JP4504117B2 - 欠陥の深さを判定する方法 - Google Patents

欠陥の深さを判定する方法 Download PDF

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Publication number
JP4504117B2
JP4504117B2 JP2004190615A JP2004190615A JP4504117B2 JP 4504117 B2 JP4504117 B2 JP 4504117B2 JP 2004190615 A JP2004190615 A JP 2004190615A JP 2004190615 A JP2004190615 A JP 2004190615A JP 4504117 B2 JP4504117 B2 JP 4504117B2
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component
crack
infrared radiation
laser beam
radiation detector
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JP2005024556A (ja
JP2005024556A5 (enExample
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ジョン・ウィリアム・デビット
アンソニー・エス・バウコ
クレイグ・アラン・カンテロ
ケビン・ジー・ハーディング
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2004190615A 2003-06-30 2004-06-29 欠陥の深さを判定する方法 Expired - Fee Related JP4504117B2 (ja)

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Application Number Priority Date Filing Date Title
US10/609,812 US6874932B2 (en) 2003-06-30 2003-06-30 Methods for determining the depth of defects

Publications (3)

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JP2005024556A JP2005024556A (ja) 2005-01-27
JP2005024556A5 JP2005024556A5 (enExample) 2007-08-09
JP4504117B2 true JP4504117B2 (ja) 2010-07-14

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JP2004190615A Expired - Fee Related JP4504117B2 (ja) 2003-06-30 2004-06-29 欠陥の深さを判定する方法

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US (1) US6874932B2 (enExample)
EP (1) EP1505384A1 (enExample)
JP (1) JP4504117B2 (enExample)
BR (1) BRPI0402556A (enExample)
CA (1) CA2471334C (enExample)
SG (1) SG128465A1 (enExample)

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KR20210127199A (ko) 2019-02-18 2021-10-21 에코에이티엠, 엘엘씨 전자 디바이스의 신경망 기반의 물리적 상태 평가, 및 관련된 시스템 및 방법
US12380420B2 (en) 2019-12-18 2025-08-05 Ecoatm, Llc Systems and methods for vending and/or purchasing mobile phones and other electronic devices
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US12271929B2 (en) 2020-08-17 2025-04-08 Ecoatm Llc Evaluating an electronic device using a wireless charger
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JP2023538776A (ja) 2020-08-25 2023-09-11 エコエーティーエム， エルエルシー 電子デバイスの評価および再生利用
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US11603593B2 (en) 2020-09-04 2023-03-14 General Electric Company Systems and methods for automatic detection of coating defects
JP2024525616A (ja) 2021-07-09 2024-07-12 エコエーティーエム， エルエルシー 経時変化する情報を使用した電子デバイスの識別
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Also Published As

Publication number Publication date
BRPI0402556A (pt) 2005-05-03
CA2471334C (en) 2010-02-09
CA2471334A1 (en) 2004-12-30
US20040262521A1 (en) 2004-12-30
US6874932B2 (en) 2005-04-05
JP2005024556A (ja) 2005-01-27
SG128465A1 (en) 2007-01-30
EP1505384A1 (en) 2005-02-09

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