JP4847568B2 - Ｘ線撮像装置およびｘ線撮像方法 - Google Patents

Ｘ線撮像装置およびｘ線撮像方法 Download PDF

Info

Publication number
JP4847568B2
JP4847568B2 JP2009215757A JP2009215757A JP4847568B2 JP 4847568 B2 JP4847568 B2 JP 4847568B2 JP 2009215757 A JP2009215757 A JP 2009215757A JP 2009215757 A JP2009215757 A JP 2009215757A JP 4847568 B2 JP4847568 B2 JP 4847568B2
Authority
JP
Japan
Prior art keywords
ray
attenuation
rays
intensity
ray imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2009215757A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011011039A (ja
Inventor
大平 向出
一徳 福田
壮俊 渡邉
一広 高田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2009215757A priority Critical patent/JP4847568B2/ja
Publication of JP2011011039A publication Critical patent/JP2011011039A/ja
Application granted granted Critical
Publication of JP4847568B2 publication Critical patent/JP4847568B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Pulmonology (AREA)
  • Veterinary Medicine (AREA)
  • Animal Behavior & Ethology (AREA)
  • Surgery (AREA)
  • Theoretical Computer Science (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Optics & Photonics (AREA)
  • Biomedical Technology (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2009215757A 2008-10-24 2009-09-17 Ｘ線撮像装置およびｘ線撮像方法 Expired - Fee Related JP4847568B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009215757A JP4847568B2 (ja) 2008-10-24 2009-09-17 Ｘ線撮像装置およびｘ線撮像方法

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2008273859 2008-10-24
JP2008273859 2008-10-24
JP2009132096 2009-06-01
JP2009132096 2009-06-01
JP2009215757A JP4847568B2 (ja) 2008-10-24 2009-09-17 Ｘ線撮像装置およびｘ線撮像方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011224935A Division JP5389138B2 (ja) 2008-10-24 2011-10-12 Ｘ線撮像装置およびｘ線撮像方法

Publications (2)

Publication Number Publication Date
JP2011011039A JP2011011039A (ja) 2011-01-20
JP4847568B2 true JP4847568B2 (ja) 2011-12-28

Family

ID=42119789

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2009215757A Expired - Fee Related JP4847568B2 (ja) 2008-10-24 2009-09-17 Ｘ線撮像装置およびｘ線撮像方法
JP2011224935A Expired - Fee Related JP5389138B2 (ja) 2008-10-24 2011-10-12 Ｘ線撮像装置およびｘ線撮像方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2011224935A Expired - Fee Related JP5389138B2 (ja) 2008-10-24 2011-10-12 Ｘ線撮像装置およびｘ線撮像方法

Country Status (8)

Country Link
US (1) US8588366B2 (enExample)
EP (1) EP2350622A2 (enExample)
JP (2) JP4847568B2 (enExample)
KR (1) KR101318221B1 (enExample)
CN (1) CN102187207B (enExample)
BR (1) BRPI0919643A2 (enExample)
RU (1) RU2467355C1 (enExample)
WO (1) WO2010047401A2 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010082688A2 (en) * 2009-01-15 2010-07-22 Canon Kabushiki Kaisha X-ray imaging apparatus and method of x-ray imaging
GB2479329B (en) * 2009-01-15 2013-08-14 Canon Kk X-ray imaging apparatus and method of X-ray imaging
JP5675169B2 (ja) 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5733908B2 (ja) 2010-04-27 2015-06-10 キヤノン株式会社 Ｘ線撮像装置
JP5610885B2 (ja) * 2010-07-12 2014-10-22 キヤノン株式会社 Ｘ線撮像装置および撮像方法
JP5646906B2 (ja) 2010-08-06 2014-12-24 キヤノン株式会社 Ｘ線装置およびｘ線測定方法
GB201119257D0 (en) * 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
WO2013160153A1 (de) * 2012-04-24 2013-10-31 Siemens Aktiengesellschaft Röntgenvorrichtung
WO2013183469A1 (en) * 2012-06-07 2013-12-12 Canon Kabushiki Kaisha X-ray device and x-ray measurement method
RU2530300C1 (ru) * 2013-02-21 2014-10-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Тамбовский государственный технический университет" ФГБОУ ВПО ТГТУ Способ повышения качества структурного изображения биообъекта в оптической когерентной томографии
RU2572045C2 (ru) * 2013-12-03 2015-12-27 Федеральное государственное бюджетное учреждение науки Институт ядерной физики им. Г.И. Будкера Сибирского отделения РАН (ИЯФ СО РАН) Преломляющая рентгеновская линза
JP6292988B2 (ja) 2014-06-12 2018-03-14 キヤノン株式会社 物体情報取得方法及び物体情報取得装置
CN105223212B (zh) * 2014-06-25 2019-02-22 同方威视技术股份有限公司 安检ct系统及其方法
CN111465840A (zh) * 2017-10-18 2020-07-28 Ka影像公司 用于相衬x射线成像的高分辨率x射线探测的方法和系统
MX2020002223A (es) 2017-10-20 2020-12-09 Australian Nuclear Science & Tech Org Sistema y metodo de formacion compresiva de imagenes.
CN114930162A (zh) * 2020-02-27 2022-08-19 深圳帧观德芯科技有限公司 相位对比成像法
CN111610206B (zh) * 2020-06-23 2021-03-30 中国科学院高能物理研究所 一种相干x光保护、监测与智能衰减一体化集成装置
CN114354659B (zh) * 2021-12-21 2024-01-09 昆山善思光电科技有限公司 一种x光射线光源在x光机检测仪中的衰减检测方法
PL447847A1 (pl) * 2024-02-23 2025-08-25 Pid Polska Spółka Z Ograniczoną Odpowiedzialnością System detektora i układu przeciwrozproszeniowego promieniowania X zwłaszcza do skanerów cargo z akceleratorem liniowym

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE347859B (enExample) * 1970-11-30 1972-08-14 Medinova Ab
US4481419A (en) * 1981-10-29 1984-11-06 Siemens Gammasonics, Inc. Attenuation zone plate
JPH08211518A (ja) * 1995-02-07 1996-08-20 Toshiba Corp 放射線検出器及びｘ線撮影装置
RU2115943C1 (ru) * 1997-01-16 1998-07-20 Виктор Натанович Ингал Способ фазовой рентгенографии объектов и устройство для его осуществления (варианты)
JP2002102215A (ja) * 2000-09-27 2002-04-09 Konica Corp 乳房ｘ画像撮影装置
JP2003010162A (ja) 2001-07-04 2003-01-14 Nagata Seiki Co Ltd 位相コントラストｘ線撮像装置
JP2004317299A (ja) * 2003-04-16 2004-11-11 Univ Tokyo Ｘ線減衰部材、ｘ線減衰方法、ｘａｆｓ実験装置及びｘａｆｓ測定方法
WO2005009206A2 (en) * 2003-06-25 2005-02-03 Besson Guy M Dynamic multi-spectral imaging system
US7272208B2 (en) * 2004-09-21 2007-09-18 Ge Medical Systems Global Technology Company, Llc System and method for an adaptive morphology x-ray beam in an x-ray system
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
DE102006063048B3 (de) * 2006-02-01 2018-03-29 Siemens Healthcare Gmbh Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen
DE102006017291B4 (de) * 2006-02-01 2017-05-24 Paul Scherer Institut Fokus/Detektor-System einer Röntgenapparatur zur Erzeugung von Phasenkontrastaufnahmen, Röntgensystem mit einem solchen Fokus/Detektor-System sowie zugehöriges Speichermedium und Verfahren
WO2007125833A1 (ja) * 2006-04-24 2007-11-08 The University Of Tokyo Ｘ線撮像装置及びｘ線撮像方法
GB2441578A (en) * 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
JP4512660B2 (ja) * 2008-03-12 2010-07-28 キヤノン株式会社 Ｘ線撮像装置、ｘ線撮像方法、ｘ線撮像装置の制御方法
GB2479329B (en) * 2009-01-15 2013-08-14 Canon Kk X-ray imaging apparatus and method of X-ray imaging

Also Published As

Publication number Publication date
KR101318221B1 (ko) 2013-10-15
BRPI0919643A2 (pt) 2015-12-08
CN102187207A (zh) 2011-09-14
US8588366B2 (en) 2013-11-19
JP2011011039A (ja) 2011-01-20
WO2010047401A2 (en) 2010-04-29
CN102187207B (zh) 2014-04-02
JP5389138B2 (ja) 2014-01-15
US20110158389A1 (en) 2011-06-30
EP2350622A2 (en) 2011-08-03
RU2467355C1 (ru) 2012-11-20
KR20110079722A (ko) 2011-07-07
WO2010047401A3 (en) 2011-05-26
JP2012045400A (ja) 2012-03-08

Similar Documents

Publication Publication Date Title
JP4847568B2 (ja) Ｘ線撮像装置およびｘ線撮像方法
JP6529968B2 (ja) Ｘ線格子位相コントラストイメージング装置及び方法
US8972191B2 (en) Low dose single step grating based X-ray phase contrast imaging
EP2442722B1 (en) Correction method for differential phase contrast imaging
Thüring et al. X-ray phase-contrast imaging at 100 keV on a conventional source
JP5111528B2 (ja) Ｘ線撮像装置およびｘ線撮像方法
JP7225432B2 (ja) 医療用透過ｘ線撮影におけるｘ線の操作に使用されるインラインｘ線集束光学系
JP5665834B2 (ja) Ｘ線撮像装置
JP2011041795A (ja) Ｘ線撮像装置およびｘ線撮像方法
Sun et al. Grating-free quantitative phase retrieval for x-ray phase-contrast imaging with conventional sources
Gullberg et al. X‐ray bi‐prism interferometry—A design study of proposed novel hardware
Wang Recent advances in X-ray grating-based dark-field imaging
Pyakurel Phase and dark field radiography and CT with mesh-based structured illumination and polycapillary optics
US20200011812A1 (en) Radiographic image generating device
JP2011232163A (ja) Ｘ線撮像装置
How et al. Single-exposure x-ray dark-field imaging: quantifying sample microstructure using a single-grid setup
Reunamo Augmenting Soft Tissue Contrast Using Phase-Contrast Techniques in Micro-Computed Tomography Imaging
Hayden Mesh-Based Fourier Imaging for Biological and Security Applications
JP2020038153A (ja) 放射線画像生成装置
Haibel Synchrotron Tomography

Legal Events

Date Code Title Description
A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20110812

TRDD Decision of grant or rejection written
A975 Report on accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A971005

Effective date: 20110906

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110913

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20111013

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20141021

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20141021

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees