JP4956312B2 - 遅延線 - Google Patents
遅延線 Download PDFInfo
- Publication number
- JP4956312B2 JP4956312B2 JP2007190207A JP2007190207A JP4956312B2 JP 4956312 B2 JP4956312 B2 JP 4956312B2 JP 2007190207 A JP2007190207 A JP 2007190207A JP 2007190207 A JP2007190207 A JP 2007190207A JP 4956312 B2 JP4956312 B2 JP 4956312B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- signal line
- line
- capacitive elements
- delay
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/30—Time-delay networks
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Pulse Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Description
Claims (6)
- 信号線路と、
前記信号線路に対して間隔をあけて形成されたグランドと、
前記信号線路に沿って配された複数の容量素子と
を備え、
前記複数の容量素子のそれぞれについて、前記信号線路と前記グランドとの間の結合容量の大きさが個別に切り替えられることにより、前記信号線路上の信号の時間的遅延の大きさを切り替え、
前記複数の容量素子のうち隣り合う一対の容量素子間における前記信号線路の電気長が互いに異なって配される遅延線。 - 前記複数の容量素子の相互の間隔がランダムに異なる請求項1に記載の遅延線。
- 前記複数の容量素子の各々は、前記信号線路および前記グランドに間隔を開けまたは近接することにより、前記結合容量の大きさを切り替える可動部を有する請求項1または請求項2に記載の遅延線。
- 前記複数の容量素子の各々は、前記信号線路および前記グランドのいずれか一方に固定され、他方に近接することによって、前記結合容量の大きさを切り替える可動部を有する請求項1または2に記載の遅延線。
- 前記複数の容量素子の各々の一端は前記グランドに接続され、前記複数の容量素子の各々の他端と前記信号線路との間を電気的に開閉するスイッチを更に備える請求項1または請求項2に記載の遅延線。
- 信号線路と、
前記信号線路に対して間隔をあけて形成されたグランドと、
前記信号線路に沿って等間隔に配された複数の容量素子と、
前記複数の容量素子に対応して配され、前記信号線路と前記グランドとの間に、前記複数の容量素子のうちの対応する一つを接続するか否かを切り替えることにより、前記信号線路上の信号の時間的遅延の大きさを切り替える複数のスイッチと、
前記複数の容量素子のうちの3つ以上の容量素子を電気的に接続する場合に、前記3つ以上の容量素子のうちで隣り合う一対の容量素子間における前記信号線路の電気長が互いに異なるべく、前記3つ以上の容量素子を選択して対応するスイッチを切り替える制御部と
を備える遅延線。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007190207A JP4956312B2 (ja) | 2007-07-20 | 2007-07-20 | 遅延線 |
US12/174,643 US20090195328A1 (en) | 2007-07-20 | 2008-07-17 | Delay line, signal delay method, and test signal generating apparatus |
DE102008034121A DE102008034121A1 (de) | 2007-07-20 | 2008-07-18 | Verzögerungsleitung, Signalverzögerungsverfahren und Prüfsignal-Erzeugungsvorrichtung |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007190207A JP4956312B2 (ja) | 2007-07-20 | 2007-07-20 | 遅延線 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009027566A JP2009027566A (ja) | 2009-02-05 |
JP4956312B2 true JP4956312B2 (ja) | 2012-06-20 |
Family
ID=40157622
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007190207A Active JP4956312B2 (ja) | 2007-07-20 | 2007-07-20 | 遅延線 |
Country Status (3)
Country | Link |
---|---|
US (1) | US20090195328A1 (ja) |
JP (1) | JP4956312B2 (ja) |
DE (1) | DE102008034121A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2606709C1 (ru) * | 2015-09-02 | 2017-01-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Томский государственный университет систем управления и радиоэлектроники" (ТУСУР) | Меандровая линия задержки с лицевой связью, защищающая от сверхкоротких импульсов |
US10361674B2 (en) | 2017-01-12 | 2019-07-23 | Infineon Technologies Ag | Radio frequency delay line |
RU2732805C1 (ru) * | 2019-11-27 | 2020-09-22 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Томский государственный университет систем управления и радиоэлектроники" (ТУСУР) | Модифицированная микрополосковая линия, защищающая от сверхкоротких импульсов |
RU2724972C1 (ru) * | 2019-11-27 | 2020-06-29 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Томский государственный университет систем управления и радиоэлектроники" (ТУСУР) | Меандровая микрополосковая линия задержки из двух витков, защищающая от сверхкоротких импульсов |
RU2724970C1 (ru) * | 2019-11-27 | 2020-06-29 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Томский государственный университет систем управления и радиоэлектроники" (ТУСУР) | Меандровая линия задержки с лицевой связью из двух витков, защищающая от сверхкоротких импульсов |
RU2742049C1 (ru) * | 2019-12-09 | 2021-02-02 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Томский государственный университет систем управления и радиоэлектроники" (ТУСУР) | Меандровая линия задержки с лицевой связью, защищающая от сверхкоротких импульсов с увеличенной длительностью |
RU2724983C1 (ru) * | 2019-12-09 | 2020-06-29 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Томский государственный университет систем управления и радиоэлектроники" (ТУСУР) | Усовершенствованная меандровая линия задержки с лицевой связью, защищающая от сверхкоротких импульсов |
RU2767975C1 (ru) * | 2021-06-18 | 2022-03-22 | федеральное государственное бюджетное образовательное учреждение высшего образования «Томский государственный университет систем управления и радиоэлектроники» | Меандровая линия с лицевой связью и пассивным проводником, защищающая от сверхкоротких импульсов |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0673524B2 (ja) * | 1984-01-18 | 1994-09-21 | 株式会社東芝 | 超音波診断装置用遅延回路 |
US4837532A (en) * | 1987-10-26 | 1989-06-06 | General Electric Company | MMIC (monolithic microwave integrated circuit) voltage controlled analog phase shifter |
EP1099109A1 (en) * | 1998-07-22 | 2001-05-16 | Unilever N.V. | Monitoring apparatus |
JP2001162288A (ja) | 1999-12-06 | 2001-06-19 | Mitsubishi Materials Corp | 脱リン材 |
US6386272B1 (en) * | 2000-01-28 | 2002-05-14 | York International Corporation | Device and method for detecting fouling in a shell and tube heat exchanger |
US6778023B2 (en) * | 2001-07-31 | 2004-08-17 | Nokia Corporation | Tunable filter and method of tuning a filter |
JP3818176B2 (ja) * | 2002-03-06 | 2006-09-06 | 株式会社村田製作所 | Rfmems素子 |
US6834515B2 (en) * | 2002-09-13 | 2004-12-28 | Air Products And Chemicals, Inc. | Plate-fin exchangers with textured surfaces |
ATE520140T1 (de) * | 2002-09-16 | 2011-08-15 | Imec | Geschaltete kapazität |
US7075363B1 (en) * | 2003-07-07 | 2006-07-11 | Aeluros, Inc. | Tuned continuous time delay FIR equalizer |
US7135941B1 (en) * | 2004-05-24 | 2006-11-14 | Christos Tsironis | Triple probe automatic slide screw load pull tuner and method |
KR100635279B1 (ko) * | 2005-02-22 | 2006-10-19 | 삼성전자주식회사 | 초고속 데이터 통신용 아날로그 상관기 |
JP4838536B2 (ja) * | 2005-05-20 | 2011-12-14 | 株式会社エヌ・ティ・ティ・ドコモ | 整合回路 |
US7646268B1 (en) * | 2006-12-22 | 2010-01-12 | Christos Tsironis | Low frequency harmonic load pull tuner and method |
JP5079387B2 (ja) * | 2007-05-10 | 2012-11-21 | 株式会社エヌ・ティ・ティ・ドコモ | 整合回路 |
-
2007
- 2007-07-20 JP JP2007190207A patent/JP4956312B2/ja active Active
-
2008
- 2008-07-17 US US12/174,643 patent/US20090195328A1/en not_active Abandoned
- 2008-07-18 DE DE102008034121A patent/DE102008034121A1/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
DE102008034121A1 (de) | 2009-01-29 |
US20090195328A1 (en) | 2009-08-06 |
JP2009027566A (ja) | 2009-02-05 |
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