JP4794290B2 - 実時間試験測定装置及び変調領域トリガ発生器 - Google Patents
実時間試験測定装置及び変調領域トリガ発生器 Download PDFInfo
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- JP4794290B2 JP4794290B2 JP2005355436A JP2005355436A JP4794290B2 JP 4794290 B2 JP4794290 B2 JP 4794290B2 JP 2005355436 A JP2005355436 A JP 2005355436A JP 2005355436 A JP2005355436 A JP 2005355436A JP 4794290 B2 JP4794290 B2 JP 4794290B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0218—Circuits therefor
- G01R13/0254—Circuits therefor for triggering, synchronisation
- G01R13/0263—Circuits therefor for triggering, synchronisation for non-recurrent functions, e.g. transients
Description
20 高速フーリエ変換(FFT)モジュール
22 周波数マスク・トリガ判断部
24 振幅検出モジュール
26 包絡線トリガ判断モジュール
28 周波数変調(FM)復調モジュール
30 FMトリガ判断モジュール
32 コンスタレーション・シンボル発生モジュール
34 QAMトリガ判断モジュール
36 CDMA符号領域復調モジュール
38 CDMAトリガ判断モジュール
40 OFDMシンボル復調モジュール
42 OFDMトリガ判断モジュール
44 ロジック回路
50 RF信号調整回路
52 局部発振器
54 混合器
56 中間周波数フィルタ
58 アナログ・デジタル変換器
60 中間周波数振幅/位相補正回路
62 直交信号発生器
64 トリガ発生器
66 蓄積メモリ
68 メモリ制御器
Claims (1)
- 時間領域トリガ信号、周波数領域トリガ信号及び変調領域トリガ信号を出力信号として夫々供給する複数のトリガ発生器と、
複数の上記トリガ発生器の上記出力信号から複数の上記トリガ発生器の上記出力信号の所望の組み合わせを選択し、取込みトリガ信号を生成するロジック回路と、
上記取込みトリガ信号に応じて変調入力信号から異常事象又は確認事象を囲むデータを取り込むメモリとを具え、
複数の上記トリガ発生器の1つが変調領域トリガ発生器であって、
特定の変調規格に応じて上記変調入力信号を復調して、情報内容を表すデータを求める復調モジュールと、
上記異常事象又は上記確認事象の発生について上記情報内容を分析し、上記異常事象又は上記確認事象の発生に応じて上記変調領域トリガ信号を出力信号として発生するトリガ判断モジュールとを有する
ことを特徴とする実時間試験測定装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/009,161 | 2004-12-09 | ||
US11/009,161 US7765086B2 (en) | 2004-12-09 | 2004-12-09 | Modulation domain trigger |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006186994A JP2006186994A (ja) | 2006-07-13 |
JP4794290B2 true JP4794290B2 (ja) | 2011-10-19 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005355436A Active JP4794290B2 (ja) | 2004-12-09 | 2005-12-08 | 実時間試験測定装置及び変調領域トリガ発生器 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7765086B2 (ja) |
EP (1) | EP1669764B1 (ja) |
JP (1) | JP4794290B2 (ja) |
DE (1) | DE602005011236D1 (ja) |
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US8233569B2 (en) * | 2006-09-28 | 2012-07-31 | Tektronix, Inc. | Realtime spectrum trigger system on realtime oscilloscope |
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US20080205557A1 (en) * | 2007-02-27 | 2008-08-28 | Tektronix, Inc. | Systems and Methods for Performing External Correction |
US7816904B2 (en) * | 2007-10-09 | 2010-10-19 | Tektronix, Inc. | Modulation signature trigger |
US20090281758A1 (en) * | 2008-05-08 | 2009-11-12 | Lecroy Corporation | Method and Apparatus for Triggering a Test and Measurement Instrument |
US8386208B2 (en) * | 2008-05-08 | 2013-02-26 | Teledyne Lecroy, Inc. | Method and apparatus for trigger scanning |
US8190392B2 (en) * | 2008-05-08 | 2012-05-29 | Lecroy Corporation | Method and apparatus for multiple trigger path triggering |
EP2192414A1 (en) * | 2008-12-01 | 2010-06-02 | Mitsubishi Electric R&D Centre Europe B.V. | Detection of sinusoidal waveform in noise |
DE102009013617A1 (de) | 2009-01-13 | 2010-08-05 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren und Vorrichtung zur signal- bzw. spektralangepassten Selektion von Signal- bzw. Spektralabschnitten |
JP5037598B2 (ja) * | 2009-12-18 | 2012-09-26 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | 信号分析装置用トリガ生成装置及び方法 |
US8452571B2 (en) * | 2010-03-16 | 2013-05-28 | Tektronix, Inc | Trigger figure-of-merit indicator |
US9164131B2 (en) * | 2010-05-13 | 2015-10-20 | Tektronix, Inc. | Signal recognition and triggering using computer vision techniques |
US9297834B2 (en) * | 2010-08-13 | 2016-03-29 | Tektronix, Inc. | Time-domain searching in a test and measurement instrument |
US8649989B2 (en) * | 2010-08-13 | 2014-02-11 | Tektronix, Inc. | Time-domain triggering in a test and measurement instrument |
US8521460B2 (en) * | 2010-09-28 | 2013-08-27 | Tektronix, Inc. | Multi-domain test and measurement instrument |
US8675719B2 (en) | 2010-09-28 | 2014-03-18 | Tektronix, Inc. | Multi-domain test and measurement instrument |
US8866468B2 (en) * | 2011-01-27 | 2014-10-21 | Tektronix, Inc. | DF/dT trigger system and method |
EP2520941B1 (en) * | 2011-04-27 | 2015-03-04 | Tektronix, Inc. | Trigger figure-of-merit indicator |
CN102932287B (zh) * | 2011-08-11 | 2017-04-19 | 特克特朗尼克公司 | 测试和测量仪器中的时域搜索 |
US9291646B2 (en) * | 2012-07-27 | 2016-03-22 | Tektronix, Inc. | Cross domain triggering in a test and measurement instrument |
US9772353B2 (en) | 2013-06-04 | 2017-09-26 | Tektronix, Inc. | Equivalent-time sampling technique for non-coherently modulated signals |
CN107543965B (zh) * | 2017-09-04 | 2020-09-18 | 中国电子科技集团公司第四十一研究所 | 一种iq数据分析处理系统、信号分析仪及方法 |
US10547490B1 (en) | 2018-08-03 | 2020-01-28 | Rohde & Schwarz Gmbh & Co. Kg | Digital triggering system as well as method for processing data |
JP7410070B2 (ja) | 2021-03-17 | 2024-01-09 | アンリツ株式会社 | 信号解析装置、及び信号解析結果表示方法 |
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JPH05340969A (ja) * | 1992-06-11 | 1993-12-24 | Hitachi Denshi Ltd | デジタルオシロスコープ |
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2004
- 2004-12-09 US US11/009,161 patent/US7765086B2/en active Active
-
2005
- 2005-12-02 EP EP05257440A patent/EP1669764B1/en active Active
- 2005-12-02 DE DE602005011236T patent/DE602005011236D1/de active Active
- 2005-12-08 JP JP2005355436A patent/JP4794290B2/ja active Active
Also Published As
Publication number | Publication date |
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JP2006186994A (ja) | 2006-07-13 |
EP1669764B1 (en) | 2008-11-26 |
US7765086B2 (en) | 2010-07-27 |
EP1669764A1 (en) | 2006-06-14 |
US20060129355A1 (en) | 2006-06-15 |
DE602005011236D1 (de) | 2009-01-08 |
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