CN102187207B - X射线成像装置和x射线成像方法 - Google Patents

X射线成像装置和x射线成像方法 Download PDF

Info

Publication number
CN102187207B
CN102187207B CN200980141289.6A CN200980141289A CN102187207B CN 102187207 B CN102187207 B CN 102187207B CN 200980141289 A CN200980141289 A CN 200980141289A CN 102187207 B CN102187207 B CN 102187207B
Authority
CN
China
Prior art keywords
ray
rays
intensity
unit
attenuating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN200980141289.6A
Other languages
English (en)
Chinese (zh)
Other versions
CN102187207A (zh
Inventor
向出大平
高田一广
福田一德
渡边壮俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN102187207A publication Critical patent/CN102187207A/zh
Application granted granted Critical
Publication of CN102187207B publication Critical patent/CN102187207B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/032—Transmission computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Molecular Biology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Pulmonology (AREA)
  • Veterinary Medicine (AREA)
  • Animal Behavior & Ethology (AREA)
  • Surgery (AREA)
  • Theoretical Computer Science (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Optics & Photonics (AREA)
  • Biomedical Technology (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
CN200980141289.6A 2008-10-24 2009-10-19 X射线成像装置和x射线成像方法 Expired - Fee Related CN102187207B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2008273859 2008-10-24
JP2008-273859 2008-10-24
JP2009-132096 2009-06-01
JP2009132096 2009-06-01
PCT/JP2009/068297 WO2010047401A2 (en) 2008-10-24 2009-10-19 X-ray imaging apparatus and x-ray imaging method

Publications (2)

Publication Number Publication Date
CN102187207A CN102187207A (zh) 2011-09-14
CN102187207B true CN102187207B (zh) 2014-04-02

Family

ID=42119789

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200980141289.6A Expired - Fee Related CN102187207B (zh) 2008-10-24 2009-10-19 X射线成像装置和x射线成像方法

Country Status (8)

Country Link
US (1) US8588366B2 (enExample)
EP (1) EP2350622A2 (enExample)
JP (2) JP4847568B2 (enExample)
KR (1) KR101318221B1 (enExample)
CN (1) CN102187207B (enExample)
BR (1) BRPI0919643A2 (enExample)
RU (1) RU2467355C1 (enExample)
WO (1) WO2010047401A2 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010082688A2 (en) * 2009-01-15 2010-07-22 Canon Kabushiki Kaisha X-ray imaging apparatus and method of x-ray imaging
GB2479329B (en) * 2009-01-15 2013-08-14 Canon Kk X-ray imaging apparatus and method of X-ray imaging
JP5675169B2 (ja) 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5733908B2 (ja) 2010-04-27 2015-06-10 キヤノン株式会社 Ｘ線撮像装置
JP5610885B2 (ja) * 2010-07-12 2014-10-22 キヤノン株式会社 Ｘ線撮像装置および撮像方法
JP5646906B2 (ja) 2010-08-06 2014-12-24 キヤノン株式会社 Ｘ線装置およびｘ線測定方法
GB201119257D0 (en) * 2011-11-08 2011-12-21 Eshtech Ltd X-ray detection apparatus
WO2013160153A1 (de) * 2012-04-24 2013-10-31 Siemens Aktiengesellschaft Röntgenvorrichtung
WO2013183469A1 (en) * 2012-06-07 2013-12-12 Canon Kabushiki Kaisha X-ray device and x-ray measurement method
RU2530300C1 (ru) * 2013-02-21 2014-10-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Тамбовский государственный технический университет" ФГБОУ ВПО ТГТУ Способ повышения качества структурного изображения биообъекта в оптической когерентной томографии
RU2572045C2 (ru) * 2013-12-03 2015-12-27 Федеральное государственное бюджетное учреждение науки Институт ядерной физики им. Г.И. Будкера Сибирского отделения РАН (ИЯФ СО РАН) Преломляющая рентгеновская линза
JP6292988B2 (ja) 2014-06-12 2018-03-14 キヤノン株式会社 物体情報取得方法及び物体情報取得装置
CN105223212B (zh) * 2014-06-25 2019-02-22 同方威视技术股份有限公司 安检ct系统及其方法
CN111465840A (zh) * 2017-10-18 2020-07-28 Ka影像公司 用于相衬x射线成像的高分辨率x射线探测的方法和系统
MX2020002223A (es) 2017-10-20 2020-12-09 Australian Nuclear Science & Tech Org Sistema y metodo de formacion compresiva de imagenes.
CN114930162A (zh) * 2020-02-27 2022-08-19 深圳帧观德芯科技有限公司 相位对比成像法
CN111610206B (zh) * 2020-06-23 2021-03-30 中国科学院高能物理研究所 一种相干x光保护、监测与智能衰减一体化集成装置
CN114354659B (zh) * 2021-12-21 2024-01-09 昆山善思光电科技有限公司 一种x光射线光源在x光机检测仪中的衰减检测方法
PL447847A1 (pl) * 2024-02-23 2025-08-25 Pid Polska Spółka Z Ograniczoną Odpowiedzialnością System detektora i układu przeciwrozproszeniowego promieniowania X zwłaszcza do skanerów cargo z akceleratorem liniowym

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3755672A (en) * 1970-11-30 1973-08-28 Medinova Ab So Exposure compensating device for radiographic apparatus
JP2002102215A (ja) * 2000-09-27 2002-04-09 Konica Corp 乳房ｘ画像撮影装置
CN101011254A (zh) * 2006-02-01 2007-08-08 西门子公司 用于产生相位对比图像的x射线装置的焦点/检测器系统
US20070183580A1 (en) * 2006-02-01 2007-08-09 Stefan Popescu Focus/detector system of an x-ray apparatus for generating phase contrast recordings
WO2008029107A2 (en) * 2006-09-08 2008-03-13 Ucl Business Plc Phase contrast imaging

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4481419A (en) * 1981-10-29 1984-11-06 Siemens Gammasonics, Inc. Attenuation zone plate
JPH08211518A (ja) * 1995-02-07 1996-08-20 Toshiba Corp 放射線検出器及びｘ線撮影装置
RU2115943C1 (ru) * 1997-01-16 1998-07-20 Виктор Натанович Ингал Способ фазовой рентгенографии объектов и устройство для его осуществления (варианты)
JP2003010162A (ja) 2001-07-04 2003-01-14 Nagata Seiki Co Ltd 位相コントラストｘ線撮像装置
JP2004317299A (ja) * 2003-04-16 2004-11-11 Univ Tokyo Ｘ線減衰部材、ｘ線減衰方法、ｘａｆｓ実験装置及びｘａｆｓ測定方法
WO2005009206A2 (en) * 2003-06-25 2005-02-03 Besson Guy M Dynamic multi-spectral imaging system
US7272208B2 (en) * 2004-09-21 2007-09-18 Ge Medical Systems Global Technology Company, Llc System and method for an adaptive morphology x-ray beam in an x-ray system
EP1731099A1 (en) * 2005-06-06 2006-12-13 Paul Scherrer Institut Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
WO2007125833A1 (ja) * 2006-04-24 2007-11-08 The University Of Tokyo Ｘ線撮像装置及びｘ線撮像方法
JP4512660B2 (ja) * 2008-03-12 2010-07-28 キヤノン株式会社 Ｘ線撮像装置、ｘ線撮像方法、ｘ線撮像装置の制御方法
GB2479329B (en) * 2009-01-15 2013-08-14 Canon Kk X-ray imaging apparatus and method of X-ray imaging

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3755672A (en) * 1970-11-30 1973-08-28 Medinova Ab So Exposure compensating device for radiographic apparatus
JP2002102215A (ja) * 2000-09-27 2002-04-09 Konica Corp 乳房ｘ画像撮影装置
CN101011254A (zh) * 2006-02-01 2007-08-08 西门子公司 用于产生相位对比图像的x射线装置的焦点/检测器系统
US20070183580A1 (en) * 2006-02-01 2007-08-09 Stefan Popescu Focus/detector system of an x-ray apparatus for generating phase contrast recordings
WO2008029107A2 (en) * 2006-09-08 2008-03-13 Ucl Business Plc Phase contrast imaging

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
JP特开2002-102215A 2002.04.09

Also Published As

Publication number Publication date
KR101318221B1 (ko) 2013-10-15
BRPI0919643A2 (pt) 2015-12-08
CN102187207A (zh) 2011-09-14
US8588366B2 (en) 2013-11-19
JP2011011039A (ja) 2011-01-20
WO2010047401A2 (en) 2010-04-29
JP5389138B2 (ja) 2014-01-15
US20110158389A1 (en) 2011-06-30
JP4847568B2 (ja) 2011-12-28
EP2350622A2 (en) 2011-08-03
RU2467355C1 (ru) 2012-11-20
KR20110079722A (ko) 2011-07-07
WO2010047401A3 (en) 2011-05-26
JP2012045400A (ja) 2012-03-08

Similar Documents

Publication Publication Date Title
CN102187207B (zh) X射线成像装置和x射线成像方法
US9234856B2 (en) X-ray apparatus and X-ray measuring method
US8036336B2 (en) X-ray imaging apparatus, X-ray imaging method and method of controlling X-ray imaging apparatus
US9103923B2 (en) X-ray imaging apparatus and X-ray imaging method
CN102272860B (zh) X射线成像装置和x射线成像方法
JP2010502977A (ja) 位相コントラスト画像形成
JP2012200567A (ja) 放射線撮影システム及び放射線撮影方法
JP5665834B2 (ja) Ｘ線撮像装置
JP2012125423A (ja) 放射線画像検出装置、放射線撮影装置、放射線撮影システム
WO2019171920A1 (ja) 放射線位相撮像装置
JP5733908B2 (ja) Ｘ線撮像装置
JP2014012132A (ja) Ｘ線装置およびｘ線測定方法
JP5610885B2 (ja) Ｘ線撮像装置および撮像方法
Pyakurel Phase and dark field radiography and CT with mesh-based structured illumination and polycapillary optics
WO2017175364A1 (ja) Ｘ線撮像装置
WO2012057045A1 (ja) 放射線撮影装置、放射線撮影システム
Hayden Mesh-Based Fourier Imaging for Biological and Security Applications

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140402

Termination date: 20161019

CF01 Termination of patent right due to non-payment of annual fee