JP4541849B2 - 位置決め装置 - Google Patents
位置決め装置 Download PDFInfo
- Publication number
- JP4541849B2 JP4541849B2 JP2004337357A JP2004337357A JP4541849B2 JP 4541849 B2 JP4541849 B2 JP 4541849B2 JP 2004337357 A JP2004337357 A JP 2004337357A JP 2004337357 A JP2004337357 A JP 2004337357A JP 4541849 B2 JP4541849 B2 JP 4541849B2
- Authority
- JP
- Japan
- Prior art keywords
- electromagnet
- moving body
- magnetic
- stage
- current value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02K—DYNAMO-ELECTRIC MACHINES
- H02K41/00—Propulsion systems in which a rigid body is moved along a path due to dynamo-electric interaction between the body and a magnetic field travelling along the path
- H02K41/02—Linear motors; Sectional motors
- H02K41/03—Synchronous motors; Motors moving step by step; Reluctance motors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
- G03F7/70725—Stages control
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70816—Bearings
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02K—DYNAMO-ELECTRIC MACHINES
- H02K2201/00—Specific aspects not provided for in the other groups of this subclass relating to the magnetic circuits
- H02K2201/18—Machines moving with multiple degrees of freedom
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Public Health (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Combustion & Propulsion (AREA)
- Electromagnetism (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004337357A JP4541849B2 (ja) | 2004-11-22 | 2004-11-22 | 位置決め装置 |
| US11/282,713 US7385318B2 (en) | 2004-11-22 | 2005-11-21 | Positioning system, magnetic bearing, and method of controlling the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004337357A JP4541849B2 (ja) | 2004-11-22 | 2004-11-22 | 位置決め装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006147919A JP2006147919A (ja) | 2006-06-08 |
| JP2006147919A5 JP2006147919A5 (enExample) | 2008-01-17 |
| JP4541849B2 true JP4541849B2 (ja) | 2010-09-08 |
Family
ID=36573401
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004337357A Expired - Fee Related JP4541849B2 (ja) | 2004-11-22 | 2004-11-22 | 位置決め装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7385318B2 (enExample) |
| JP (1) | JP4541849B2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5233483B2 (ja) * | 2008-07-31 | 2013-07-10 | 株式会社ニコン | ステージ装置及び露光装置並びにデバイス製造方法 |
| US8358039B2 (en) | 2008-10-17 | 2013-01-22 | Massachusetts Institute Of Technology | High-scan rate positioner for scanned probe microscopy |
| JP2014064025A (ja) * | 2013-11-18 | 2014-04-10 | Canon Inc | 位置決め装置、露光装置およびデバイス製造方法 |
| JP2025154016A (ja) * | 2024-03-29 | 2025-10-10 | ダイキン工業株式会社 | 磁気ユニット、圧縮機及び冷凍装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06100164A (ja) * | 1992-08-27 | 1994-04-12 | Hitachi Ltd | 磁気的に結合された搬送装置 |
| JP3800616B2 (ja) * | 1994-06-27 | 2006-07-26 | 株式会社ニコン | 目標物移動装置、位置決め装置及び可動ステージ装置 |
| US5925956A (en) * | 1995-06-30 | 1999-07-20 | Nikon Corporation | Stage construction incorporating magnetically levitated movable stage |
| JPH11189332A (ja) * | 1997-12-26 | 1999-07-13 | Canon Inc | ステージ装置およびこれを用いた露光装置ならびにデバイス製造方法 |
| JP2001057325A (ja) * | 1999-08-17 | 2001-02-27 | Nikon Corp | ステージ装置及び露光装置 |
| JP2001107961A (ja) * | 1999-10-07 | 2001-04-17 | Mitsubishi Electric Corp | 電磁石駆動装置 |
| US6355994B1 (en) * | 1999-11-05 | 2002-03-12 | Multibeam Systems, Inc. | Precision stage |
| US6731372B2 (en) * | 2001-03-27 | 2004-05-04 | Nikon Corporation | Multiple chamber fluid mount |
| FR2829200B1 (fr) * | 2001-09-06 | 2004-12-31 | Mecanique Magnetique Sa | Dispositif et procede de compensation automatique de perturbations synchrones |
| JP3977086B2 (ja) * | 2002-01-18 | 2007-09-19 | キヤノン株式会社 | ステージシステム |
| JP4280543B2 (ja) | 2002-05-08 | 2009-06-17 | キヤノン株式会社 | 移動体機構および露光装置 |
| JP2004172557A (ja) | 2002-11-22 | 2004-06-17 | Canon Inc | ステージ装置及びその制御方法 |
-
2004
- 2004-11-22 JP JP2004337357A patent/JP4541849B2/ja not_active Expired - Fee Related
-
2005
- 2005-11-21 US US11/282,713 patent/US7385318B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006147919A (ja) | 2006-06-08 |
| US20060119190A1 (en) | 2006-06-08 |
| US7385318B2 (en) | 2008-06-10 |
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