CA2471334C - Methods for determining the depth of defects - Google Patents
Methods for determining the depth of defects Download PDFInfo
- Publication number
- CA2471334C CA2471334C CA2471334A CA2471334A CA2471334C CA 2471334 C CA2471334 C CA 2471334C CA 2471334 A CA2471334 A CA 2471334A CA 2471334 A CA2471334 A CA 2471334A CA 2471334 C CA2471334 C CA 2471334C
- Authority
- CA
- Canada
- Prior art keywords
- component
- component surface
- cracks
- infrared radiation
- radiation detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000007547 defect Effects 0.000 title claims abstract description 64
- 238000000034 method Methods 0.000 title claims abstract description 36
- 230000005855 radiation Effects 0.000 claims abstract description 33
- 230000004044 response Effects 0.000 claims abstract description 17
- 230000001052 transient effect Effects 0.000 claims abstract description 17
- 238000010438 heat treatment Methods 0.000 claims abstract description 15
- 230000005670 electromagnetic radiation Effects 0.000 claims abstract description 10
- 230000003287 optical effect Effects 0.000 claims abstract description 10
- 238000001514 detection method Methods 0.000 claims description 9
- 238000007689 inspection Methods 0.000 abstract description 20
- 239000000463 material Substances 0.000 description 10
- 230000033001 locomotion Effects 0.000 description 6
- 238000011156 evaluation Methods 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 238000011088 calibration curve Methods 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 230000001965 increasing effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000013144 data compression Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000035080 detection of muscle activity involved in regulation of muscle adaptation Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 238000003331 infrared imaging Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/609,812 | 2003-06-30 | ||
| US10/609,812 US6874932B2 (en) | 2003-06-30 | 2003-06-30 | Methods for determining the depth of defects |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2471334A1 CA2471334A1 (en) | 2004-12-30 |
| CA2471334C true CA2471334C (en) | 2010-02-09 |
Family
ID=33540927
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2471334A Expired - Fee Related CA2471334C (en) | 2003-06-30 | 2004-06-17 | Methods for determining the depth of defects |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6874932B2 (enExample) |
| EP (1) | EP1505384A1 (enExample) |
| JP (1) | JP4504117B2 (enExample) |
| BR (1) | BRPI0402556A (enExample) |
| CA (1) | CA2471334C (enExample) |
| SG (1) | SG128465A1 (enExample) |
Families Citing this family (57)
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| US7591583B2 (en) * | 2005-05-18 | 2009-09-22 | Federal-Mogul World Wide, Inc. | Transient defect detection algorithm |
| US7467049B2 (en) * | 2005-05-27 | 2008-12-16 | American Electric Power Company, Inc. | System and method for detecting impaired electric power equipment |
| US7632012B2 (en) * | 2005-09-01 | 2009-12-15 | Siemens Energy, Inc. | Method of measuring in situ differential emissivity and temperature |
| US7553070B2 (en) * | 2006-11-06 | 2009-06-30 | The Boeing Company | Infrared NDI for detecting shallow irregularities |
| JP5027606B2 (ja) * | 2007-09-26 | 2012-09-19 | 株式会社キーエンス | レーザ加工装置、加工データ生成方法及びコンピュータプログラム |
| US8393784B2 (en) * | 2008-03-31 | 2013-03-12 | General Electric Company | Characterization of flaws in composites identified by thermography |
| US10853873B2 (en) | 2008-10-02 | 2020-12-01 | Ecoatm, Llc | Kiosks for evaluating and purchasing used electronic devices and related technology |
| DE202009019027U1 (de) * | 2008-10-02 | 2015-09-21 | ecoATM, Inc. | Sekundärmarkt und Verkaufssystem für Geräte |
| US9881284B2 (en) | 2008-10-02 | 2018-01-30 | ecoATM, Inc. | Mini-kiosk for recycling electronic devices |
| US7881965B2 (en) | 2008-10-02 | 2011-02-01 | ecoATM, Inc. | Secondary market and vending system for devices |
| US20130124426A1 (en) * | 2008-10-02 | 2013-05-16 | ecoATM, Inc. | Method And Apparatus For Recycling Electronic Devices |
| US11010841B2 (en) | 2008-10-02 | 2021-05-18 | Ecoatm, Llc | Kiosk for recycling electronic devices |
| US20100140236A1 (en) * | 2008-12-04 | 2010-06-10 | General Electric Company | Laser machining system and method |
| WO2010106639A1 (ja) * | 2009-03-17 | 2010-09-23 | 西日本高速道路エンジニアリング四国株式会社 | 構造物の損傷深さ判定方法とその装置及び構造物の損傷処置判定方法とその装置 |
| JP5414058B2 (ja) * | 2010-03-10 | 2014-02-12 | 独立行政法人産業技術総合研究所 | 熱拡散率測定装置 |
| CA3210819A1 (en) | 2011-04-06 | 2012-10-11 | Ecoatm, Llc | Method and kiosk for recycling electronic devices |
| US8755044B2 (en) * | 2011-08-15 | 2014-06-17 | Kla-Tencor Corporation | Large particle detection for multi-spot surface scanning inspection systems |
| KR101429348B1 (ko) * | 2012-09-05 | 2014-08-13 | 한국원자력연구원 | 시편의 내부결함 검출을 위한 비접촉식 영상 검사 방법 및 장치 |
| US9041408B2 (en) * | 2013-01-16 | 2015-05-26 | Hrl Laboratories, Llc | Removable surface-wave networks for in-situ material health monitoring |
| US8759770B1 (en) * | 2013-04-08 | 2014-06-24 | General Electric Company | System and method for qualifying usability risk associated with subsurface defects in a multilayer coating |
| KR101580844B1 (ko) * | 2014-05-08 | 2015-12-30 | 한국수력원자력(주) | 발전소 가열 및 냉각 운전 과도사건의 피로평가에서 보정계수 산출방법 |
| JP6304880B2 (ja) * | 2014-06-17 | 2018-04-04 | 株式会社Ihi | 非破壊検査装置 |
| WO2016047093A1 (ja) * | 2014-09-25 | 2016-03-31 | 日本電気株式会社 | 状態判定装置および状態判定方法 |
| US10401411B2 (en) | 2014-09-29 | 2019-09-03 | Ecoatm, Llc | Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices |
| CA2964214C (en) | 2014-10-02 | 2020-08-04 | ecoATM, Inc. | Wireless-enabled kiosk for recycling consumer devices |
| CA2964223C (en) | 2014-10-02 | 2020-04-14 | ecoATM, Inc. | Application for device evaluation and other processes associated with device recycling |
| US10445708B2 (en) | 2014-10-03 | 2019-10-15 | Ecoatm, Llc | System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods |
| EP3213280B1 (en) | 2014-10-31 | 2021-08-18 | ecoATM, LLC | Systems and methods for recycling consumer electronic devices |
| WO2016069742A1 (en) | 2014-10-31 | 2016-05-06 | ecoATM, Inc. | Methods and systems for facilitating processes associated with insurance services and/or other services for electronic devices |
| CA3227945A1 (en) | 2014-11-06 | 2016-05-12 | Ecoatm, Llc | Methods and systems for evaluating and recycling electronic devices |
| WO2016094789A1 (en) | 2014-12-12 | 2016-06-16 | ecoATM, Inc. | Systems and methods for recycling consumer electronic devices |
| CN105784754A (zh) * | 2016-02-25 | 2016-07-20 | 山西省交通科学研究院 | 一种预应力混凝土结构预应力孔道密实度检测系统及方法 |
| FR3049701B1 (fr) * | 2016-03-31 | 2018-04-27 | Espci | Procede, methode et dispositif de determination de la profondeur d'une fissure dans un solide |
| US10127647B2 (en) | 2016-04-15 | 2018-11-13 | Ecoatm, Llc | Methods and systems for detecting cracks in electronic devices |
| US9885672B2 (en) | 2016-06-08 | 2018-02-06 | ecoATM, Inc. | Methods and systems for detecting screen covers on electronic devices |
| US10269110B2 (en) | 2016-06-28 | 2019-04-23 | Ecoatm, Llc | Methods and systems for detecting cracks in illuminated electronic device screens |
| FR3053469B1 (fr) * | 2016-06-30 | 2018-08-17 | Areva Np | Procede d'inspection d'une surface metallique et dispositif associe |
| CN109804119B (zh) * | 2016-12-30 | 2021-03-19 | 同济大学 | 基于红外热像图分析的沥青路面裂缝发育程度检测方法 |
| US10241036B2 (en) * | 2017-05-08 | 2019-03-26 | Siemens Energy, Inc. | Laser thermography |
| CN108254410B (zh) * | 2017-12-27 | 2020-04-03 | 中国人民解放军陆军装甲兵学院 | 基于红外检测的喷涂层接触疲劳寿命预测方法及装置 |
| US10551327B2 (en) * | 2018-04-11 | 2020-02-04 | General Electric Company | Cooling hole inspection system |
| CN109614892A (zh) * | 2018-11-26 | 2019-04-12 | 青岛小鸟看看科技有限公司 | 一种疲劳驾驶检测方法、装置和电子设备 |
| EP3884475A1 (en) | 2018-12-19 | 2021-09-29 | ecoATM, LLC | Systems and methods for vending and/or purchasing mobile phones and other electronic devices |
| US12322259B2 (en) | 2018-12-19 | 2025-06-03 | Ecoatm, Llc | Systems and methods for vending and/or purchasing mobile phones and other electronic devices |
| EP3924918A1 (en) | 2019-02-12 | 2021-12-22 | ecoATM, LLC | Kiosk for evaluating and purchasing used electronic devices |
| CA3129917A1 (en) | 2019-02-12 | 2020-08-20 | Ecoatm, Llc | Connector carrier for electronic device kiosk |
| KR20210127199A (ko) | 2019-02-18 | 2021-10-21 | 에코에이티엠, 엘엘씨 | 전자 디바이스의 신경망 기반의 물리적 상태 평가, 및 관련된 시스템 및 방법 |
| US12380420B2 (en) | 2019-12-18 | 2025-08-05 | Ecoatm, Llc | Systems and methods for vending and/or purchasing mobile phones and other electronic devices |
| WO2022040668A1 (en) | 2020-08-17 | 2022-02-24 | Ecoatm, Llc | Evaluating an electronic device using optical character recognition |
| US12271929B2 (en) | 2020-08-17 | 2025-04-08 | Ecoatm Llc | Evaluating an electronic device using a wireless charger |
| EP4197083B1 (en) | 2020-08-17 | 2024-10-09 | ecoATM, LLC | Connector carrier for electronic device kiosk |
| US11922467B2 (en) | 2020-08-17 | 2024-03-05 | ecoATM, Inc. | Evaluating an electronic device using optical character recognition |
| JP2023538776A (ja) | 2020-08-25 | 2023-09-11 | エコエーティーエム， エルエルシー | 電子デバイスの評価および再生利用 |
| US11810288B2 (en) | 2020-09-04 | 2023-11-07 | General Electric Company | Systems and methods for generating a single observation image to analyze coating defects |
| US11603593B2 (en) | 2020-09-04 | 2023-03-14 | General Electric Company | Systems and methods for automatic detection of coating defects |
| JP2024525616A (ja) | 2021-07-09 | 2024-07-12 | エコエーティーエム， エルエルシー | 経時変化する情報を使用した電子デバイスの識別 |
| DE102021124565A1 (de) * | 2021-09-22 | 2023-03-23 | Infineon Technologies Ag | Vorrichtung und verfahren zum aufspüren von rissen in proben mit hilfe von infrarotstrahlung |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US511048A (en) * | 1893-12-19 | Work-bench for saloons | ||
| USRE32166E (en) * | 1979-01-17 | 1986-06-03 | Elkem A/S | Detection of flaws in metal members |
| US4266185A (en) * | 1979-02-16 | 1981-05-05 | Dover & Partners Limited | Probes and apparatus for and methods of measuring crack depths |
| US4345457A (en) * | 1979-12-27 | 1982-08-24 | Kuroki Kogyosho Co., Ltd. | Method for detecting the depth of cracks in rolls used for transferring hot steel ingot bloom and rolls used therefor |
| DE3034944C2 (de) * | 1980-09-01 | 1985-01-17 | Gerhard Dr. 8029 Sauerlach Busse | Verfahren und Einrichtung zur photothermischen Struktur-Untersuchung fester Körper |
| US4647220A (en) * | 1984-07-09 | 1987-03-03 | Lockheed Corporation | Method of and apparatus for detecting corrosion utilizing infrared analysis |
| JPS62126339A (ja) * | 1985-11-28 | 1987-06-08 | Komatsu Ltd | 内部欠陥の検出方法および装置 |
| GB2197465B (en) * | 1986-09-17 | 1990-05-30 | Atomic Energy Authority Uk | Crack sizing |
| US4760304A (en) * | 1986-11-24 | 1988-07-26 | General Electric Company | Dark field coaxial ultrasonic transducer |
| JPH01151246A (ja) * | 1987-12-08 | 1989-06-14 | Ricoh Co Ltd | 半導体集積回路装置の多層配線 |
| US4983836A (en) * | 1988-06-30 | 1991-01-08 | Nkk Corporation | Method for detecting thinned out portion on inner surface or outer surface of pipe |
| JPH0212044A (ja) * | 1988-06-30 | 1990-01-17 | Nkk Corp | 赤外線カメラによる欠陥部の検出方法 |
| US5131758A (en) * | 1990-05-16 | 1992-07-21 | Administrator Of The National Aeronautics And Space Administration | Method of remotely characterizing thermal properties of a sample |
| US5111048A (en) * | 1990-09-27 | 1992-05-05 | General Electric Company | Apparatus and method for detecting fatigue cracks using infrared thermography |
| US5748003A (en) * | 1991-07-29 | 1998-05-05 | Colorado State University Research Foundation | Microwaves used for determining fatigue and surface crack features on metal surfaces |
| JPH05296956A (ja) * | 1992-04-24 | 1993-11-12 | Toshiba Corp | 表面探傷装置 |
| US5302830A (en) * | 1993-03-05 | 1994-04-12 | General Research Corporation | Method for measuring thermal differences in infrared emissions from micro devices |
| US5810477A (en) * | 1993-04-30 | 1998-09-22 | International Business Machines Corporation | System for identifying surface conditions of a moving medium |
| US20020018510A1 (en) * | 1996-07-31 | 2002-02-14 | Murphy John C. | Thermal-based methods for nondestructive evaluation |
| FR2760528B1 (fr) * | 1997-03-05 | 1999-05-21 | Framatome Sa | Procede et dispositif d'examen photothermique d'un materiau |
| JPH11337511A (ja) * | 1998-05-25 | 1999-12-10 | Advantest Corp | 回路検査装置および方法 |
| US7083327B1 (en) * | 1999-04-06 | 2006-08-01 | Thermal Wave Imaging, Inc. | Method and apparatus for detecting kissing unbond defects |
| US6236049B1 (en) * | 1999-09-16 | 2001-05-22 | Wayne State University | Infrared imaging of ultrasonically excited subsurface defects in materials |
| US6437334B1 (en) * | 1999-09-16 | 2002-08-20 | Wayne State University | System and method for detecting cracks in a tooth by ultrasonically exciting and thermally imaging the tooth |
| US6751342B2 (en) * | 1999-12-02 | 2004-06-15 | Thermal Wave Imaging, Inc. | System for generating thermographic images using thermographic signal reconstruction |
| DE10158095B4 (de) * | 2001-05-05 | 2012-03-22 | Lpkf Laser & Electronics Ag | Vorrichtung zur Kontrolle einer Schweißnaht in einem aus schweißfähigem Kunststoff bestehenden Werkstück |
-
2003
- 2003-06-30 US US10/609,812 patent/US6874932B2/en not_active Expired - Lifetime
-
2004
- 2004-06-17 CA CA2471334A patent/CA2471334C/en not_active Expired - Fee Related
- 2004-06-25 SG SG200403790A patent/SG128465A1/en unknown
- 2004-06-28 BR BR0402556-3A patent/BRPI0402556A/pt not_active IP Right Cessation
- 2004-06-29 JP JP2004190615A patent/JP4504117B2/ja not_active Expired - Fee Related
- 2004-06-30 EP EP04253962A patent/EP1505384A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| BRPI0402556A (pt) | 2005-05-03 |
| CA2471334A1 (en) | 2004-12-30 |
| US20040262521A1 (en) | 2004-12-30 |
| US6874932B2 (en) | 2005-04-05 |
| JP2005024556A (ja) | 2005-01-27 |
| SG128465A1 (en) | 2007-01-30 |
| JP4504117B2 (ja) | 2010-07-14 |
| EP1505384A1 (en) | 2005-02-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed |
Effective date: 20210617 |