JP2008014775A5 - - Google Patents

Download PDF

Info

Publication number
JP2008014775A5
JP2008014775A5 JP2006185850A JP2006185850A JP2008014775A5 JP 2008014775 A5 JP2008014775 A5 JP 2008014775A5 JP 2006185850 A JP2006185850 A JP 2006185850A JP 2006185850 A JP2006185850 A JP 2006185850A JP 2008014775 A5 JP2008014775 A5 JP 2008014775A5
Authority
JP
Japan
Prior art keywords
heat
radiation analyzer
microcalorimeter
analyzer according
superconducting radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006185850A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008014775A (ja
JP5026006B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2006185850A priority Critical patent/JP5026006B2/ja
Priority claimed from JP2006185850A external-priority patent/JP5026006B2/ja
Priority to DE102007025361A priority patent/DE102007025361A1/de
Priority to US11/810,767 priority patent/US7789557B2/en
Publication of JP2008014775A publication Critical patent/JP2008014775A/ja
Publication of JP2008014775A5 publication Critical patent/JP2008014775A5/ja
Application granted granted Critical
Publication of JP5026006B2 publication Critical patent/JP5026006B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2006185850A 2006-07-05 2006-07-05 超伝導放射線分析装置 Active JP5026006B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006185850A JP5026006B2 (ja) 2006-07-05 2006-07-05 超伝導放射線分析装置
DE102007025361A DE102007025361A1 (de) 2006-07-05 2007-05-31 Supraleitende Radiometrievorrichtung
US11/810,767 US7789557B2 (en) 2006-07-05 2007-06-07 Superconducting radiometry apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006185850A JP5026006B2 (ja) 2006-07-05 2006-07-05 超伝導放射線分析装置

Publications (3)

Publication Number Publication Date
JP2008014775A JP2008014775A (ja) 2008-01-24
JP2008014775A5 true JP2008014775A5 (enExample) 2009-08-06
JP5026006B2 JP5026006B2 (ja) 2012-09-12

Family

ID=38825424

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006185850A Active JP5026006B2 (ja) 2006-07-05 2006-07-05 超伝導放射線分析装置

Country Status (3)

Country Link
US (1) US7789557B2 (enExample)
JP (1) JP5026006B2 (enExample)
DE (1) DE102007025361A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5146745B2 (ja) * 2008-05-09 2013-02-20 エスアイアイ・ナノテクノロジー株式会社 Ｘ線分析装置
JP5146746B2 (ja) * 2008-05-14 2013-02-20 エスアイアイ・ナノテクノロジー株式会社 Ｘ線分析装置
WO2011079045A2 (en) 2009-12-23 2011-06-30 Energy Recovery, Inc. Rotary energy recovery device
JP5317126B2 (ja) * 2010-03-05 2013-10-16 独立行政法人産業技術総合研究所 イオン価数弁別高速粒子検出器
JP6058945B2 (ja) * 2012-08-20 2017-01-11 株式会社日立ハイテクサイエンス 放射線分析装置及び方法
US9523777B2 (en) * 2014-04-10 2016-12-20 Uchicago Argonne, Llc Thermal kinetic inductance detector

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04143644A (ja) * 1990-10-05 1992-05-18 Canon Inc 電子素子用温度制御装置
US5880468A (en) * 1996-08-26 1999-03-09 The United States Of America As Represented By The Secretary Of Commerce Superconducting transition-edge sensor
US6211519B1 (en) * 1998-09-14 2001-04-03 The Board Of Trustees Of The Leland Stanford Junior University Transition-edge sensor with enhanced electrothermal feedback for cryogenic particle detection
JP4080778B2 (ja) * 2002-04-18 2008-04-23 エスアイアイ・ナノテクノロジー株式会社 カロリーメータ
JP4184701B2 (ja) * 2002-04-19 2008-11-19 エスアイアイ・ナノテクノロジー株式会社 放射線検出器
JP4314921B2 (ja) * 2003-03-18 2009-08-19 株式会社島津製作所 放射線検出器
JP2004361275A (ja) * 2003-06-05 2004-12-24 Sii Nanotechnology Inc 放射線計測装置およびそれを用いた分析装置
JP2005003411A (ja) * 2003-06-10 2005-01-06 Sii Nanotechnology Inc 超伝導放射線検出器
JP2005214792A (ja) * 2004-01-29 2005-08-11 Sii Nanotechnology Inc 超伝導ｘ線検出装置及びそれを用いた超伝導ｘ線分析装置
US7274019B2 (en) * 2004-07-30 2007-09-25 Uchicago Argonne, Llc Method for detection and imaging over a broad spectral range
JP2006058046A (ja) * 2004-08-18 2006-03-02 Sii Nanotechnology Inc 超伝導ｘ線分析装置及びｘ線分析方法
JP2006118917A (ja) * 2004-10-20 2006-05-11 Sii Nanotechnology Inc 超伝導ｘ線検出装置及びそれを用いた超伝導ｘ線分析装置
GB2437208B (en) * 2005-01-24 2009-12-02 Sii Nanotechnology Inc Superconducting x-ray detector and x-ray analysis apparatus using the same
US7767976B2 (en) * 2008-05-07 2010-08-03 Lockheed-Martin Corporation Sensor systems and methods using entangled quantum particles

Similar Documents

Publication Publication Date Title
CN103499603B (zh) 非接触式高温热物理性能参数测量装置及方法
WO2008036770A3 (en) Universal sensor controller for a thermal anemometer
JP2007526486A5 (enExample)
WO2012059743A3 (en) Temperature calibration methods and apparatus for optical absorption gas sensors, and optical absorption gas sensors thereby calibrated
WO2011152921A3 (en) Apparatus and method for current sensing using a wire bond
JP2012134142A5 (enExample)
FR2959016B1 (fr) Dispositif de mesure des proprietes physiques des gaz
BRPI0901307A2 (pt) detecção de fuga de corrente por meio de opto-chaves
JP2008014775A5 (enExample)
WO2007149205A3 (en) High accuracy in-situ resistance measurements methods
JP2012058043A5 (enExample)
BR112014025170A8 (pt) Disposição para medição de uma corrente com um transdutor de corrente do tipo rogowski
TW200936996A (en) Temperature sensing module
CN108548844B (zh) 圆环加热激励中心点测温的热物性传感器及测量方法
CN103759651B (zh) 一种实时监控变温变压型激光散斑测量系统
RU2012109190A (ru) Анемометр с постоянной температурой горячего проводника
JP6045099B2 (ja) 間欠駆動型可燃性ガス検出装置
JP2014186002A5 (enExample)
Bhattacharya et al. Characterization of Yb2O3 based optical temperature sensor for high temperature applications
BR112022023787A2 (pt) Termômetro de ruído de detecção de corrente e uso de um termômetro de ruído de detecção de corrente
RU2345334C1 (ru) Способ измерения мощности лазерного излучения
JP5026006B2 (ja) 超伝導放射線分析装置
Xie et al. Research of Weak Signal Processing Circuit Based on Non-Dispersive Infrared Automobile Exhaust Sensor
CN104316215B (zh) 一种用电桥测量led结温的装置及其方法
KR101709080B1 (ko) 광속보상 led 장치 및 방법