JP4995647B2 - 過熱保護機能付き半導体装置の制御回路 - Google Patents
過熱保護機能付き半導体装置の制御回路 Download PDFInfo
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- JP4995647B2 JP4995647B2 JP2007155456A JP2007155456A JP4995647B2 JP 4995647 B2 JP4995647 B2 JP 4995647B2 JP 2007155456 A JP2007155456 A JP 2007155456A JP 2007155456 A JP2007155456 A JP 2007155456A JP 4995647 B2 JP4995647 B2 JP 4995647B2
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- circuit
- gate
- overheat protection
- mosfet
- semiconductor element
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- 239000004065 semiconductor Substances 0.000 title claims description 81
- 238000001514 detection method Methods 0.000 claims description 90
- 239000003990 capacitor Substances 0.000 description 6
- 230000006866 deterioration Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000006378 damage Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 238000013021 overheating Methods 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/18—Modifications for indicating state of switch
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
- H03K17/0812—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit
- H03K17/08122—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B39/00—Circuit arrangements or apparatus for operating incandescent light sources
- H05B39/04—Controlling
- H05B39/041—Controlling the light-intensity of the source
- H05B39/044—Controlling the light-intensity of the source continuously
- H05B39/047—Controlling the light-intensity of the source continuously with pulse width modulation from a DC power source
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
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- Electronic Switches (AREA)
- Semiconductor Integrated Circuits (AREA)
Description
また、前記半導体素子に流れ込む電流を検知し、該電流の値が所定のしきい値を超えたとき、検知信号を出力する電流検知回路と、該電流検知回路の検知信号と前記PWM信号との論理和を出力する論理ゲートと、該論理ゲートの出力に応じて前記半導体素子を駆動させる駆動回路とを有するようにすることができる。
また、前記制御手段は、所定のスイッチのオン/オフ操作に応じて前記PWM信号を供給するようにすることができる。
本発明の過熱保護機能付き半導体装置の制御回路では、制御手段からのPWM信号によって+B電源からの電力を負荷に供給する半導体素子がオン/オフされ、駆動電力供給手段からワンチップ上に搭載される、ワンチップの温度上昇を検出する温度検出回路、該温度検出回路の検出出力を保持するラッチ回路及び該ラッチ回路の出力に応じて半導体素子のゲート入力を遮断するゲート遮断回路を含む過熱保護手段を駆動させるための駆動電力が供給され、過熱保護手段の温度検出回路が作動してゲート遮断回路がオンし、半導体素子のゲート遮断による保護動作が行われるとともに、制御手段からのPWM信号の供給が無くなると、タイマ手段によって所定期間だけ駆動電力供給手段による駆動電力の供給が継続される。
2 増幅回路
3 半導体装置
3b ゲート抵抗
3c 温度検出回路
3d ラッチ回路
3e ゲート遮断回路
4 負荷
5 出力状態検出部
6 電源回路
7 PWM点灯スイッチ
10 PWM点灯スイッチ
30 電源回路
30a チャージポンプ回路
40 タイマ回路
50 ORゲート
60 ゲート駆動回路
70 電流検知回路
80 半導体装置
82 ゲート抵抗
83 温度検出回路
84 ラッチ回路
85 ゲート遮断回路
90 負荷
Claims (3)
- ワンチップ上に、+B電源からの電力を負荷に供給する半導体素子と、前記ワンチップの温度上昇を検出する温度検出回路、該温度検出回路の検出出力を保持するラッチ回路及び該ラッチ回路の出力に応じて前記半導体素子のゲート入力を遮断するゲート遮断回路を含む過熱保護手段とを搭載した過熱保護機能付き半導体装置の制御回路であって、
前記半導体素子をオン/オフさせるためのPWM信号を供給する制御手段と、
前記過熱保護手段を駆動させるための駆動電力を供給する駆動電力供給手段と、
前記PWM信号の供給に応じて前記駆動電力供給手段に駆動電力を供給させるタイマ手段とを備え、
前記温度検出回路が作動して前記ゲート遮断回路がオンし、前記半導体素子のゲート遮断による保護動作が行われ、前記制御手段からのPWM信号の供給が無くなると、前記タイマ手段によって所定期間だけ前記駆動電力供給手段による駆動電力の供給が継続される
ことを特徴とする過熱保護機能付き半導体装置の制御回路。 - 前記半導体素子に流れ込む電流を検知し、該電流の値が所定のしきい値を超えたとき、検知信号を出力する電流検知回路と、
該電流検知回路の検知信号と前記PWM信号との論理和を出力する論理ゲートと、
該論理ゲートの出力に応じて前記半導体素子を駆動させる駆動回路とを有する
ことを特徴とする請求項1に記載の過熱保護機能付き半導体装置の制御回路。 - 前記制御手段は、所定のスイッチのオン/オフ操作に応じて前記PWM信号を供給することを特徴とする請求項1又は2に記載の過熱保護機能付き半導体装置の制御回路。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007155456A JP4995647B2 (ja) | 2007-06-12 | 2007-06-12 | 過熱保護機能付き半導体装置の制御回路 |
DE102008025465.7A DE102008025465B4 (de) | 2007-06-12 | 2008-05-28 | Steuerschaltung für eine Halbleitereinrichtung mit einer Überhitzungsschutzfunktion |
US12/155,078 US7768759B2 (en) | 2007-06-12 | 2008-05-29 | Control circuit of semiconductor device having over-heat protecting function |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007155456A JP4995647B2 (ja) | 2007-06-12 | 2007-06-12 | 過熱保護機能付き半導体装置の制御回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008311765A JP2008311765A (ja) | 2008-12-25 |
JP4995647B2 true JP4995647B2 (ja) | 2012-08-08 |
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JP2007155456A Active JP4995647B2 (ja) | 2007-06-12 | 2007-06-12 | 過熱保護機能付き半導体装置の制御回路 |
Country Status (3)
Country | Link |
---|---|
US (1) | US7768759B2 (ja) |
JP (1) | JP4995647B2 (ja) |
DE (1) | DE102008025465B4 (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014203655A1 (de) * | 2014-02-28 | 2015-09-03 | Siemens Aktiengesellschaft | Schaltungsanordnung und Verfahren zum Ansteuern eines Sperrschicht-Feldeffekttransistors |
CN105974992B (zh) * | 2016-06-03 | 2017-12-05 | 沙洲职业工学院 | 一种强电磁干扰环境中pwm控制信号传输方法和装置 |
JP6811051B2 (ja) * | 2016-07-29 | 2021-01-13 | 株式会社小糸製作所 | 点灯回路および車両用灯具 |
US10528099B2 (en) | 2016-10-10 | 2020-01-07 | Micron Technology, Inc. | Configuration update for a memory device based on a temperature of the memory device |
JP6753301B2 (ja) * | 2016-12-19 | 2020-09-09 | 三菱電機株式会社 | 駆動回路 |
KR102028388B1 (ko) * | 2017-10-18 | 2019-10-07 | 한국전기연구원 | 게이트 구동회로 및 이를 포함하는 전력 스위치 제어장치 |
EP3561981A1 (de) * | 2018-04-27 | 2019-10-30 | Siemens Aktiengesellschaft | Verfahren zur reduktion eines temperaturanstiegs bei einem steuerbaren schaltelement |
GB2595929B (en) * | 2020-06-12 | 2023-04-26 | Dyson Technology Ltd | Protection circuit for an electrical appliance |
JP2022093994A (ja) * | 2020-12-14 | 2022-06-24 | 株式会社東芝 | 電力変換装置 |
Family Cites Families (13)
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JP3367619B2 (ja) * | 1993-12-17 | 2003-01-14 | 松下電器産業株式会社 | 空気調和機の制御装置 |
DE19534604C1 (de) * | 1995-09-18 | 1996-10-24 | Siemens Ag | Durch Feldeffekt steuerbares Halbleiterbauelement mit mehreren Temperatursensoren zum Schutz vor Überlastung |
US5737169A (en) * | 1996-02-28 | 1998-04-07 | Eni, A Division Of Astec America, Inc. | Intrinsic element sensing integrated SOA protection for power MOSFET switches |
US5675297A (en) * | 1996-04-29 | 1997-10-07 | Delco Electronics Corporation | Integrated pulse-width modulation circuit with thermal shutdown circuit |
DE19704861A1 (de) * | 1997-02-10 | 1998-08-27 | Daimler Benz Ag | Steuerbare Schalteinrichtung, Anordnung und Verfahren zum Betreiben einer Schalteinrichtung, insbesondere für Leistungshalbleiter |
JP3706515B2 (ja) * | 1998-12-28 | 2005-10-12 | 矢崎総業株式会社 | 電源供給制御装置および電源供給制御方法 |
JP2001045650A (ja) * | 1999-08-02 | 2001-02-16 | Yazaki Corp | 電源供給制御装置 |
JP2001112164A (ja) * | 1999-10-04 | 2001-04-20 | Yazaki Corp | 半導体リレーシステムの過電流遮断時のゲート電流制御装置 |
JP3585105B2 (ja) * | 1999-12-08 | 2004-11-04 | 矢崎総業株式会社 | 過熱保護機能付き半導体装置の制御回路 |
JP3845261B2 (ja) * | 2001-02-28 | 2006-11-15 | 矢崎総業株式会社 | 自動車用電気負荷駆動制御装置 |
JP4178904B2 (ja) * | 2002-10-16 | 2008-11-12 | アンデン株式会社 | パワー素子の温度保護装置 |
DE102004025420B4 (de) * | 2004-05-24 | 2014-05-28 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Schaltungselement zum Sichern einer Lastschaltung und Chip mit einem derartigen Schaltungselement |
JP4732191B2 (ja) * | 2006-02-28 | 2011-07-27 | 矢崎総業株式会社 | 過熱保護機能付き半導体装置の制御回路 |
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- 2007-06-12 JP JP2007155456A patent/JP4995647B2/ja active Active
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2008
- 2008-05-28 DE DE102008025465.7A patent/DE102008025465B4/de active Active
- 2008-05-29 US US12/155,078 patent/US7768759B2/en active Active
Also Published As
Publication number | Publication date |
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JP2008311765A (ja) | 2008-12-25 |
DE102008025465A1 (de) | 2008-12-18 |
DE102008025465B4 (de) | 2018-11-08 |
US7768759B2 (en) | 2010-08-03 |
US20080310068A1 (en) | 2008-12-18 |
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