JP4654193B2 - 結晶成長装置 - Google Patents
結晶成長装置 Download PDFInfo
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- JP4654193B2 JP4654193B2 JP2006535945A JP2006535945A JP4654193B2 JP 4654193 B2 JP4654193 B2 JP 4654193B2 JP 2006535945 A JP2006535945 A JP 2006535945A JP 2006535945 A JP2006535945 A JP 2006535945A JP 4654193 B2 JP4654193 B2 JP 4654193B2
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- coil
- crystal growth
- coils
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- semiconductor crystal
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- 239000013078 crystal Substances 0.000 title claims abstract description 49
- 239000004065 semiconductor Substances 0.000 claims abstract description 32
- 239000000155 melt Substances 0.000 claims abstract description 31
- 239000004020 conductor Substances 0.000 claims abstract description 7
- 238000010438 heat treatment Methods 0.000 claims description 22
- 239000002356 single layer Substances 0.000 claims description 4
- 239000004973 liquid crystal related substance Substances 0.000 claims 1
- 238000004804 winding Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 18
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 10
- 230000005684 electric field Effects 0.000 description 10
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 7
- 229910002804 graphite Inorganic materials 0.000 description 7
- 239000010439 graphite Substances 0.000 description 7
- 238000002844 melting Methods 0.000 description 7
- 230000008018 melting Effects 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- 229910052742 iron Inorganic materials 0.000 description 5
- 230000036962 time dependent Effects 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 238000009835 boiling Methods 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- CPELXLSAUQHCOX-UHFFFAOYSA-M Bromide Chemical compound [Br-] CPELXLSAUQHCOX-UHFFFAOYSA-M 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 102100027340 Slit homolog 2 protein Human genes 0.000 description 1
- 101710133576 Slit homolog 2 protein Proteins 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000002500 effect on skin Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000002657 fibrous material Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000005355 lead glass Substances 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000013517 stratification Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/90—Apparatus characterized by composition or treatment thereof, e.g. surface finish, surface coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
Description
本願は、結晶成長装置、特に半導体結晶成長装置に関連し、溶融物用の加熱るつぼ及びるつぼに同軸配置されたコイルアレイを、溶融物に磁界を発生させるために備え、コイルアレイが三個かそれ以上のコイルから成り、それらのコイルは軸線方向に一方が他方の上に設けられ、各コイルを介して別個の電流が隣のコイルと位相をずらして流れる。
Claims (9)
- 溶融物(13、23)用の加熱るつぼ(11、21)と、加熱るつぼ(11、21)に対して同軸に配置され、溶融物(13、23)中に磁界を発生するコイルアレイとを有し、コイルアレイが少なくとも三つのコイルを備え、それらのコイルが軸線方向に上下に配置され、各コイルには交流電流が流れ、コイルに流れる交流電流の位相が隣のコイルに流れる交流電流の位相とずれている、半導体結晶成長装置において、
それぞれのコイルが導電性材料の中空円筒体(1)から作られ、導電性材料がスリット(2)を複数回巻くことによって、単一層の螺旋状電流路を形成し、螺旋状電流路が中空円筒体(1)の軸線方向に沿って複数のセグメントに分割され、各セグメントがそれぞれの一つのコイルを成し、各コイルが相応した接触ポイント(3、4、5、6)を介して電力供給部に接続されることを特徴とする半導体結晶成長装置。 - 三個のコイルがユニットを形成し、星形または三角結線の形で電気的に接続され、それによりコイルが回路によって回転電流源(17)の電極に接続されることを特徴とする請求項1に記載の半導体結晶成長装置。
- コイルが、さらに直流電源に接続されることを特徴とする請求項1又は2に記載の結晶成長装置。
- 巻回スリット(2)が、中空円筒体(1)を囲むように同じ方向に延びることを特徴とする請求項1に記載の半導体結晶成長装置。
- 軸線方向の上下に配列し、三個のコイルを形成するセグメントが、回転電流源(17)の位相に関連して各々二個の接触ポイント(3、4、5、6)を有することを特徴とする請求項2に記載の半導体結晶成長装置。
- 接触ポイント(3、4、5、6)が、中空円筒形体(1)の横面の外側又は内側に延びる導電性レール(7、8、9)に接続され、導電性レール(7、8、9)が、中空円筒体(1)の端部で回転電流源(17)の位相に関連した接続部において終端することを特徴とする請求項5に記載の半導体液晶成長装置。
- 導電性レール(7、8、9)が、抵抗加熱要素として使用され、そのために直流電流源に接続されることを特徴とする請求項6に記載の半導体結晶成長装置。
- それぞれのコイルが互いに星形結線で接続され、中空円筒体の長手に沿って伸長し、すべてのコイルと接触するメイントラックが、直流電流源に接続されることを特徴とする請求項1に記載の半導体結晶成長装置。
- 中空円筒体(1)が、るつぼ(11、21)の外部であるが、るつぼ(11、21)を囲む容器(10、20)の内部に配置されることを特徴とする請求項1に記載の半導体結晶成長装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10349339A DE10349339A1 (de) | 2003-10-23 | 2003-10-23 | Kristallzüchtungsanlage |
PCT/DE2004/002373 WO2005041278A2 (de) | 2003-10-23 | 2004-10-25 | Kristallzüchtungsanlage |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007509026A JP2007509026A (ja) | 2007-04-12 |
JP4654193B2 true JP4654193B2 (ja) | 2011-03-16 |
Family
ID=34484947
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006535945A Active JP4654193B2 (ja) | 2003-10-23 | 2004-10-25 | 結晶成長装置 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7179331B2 (ja) |
EP (2) | EP1676299B8 (ja) |
JP (1) | JP4654193B2 (ja) |
KR (1) | KR100810467B1 (ja) |
AT (1) | ATE435502T1 (ja) |
DE (2) | DE10349339A1 (ja) |
ES (1) | ES2328580T3 (ja) |
WO (1) | WO2005041278A2 (ja) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007020239B4 (de) * | 2006-04-24 | 2009-09-03 | Forschungsverbund Berlin E.V. | Vorrichtung zur Herstellung von Kristallen aus elektrisch leitfähigen Schmelzen |
WO2007122231A1 (de) * | 2006-04-24 | 2007-11-01 | Forschungsverbund Berlin E.V. | Vorrichtung zur herstellung von kristallen aus elektrisch leitfähigen schmelzen |
DE102006020234A1 (de) * | 2006-04-27 | 2007-10-31 | Deutsche Solar Ag | Ofen für Nichtmetall-Schmelzen |
DE102007026298A1 (de) | 2007-06-06 | 2008-12-11 | Freiberger Compound Materials Gmbh | Anordnung und Verfahren zur Herstellung eines Kristalls aus der Schmelze eines Rohmaterials sowie Einkristall |
DE102007028547B4 (de) * | 2007-06-18 | 2009-10-08 | Forschungsverbund Berlin E.V. | Vorrichtung zur Herstellung von Kristallen aus elektrisch leitenden Schmelzen |
DE102007028548B4 (de) | 2007-06-18 | 2009-07-16 | Forschungsverbund Berlin E.V. | Vorrichtung und Verfahren zur Herstellung von Kristallen aus elektrisch leitenden Schmelzen |
DE102007046409B4 (de) | 2007-09-24 | 2009-07-23 | Forschungsverbund Berlin E.V. | Vorrichtung zur Herstellung von Kristallen aus elektrisch leitenden Schmelzen |
EP2072645B2 (en) * | 2007-12-19 | 2014-12-24 | Schott AG | Method for producing a monocrystalline or polycrystalline semiconductor material |
FR2927910B1 (fr) * | 2008-02-27 | 2011-06-17 | Centre Nat Rech Scient | Procede de cristallogenese d'un materiau electriquement conducteur a l'etat fondu. |
DE102008027359B4 (de) | 2008-06-04 | 2012-04-12 | Forschungsverbund Berlin E.V. | Verfahren zur intensiven Durchmischung von elektrisch leitenden Schmelzen in Kristallisations- und Erstarrungsprozessen |
DE102008034029A1 (de) * | 2008-07-17 | 2010-01-21 | Forschungsverbund Berlin E.V. | Vorrichtung und Verfahren zur Züchtung von Kristallen aus elektrisch leitenden Schmelzen in Mehrtiegelanordnungen |
DE102008035439B4 (de) | 2008-07-25 | 2011-06-16 | Forschungsverbund Berlin E.V. | Vorrichtung zur Herstellung von Kristallen aus elektrisch leitenden Schmelzen |
CN101736401B (zh) * | 2008-11-10 | 2013-07-24 | Axt公司 | 锗晶体生长的方法和装置 |
WO2010053586A2 (en) * | 2008-11-10 | 2010-05-14 | Axt, Inc | Systems, methods and substrates of monocrystalline germanium crystal growth |
DE102008059521B4 (de) * | 2008-11-28 | 2011-11-17 | Forschungsverbund Berlin E.V. | Verfahren zum Erstarren einer Nichtmetall-Schmelze |
DE102009045680B4 (de) | 2009-10-14 | 2012-03-22 | Forschungsverbund Berlin E.V. | Vorrichtung und Verfahren zur Herstellung von Siliziumblöcken aus der Schmelze durch gerichtete Erstarrung |
DE102009046845A1 (de) | 2009-11-18 | 2011-06-01 | Forschungsverbund Berlin E.V. | Kristallisationsanlage und Kristallisationsverfahren |
DE112009005457A5 (de) | 2009-12-21 | 2012-10-31 | Deutsche Solar Gmbh | Verfahren und Anordnung zur Beeinflussung der Schmelzkonvektion bei der Herstellung eines Festkörpers aus einer elektrisch leitfähigen Schmelze |
DE102010028173B4 (de) | 2010-04-26 | 2012-11-29 | Forschungsverbund Berlin E.V. | Verfahren zur Herstellung von Kristallblöcken hoher Reinheit |
DE102010041061B4 (de) | 2010-09-20 | 2013-10-24 | Forschungsverbund Berlin E.V. | Kristallisationsanlage und Kristallisationsverfahren zur Herstellung eines Blocks aus einem Material, dessen Schmelze elektrisch leitend ist |
DE102011076860B4 (de) | 2011-06-01 | 2016-01-14 | Forschungsverbund Berlin E.V. | Verfahren zur gerichteten Kristallisation von Ingots |
DE102011051608A1 (de) | 2011-07-06 | 2013-01-10 | Schott Solar Ag | Verfahren und Vorrichtung zum gerichteten Erstarren einer Nichtmetall-Schmelze |
DE102011079284B3 (de) * | 2011-07-15 | 2012-11-29 | Siltronic Ag | Ringförmiger Widerstandsheizer zum Zuführen von Wärme zu einem wachsenden Einkristall |
CN102586862B (zh) * | 2012-03-08 | 2014-07-30 | 天津市环欧半导体材料技术有限公司 | 一种提高直拉硅单晶电阻率均匀性的行波磁场法 |
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CN109280968A (zh) * | 2017-07-21 | 2019-01-29 | 镇江仁德新能源科技有限公司 | 一种石墨加热器及硅晶体生长炉 |
KR20200070760A (ko) * | 2018-12-10 | 2020-06-18 | 웅진에너지 주식회사 | 잉곳 성장장치 |
KR20200070759A (ko) * | 2018-12-10 | 2020-06-18 | 웅진에너지 주식회사 | 실리콘 잉곳 성장장치 |
CN113215649B (zh) * | 2021-05-06 | 2021-12-03 | 深圳市国王科技有限公司 | 一种mos场效应管拉晶装置 |
CN114318504B (zh) * | 2021-12-31 | 2023-09-26 | 西安交通大学 | 一种用于直拉法生长晶体的热磁耦合加热装置及配置方法 |
CN114411264B (zh) * | 2022-01-20 | 2024-02-20 | 南京晶升装备股份有限公司 | 一种旋转碳化硅长晶炉感应加热系统及长晶炉 |
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2003
- 2003-10-23 DE DE10349339A patent/DE10349339A1/de not_active Ceased
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2004
- 2004-08-19 US US10/921,560 patent/US7179331B2/en active Active
- 2004-10-25 WO PCT/DE2004/002373 patent/WO2005041278A2/de active Application Filing
- 2004-10-25 KR KR1020067009551A patent/KR100810467B1/ko active IP Right Grant
- 2004-10-25 EP EP04802641A patent/EP1676299B8/de active Active
- 2004-10-25 AT AT04802641T patent/ATE435502T1/de not_active IP Right Cessation
- 2004-10-25 DE DE502004009697T patent/DE502004009697D1/de active Active
- 2004-10-25 JP JP2006535945A patent/JP4654193B2/ja active Active
- 2004-10-25 EP EP09008527A patent/EP2105522A3/de not_active Withdrawn
- 2004-10-25 ES ES04802641T patent/ES2328580T3/es active Active
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JPS60210592A (ja) * | 1984-03-31 | 1985-10-23 | M Setetsuku Kk | 単結晶の引上げ装置 |
JPS60264391A (ja) * | 1984-06-08 | 1985-12-27 | Nec Corp | 結晶製造装置 |
JPS62108795A (ja) * | 1985-11-08 | 1987-05-20 | Nippon Kokan Kk <Nkk> | 加熱流動装置 |
JPS63159285A (ja) * | 1986-12-24 | 1988-07-02 | Nkk Corp | 単結晶製造装置 |
JPS63285189A (ja) * | 1987-05-15 | 1988-11-22 | Toshiba Ceramics Co Ltd | シリコン単結晶引上装置 |
JPH01126293A (ja) * | 1987-11-12 | 1989-05-18 | Toshiba Ceramics Co Ltd | 単結晶の引き上げ方法及びその装置 |
JPH03141187A (ja) * | 1989-10-27 | 1991-06-17 | Shin Etsu Chem Co Ltd | 単結晶育成方法 |
US5196085A (en) * | 1990-12-28 | 1993-03-23 | Massachusetts Institute Of Technology | Active magnetic flow control in Czochralski systems |
JPH0681086A (ja) * | 1992-09-03 | 1994-03-22 | Hitachi Metals Ltd | 耐蝕性に優れた超微細結晶粒組織を有する合金 |
JPH08143391A (ja) * | 1993-06-01 | 1996-06-04 | Texas Instr Inc <Ti> | チョクラルスキ結晶引上げ装置に使用する螺旋加熱器 |
JP2002226294A (ja) * | 2001-01-18 | 2002-08-14 | Wacker Siltronic G Fuer Halbleitermaterialien Ag | シリコンからなる単結晶を製造する方法及び装置 |
Also Published As
Publication number | Publication date |
---|---|
DE502004009697D1 (de) | 2009-08-13 |
EP1676299A2 (de) | 2006-07-05 |
EP2105522A3 (de) | 2011-11-02 |
JP2007509026A (ja) | 2007-04-12 |
ATE435502T1 (de) | 2009-07-15 |
WO2005041278A3 (de) | 2005-07-07 |
EP1676299B1 (de) | 2009-07-01 |
EP1676299B8 (de) | 2009-08-19 |
WO2005041278A2 (de) | 2005-05-06 |
KR100810467B1 (ko) | 2008-03-07 |
KR20060104999A (ko) | 2006-10-09 |
DE10349339A1 (de) | 2005-06-16 |
US20050087125A1 (en) | 2005-04-28 |
EP2105522A2 (de) | 2009-09-30 |
ES2328580T3 (es) | 2009-11-16 |
US7179331B2 (en) | 2007-02-20 |
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