JP5025609B2 - 真空処理装置 - Google Patents

真空処理装置 Download PDF

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Publication number
JP5025609B2
JP5025609B2 JP2008244333A JP2008244333A JP5025609B2 JP 5025609 B2 JP5025609 B2 JP 5025609B2 JP 2008244333 A JP2008244333 A JP 2008244333A JP 2008244333 A JP2008244333 A JP 2008244333A JP 5025609 B2 JP5025609 B2 JP 5025609B2
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Japan
Prior art keywords
chamber
processing
inner chamber
disposed
vacuum
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JP2008244333A
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English (en)
Japanese (ja)
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JP2008306223A5 (enExample
JP2008306223A (ja
Inventor
昭孝 牧野
洋二 高橋
稔 空岡
秀樹 木原
勤 田内
勇造 大平原
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2008244333A priority Critical patent/JP5025609B2/ja
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JP2008244333A 2003-09-04 2008-09-24 真空処理装置 Expired - Lifetime JP5025609B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008244333A JP5025609B2 (ja) 2003-09-04 2008-09-24 真空処理装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2003313200 2003-09-04
JP2003313200 2003-09-04
JP2008244333A JP5025609B2 (ja) 2003-09-04 2008-09-24 真空処理装置

Related Parent Applications (1)

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JP2004258568A Division JP4522795B2 (ja) 2003-09-04 2004-09-06 真空処理装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2012086184A Division JP5415583B2 (ja) 2003-09-04 2012-04-05 真空処理装置

Publications (3)

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JP2008306223A JP2008306223A (ja) 2008-12-18
JP2008306223A5 JP2008306223A5 (enExample) 2009-07-02
JP5025609B2 true JP5025609B2 (ja) 2012-09-12

Family

ID=40234592

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2008244333A Expired - Lifetime JP5025609B2 (ja) 2003-09-04 2008-09-24 真空処理装置
JP2010025804A Expired - Fee Related JP5215332B2 (ja) 2003-09-04 2010-02-08 真空処理装置
JP2012086184A Expired - Lifetime JP5415583B2 (ja) 2003-09-04 2012-04-05 真空処理装置

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2010025804A Expired - Fee Related JP5215332B2 (ja) 2003-09-04 2010-02-08 真空処理装置
JP2012086184A Expired - Lifetime JP5415583B2 (ja) 2003-09-04 2012-04-05 真空処理装置

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JP (3) JP5025609B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012142612A (ja) * 2003-09-04 2012-07-26 Hitachi High-Technologies Corp 真空処理装置

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5206730B2 (ja) 2010-04-28 2013-06-12 株式会社デンソー 触媒通電制御装置
JP6101504B2 (ja) * 2013-02-14 2017-03-22 株式会社日立ハイテクノロジーズ 真空処理装置のモジュール検査装置
JP6463220B2 (ja) * 2015-05-21 2019-01-30 東京エレクトロン株式会社 処理システム
JP6557523B2 (ja) * 2015-06-19 2019-08-07 株式会社日立ハイテクノロジーズ プラズマ処理装置
JP6650841B2 (ja) * 2016-06-27 2020-02-19 東京エレクトロン株式会社 基板昇降機構、基板載置台および基板処理装置
JP6775432B2 (ja) * 2017-01-24 2020-10-28 Sppテクノロジーズ株式会社 真空搬送モジュール及び基板処理装置
JP6750928B2 (ja) * 2019-03-01 2020-09-02 株式会社日立ハイテク 真空処理装置
CN112826969B (zh) * 2021-03-09 2025-01-10 军事科学院系统工程研究院卫勤保障技术研究所 一种箱仪一体式化学喷淋洗消装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05160031A (ja) * 1991-12-03 1993-06-25 Kokusai Electric Co Ltd Cvd装置
JPH0878392A (ja) * 1994-09-02 1996-03-22 Mitsubishi Electric Corp プラズマ処理装置及び半導体ウエハの成膜加工方法
EP0823491B1 (en) * 1996-08-07 2002-02-27 Concept Systems Design Inc. Gas injection system for CVD reactors
US6312525B1 (en) * 1997-07-11 2001-11-06 Applied Materials, Inc. Modular architecture for semiconductor wafer fabrication equipment
JP4209539B2 (ja) * 1999-04-21 2009-01-14 東京エレクトロン株式会社 処理装置
JP5025609B2 (ja) * 2003-09-04 2012-09-12 株式会社日立ハイテクノロジーズ 真空処理装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012142612A (ja) * 2003-09-04 2012-07-26 Hitachi High-Technologies Corp 真空処理装置

Also Published As

Publication number Publication date
JP2012142612A (ja) 2012-07-26
JP2010103575A (ja) 2010-05-06
JP5415583B2 (ja) 2014-02-12
JP2008306223A (ja) 2008-12-18
JP5215332B2 (ja) 2013-06-19

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