JP2003515366A5 - - Google Patents

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Publication number
JP2003515366A5
JP2003515366A5 JP2001540572A JP2001540572A JP2003515366A5 JP 2003515366 A5 JP2003515366 A5 JP 2003515366A5 JP 2001540572 A JP2001540572 A JP 2001540572A JP 2001540572 A JP2001540572 A JP 2001540572A JP 2003515366 A5 JP2003515366 A5 JP 2003515366A5
Authority
JP
Japan
Prior art keywords
ray
dose
voltage
control signal
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001540572A
Other languages
English (en)
Japanese (ja)
Other versions
JP4746808B2 (ja
JP2003515366A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2000/010727 external-priority patent/WO2001039558A1/en
Publication of JP2003515366A publication Critical patent/JP2003515366A/ja
Publication of JP2003515366A5 publication Critical patent/JP2003515366A5/ja
Application granted granted Critical
Publication of JP4746808B2 publication Critical patent/JP4746808B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2001540572A 1999-11-23 2000-10-30 露光制御付きｘ線診断装置 Expired - Fee Related JP4746808B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP99203923.0 1999-11-23
EP99203923 1999-11-23
PCT/EP2000/010727 WO2001039558A1 (en) 1999-11-23 2000-10-30 X-ray examination apparatus with exposure control

Publications (3)

Publication Number Publication Date
JP2003515366A JP2003515366A (ja) 2003-05-07
JP2003515366A5 true JP2003515366A5 (https=) 2011-01-06
JP4746808B2 JP4746808B2 (ja) 2011-08-10

Family

ID=26075893

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001540572A Expired - Fee Related JP4746808B2 (ja) 1999-11-23 2000-10-30 露光制御付きｘ線診断装置

Country Status (2)

Country Link
EP (1) EP1151645B1 (https=)
JP (1) JP4746808B2 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1850754B1 (en) * 2005-02-11 2013-11-06 Koninklijke Philips N.V. Dose rate control in an x-ray system
US9615803B2 (en) 2014-06-16 2017-04-11 General Electric Company System and method for determining X-ray exposure parameters
US9610057B2 (en) 2014-06-16 2017-04-04 General Electric Company System and method for determining X-ray exposure parameters
KR101848408B1 (ko) * 2016-10-14 2018-04-16 주식회사 뷰웍스 디텍터 센서를 이용한 자동 노출 제어 장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5262871A (en) * 1989-11-13 1993-11-16 Rutgers, The State University Multiple resolution image sensor
DE4330787A1 (de) * 1993-09-10 1995-03-23 Siemens Ag Verfahren zum Betrieb eines Röntgenbelichtungsautomaten
BE1007803A3 (nl) * 1993-11-26 1995-10-24 Philips Electronics Nv Beeldopneemapparaat.
DE4435105C2 (de) * 1994-09-30 2003-07-24 Siemens Ag Röntgendiagnostikeinrichtung mit einem Festkörperbildwandler und Verfahren zu deren Betrieb
DE19524857C2 (de) * 1995-07-07 1998-04-09 Siemens Ag Bilddetektor
US5693948A (en) * 1995-11-21 1997-12-02 Loral Fairchild Corporation Advanced CCD-based x-ray image sensor system
JP3670439B2 (ja) * 1997-05-09 2005-07-13 株式会社日立メディコ Ｘ線装置
GB2332800B (en) * 1997-12-18 2000-09-27 Simage Oy Device for imaging radiation

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