06-08 Yokogawa Electric Corp 周波数安定化レーザ光源
JP2001244554A (ja) * 2000-02-25 2001-09-07 Fuji Photo Film Co Ltd 半導体レーザ駆動装置、半導体レーザ駆動方法及び画像形成装置
US6868100B2 (en) * 2001-12-04 2005-03-15 Agility Communications, Inc. Methods for robust channel switching of widely-tunable sampled-grating distributed bragg reflector lasers
JP4141715B2 (ja) * 2002-03-25 2008-08-27 三菱電機株式会社 波長可変半導体レーザの波長制御装置、波長制御方法および波長可変半導体レーザ装置
DE60229560D1 (de) * 2002-04-30 2008-12-04 Agilent Technologies Inc Wellenlängenabstimmbarer laser mit parameter korrektur
JP4104925B2 (ja) * 2002-07-10 2008-06-18 三菱電機株式会社 波長可変半導体レーザの波長制御装置
JP2004241659A (ja) * 2003-02-06 2004-08-26 Japan Science & Technology Agency ２波長型半導体レーザ装置、２波長型干渉計測装置、２波長型半導体レーザ発振方法及び２波長型干渉計測方法

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CN101471531A (zh) 2009-07-01
JP2009177140A (ja) 2009-08-06
CN101471531B (zh) 2012-11-21

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