JP5026006B2 - 超伝導放射線分析装置 - Google Patents

超伝導放射線分析装置 Download PDF

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Publication number
JP5026006B2
JP5026006B2 JP2006185850A JP2006185850A JP5026006B2 JP 5026006 B2 JP5026006 B2 JP 5026006B2 JP 2006185850 A JP2006185850 A JP 2006185850A JP 2006185850 A JP2006185850 A JP 2006185850A JP 5026006 B2 JP5026006 B2 JP 5026006B2
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microcalorimeter
energy
heat
peak value
magnetic field
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JP2006185850A
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Japanese (ja)
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JP2008014775A5 (enExample
JP2008014775A (ja
Inventor
啓一 田中
成計 小田原
哲 中山
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Hitachi High Tech Science Corp
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SII NanoTechnology Inc
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Priority to JP2006185850A priority Critical patent/JP5026006B2/ja
Priority to DE102007025361A priority patent/DE102007025361A1/de
Priority to US11/810,767 priority patent/US7789557B2/en
Publication of JP2008014775A publication Critical patent/JP2008014775A/ja
Publication of JP2008014775A5 publication Critical patent/JP2008014775A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/26—Measuring radiation intensity with resistance detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/1606—Measuring radiation intensity with other specified detectors not provided for in the other sub-groups of G01T1/16

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
JP2006185850A 2006-07-05 2006-07-05 超伝導放射線分析装置 Active JP5026006B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006185850A JP5026006B2 (ja) 2006-07-05 2006-07-05 超伝導放射線分析装置
DE102007025361A DE102007025361A1 (de) 2006-07-05 2007-05-31 Supraleitende Radiometrievorrichtung
US11/810,767 US7789557B2 (en) 2006-07-05 2007-06-07 Superconducting radiometry apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006185850A JP5026006B2 (ja) 2006-07-05 2006-07-05 超伝導放射線分析装置

Publications (3)

Publication Number Publication Date
JP2008014775A JP2008014775A (ja) 2008-01-24
JP2008014775A5 JP2008014775A5 (enExample) 2009-08-06
JP5026006B2 true JP5026006B2 (ja) 2012-09-12

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ID=38825424

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JP2006185850A Active JP5026006B2 (ja) 2006-07-05 2006-07-05 超伝導放射線分析装置

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US (1) US7789557B2 (enExample)
JP (1) JP5026006B2 (enExample)
DE (1) DE102007025361A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5146745B2 (ja) * 2008-05-09 2013-02-20 エスアイアイ・ナノテクノロジー株式会社 Ｘ線分析装置
JP5146746B2 (ja) * 2008-05-14 2013-02-20 エスアイアイ・ナノテクノロジー株式会社 Ｘ線分析装置
WO2011079045A2 (en) 2009-12-23 2011-06-30 Energy Recovery, Inc. Rotary energy recovery device
JP5317126B2 (ja) * 2010-03-05 2013-10-16 独立行政法人産業技術総合研究所 イオン価数弁別高速粒子検出器
JP6058945B2 (ja) * 2012-08-20 2017-01-11 株式会社日立ハイテクサイエンス 放射線分析装置及び方法
US9523777B2 (en) * 2014-04-10 2016-12-20 Uchicago Argonne, Llc Thermal kinetic inductance detector

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04143644A (ja) * 1990-10-05 1992-05-18 Canon Inc 電子素子用温度制御装置
US5880468A (en) * 1996-08-26 1999-03-09 The United States Of America As Represented By The Secretary Of Commerce Superconducting transition-edge sensor
US6211519B1 (en) * 1998-09-14 2001-04-03 The Board Of Trustees Of The Leland Stanford Junior University Transition-edge sensor with enhanced electrothermal feedback for cryogenic particle detection
JP4080778B2 (ja) * 2002-04-18 2008-04-23 エスアイアイ・ナノテクノロジー株式会社 カロリーメータ
JP4184701B2 (ja) * 2002-04-19 2008-11-19 エスアイアイ・ナノテクノロジー株式会社 放射線検出器
JP4314921B2 (ja) * 2003-03-18 2009-08-19 株式会社島津製作所 放射線検出器
JP2004361275A (ja) * 2003-06-05 2004-12-24 Sii Nanotechnology Inc 放射線計測装置およびそれを用いた分析装置
JP2005003411A (ja) * 2003-06-10 2005-01-06 Sii Nanotechnology Inc 超伝導放射線検出器
JP2005214792A (ja) * 2004-01-29 2005-08-11 Sii Nanotechnology Inc 超伝導ｘ線検出装置及びそれを用いた超伝導ｘ線分析装置
US7274019B2 (en) * 2004-07-30 2007-09-25 Uchicago Argonne, Llc Method for detection and imaging over a broad spectral range
JP2006058046A (ja) * 2004-08-18 2006-03-02 Sii Nanotechnology Inc 超伝導ｘ線分析装置及びｘ線分析方法
JP2006118917A (ja) * 2004-10-20 2006-05-11 Sii Nanotechnology Inc 超伝導ｘ線検出装置及びそれを用いた超伝導ｘ線分析装置
GB2437208B (en) * 2005-01-24 2009-12-02 Sii Nanotechnology Inc Superconducting x-ray detector and x-ray analysis apparatus using the same
US7767976B2 (en) * 2008-05-07 2010-08-03 Lockheed-Martin Corporation Sensor systems and methods using entangled quantum particles

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Publication number Publication date
JP2008014775A (ja) 2008-01-24
US7789557B2 (en) 2010-09-07
DE102007025361A1 (de) 2008-01-17
US20100019152A1 (en) 2010-01-28

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