JP4690316B2 - 照準装置及び非接触で又は接触させて使用可能な測定装置 - Google Patents

照準装置及び非接触で又は接触させて使用可能な測定装置 Download PDF

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Publication number
JP4690316B2
JP4690316B2 JP2006515699A JP2006515699A JP4690316B2 JP 4690316 B2 JP4690316 B2 JP 4690316B2 JP 2006515699 A JP2006515699 A JP 2006515699A JP 2006515699 A JP2006515699 A JP 2006515699A JP 4690316 B2 JP4690316 B2 JP 4690316B2
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Japan
Prior art keywords
aiming
laser
optical
fan
axis
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Expired - Fee Related
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JP2006515699A
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English (en)
Japanese (ja)
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JP2007524073A (ja
Inventor
キーニッツ、ウルリヒ
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オプトリス ゲーエムベーハー
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Priority claimed from PCT/DE2004/001427 external-priority patent/WO2005005910A1/de
Publication of JP2007524073A publication Critical patent/JP2007524073A/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F41WEAPONS
    • F41GWEAPON SIGHTS; AIMING
    • F41G7/00Direction control systems for self-propelled missiles
    • F41G7/20Direction control systems for self-propelled missiles based on continuous observation of target position
    • F41G7/24Beam riding guidance systems
    • F41G7/26Optical guidance systems
    • F41G7/263Means for producing guidance beams
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/07Arrangements for adjusting the solid angle of collected radiation, e.g. adjusting or orienting field of view, tracking position or encoding angular position
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0803Arrangements for time-dependent attenuation of radiation signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0831Masks; Aperture plates; Spatial light modulators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0859Sighting arrangements, e.g. cameras
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0879Optical elements not provided otherwise, e.g. optical manifolds, holograms, cubic beamsplitters, non-dispersive prisms or particular coatings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0896Optical arrangements using a light source, e.g. for illuminating a surface

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • General Engineering & Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Telescopes (AREA)
  • Laser Surgery Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
JP2006515699A 2003-07-03 2004-07-05 照準装置及び非接触で又は接触させて使用可能な測定装置 Expired - Fee Related JP4690316B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
DE10330237.9 2003-07-03
DE10330237 2003-07-03
DE10335207A DE10335207A1 (de) 2003-07-03 2003-07-30 Visiereinrichtung und Vorrichtung mit einer kontaktlos oder kontaktbehaftet einsetzbaren Mess-, Arbeits- und/oder Wirkeinrichtung
DE10335207.4 2003-07-30
PCT/DE2004/001427 WO2005005910A1 (de) 2003-07-03 2004-07-05 Visiereinrichtung und vorrichtung mit einer kontaktlos oder kontaktbehaftet einsetzbaren mess-, arbeits- und/oder wirkeinrichtung

Publications (2)

Publication Number Publication Date
JP2007524073A JP2007524073A (ja) 2007-08-23
JP4690316B2 true JP4690316B2 (ja) 2011-06-01

Family

ID=33559875

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006515699A Expired - Fee Related JP4690316B2 (ja) 2003-07-03 2004-07-05 照準装置及び非接触で又は接触させて使用可能な測定装置

Country Status (3)

Country Link
JP (1) JP4690316B2 (zh)
CN (1) CN1842691B (zh)
DE (1) DE10335207A1 (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7511805B2 (en) 2005-11-28 2009-03-31 Leica Geosystems Ag Holographic test plate for positioning and aligning pipes
JP5341490B2 (ja) * 2008-11-27 2013-11-13 本田技研工業株式会社 座標位置検出装置及び座標位置検出方法
JP5507904B2 (ja) * 2009-06-26 2014-05-28 システム計測株式会社 変位測定装置
JP5090483B2 (ja) * 2010-02-18 2012-12-05 粟井 志壽子 温度測定用鏡及び鏡構造
CN102012192B (zh) * 2010-09-15 2013-09-25 北京理工大学 一种确定激光驾束制导信息场初始定焦参数的方法
CN102645311B (zh) * 2011-12-12 2014-12-10 浙江吉利汽车研究院有限公司 一种柱撞试验对中的方法
US9441967B2 (en) 2013-05-31 2016-09-13 Stanley Black & Decker Inc. Laser level system
CN104182758B (zh) * 2014-07-11 2018-11-30 北京航天发射技术研究所 用于火箭风摆测量的图像识别方法
DE102015111379A1 (de) 2015-07-14 2017-01-19 Sick Ag Optoelektronischer Sensor
US10067355B1 (en) * 2017-09-28 2018-09-04 Symbol Technologies, Llc Imaging devices having aimer systems
CN110017825B (zh) * 2019-04-03 2023-11-24 北京城建勘测设计研究院有限责任公司 一种双面觇牌

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3398918A (en) * 1965-12-06 1968-08-27 Csf Optical system for guiding a projectile
JPH0415024U (zh) * 1990-05-23 1992-02-06
JPH0486518A (ja) * 1990-07-30 1992-03-19 Hazama Gumi Ltd レーザー照準器
JPH09145483A (ja) * 1995-11-20 1997-06-06 Minolta Co Ltd 放射温度計の照準装置
JPH09257583A (ja) * 1996-03-26 1997-10-03 Kawasaki Steel Corp 光検出器の視野チェック装置
JPH10185697A (ja) * 1996-12-11 1998-07-14 Omega Eng Inc 赤外線技術を用いて温度を測定する方法と装置
JP2000508073A (ja) * 1996-12-24 2000-06-27 ライテック ゲゼルシャフト ミット ベシュレンクテル ハフツング 非接触温度計
US6290389B2 (en) * 1995-08-03 2001-09-18 Raytek Gmbh Device for temperature measurement
JP2002139597A (ja) * 2000-10-31 2002-05-17 Ishikawajima Harima Heavy Ind Co Ltd X線照射装置の照準装置付き絞り装置
JP2002286450A (ja) * 2001-03-28 2002-10-03 Topcon Corp レーザ照準装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1548536C1 (de) * 1965-07-22 2000-05-11 Thomson Trt Defense Guyancourt Anordnung zur Ortung der Lage eines beweglichen Körpers
US4186899A (en) * 1977-12-12 1980-02-05 Ford Motor Company Controlled beam projector
SE418909B (sv) * 1978-03-02 1981-06-29 Saab Scania Ab Sett och anleggning for att medelst modulerad optisk stralning overfora information till foremal
SE425819B (sv) * 1978-03-02 1982-11-08 Saab Scania Ab Forfaringssett och anordning for ovningsskjutning
SE412959B (sv) * 1978-03-02 1980-03-24 Saab Scania Ab Sett att bestemma leget for ett antal foremal samt system for utforande av settet
US4318591A (en) * 1980-06-10 1982-03-09 Ford Aerospace & Communications Corp. Polarization switched image rotator
US4315150A (en) * 1980-07-24 1982-02-09 Telatemp Corporation Targeted infrared thermometer
DE9307359U1 (zh) * 1993-05-14 1993-07-22 Lap Gmbh Laser Applikationen, 2120 Lueneburg, De

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3398918A (en) * 1965-12-06 1968-08-27 Csf Optical system for guiding a projectile
JPH0415024U (zh) * 1990-05-23 1992-02-06
JPH0486518A (ja) * 1990-07-30 1992-03-19 Hazama Gumi Ltd レーザー照準器
US6290389B2 (en) * 1995-08-03 2001-09-18 Raytek Gmbh Device for temperature measurement
JPH09145483A (ja) * 1995-11-20 1997-06-06 Minolta Co Ltd 放射温度計の照準装置
JPH09257583A (ja) * 1996-03-26 1997-10-03 Kawasaki Steel Corp 光検出器の視野チェック装置
JPH10185697A (ja) * 1996-12-11 1998-07-14 Omega Eng Inc 赤外線技術を用いて温度を測定する方法と装置
JP2000508073A (ja) * 1996-12-24 2000-06-27 ライテック ゲゼルシャフト ミット ベシュレンクテル ハフツング 非接触温度計
JP2002139597A (ja) * 2000-10-31 2002-05-17 Ishikawajima Harima Heavy Ind Co Ltd X線照射装置の照準装置付き絞り装置
JP2002286450A (ja) * 2001-03-28 2002-10-03 Topcon Corp レーザ照準装置

Also Published As

Publication number Publication date
CN1842691A (zh) 2006-10-04
JP2007524073A (ja) 2007-08-23
DE10335207A1 (de) 2005-02-03
CN1842691B (zh) 2010-07-21

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