JP4955966B2 - 導波路、それを用いた装置及び検出方法 - Google Patents

導波路、それを用いた装置及び検出方法 Download PDF

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JP4955966B2
JP4955966B2 JP2005256655A JP2005256655A JP4955966B2 JP 4955966 B2 JP4955966 B2 JP 4955966B2 JP 2005256655 A JP2005256655 A JP 2005256655A JP 2005256655 A JP2005256655 A JP 2005256655A JP 4955966 B2 JP4955966 B2 JP 4955966B2
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Prior art keywords
waveguide
dielectric member
specimen
single line
electromagnetic wave
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Expired - Fee Related
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JP2005256655A
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Japanese (ja)
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JP2007071590A5 (https=
JP2007071590A (ja
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健明 井辻
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Canon Inc
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Canon Inc
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Priority to JP2005256655A priority Critical patent/JP4955966B2/ja
Application filed by Canon Inc filed Critical Canon Inc
Priority to CN2006800323001A priority patent/CN101258399B/zh
Priority to EP20060797571 priority patent/EP1926982B1/en
Priority to KR20087008060A priority patent/KR101002357B1/ko
Priority to US11/573,507 priority patent/US7759946B2/en
Priority to PCT/JP2006/317695 priority patent/WO2007029757A2/en
Priority to AT06797571T priority patent/ATE548642T1/de
Publication of JP2007071590A publication Critical patent/JP2007071590A/ja
Publication of JP2007071590A5 publication Critical patent/JP2007071590A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3577—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing liquids, e.g. polluted water
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N21/774—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N2021/7706—Reagent provision
    • G01N2021/7736—Reagent provision exposed, cladding free
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7769—Measurement method of reaction-produced change in sensor
    • G01N2021/7776—Index

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
JP2005256655A 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法 Expired - Fee Related JP4955966B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2005256655A JP4955966B2 (ja) 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法
EP20060797571 EP1926982B1 (en) 2005-09-05 2006-08-31 Waveguide, and device and detection method using the same
KR20087008060A KR101002357B1 (ko) 2005-09-05 2006-08-31 테라헤르츠 도파로 장치 및 이를 사용한 검출방법
US11/573,507 US7759946B2 (en) 2005-09-05 2006-08-31 Waveguide, and device and detection method using the same
CN2006800323001A CN101258399B (zh) 2005-09-05 2006-08-31 太赫波导装置及使用其的检测方法
PCT/JP2006/317695 WO2007029757A2 (en) 2005-09-05 2006-08-31 Terahertz waveguide device and detection method using the same
AT06797571T ATE548642T1 (de) 2005-09-05 2006-08-31 Wellenleiter sowie vorrichtung und erkennungsverfahren damit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005256655A JP4955966B2 (ja) 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法

Publications (3)

Publication Number Publication Date
JP2007071590A JP2007071590A (ja) 2007-03-22
JP2007071590A5 JP2007071590A5 (https=) 2010-03-04
JP4955966B2 true JP4955966B2 (ja) 2012-06-20

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JP2005256655A Expired - Fee Related JP4955966B2 (ja) 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法

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US (1) US7759946B2 (https=)
EP (1) EP1926982B1 (https=)
JP (1) JP4955966B2 (https=)
KR (1) KR101002357B1 (https=)
CN (1) CN101258399B (https=)
WO (1) WO2007029757A2 (https=)

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JPWO2008026523A1 (ja) * 2006-08-28 2010-01-21 国立大学法人東北大学 近接場光計測法および近接場光計測装置
JP4958278B2 (ja) * 2007-03-13 2012-06-20 キヤノン株式会社 検査装置
JP4807707B2 (ja) * 2007-11-30 2011-11-02 キヤノン株式会社 波形情報取得装置
JP5514612B2 (ja) * 2010-04-05 2014-06-04 株式会社日立製作所 低ノイズケーブルおよびそれを使用した装置
WO2012049587A1 (en) * 2010-10-12 2012-04-19 Koninklijke Philips Electronics N.V. Wire-type waveguide for terahertz radiation
KR101875706B1 (ko) 2011-08-23 2018-08-02 삼성전자주식회사 테라헤르츠 상호작용 회로
JP6075822B2 (ja) * 2012-03-13 2017-02-08 キヤノン株式会社 センサ装置
US9830523B2 (en) * 2012-05-31 2017-11-28 Korea Institute Of Science And Technology Method and apparatus for recognizing object material using spatial image and spatial radar information
CN103472585B (zh) * 2013-09-24 2015-05-27 北京无线电计量测试研究所 一种用于光导开关产生THz波的聚焦监测装置
WO2021112568A1 (ko) 2019-12-03 2021-06-10 삼성전자 주식회사 광학 제어 스위치 및 이를 포함하는 전자 장치
CN114027198B (zh) * 2021-12-14 2023-01-20 漳州市农业科学研究所 一种芦荟锦的繁育与栽培方法

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JPH0658895A (ja) * 1992-08-12 1994-03-04 Tokimec Inc 氷分濃度計測装置
US5623145A (en) 1995-02-15 1997-04-22 Lucent Technologies Inc. Method and apparatus for terahertz imaging
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JP4721416B2 (ja) 2005-09-05 2011-07-13 キヤノン株式会社 検体検査素子、及び検体検査装置
JP4646838B2 (ja) * 2006-03-17 2011-03-09 キヤノン株式会社 プローブ及び近接場顕微鏡
JP4861220B2 (ja) * 2006-08-28 2012-01-25 キヤノン株式会社 電磁波を用いた検査装置

Also Published As

Publication number Publication date
WO2007029757A2 (en) 2007-03-15
EP1926982A2 (en) 2008-06-04
US7759946B2 (en) 2010-07-20
CN101258399B (zh) 2011-01-19
KR20080042926A (ko) 2008-05-15
EP1926982B1 (en) 2012-03-07
CN101258399A (zh) 2008-09-03
JP2007071590A (ja) 2007-03-22
KR101002357B1 (ko) 2010-12-17
US20090219511A1 (en) 2009-09-03
WO2007029757A3 (en) 2007-07-05

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