JP5028249B2 - 顕微鏡 - Google Patents

顕微鏡 Download PDF

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Publication number
JP5028249B2
JP5028249B2 JP2007332935A JP2007332935A JP5028249B2 JP 5028249 B2 JP5028249 B2 JP 5028249B2 JP 2007332935 A JP2007332935 A JP 2007332935A JP 2007332935 A JP2007332935 A JP 2007332935A JP 5028249 B2 JP5028249 B2 JP 5028249B2
Authority
JP
Japan
Prior art keywords
pupil
imaging
modulation element
illumination
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007332935A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009156977A (ja
JP2009156977A5 (https=
Inventor
一博 林
実 祐川
高之 河野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2007332935A priority Critical patent/JP5028249B2/ja
Priority to US12/343,208 priority patent/US7944608B2/en
Publication of JP2009156977A publication Critical patent/JP2009156977A/ja
Publication of JP2009156977A5 publication Critical patent/JP2009156977A5/ja
Application granted granted Critical
Publication of JP5028249B2 publication Critical patent/JP5028249B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0414—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0444—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using means for replacing an element by another, e.g. for replacing a filter or grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0462—Slit arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/007—Optical devices or arrangements for the control of light using movable or deformable optical elements the movable or deformable optical element controlling the colour, i.e. a spectral characteristic, of the light

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Astronomy & Astrophysics (AREA)
  • Microscoopes, Condenser (AREA)
JP2007332935A 2007-12-25 2007-12-25 顕微鏡 Expired - Fee Related JP5028249B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007332935A JP5028249B2 (ja) 2007-12-25 2007-12-25 顕微鏡
US12/343,208 US7944608B2 (en) 2007-12-25 2008-12-23 Microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007332935A JP5028249B2 (ja) 2007-12-25 2007-12-25 顕微鏡

Publications (3)

Publication Number Publication Date
JP2009156977A JP2009156977A (ja) 2009-07-16
JP2009156977A5 JP2009156977A5 (https=) 2011-01-06
JP5028249B2 true JP5028249B2 (ja) 2012-09-19

Family

ID=40788285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007332935A Expired - Fee Related JP5028249B2 (ja) 2007-12-25 2007-12-25 顕微鏡

Country Status (2)

Country Link
US (1) US7944608B2 (https=)
JP (1) JP5028249B2 (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5065059B2 (ja) * 2008-01-08 2012-10-31 オリンパス株式会社 顕微鏡
WO2010103389A1 (de) 2009-03-11 2010-09-16 Sensovation Ag Autofokusverfahren und autofokuseinrichtung
US10139613B2 (en) 2010-08-20 2018-11-27 Sakura Finetek U.S.A., Inc. Digital microscope and method of sensing an image of a tissue sample
JP5900515B2 (ja) * 2012-01-18 2016-04-06 株式会社ニコン 構造化照明装置、構造化照明顕微鏡装置、構造化照明方法
DE102013002640A1 (de) * 2013-02-15 2014-08-21 Carl Zeiss Microscopy Gmbh Verfahren zum betreiben eines lichtmikroskops und optikanordnung
DE102013103971A1 (de) 2013-04-19 2014-11-06 Sensovation Ag Verfahren zum Erzeugen eines aus mehreren Teilbildern zusammengesetzten Gesamtbilds eines Objekts
US10007102B2 (en) 2013-12-23 2018-06-26 Sakura Finetek U.S.A., Inc. Microscope with slide clamping assembly
JP6131204B2 (ja) * 2014-02-28 2017-05-17 富士フイルム株式会社 観察装置
DE202015002992U1 (de) * 2015-04-22 2016-07-25 MÖLLER-WEDEL OPTICAL GmbH System zum Ausrichten einer Blende relativ zu einer optischen Achse
US11280803B2 (en) 2016-11-22 2022-03-22 Sakura Finetek U.S.A., Inc. Slide management system
JP6527273B2 (ja) 2017-09-28 2019-06-05 株式会社片岡製作所 位相差観察装置および細胞処理装置
JP7641528B2 (ja) * 2021-05-21 2025-03-07 パナソニックＩｐマネジメント株式会社 位相差顕微鏡

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4407569A (en) * 1981-07-07 1983-10-04 Carl Zeiss-Stiftung Device for selectively available phase-contrast and relief observation in microscopes
JPH06148573A (ja) * 1992-11-09 1994-05-27 Olympus Optical Co Ltd 瞳変調光学系
JP3647062B2 (ja) 1993-05-17 2005-05-11 オリンパス株式会社 正立型顕微鏡
US6384967B1 (en) * 1998-09-11 2002-05-07 Olympus Optical Co., Ltd. Illumination apparatus for a microscope
JP4020714B2 (ja) * 2001-08-09 2007-12-12 オリンパス株式会社 顕微鏡

Also Published As

Publication number Publication date
US20090161209A1 (en) 2009-06-25
JP2009156977A (ja) 2009-07-16
US7944608B2 (en) 2011-05-17

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