JP5026006B2 - 超伝導放射線分析装置 - Google Patents
超伝導放射線分析装置 Download PDFInfo
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- JP5026006B2 JP5026006B2 JP2006185850A JP2006185850A JP5026006B2 JP 5026006 B2 JP5026006 B2 JP 5026006B2 JP 2006185850 A JP2006185850 A JP 2006185850A JP 2006185850 A JP2006185850 A JP 2006185850A JP 5026006 B2 JP5026006 B2 JP 5026006B2
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- 230000005855 radiation Effects 0.000 title claims description 45
- 238000001514 detection method Methods 0.000 claims description 12
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- 230000001360 synchronised effect Effects 0.000 claims 2
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
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- 230000007613 environmental effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
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- 229910052734 helium Inorganic materials 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/26—Measuring radiation intensity with resistance detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/1606—Measuring radiation intensity with other specified detectors not provided for in the other sub-groups of G01T1/16
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Description
サンプルから射出されたX線などの放射線が吸収体に入射すると、その放射線により温度計で発生するジュール熱と、メンブレンを伝わり熱浴へ逃げる熱が発生する。これらの熱のバランスを調整することにより、液体窒素温度(絶対温度77K)以下で超伝導体となる材料とからなる温度計を、超伝導状態と常伝導状態の遷移状態である超伝導転移端と呼ばれる領域内に動作点を保持するようにする。これにより、温度計では微小な温度変化に対して大きな抵抗変化を生じ、これを利用することでマイクロカロリーメータは放射線を検出し分析するものである。
K. D. Irwin, "An application of electrothermal feedback for high resolution cryogenic particle detection", Applied physics Letters, 第66巻, 1998-2000 (1995)
熱付加装置からの熱量付加に同期して、信号検出機構からの出力信号のうち付加した熱量にあたる波高値を測定する波高値モニターと、
波高値モニターからの出力に基づいて熱付加装置から熱量に対応する波高値になるように補正するエネルギー補正装置とからなる構成にしたものである。
2 シャント抵抗
3 入力コイル
4 SQUIDアンプ
5 バイアス電源
6 室温アンプ
7 波高分析器
8 熱付加装置
9 波高値モニター
10 エネルギー補正装置
Claims (4)
- 放射線のエネルギーを温度変化として検出するマイクロカロリーメータと、
前記マイクロカロリーメータに流れる電流を検出する信号検出機構と、
前記マイクロカロリーメータに熱量を付加する熱付加装置と、
前記熱付加装置の前記熱量の付加に同期した前記信号検出機構の出力電圧の波高値を測定する波高値モニターと、
前記マイクロカロリーメータに、前記波高値モニターの出力に基づき、前記波高値の変動を打ち消す補正を行うための磁場を印加する磁場印加手段と、からなる超伝導放射線分析装置。 - 前記熱付加装置は、一定のエネルギーを有するX線またはレーザ光を照射する線源である請求項1に記載の超伝導放射線分析装置。
- 放射線のエネルギーを温度変化として検出するマイクロカロリーメータと、
前記マイクロカロリーメータに流れる電流を検出する信号検出機構と、
前記マイクロカロリーメータに熱量を付加するために一定のエネルギーを有するX線またはレーザ光を照射する線源と、
前記熱量の付加に同期した前記信号検出機構の出力電圧の波高値を測定する波高値モニターと、
前記波高値モニターの出力に基づき、前記波高値の変動を打ち消す補正を行うエネルギー補正装置と、からなる超伝導放射線分析装置。 - 前記エネルギー補正装置は、前記マイクロカロリーメータに磁場を印加する磁場印加手段である請求項3に記載の超伝導放射線分析装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006185850A JP5026006B2 (ja) | 2006-07-05 | 2006-07-05 | 超伝導放射線分析装置 |
DE102007025361A DE102007025361A1 (de) | 2006-07-05 | 2007-05-31 | Supraleitende Radiometrievorrichtung |
US11/810,767 US7789557B2 (en) | 2006-07-05 | 2007-06-07 | Superconducting radiometry apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006185850A JP5026006B2 (ja) | 2006-07-05 | 2006-07-05 | 超伝導放射線分析装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008014775A JP2008014775A (ja) | 2008-01-24 |
JP2008014775A5 JP2008014775A5 (ja) | 2009-08-06 |
JP5026006B2 true JP5026006B2 (ja) | 2012-09-12 |
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Application Number | Title | Priority Date | Filing Date |
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JP2006185850A Active JP5026006B2 (ja) | 2006-07-05 | 2006-07-05 | 超伝導放射線分析装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7789557B2 (ja) |
JP (1) | JP5026006B2 (ja) |
DE (1) | DE102007025361A1 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5146745B2 (ja) * | 2008-05-09 | 2013-02-20 | エスアイアイ・ナノテクノロジー株式会社 | X線分析装置 |
JP5146746B2 (ja) * | 2008-05-14 | 2013-02-20 | エスアイアイ・ナノテクノロジー株式会社 | X線分析装置 |
DK2516954T3 (da) | 2009-12-23 | 2020-04-14 | Energy Recovery Inc | Rotationsenergigenerhvervelsesanordning |
JP5317126B2 (ja) * | 2010-03-05 | 2013-10-16 | 独立行政法人産業技術総合研究所 | イオン価数弁別高速粒子検出器 |
JP6058945B2 (ja) * | 2012-08-20 | 2017-01-11 | 株式会社日立ハイテクサイエンス | 放射線分析装置及び方法 |
US9523777B2 (en) * | 2014-04-10 | 2016-12-20 | Uchicago Argonne, Llc | Thermal kinetic inductance detector |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04143644A (ja) * | 1990-10-05 | 1992-05-18 | Canon Inc | 電子素子用温度制御装置 |
US5880468A (en) * | 1996-08-26 | 1999-03-09 | The United States Of America As Represented By The Secretary Of Commerce | Superconducting transition-edge sensor |
US6211519B1 (en) * | 1998-09-14 | 2001-04-03 | The Board Of Trustees Of The Leland Stanford Junior University | Transition-edge sensor with enhanced electrothermal feedback for cryogenic particle detection |
JP4080778B2 (ja) * | 2002-04-18 | 2008-04-23 | エスアイアイ・ナノテクノロジー株式会社 | カロリーメータ |
JP4184701B2 (ja) * | 2002-04-19 | 2008-11-19 | エスアイアイ・ナノテクノロジー株式会社 | 放射線検出器 |
JP4314921B2 (ja) * | 2003-03-18 | 2009-08-19 | 株式会社島津製作所 | 放射線検出器 |
JP2004361275A (ja) * | 2003-06-05 | 2004-12-24 | Sii Nanotechnology Inc | 放射線計測装置およびそれを用いた分析装置 |
JP2005003411A (ja) * | 2003-06-10 | 2005-01-06 | Sii Nanotechnology Inc | 超伝導放射線検出器 |
JP2005214792A (ja) * | 2004-01-29 | 2005-08-11 | Sii Nanotechnology Inc | 超伝導x線検出装置及びそれを用いた超伝導x線分析装置 |
US7274019B2 (en) * | 2004-07-30 | 2007-09-25 | Uchicago Argonne, Llc | Method for detection and imaging over a broad spectral range |
JP2006058046A (ja) * | 2004-08-18 | 2006-03-02 | Sii Nanotechnology Inc | 超伝導x線分析装置及びx線分析方法 |
JP2006118917A (ja) * | 2004-10-20 | 2006-05-11 | Sii Nanotechnology Inc | 超伝導x線検出装置及びそれを用いた超伝導x線分析装置 |
WO2006078024A1 (ja) * | 2005-01-24 | 2006-07-27 | Sii Nanotechnology Inc. | 超伝導x線検出器およびそれを用いたx線分析装置 |
US7767976B2 (en) * | 2008-05-07 | 2010-08-03 | Lockheed-Martin Corporation | Sensor systems and methods using entangled quantum particles |
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2006
- 2006-07-05 JP JP2006185850A patent/JP5026006B2/ja active Active
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2007
- 2007-05-31 DE DE102007025361A patent/DE102007025361A1/de not_active Ceased
- 2007-06-07 US US11/810,767 patent/US7789557B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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US20100019152A1 (en) | 2010-01-28 |
US7789557B2 (en) | 2010-09-07 |
DE102007025361A1 (de) | 2008-01-17 |
JP2008014775A (ja) | 2008-01-24 |
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