JP5028077B2 - 撮像装置、及びその欠陥画素の判別方法、並びにプログラム - Google Patents

撮像装置、及びその欠陥画素の判別方法、並びにプログラム Download PDF

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JP5028077B2
JP5028077B2 JP2006334741A JP2006334741A JP5028077B2 JP 5028077 B2 JP5028077 B2 JP 5028077B2 JP 2006334741 A JP2006334741 A JP 2006334741A JP 2006334741 A JP2006334741 A JP 2006334741A JP 5028077 B2 JP5028077 B2 JP 5028077B2
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JP2008148129A5 (enrdf_load_stackoverflow
JP2008148129A (ja
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俊樹 石田
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Canon Inc
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Canon Inc
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JP2006334741A 2006-12-12 2006-12-12 撮像装置、及びその欠陥画素の判別方法、並びにプログラム Expired - Fee Related JP5028077B2 (ja)

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JP2008148129A JP2008148129A (ja) 2008-06-26
JP2008148129A5 JP2008148129A5 (enrdf_load_stackoverflow) 2010-02-04
JP5028077B2 true JP5028077B2 (ja) 2012-09-19

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6848421B2 (ja) * 2016-12-21 2021-03-24 株式会社リコー 光電変換装置、光電変換方法及び画像形成装置
JP6992521B2 (ja) * 2017-01-25 2022-01-13 株式会社リコー 光電変換装置、欠陥画素の判定方法及び画像形成装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09289614A (ja) * 1996-04-24 1997-11-04 Matsushita Electric Ind Co Ltd 固体撮像装置
JP3601908B2 (ja) * 1996-07-30 2004-12-15 東芝医用システムエンジニアリング株式会社 撮像素子の欠陥画素補正処理装置、ｘ線診断装置
JP3876400B2 (ja) * 1999-06-23 2007-01-31 富士通株式会社 赤外線撮像装置及び素子欠陥補償方法
JP2002354340A (ja) * 2001-05-24 2002-12-06 Olympus Optical Co Ltd 撮像装置
JP2004327722A (ja) * 2003-04-24 2004-11-18 Matsushita Electric Ind Co Ltd 固体撮像装置の検査方法

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