JP4956430B2 - 深さが変化する検出素子を有する容量性検出装置 - Google Patents

深さが変化する検出素子を有する容量性検出装置 Download PDF

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JP4956430B2
JP4956430B2 JP2007527824A JP2007527824A JP4956430B2 JP 4956430 B2 JP4956430 B2 JP 4956430B2 JP 2007527824 A JP2007527824 A JP 2007527824A JP 2007527824 A JP2007527824 A JP 2007527824A JP 4956430 B2 JP4956430 B2 JP 4956430B2
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detection
capacitive
detection element
sensing
reference plane
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JP2008510251A (ja
JP2008510251A5 (enExample
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マッキー、ボブ、リー
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シナプティクス インコーポレイテッド
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0443—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a single layer of sensing electrodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Position Input By Displaying (AREA)
JP2007527824A 2004-08-19 2005-07-07 深さが変化する検出素子を有する容量性検出装置 Expired - Fee Related JP4956430B2 (ja)

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Application Number Priority Date Filing Date Title
US10/922,574 US7737953B2 (en) 2004-08-19 2004-08-19 Capacitive sensing apparatus having varying depth sensing elements
US10/922,574 2004-08-19
PCT/US2005/024206 WO2006023147A2 (en) 2004-08-19 2005-07-07 Capacitive sensing apparatus having varying depth sensing elements

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JP2008510251A JP2008510251A (ja) 2008-04-03
JP2008510251A5 JP2008510251A5 (enExample) 2008-08-14
JP4956430B2 true JP4956430B2 (ja) 2012-06-20

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US (2) US7737953B2 (enExample)
EP (1) EP1782174B1 (enExample)
JP (1) JP4956430B2 (enExample)
KR (1) KR101129665B1 (enExample)
CN (1) CN101006416B (enExample)
WO (1) WO2006023147A2 (enExample)

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US20060038791A1 (en) 2006-02-23
KR101129665B1 (ko) 2012-03-28
EP1782174A2 (en) 2007-05-09
EP1782174B1 (en) 2012-11-28
CN101006416B (zh) 2012-03-14
US7737953B2 (en) 2010-06-15
JP2008510251A (ja) 2008-04-03
US20100231555A1 (en) 2010-09-16
KR20070072480A (ko) 2007-07-04
CN101006416A (zh) 2007-07-25
US8493348B2 (en) 2013-07-23

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