JP2007071590A5 - - Google Patents

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Publication number
JP2007071590A5
JP2007071590A5 JP2005256655A JP2005256655A JP2007071590A5 JP 2007071590 A5 JP2007071590 A5 JP 2007071590A5 JP 2005256655 A JP2005256655 A JP 2005256655A JP 2005256655 A JP2005256655 A JP 2005256655A JP 2007071590 A5 JP2007071590 A5 JP 2007071590A5
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JP
Japan
Prior art keywords
single line
specimen
electromagnetic wave
gap
waveguide
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Application number
JP2005256655A
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English (en)
Japanese (ja)
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JP4955966B2 (ja
JP2007071590A (ja
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Priority claimed from JP2005256655A external-priority patent/JP4955966B2/ja
Priority to JP2005256655A priority Critical patent/JP4955966B2/ja
Priority to CN2006800323001A priority patent/CN101258399B/zh
Priority to KR20087008060A priority patent/KR101002357B1/ko
Priority to US11/573,507 priority patent/US7759946B2/en
Priority to EP20060797571 priority patent/EP1926982B1/en
Priority to PCT/JP2006/317695 priority patent/WO2007029757A2/en
Priority to AT06797571T priority patent/ATE548642T1/de
Publication of JP2007071590A publication Critical patent/JP2007071590A/ja
Publication of JP2007071590A5 publication Critical patent/JP2007071590A5/ja
Publication of JP4955966B2 publication Critical patent/JP4955966B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005256655A 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法 Expired - Fee Related JP4955966B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2005256655A JP4955966B2 (ja) 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法
EP20060797571 EP1926982B1 (en) 2005-09-05 2006-08-31 Waveguide, and device and detection method using the same
KR20087008060A KR101002357B1 (ko) 2005-09-05 2006-08-31 테라헤르츠 도파로 장치 및 이를 사용한 검출방법
US11/573,507 US7759946B2 (en) 2005-09-05 2006-08-31 Waveguide, and device and detection method using the same
CN2006800323001A CN101258399B (zh) 2005-09-05 2006-08-31 太赫波导装置及使用其的检测方法
PCT/JP2006/317695 WO2007029757A2 (en) 2005-09-05 2006-08-31 Terahertz waveguide device and detection method using the same
AT06797571T ATE548642T1 (de) 2005-09-05 2006-08-31 Wellenleiter sowie vorrichtung und erkennungsverfahren damit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005256655A JP4955966B2 (ja) 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法

Publications (3)

Publication Number Publication Date
JP2007071590A JP2007071590A (ja) 2007-03-22
JP2007071590A5 true JP2007071590A5 (https=) 2010-03-04
JP4955966B2 JP4955966B2 (ja) 2012-06-20

Family

ID=37763396

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005256655A Expired - Fee Related JP4955966B2 (ja) 2005-09-05 2005-09-05 導波路、それを用いた装置及び検出方法

Country Status (6)

Country Link
US (1) US7759946B2 (https=)
EP (1) EP1926982B1 (https=)
JP (1) JP4955966B2 (https=)
KR (1) KR101002357B1 (https=)
CN (1) CN101258399B (https=)
WO (1) WO2007029757A2 (https=)

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JPWO2008026523A1 (ja) * 2006-08-28 2010-01-21 国立大学法人東北大学 近接場光計測法および近接場光計測装置
JP4958278B2 (ja) * 2007-03-13 2012-06-20 キヤノン株式会社 検査装置
JP4807707B2 (ja) * 2007-11-30 2011-11-02 キヤノン株式会社 波形情報取得装置
JP5514612B2 (ja) * 2010-04-05 2014-06-04 株式会社日立製作所 低ノイズケーブルおよびそれを使用した装置
WO2012049587A1 (en) * 2010-10-12 2012-04-19 Koninklijke Philips Electronics N.V. Wire-type waveguide for terahertz radiation
KR101875706B1 (ko) 2011-08-23 2018-08-02 삼성전자주식회사 테라헤르츠 상호작용 회로
JP6075822B2 (ja) * 2012-03-13 2017-02-08 キヤノン株式会社 センサ装置
US9830523B2 (en) * 2012-05-31 2017-11-28 Korea Institute Of Science And Technology Method and apparatus for recognizing object material using spatial image and spatial radar information
CN103472585B (zh) * 2013-09-24 2015-05-27 北京无线电计量测试研究所 一种用于光导开关产生THz波的聚焦监测装置
WO2021112568A1 (ko) 2019-12-03 2021-06-10 삼성전자 주식회사 광학 제어 스위치 및 이를 포함하는 전자 장치
CN114027198B (zh) * 2021-12-14 2023-01-20 漳州市农业科学研究所 一种芦荟锦的繁育与栽培方法

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JP3950820B2 (ja) * 2003-06-25 2007-08-01 キヤノン株式会社 高周波電気信号制御装置及びセンシングシステム
JP4012125B2 (ja) * 2003-06-25 2007-11-21 キヤノン株式会社 電磁波制御装置およびセンシングシステム
KR100473794B1 (ko) * 2003-07-23 2005-03-14 한국표준과학연구원 플라즈마 전자밀도 측정 및 모니터링 장치
JP4287724B2 (ja) * 2003-10-02 2009-07-01 日立電線株式会社 プラズマ電位測定方法及び装置
JP3790249B2 (ja) 2004-01-13 2006-06-28 株式会社東芝 ループアンテナ及びループアンテナを備えた無線通信機
US9178282B2 (en) * 2004-07-14 2015-11-03 William Marsh Rice University Method for coupling terahertz pulses into a coaxial waveguide
JP4546326B2 (ja) * 2004-07-30 2010-09-15 キヤノン株式会社 センシング装置
WO2006046745A1 (en) * 2004-10-29 2006-05-04 Canon Kabushiki Kaisha Sensor for analyzing or identifying property of object, sensing apparatus using same, and sensing method
JP4721416B2 (ja) 2005-09-05 2011-07-13 キヤノン株式会社 検体検査素子、及び検体検査装置
JP4646838B2 (ja) * 2006-03-17 2011-03-09 キヤノン株式会社 プローブ及び近接場顕微鏡
JP4861220B2 (ja) * 2006-08-28 2012-01-25 キヤノン株式会社 電磁波を用いた検査装置

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