JP4692310B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP4692310B2
JP4692310B2 JP2006031813A JP2006031813A JP4692310B2 JP 4692310 B2 JP4692310 B2 JP 4692310B2 JP 2006031813 A JP2006031813 A JP 2006031813A JP 2006031813 A JP2006031813 A JP 2006031813A JP 4692310 B2 JP4692310 B2 JP 4692310B2
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JP
Japan
Prior art keywords
ions
ion trap
mass
ion
auxiliary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2006031813A
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English (en)
Japanese (ja)
Other versions
JP2007213944A (ja
JP2007213944A5 (enExample
Inventor
英樹 長谷川
雄一郎 橋本
泉 和氣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2006031813A priority Critical patent/JP4692310B2/ja
Priority to US11/653,859 priority patent/US7759641B2/en
Publication of JP2007213944A publication Critical patent/JP2007213944A/ja
Publication of JP2007213944A5 publication Critical patent/JP2007213944A5/ja
Application granted granted Critical
Publication of JP4692310B2 publication Critical patent/JP4692310B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0063—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2006031813A 2006-02-09 2006-02-09 質量分析装置 Expired - Fee Related JP4692310B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2006031813A JP4692310B2 (ja) 2006-02-09 2006-02-09 質量分析装置
US11/653,859 US7759641B2 (en) 2006-02-09 2007-01-17 Ion trap mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006031813A JP4692310B2 (ja) 2006-02-09 2006-02-09 質量分析装置

Publications (3)

Publication Number Publication Date
JP2007213944A JP2007213944A (ja) 2007-08-23
JP2007213944A5 JP2007213944A5 (enExample) 2008-11-20
JP4692310B2 true JP4692310B2 (ja) 2011-06-01

Family

ID=38333101

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006031813A Expired - Fee Related JP4692310B2 (ja) 2006-02-09 2006-02-09 質量分析装置

Country Status (2)

Country Link
US (1) US7759641B2 (enExample)
JP (1) JP4692310B2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0513047D0 (en) 2005-06-27 2005-08-03 Thermo Finnigan Llc Electronic ion trap
JP5124293B2 (ja) * 2008-01-11 2013-01-23 株式会社日立ハイテクノロジーズ 質量分析計および質量分析方法
JP5449701B2 (ja) * 2008-05-28 2014-03-19 株式会社日立ハイテクノロジーズ 質量分析計
US20110248157A1 (en) * 2008-10-14 2011-10-13 Masuyuki Sugiyama Mass spectrometer and mass spectrometry method
JP5303286B2 (ja) * 2009-01-21 2013-10-02 株式会社日立ハイテクノロジーズ 質量分析装置
US8168944B2 (en) * 2009-07-06 2012-05-01 Dh Technologies Development Pte. Ltd. Methods and systems for providing a substantially quadrupole field with a higher order component
DE102010013546B4 (de) * 2010-02-01 2013-07-25 Bruker Daltonik Gmbh Ionenmanipulationszelle mit maßgeschneiderten Potenzialprofilen
GB2477393B (en) * 2010-02-01 2014-09-03 Bruker Daltonik Gmbh Ion manipulation cell with tailored potential profile
GB201019337D0 (en) 2010-11-16 2010-12-29 Micromass Ltd Controlling hydrogen-deuterium exchange on a spectrum by spectrum basis
GB201104225D0 (en) * 2011-03-14 2011-04-27 Micromass Ltd Pre scan for mass to charge ratio range
GB201114735D0 (en) * 2011-08-25 2011-10-12 Micromass Ltd Mass spectrometer
WO2017079193A1 (en) 2015-11-02 2017-05-11 Purdue Research Foundation Precurson and neutral loss scan in an ion trap
US10026592B2 (en) 2016-07-01 2018-07-17 Lam Research Corporation Systems and methods for tailoring ion energy distribution function by odd harmonic mixing
GB2605395B (en) * 2021-03-30 2024-12-11 Thermo Fisher Scient Bremen Gmbh Ion trap

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT528250A (enExample) * 1953-12-24
US4540884A (en) * 1982-12-29 1985-09-10 Finnigan Corporation Method of mass analyzing a sample by use of a quadrupole ion trap
US5381007A (en) * 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5689111A (en) * 1995-08-10 1997-11-18 Analytica Of Branford, Inc. Ion storage time-of-flight mass spectrometer
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5783824A (en) * 1995-04-03 1998-07-21 Hitachi, Ltd. Ion trapping mass spectrometry apparatus
JP3495512B2 (ja) * 1996-07-02 2004-02-09 株式会社日立製作所 イオントラップ質量分析装置
WO1997007530A1 (en) * 1995-08-11 1997-02-27 Mds Health Group Limited Spectrometer with axial field
US5714755A (en) * 1996-03-01 1998-02-03 Varian Associates, Inc. Mass scanning method using an ion trap mass spectrometer
US6504148B1 (en) * 1999-05-27 2003-01-07 Mds Inc. Quadrupole mass spectrometer with ION traps to enhance sensitivity
US7049580B2 (en) * 2002-04-05 2006-05-23 Mds Inc. Fragmentation of ions by resonant excitation in a high order multipole field, low pressure ion trap
JP4690641B2 (ja) * 2003-07-28 2011-06-01 株式会社日立ハイテクノロジーズ 質量分析計
JP4223937B2 (ja) * 2003-12-16 2009-02-12 株式会社日立ハイテクノロジーズ 質量分析装置
JP4659395B2 (ja) * 2004-06-08 2011-03-30 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
GB0524042D0 (en) * 2005-11-25 2006-01-04 Micromass Ltd Mass spectrometer

Also Published As

Publication number Publication date
US7759641B2 (en) 2010-07-20
JP2007213944A (ja) 2007-08-23
US20070181803A1 (en) 2007-08-09

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