JP4590511B2 - 電子コンパス - Google Patents

電子コンパス Download PDF

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Publication number
JP4590511B2
JP4590511B2 JP2007110968A JP2007110968A JP4590511B2 JP 4590511 B2 JP4590511 B2 JP 4590511B2 JP 2007110968 A JP2007110968 A JP 2007110968A JP 2007110968 A JP2007110968 A JP 2007110968A JP 4590511 B2 JP4590511 B2 JP 4590511B2
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Japan
Prior art keywords
point
offset
measurement
magnetic sensor
calibration
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Expired - Fee Related
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JP2007110968A
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English (en)
Japanese (ja)
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JP2008241675A5 (enExample
JP2008241675A (ja
Inventor
義信 本蔵
克彦 土田
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Aichi Micro Intelligent Corp
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Aichi Micro Intelligent Corp
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Priority to JP2007110968A priority Critical patent/JP4590511B2/ja
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Publication of JP2008241675A5 publication Critical patent/JP2008241675A5/ja
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Publication of JP4590511B2 publication Critical patent/JP4590511B2/ja
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  • Measuring Magnetic Variables (AREA)
JP2007110968A 2007-03-23 2007-03-23 電子コンパス Expired - Fee Related JP4590511B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007110968A JP4590511B2 (ja) 2007-03-23 2007-03-23 電子コンパス

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007110968A JP4590511B2 (ja) 2007-03-23 2007-03-23 電子コンパス

Publications (3)

Publication Number Publication Date
JP2008241675A JP2008241675A (ja) 2008-10-09
JP2008241675A5 JP2008241675A5 (enExample) 2010-07-01
JP4590511B2 true JP4590511B2 (ja) 2010-12-01

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ID=39913191

Family Applications (1)

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JP2007110968A Expired - Fee Related JP4590511B2 (ja) 2007-03-23 2007-03-23 電子コンパス

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JP (1) JP4590511B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI420130B (zh) * 2009-04-10 2013-12-21 Hon Hai Prec Ind Co Ltd 電子羅盤測試系統及方法
US8825426B2 (en) 2010-04-09 2014-09-02 CSR Technology Holdings Inc. Method and apparatus for calibrating a magnetic sensor
EP2447667B1 (en) 2010-10-26 2015-11-11 BlackBerry Limited System and method for calibrating a magnetometer according to a quality threshold
US8676528B2 (en) 2011-02-08 2014-03-18 Blackberry Limited System and method for calibrating an accelerometer
JP5017539B1 (ja) 2011-02-17 2012-09-05 アイチ・マイクロ・インテリジェント株式会社 地磁気を測定し、利用する応用機器
JP2015102512A (ja) 2013-11-27 2015-06-04 愛知製鋼株式会社 磁場発生装置およびオフセット算出方法
JP2016057190A (ja) 2014-09-10 2016-04-21 愛知製鋼株式会社 磁界測定装置
CN107925332B (zh) 2015-09-01 2020-04-21 三菱电机株式会社 致动器及其调整方法
CN114777755B (zh) * 2022-03-08 2025-01-03 维沃移动通信有限公司 电子罗盘校准方法、装置、电子设备及存储介质
WO2024107007A1 (ko) * 2022-11-18 2024-05-23 삼성전자 주식회사 웨어러블 전자 장치 및 이의 동작 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005345387A (ja) * 2004-06-04 2005-12-15 Yamaha Corp 携帯端末装置
JPWO2006035505A1 (ja) * 2004-09-29 2008-05-22 株式会社シーアンドエヌ 磁気センサの制御方法、制御装置、および携帯端末装置
JP2006275524A (ja) * 2005-03-28 2006-10-12 Citizen Watch Co Ltd 電子方位計及び記録媒体
JP5040103B2 (ja) * 2005-11-22 2012-10-03 ヤマハ株式会社 磁気センサ制御装置、方法及びプログラム
WO2007129653A1 (ja) * 2006-05-09 2007-11-15 Alps Electric Co., Ltd. キャリブレーションプログラム及び電子コンパス

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Publication number Publication date
JP2008241675A (ja) 2008-10-09

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