JP4589030B2 - 光検出装置 - Google Patents

光検出装置 Download PDF

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Publication number
JP4589030B2
JP4589030B2 JP2004140073A JP2004140073A JP4589030B2 JP 4589030 B2 JP4589030 B2 JP 4589030B2 JP 2004140073 A JP2004140073 A JP 2004140073A JP 2004140073 A JP2004140073 A JP 2004140073A JP 4589030 B2 JP4589030 B2 JP 4589030B2
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JP
Japan
Prior art keywords
circuit
output
value
voltage value
integration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004140073A
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English (en)
Japanese (ja)
Other versions
JP2005321313A (ja
Inventor
誠一郎 水野
保博 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2004140073A priority Critical patent/JP4589030B2/ja
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to CNB2005800148794A priority patent/CN100570295C/zh
Priority to US11/596,072 priority patent/US7501611B2/en
Priority to PCT/JP2005/008301 priority patent/WO2005108938A1/ja
Priority to EP05736816A priority patent/EP1757912B1/en
Priority to TW094114737A priority patent/TW200607342A/zh
Publication of JP2005321313A publication Critical patent/JP2005321313A/ja
Priority to IL179130A priority patent/IL179130A0/en
Application granted granted Critical
Publication of JP4589030B2 publication Critical patent/JP4589030B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/18—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors using comparison with a reference electric value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J1/46—Electric circuits using a capacitor
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Power Engineering (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
JP2004140073A 2004-05-10 2004-05-10 光検出装置 Expired - Fee Related JP4589030B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2004140073A JP4589030B2 (ja) 2004-05-10 2004-05-10 光検出装置
US11/596,072 US7501611B2 (en) 2004-05-10 2005-05-02 Photo detector apparatus
PCT/JP2005/008301 WO2005108938A1 (ja) 2004-05-10 2005-05-02 光検出装置
EP05736816A EP1757912B1 (en) 2004-05-10 2005-05-02 Photo detector apparatus
CNB2005800148794A CN100570295C (zh) 2004-05-10 2005-05-02 光检测装置
TW094114737A TW200607342A (en) 2004-05-10 2005-05-06 Photo detector apparatus
IL179130A IL179130A0 (en) 2004-05-10 2006-11-08 Photo detector apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004140073A JP4589030B2 (ja) 2004-05-10 2004-05-10 光検出装置

Publications (2)

Publication Number Publication Date
JP2005321313A JP2005321313A (ja) 2005-11-17
JP4589030B2 true JP4589030B2 (ja) 2010-12-01

Family

ID=35320317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004140073A Expired - Fee Related JP4589030B2 (ja) 2004-05-10 2004-05-10 光検出装置

Country Status (7)

Country Link
US (1) US7501611B2 (OSRAM)
EP (1) EP1757912B1 (OSRAM)
JP (1) JP4589030B2 (OSRAM)
CN (1) CN100570295C (OSRAM)
IL (1) IL179130A0 (OSRAM)
TW (1) TW200607342A (OSRAM)
WO (1) WO2005108938A1 (OSRAM)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5177981B2 (ja) 2006-09-06 2013-04-10 浜松ホトニクス株式会社 光検出装置
TWI345910B (en) * 2006-10-02 2011-07-21 Novatek Microelectronics Corp Cmos image sensor for high-speed operation
JP5094498B2 (ja) 2008-03-27 2012-12-12 キヤノン株式会社 固体撮像装置及び撮像システム
US8026960B2 (en) * 2008-04-29 2011-09-27 Xerox Corporation Image sensor and associated readout system
US8946678B2 (en) 2012-03-15 2015-02-03 Virginia Commonwealth University Room temperature nanowire IR, visible and UV photodetectors
JP2014230212A (ja) 2013-05-24 2014-12-08 キヤノン株式会社 光電変換装置及び撮像システム
US9762824B2 (en) * 2015-12-30 2017-09-12 Raytheon Company Gain adaptable unit cell
US9699395B1 (en) * 2016-03-17 2017-07-04 Raytheon Company Imaging circuits and method
CN106791511B (zh) * 2016-11-25 2019-07-05 华东师范大学 一种光电探测双模式读出电路
CN106791512B (zh) * 2016-11-29 2019-07-26 华东师范大学 一种积分电容自动可调读出电路
WO2018198674A1 (ja) * 2017-04-27 2018-11-01 コニカミノルタ株式会社 光計測装置
CN112449126B (zh) * 2019-09-05 2023-02-10 昇佳电子股份有限公司 光感测器电路
JP2025131275A (ja) 2024-02-28 2025-09-09 コニカミノルタ株式会社 ディスプレイ光計測装置及び光計測方法並びにプログラム
JP2025131276A (ja) 2024-02-28 2025-09-09 コニカミノルタ株式会社 ディスプレイ光計測装置及び光計測方法並びにプログラム
WO2025253777A1 (ja) * 2024-06-05 2025-12-11 ソニーセミコンダクタソリューションズ株式会社 撮像装置および撮像方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6201573B1 (en) * 1995-11-13 2001-03-13 Hamamatsu Photonics K. K. Solid state imaging apparatus for imaging a two dimensional optical image having a number of integration circuits
JPH10108081A (ja) * 1996-10-02 1998-04-24 Sony Corp 固体撮像装置およびその信号処理方法並びにカメラ
JP4098884B2 (ja) * 1998-07-08 2008-06-11 浜松ホトニクス株式会社 固体撮像装置
DE60030959T2 (de) * 1999-01-29 2007-06-14 Hamamatsu Photonics K.K., Hamamatsu Photodetektorvorrichtung
JP4424796B2 (ja) * 1999-11-18 2010-03-03 浜松ホトニクス株式会社 光検出装置
JP4385479B2 (ja) * 2000-03-23 2009-12-16 株式会社ニコン 撮像装置
JP2001291877A (ja) * 2000-04-05 2001-10-19 Hamamatsu Photonics Kk 固体撮像装置
AU2001276726A1 (en) * 2000-08-03 2002-02-18 Hamamatsu Photonics K.K. Optical sensor
JP2002354195A (ja) * 2001-05-29 2002-12-06 Hamamatsu Photonics Kk 信号処理回路および固体撮像装置
JP4012743B2 (ja) * 2002-02-12 2007-11-21 浜松ホトニクス株式会社 光検出装置
JP4429785B2 (ja) * 2004-04-19 2010-03-10 浜松ホトニクス株式会社 固体撮像装置

Also Published As

Publication number Publication date
IL179130A0 (en) 2007-03-08
JP2005321313A (ja) 2005-11-17
CN1950684A (zh) 2007-04-18
WO2005108938A1 (ja) 2005-11-17
TW200607342A (en) 2006-02-16
EP1757912A1 (en) 2007-02-28
TWI365664B (OSRAM) 2012-06-01
EP1757912A4 (en) 2011-02-16
US20080197267A1 (en) 2008-08-21
CN100570295C (zh) 2009-12-16
EP1757912B1 (en) 2011-08-03
US7501611B2 (en) 2009-03-10

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