JP4611292B2 - 半導体製造装置 - Google Patents
半導体製造装置 Download PDFInfo
- Publication number
- JP4611292B2 JP4611292B2 JP2006519024A JP2006519024A JP4611292B2 JP 4611292 B2 JP4611292 B2 JP 4611292B2 JP 2006519024 A JP2006519024 A JP 2006519024A JP 2006519024 A JP2006519024 A JP 2006519024A JP 4611292 B2 JP4611292 B2 JP 4611292B2
- Authority
- JP
- Japan
- Prior art keywords
- stage
- semiconductor substrate
- metal
- semiconductor manufacturing
- elastic body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/6875—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a batch of workpieces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67769—Storage means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67772—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
- H01L21/67781—Batch transfer of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating or a hardness or a material
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Die Bonding (AREA)
Description
図1は、本発明の実施の形態1に係る半導体製造装置が備えるステージ100を示す上面図である。また、図2は、図1におけるA−A’断面図である。
実施の形態1に係るステージ100〜105においては、導電性シリコンゴムからなるフラットな導電性弾性体部20を部分的に形成することにより、異物40を埋没させ半導体基板30にかかる応力を低減する。しかし、導電性弾性体部20に代えて、疎面処理を施された金属からなる金属部を形成させてもよい。
Claims (3)
- 半導体基板を載置するステージを備える半導体製造装置であって、
前記ステージは、
表面に無数の窪みを形成する処理が施されていない金属からなり、載置された前記半導体基板に当接する第1金属部と、
表面に無数の窪みを形成する処理が施された金属からなり、載置された前記半導体基板に当接する第2金属部と
を有し、
前記第1金属部には吸着のための複数の孔が形成され、
前記窪みには前記孔が形成されない
半導体製造装置。 - 半導体基板を載置するステージを備える半導体製造装置であって、
前記ステージは、
表面に無数の窪みを形成する処理が施されていない金属からなり、載置された前記半導体基板に当接する第1金属部と、
表面に無数の窪みを形成する処理が施された金属からなり、載置された前記半導体基板に当接する第2金属部と、
前記窪みに埋め込まれた導電性弾性体と
を有する半導体製造装置。 - 請求項2記載の半導体製造装置であって、
前記窪みは、広さが1〜10000μm 2 で深さが1〜100μmである
半導体製造装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2005/000174 WO2006075356A1 (ja) | 2005-01-11 | 2005-01-11 | 半導体製造装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2006075356A1 JPWO2006075356A1 (ja) | 2008-06-12 |
JP4611292B2 true JP4611292B2 (ja) | 2011-01-12 |
Family
ID=36677392
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006519024A Active JP4611292B2 (ja) | 2005-01-11 | 2005-01-11 | 半導体製造装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8696816B2 (ja) |
EP (1) | EP1796158B1 (ja) |
JP (1) | JP4611292B2 (ja) |
CN (1) | CN100511632C (ja) |
TW (1) | TWI280608B (ja) |
WO (1) | WO2006075356A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9186368B2 (en) | 2009-09-03 | 2015-11-17 | Hayashibara Co., Ltd. | Process for producing a particulate composition comprising an hydrous crystalline 2-O-α-D-glucosyl-L-ascorbic acid |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5324231B2 (ja) * | 2009-01-08 | 2013-10-23 | 日東電工株式会社 | 半導体ウエハのアライメント装置 |
CN103506927B (zh) * | 2013-10-28 | 2015-12-02 | 中国科学院地球化学研究所 | 一种抛光机载料块 |
EP3876352A1 (en) | 2015-03-23 | 2021-09-08 | Hubbell Incorporated | Connector for flexible busbar |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5543853A (en) * | 1978-09-25 | 1980-03-27 | Hitachi Ltd | Dicing |
JPS62199030A (ja) * | 1986-02-27 | 1987-09-02 | Nec Kyushu Ltd | 半導体ウエハ−の処理装置 |
JPH01129438A (ja) * | 1987-11-16 | 1989-05-22 | Hitachi Ltd | 真空吸着固定台および真空吸着固定方法 |
JPH04152512A (ja) * | 1990-10-16 | 1992-05-26 | Fujitsu Ltd | ウエハチャック |
JPH10107131A (ja) * | 1996-09-25 | 1998-04-24 | Teikoku Seiki Kk | 吸着テーブル及びそのエレメント |
JPH10112495A (ja) * | 1996-10-07 | 1998-04-28 | Dainippon Screen Mfg Co Ltd | 基板保持体 |
JP2001345355A (ja) * | 2000-06-02 | 2001-12-14 | Kumamoto Nippon Denki Kk | サポートフレーム貼付装置 |
JP2004265962A (ja) * | 2003-02-28 | 2004-09-24 | Hirata Corp | 基板回転装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5913752B2 (ja) | 1978-09-25 | 1984-03-31 | ヤマハ株式会社 | 電子楽器 |
JPS59135742A (ja) | 1983-01-25 | 1984-08-04 | Toshiba Corp | 半導体ウエハ支持装置 |
JP3469999B2 (ja) | 1996-10-30 | 2003-11-25 | 京セラ株式会社 | 吸着盤の製造方法 |
JP4152512B2 (ja) | 1999-01-11 | 2008-09-17 | 大成建設株式会社 | 顕熱流解析方法 |
JP2001209981A (ja) * | 1999-02-09 | 2001-08-03 | Ricoh Co Ltd | 光ディスク基板成膜装置、光ディスク基板成膜方法、基板ホルダーの製造方法、基板ホルダー、光ディスクおよび相変化記録型光ディスク |
DE19962170A1 (de) * | 1999-12-22 | 2001-07-12 | Steag Micro Tech Gmbh | Substrahthalter |
DE10308095B3 (de) * | 2003-02-24 | 2004-10-14 | Infineon Technologies Ag | Elektronisches Bauteil mit mindestens einem Halbleiterchip auf einem Schaltungsträger und Verfahren zur Herstellung desselben |
-
2005
- 2005-01-11 EP EP05703413.4A patent/EP1796158B1/en active Active
- 2005-01-11 US US11/571,971 patent/US8696816B2/en active Active
- 2005-01-11 CN CNB2005800270071A patent/CN100511632C/zh active Active
- 2005-01-11 JP JP2006519024A patent/JP4611292B2/ja active Active
- 2005-01-11 WO PCT/JP2005/000174 patent/WO2006075356A1/ja active Application Filing
- 2005-03-16 TW TW094108005A patent/TWI280608B/zh not_active IP Right Cessation
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5543853A (en) * | 1978-09-25 | 1980-03-27 | Hitachi Ltd | Dicing |
JPS62199030A (ja) * | 1986-02-27 | 1987-09-02 | Nec Kyushu Ltd | 半導体ウエハ−の処理装置 |
JPH01129438A (ja) * | 1987-11-16 | 1989-05-22 | Hitachi Ltd | 真空吸着固定台および真空吸着固定方法 |
JPH04152512A (ja) * | 1990-10-16 | 1992-05-26 | Fujitsu Ltd | ウエハチャック |
JPH10107131A (ja) * | 1996-09-25 | 1998-04-24 | Teikoku Seiki Kk | 吸着テーブル及びそのエレメント |
JPH10112495A (ja) * | 1996-10-07 | 1998-04-28 | Dainippon Screen Mfg Co Ltd | 基板保持体 |
JP2001345355A (ja) * | 2000-06-02 | 2001-12-14 | Kumamoto Nippon Denki Kk | サポートフレーム貼付装置 |
JP2004265962A (ja) * | 2003-02-28 | 2004-09-24 | Hirata Corp | 基板回転装置 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9186368B2 (en) | 2009-09-03 | 2015-11-17 | Hayashibara Co., Ltd. | Process for producing a particulate composition comprising an hydrous crystalline 2-O-α-D-glucosyl-L-ascorbic acid |
US9265781B2 (en) | 2009-09-03 | 2016-02-23 | Hayashibara Co., Ltd. | Process for producing a particulate composition comprising anhydrous crystalline 2-O-alpha-D-glucosyl-L-ascorbic acid |
US9872872B2 (en) | 2009-09-03 | 2018-01-23 | Hayashibara Co., Ltd. | Process for producing a particulate composition comprising an hydrous crystalline 2-O-α-D-glucosyl-L-ascorbic acid |
US10603333B2 (en) | 2009-09-03 | 2020-03-31 | Hayashibara Co., Ltd. | Process for producing a particulate composition comprising an hydrous crystalline 2-o-alpha-d-glucosyl-ascorbic acid |
Also Published As
Publication number | Publication date |
---|---|
CN101019221A (zh) | 2007-08-15 |
JPWO2006075356A1 (ja) | 2008-06-12 |
US8696816B2 (en) | 2014-04-15 |
EP1796158A4 (en) | 2010-08-04 |
TW200625399A (en) | 2006-07-16 |
US20070228628A1 (en) | 2007-10-04 |
TWI280608B (en) | 2007-05-01 |
CN100511632C (zh) | 2009-07-08 |
EP1796158B1 (en) | 2016-05-18 |
EP1796158A1 (en) | 2007-06-13 |
WO2006075356A1 (ja) | 2006-07-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US11742224B2 (en) | Substrate chuck and substrate bonding system including the same | |
JP2019534571A5 (ja) | ||
JP4611292B2 (ja) | 半導体製造装置 | |
JPWO2017086333A1 (ja) | 真空チャック | |
US20090008803A1 (en) | Layout of dummy patterns | |
KR101875351B1 (ko) | 반도체 기판을 수용하기 위한 수용 장치 | |
JP5146056B2 (ja) | 半導体装置の製造方法および半導体装置の支持装置 | |
JPH03270048A (ja) | 真空チャック | |
JP6325933B2 (ja) | 真空チャック | |
US20160247709A1 (en) | Wafer support device | |
KR100717694B1 (ko) | 분리층을 갖는 정전척 | |
JP2006253352A (ja) | 吸着装置 | |
KR101441317B1 (ko) | 웨이퍼 이송용 피크 패드 | |
JP7307582B2 (ja) | 基板保持部材 | |
JP6735767B2 (ja) | 歪んだウェハをチャッキングするための装置 | |
JP4447497B2 (ja) | 基板保持具 | |
KR20070070155A (ko) | 반도체 제조장치 | |
KR100462565B1 (ko) | 반도체 제조설비의 진공 척 | |
JP2020155703A (ja) | ピックアップ装置 | |
KR100639572B1 (ko) | 더블 플랫을 갖는 정전척 | |
KR100783569B1 (ko) | 캡 형 정전척 | |
KR200273741Y1 (ko) | 반도체 제조설비의 진공 척 | |
US20090184028A1 (en) | Wafer cassette | |
US20140291942A1 (en) | Chuck structure for substrate cleansing equipment | |
JP2006054379A (ja) | 吸着治具および研磨装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100720 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100913 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20101012 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20101013 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20131022 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4611292 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |