JP5004562B2 - 半導体装置の作製方法 - Google Patents

半導体装置の作製方法 Download PDF

Info

Publication number
JP5004562B2
JP5004562B2 JP2006312711A JP2006312711A JP5004562B2 JP 5004562 B2 JP5004562 B2 JP 5004562B2 JP 2006312711 A JP2006312711 A JP 2006312711A JP 2006312711 A JP2006312711 A JP 2006312711A JP 5004562 B2 JP5004562 B2 JP 5004562B2
Authority
JP
Japan
Prior art keywords
substrate
semiconductor integrated
integrated circuit
insulating layer
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2006312711A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007180512A (ja
JP2007180512A5 (enExample
Inventor
友子 田村
智幸 青木
卓也 鶴目
浩二 大力
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2006312711A priority Critical patent/JP5004562B2/ja
Publication of JP2007180512A publication Critical patent/JP2007180512A/ja
Publication of JP2007180512A5 publication Critical patent/JP2007180512A5/ja
Application granted granted Critical
Publication of JP5004562B2 publication Critical patent/JP5004562B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

JP2006312711A 2005-12-02 2006-11-20 半導体装置の作製方法 Expired - Fee Related JP5004562B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006312711A JP5004562B2 (ja) 2005-12-02 2006-11-20 半導体装置の作製方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005348872 2005-12-02
JP2005348872 2005-12-02
JP2006312711A JP5004562B2 (ja) 2005-12-02 2006-11-20 半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JP2007180512A JP2007180512A (ja) 2007-07-12
JP2007180512A5 JP2007180512A5 (enExample) 2008-11-20
JP5004562B2 true JP5004562B2 (ja) 2012-08-22

Family

ID=38305335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006312711A Expired - Fee Related JP5004562B2 (ja) 2005-12-02 2006-11-20 半導体装置の作製方法

Country Status (1)

Country Link
JP (1) JP5004562B2 (enExample)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08172159A (ja) * 1994-12-16 1996-07-02 Hitachi Ltd 半導体集積回路装置の製造方法、それに用いるウエハ搬送治具および半導体集積回路装置
EP2565924B1 (en) * 2001-07-24 2018-01-10 Samsung Electronics Co., Ltd. Transfer method
JP2004134672A (ja) * 2002-10-11 2004-04-30 Sony Corp 超薄型半導体装置の製造方法および製造装置、並びに超薄型の裏面照射型固体撮像装置の製造方法および製造装置

Also Published As

Publication number Publication date
JP2007180512A (ja) 2007-07-12

Similar Documents

Publication Publication Date Title
JP5707470B2 (ja) 半導体装置
JP5973598B2 (ja) 半導体装置の作製方法
US8546210B2 (en) Semiconductor device and method for manufacturing the same
KR101381834B1 (ko) 반도체 장치 및 반도체 장치의 제작방법
US8338931B2 (en) Semiconductor device and product tracing system utilizing the semiconductor device having top and bottom fibrous sealing layers
CN101189625B (zh) 半导体器件及其制造方法以及天线的制造方法
CN100514604C (zh) 半导体器件
JP5348873B2 (ja) 半導体装置及びその作製方法
JP2009021568A (ja) 半導体装置の作製方法
US7826552B2 (en) Semiconductor device and wireless communication system
US7875530B2 (en) Method for manufacturing semiconductor device
US7504317B2 (en) Manufacturing method of semiconductor device
JP2007036216A (ja) 半導体装置及び無線通信システム
KR20080036168A (ko) 반도체장치 및 무선 통신 시스템
JP2008269583A (ja) 半導体装置
CN100561723C (zh) 半导体器件和其制造方法
JP5008299B2 (ja) 半導体装置の作製方法
JP5004562B2 (ja) 半導体装置の作製方法
JP2007181187A (ja) アンテナ及びその作製方法、アンテナを有する半導体装置及びその作製方法、並びに無線通信システム
JP5004563B2 (ja) 半導体装置の作製方法
JP4593534B2 (ja) 半導体装置及び無線通信システム
JP5030470B2 (ja) 半導体装置の作製方法

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20081003

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20081003

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120327

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120329

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120413

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120515

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120522

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150601

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150601

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees