JP4905514B2 - 窒化物系半導体発光素子 - Google Patents
窒化物系半導体発光素子 Download PDFInfo
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- JP4905514B2 JP4905514B2 JP2009166924A JP2009166924A JP4905514B2 JP 4905514 B2 JP4905514 B2 JP 4905514B2 JP 2009166924 A JP2009166924 A JP 2009166924A JP 2009166924 A JP2009166924 A JP 2009166924A JP 4905514 B2 JP4905514 B2 JP 4905514B2
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- contact layer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/16—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular crystal structure or orientation, e.g. polycrystalline, amorphous or porous
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of group III and group V of the periodic system
- H01L33/32—Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/14—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a carrier transport control structure, e.g. highly-doped semiconductor layer or current-blocking structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/36—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
- H01L33/40—Materials therefor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0421—Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3202—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth
- H01S5/320275—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth semi-polar orientation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
Description
Claims (2)
- 窒化物系半導体発光素子であって、
GaN基板と
前記GaN基板の主面に設けられており発光層を含む六方晶系の窒化ガリウム系半導体領域と、
前記窒化ガリウム系半導体領域上に設けられており金属からなる電極と
を備え、
前記窒化ガリウム系半導体領域は、歪みを内包する接触層を含み、
前記接触層は前記電極と接しており、
前記主面は、前記GaN基板のc軸方向に直交する面から前記GaN基板のm軸に向けて所定の傾斜角度で傾斜した基準平面に沿って延びており、
前記傾斜角度は、63度以上83度未満の範囲に含まれ、
前記窒化ガリウム系半導体領域は、前記GaN基板に格子整合しており、
前記接触層は、p型ドープされたInGaN、又は、p型ドープされたInAlGaNからなり、
前記接触層がp型ドープされたInGaNからなる場合、前記接触層のInの組成比は1%以上20%以下の範囲内にあり、前記接触層がp型ドープされたInAlGaNからなる場合、前記接触層のInの組成比は、前記接触層のAlの組成比に0.22を乗じた値よりも大きい、ことを特徴とする窒化物系半導体発光素子。 - 前記発光層は、500nm以上の所定範囲内にピーク波長を有する光を発光する、ことを特徴とする請求項1に記載の窒化物系半導体発光素子。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009166924A JP4905514B2 (ja) | 2009-07-15 | 2009-07-15 | 窒化物系半導体発光素子 |
KR1020100067490A KR101216342B1 (ko) | 2009-07-15 | 2010-07-13 | 질화물계 반도체 발광 소자 |
US12/836,090 US8174035B2 (en) | 2009-07-15 | 2010-07-14 | Nitride-based semiconductor light emitting device |
TW099123322A TW201115787A (en) | 2009-07-15 | 2010-07-15 | Nitride-based semiconductor light emitting device |
CN2010102313676A CN101958386A (zh) | 2009-07-15 | 2010-07-15 | 氮化物类半导体发光元件 |
EP10169585A EP2276079A3 (en) | 2009-07-15 | 2010-07-15 | Nitride-based semiconductor light emitting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009166924A JP4905514B2 (ja) | 2009-07-15 | 2009-07-15 | 窒化物系半導体発光素子 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012003323A Division JP2012094896A (ja) | 2012-01-11 | 2012-01-11 | 窒化物系半導体発光素子 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011023524A JP2011023524A (ja) | 2011-02-03 |
JP4905514B2 true JP4905514B2 (ja) | 2012-03-28 |
Family
ID=43012777
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009166924A Active JP4905514B2 (ja) | 2009-07-15 | 2009-07-15 | 窒化物系半導体発光素子 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8174035B2 (ja) |
EP (1) | EP2276079A3 (ja) |
JP (1) | JP4905514B2 (ja) |
KR (1) | KR101216342B1 (ja) |
CN (1) | CN101958386A (ja) |
TW (1) | TW201115787A (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5139555B2 (ja) * | 2011-04-22 | 2013-02-06 | 住友電気工業株式会社 | 窒化物半導体レーザ、及びエピタキシャル基板 |
DE102017119931A1 (de) * | 2017-08-30 | 2019-02-28 | Osram Opto Semiconductors Gmbh | Optoelektronisches Halbleiterbauelement |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3955367B2 (ja) | 1997-09-30 | 2007-08-08 | フィリップス ルミレッズ ライティング カンパニー リミテッド ライアビリティ カンパニー | 光半導体素子およびその製造方法 |
JP2001339121A (ja) * | 2000-05-29 | 2001-12-07 | Sharp Corp | 窒化物半導体発光素子とそれを含む光学装置 |
JP4416297B2 (ja) * | 2000-09-08 | 2010-02-17 | シャープ株式会社 | 窒化物半導体発光素子、ならびにそれを使用した発光装置および光ピックアップ装置 |
US6734530B2 (en) | 2001-06-06 | 2004-05-11 | Matsushita Electric Industries Co., Ltd. | GaN-based compound semiconductor EPI-wafer and semiconductor element using the same |
TW502438B (en) | 2001-07-23 | 2002-09-11 | Uni Light Technology Inc | Semiconductor device with ohmic contact and method for producing the same |
TWI262606B (en) | 2001-08-30 | 2006-09-21 | Osram Opto Semiconductors Gmbh | Radiation-emitting semiconductor-element and its production method |
ATE418806T1 (de) * | 2004-04-02 | 2009-01-15 | Nichia Corp | Nitrid-halbleiterlaservorrichtung |
JP4301136B2 (ja) * | 2004-10-18 | 2009-07-22 | サンケン電気株式会社 | 半導体発光素子およびその製造方法 |
US7751455B2 (en) | 2004-12-14 | 2010-07-06 | Palo Alto Research Center Incorporated | Blue and green laser diodes with gallium nitride or indium gallium nitride cladding laser structure |
TWI453813B (zh) * | 2005-03-10 | 2014-09-21 | Univ California | 用於生長平坦半極性的氮化鎵之技術 |
JP2008258503A (ja) | 2007-04-06 | 2008-10-23 | Sumitomo Electric Ind Ltd | 窒化物系半導体発光素子、および窒化物系半導体発光素子を作製する方法 |
JP2009016467A (ja) * | 2007-07-03 | 2009-01-22 | Sony Corp | 窒化ガリウム系半導体素子及びこれを用いた光学装置並びにこれを用いた画像表示装置 |
JP2009021361A (ja) | 2007-07-11 | 2009-01-29 | Sumitomo Electric Ind Ltd | 窒化物系半導体発光素子、および窒化物系半導体発光素子を作製する方法 |
JP2009081374A (ja) * | 2007-09-27 | 2009-04-16 | Rohm Co Ltd | 半導体発光素子 |
JP2009081336A (ja) * | 2007-09-27 | 2009-04-16 | Sanyo Electric Co Ltd | 窒化物系半導体レーザ素子およびその製造方法 |
JP2010016092A (ja) * | 2008-07-02 | 2010-01-21 | Sharp Corp | 窒化物系半導体発光素子 |
JP2010118647A (ja) * | 2008-10-17 | 2010-05-27 | Sumitomo Electric Ind Ltd | 窒化物系半導体発光素子、窒化物系半導体発光素子を作製する方法、及び発光装置 |
-
2009
- 2009-07-15 JP JP2009166924A patent/JP4905514B2/ja active Active
-
2010
- 2010-07-13 KR KR1020100067490A patent/KR101216342B1/ko not_active IP Right Cessation
- 2010-07-14 US US12/836,090 patent/US8174035B2/en active Active
- 2010-07-15 CN CN2010102313676A patent/CN101958386A/zh active Pending
- 2010-07-15 EP EP10169585A patent/EP2276079A3/en not_active Withdrawn
- 2010-07-15 TW TW099123322A patent/TW201115787A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
KR20110007046A (ko) | 2011-01-21 |
TW201115787A (en) | 2011-05-01 |
US20110012126A1 (en) | 2011-01-20 |
EP2276079A3 (en) | 2011-07-06 |
EP2276079A2 (en) | 2011-01-19 |
CN101958386A (zh) | 2011-01-26 |
JP2011023524A (ja) | 2011-02-03 |
US8174035B2 (en) | 2012-05-08 |
KR101216342B1 (ko) | 2012-12-27 |
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