JP2005024556A5 - - Google Patents

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Publication number
JP2005024556A5
JP2005024556A5 JP2004190615A JP2004190615A JP2005024556A5 JP 2005024556 A5 JP2005024556 A5 JP 2005024556A5 JP 2004190615 A JP2004190615 A JP 2004190615A JP 2004190615 A JP2004190615 A JP 2004190615A JP 2005024556 A5 JP2005024556 A5 JP 2005024556A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2004190615A
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Japanese (ja)
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JP2005024556A (ja
JP4504117B2 (ja
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Publication date
Priority claimed from US10/609,812 external-priority patent/US6874932B2/en
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Publication of JP2005024556A publication Critical patent/JP2005024556A/ja
Publication of JP2005024556A5 publication Critical patent/JP2005024556A5/ja
Application granted granted Critical
Publication of JP4504117B2 publication Critical patent/JP4504117B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004190615A 2003-06-30 2004-06-29 欠陥の深さを判定する方法 Expired - Fee Related JP4504117B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/609,812 US6874932B2 (en) 2003-06-30 2003-06-30 Methods for determining the depth of defects

Publications (3)

Publication Number Publication Date
JP2005024556A JP2005024556A (ja) 2005-01-27
JP2005024556A5 true JP2005024556A5 (enExample) 2007-08-09
JP4504117B2 JP4504117B2 (ja) 2010-07-14

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ID=33540927

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004190615A Expired - Fee Related JP4504117B2 (ja) 2003-06-30 2004-06-29 欠陥の深さを判定する方法

Country Status (6)

Country Link
US (1) US6874932B2 (enExample)
EP (1) EP1505384A1 (enExample)
JP (1) JP4504117B2 (enExample)
BR (1) BRPI0402556A (enExample)
CA (1) CA2471334C (enExample)
SG (1) SG128465A1 (enExample)

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