JP4746808B2 - 露光制御付きx線診断装置 - Google Patents
露光制御付きx線診断装置 Download PDFInfo
- Publication number
- JP4746808B2 JP4746808B2 JP2001540572A JP2001540572A JP4746808B2 JP 4746808 B2 JP4746808 B2 JP 4746808B2 JP 2001540572 A JP2001540572 A JP 2001540572A JP 2001540572 A JP2001540572 A JP 2001540572A JP 4746808 B2 JP4746808 B2 JP 4746808B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- exposure
- test
- during
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/30—Controlling
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/48—Diagnostic techniques
- A61B6/488—Diagnostic techniques involving pre-scan acquisition
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/54—Control of apparatus or devices for radiation diagnosis
- A61B6/542—Control of apparatus or devices for radiation diagnosis involving control of exposure
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/30—Controlling
- H05G1/38—Exposure time
- H05G1/42—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/30—Controlling
- H05G1/38—Exposure time
- H05G1/42—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube
- H05G1/44—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube in which the switching instant is determined by measuring the amount of radiation directly
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/30—Controlling
- H05G1/46—Combined control of different quantities, e.g. exposure time as well as voltage or current
Landscapes
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Medical Informatics (AREA)
- Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Radiology & Medical Imaging (AREA)
- Molecular Biology (AREA)
- Optics & Photonics (AREA)
- Pathology (AREA)
- Physics & Mathematics (AREA)
- Biomedical Technology (AREA)
- Heart & Thoracic Surgery (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Surgery (AREA)
- Animal Behavior & Ethology (AREA)
- High Energy & Nuclear Physics (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Biophysics (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP99203923.0 | 1999-11-23 | ||
| EP99203923 | 1999-11-23 | ||
| PCT/EP2000/010727 WO2001039558A1 (en) | 1999-11-23 | 2000-10-30 | X-ray examination apparatus with exposure control |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2003515366A JP2003515366A (ja) | 2003-05-07 |
| JP2003515366A5 JP2003515366A5 (https=) | 2011-01-06 |
| JP4746808B2 true JP4746808B2 (ja) | 2011-08-10 |
Family
ID=26075893
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001540572A Expired - Fee Related JP4746808B2 (ja) | 1999-11-23 | 2000-10-30 | 露光制御付きx線診断装置 |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP1151645B1 (https=) |
| JP (1) | JP4746808B2 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1850754B1 (en) * | 2005-02-11 | 2013-11-06 | Koninklijke Philips N.V. | Dose rate control in an x-ray system |
| US9615803B2 (en) | 2014-06-16 | 2017-04-11 | General Electric Company | System and method for determining X-ray exposure parameters |
| US9610057B2 (en) | 2014-06-16 | 2017-04-04 | General Electric Company | System and method for determining X-ray exposure parameters |
| KR101848408B1 (ko) * | 2016-10-14 | 2018-04-16 | 주식회사 뷰웍스 | 디텍터 센서를 이용한 자동 노출 제어 장치 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5262871A (en) * | 1989-11-13 | 1993-11-16 | Rutgers, The State University | Multiple resolution image sensor |
| JPH07153592A (ja) * | 1993-09-10 | 1995-06-16 | Siemens Ag | 自動x線露光装置の作動方法および自動x線露光装置 |
| JPH08111296A (ja) * | 1994-09-30 | 1996-04-30 | Siemens Ag | 固体イメージセンサ付x線診断装置及び該装置の作動方法 |
| JPH08206102A (ja) * | 1993-11-26 | 1996-08-13 | Philips Electron Nv | X線診断装置 |
| JPH0937159A (ja) * | 1995-07-07 | 1997-02-07 | Siemens Ag | 画像検出器 |
| JPH09197051A (ja) * | 1995-11-21 | 1997-07-31 | Loral Fairchild Corp | Ccdベースのx線イメージセンサシステム |
| JPH10308899A (ja) * | 1997-05-09 | 1998-11-17 | Hitachi Medical Corp | X線装置 |
| WO1999033258A1 (en) * | 1997-12-18 | 1999-07-01 | Simage Oy | Device for imaging radiation |
-
2000
- 2000-10-30 JP JP2001540572A patent/JP4746808B2/ja not_active Expired - Fee Related
- 2000-10-30 EP EP00969573A patent/EP1151645B1/en not_active Expired - Lifetime
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5262871A (en) * | 1989-11-13 | 1993-11-16 | Rutgers, The State University | Multiple resolution image sensor |
| JPH07153592A (ja) * | 1993-09-10 | 1995-06-16 | Siemens Ag | 自動x線露光装置の作動方法および自動x線露光装置 |
| JPH08206102A (ja) * | 1993-11-26 | 1996-08-13 | Philips Electron Nv | X線診断装置 |
| JPH08111296A (ja) * | 1994-09-30 | 1996-04-30 | Siemens Ag | 固体イメージセンサ付x線診断装置及び該装置の作動方法 |
| JPH0937159A (ja) * | 1995-07-07 | 1997-02-07 | Siemens Ag | 画像検出器 |
| JPH09197051A (ja) * | 1995-11-21 | 1997-07-31 | Loral Fairchild Corp | Ccdベースのx線イメージセンサシステム |
| JPH10308899A (ja) * | 1997-05-09 | 1998-11-17 | Hitachi Medical Corp | X線装置 |
| WO1999033258A1 (en) * | 1997-12-18 | 1999-07-01 | Simage Oy | Device for imaging radiation |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1151645B1 (en) | 2011-10-19 |
| JP2003515366A (ja) | 2003-05-07 |
| EP1151645A1 (en) | 2001-11-07 |
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