JP4480947B2 - Product inspection content setting method, product inspection content changing method, product inspection content setting system, and product inspection content changing system - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a product inspection content setting method, a product inspection content changing method, a product inspection content setting system, and a product inspection content changing system that can efficiently inspect a product.
[0002]
[Prior art]
In general, the product inspection is composed of a plurality of in-process inspections and final inspections as shown in FIG. In each inspection process, inspection devices having the same function may be used repeatedly, or inspection devices having different functions and performance may be used. Further, not only a plurality of inspection apparatuses having the same function but also inspection apparatuses having different functions may be used in one inspection process. Defects that are not found in the in-process inspection will be found in the post-process inspection and final inspection.
[0003]
[Problems to be solved by the invention]
By the way, defects discovered after the subsequent process may not be discovered intentionally and the cause may remain unknown. For example, on a printed circuit board, where is not soldered (open) In most cases, the true cause of failure is not directly known, such as where it is short-circuited. If an attempt is made to elucidate the cause of failure, it will take time and increase the manufacturing cost. In addition, if a defect is found in a previous process, it will lead to a reduction in the number of man-hours, and it is important to perform an inspection without leakage in an appropriate process. In addition, it is naturally undesirable to perform duplicate inspections, which leads to a decrease in production efficiency and equipment consumption.
Accordingly, the present invention has been made to solve the above-described problems, and eliminates duplicate inspection for the same defect, and can realize a product inspection content setting method and a product inspection content changing method that can realize cost reduction and inspection time reduction. An object of the present invention is to provide a product inspection content setting system and a product inspection content changing system.
[0004]
[Means for Solving the Problems]
  In order to solve the above-described problems, the invention according to claim 1Target to be inspectedConfigure the productpluralParts andEachParts and parts, The assembly method of each part, the relation of the connection location of each part, the target product design data including information related to each part, each part that can be used to configure the product,An inspection method for inspecting the part; andTheDetectable by inspection methodCan occur in each of the above partsDefects and, Data that can detect each inspection method corresponding to the design condition associated with the information about,ContrastBy associating, information relating to a defect phenomenon that may occur in the parts of the target product and an inspection method that can detect the defect phenomenon is associated with each other.Target product detectable data,In the case where a plurality of inspection methods correspond to the same defect phenomenon in each part in the target product detectable data, inspection is performed from the viewpoint of enabling inspection with optimum inspection time, inspection cost, and inspection capability. Determined based on time, inspection cost and inspection abilityExpressed by each inspection methodBy preferentially selecting an inspection method with a high inspection rank for a defect phenomenon, each defect phenomenon isThe main feature is the product inspection content setting method that sets the inspection method.
  In invention of Claim 2,Before selecting an inspection method using the inspection rank, each of the target productsParts and,AboveeachParts and parts,Defects occurring at the site and,Information aboutMappingTarget product defect occurrence dataBased on beforeFrom the target product detectable data,Each of the parts in the target productExtract an inspection method that enables detection of a defective phenomenon occurring in the part,If the extracted inspection method is duplicated for the same defect phenomenon in each part, the inspection method having a high inspection rank is preferentially selected, so that each defect phenomenonThe main feature is the product inspection content setting method that sets the inspection method.
  In invention of Claim 3,The target product defect occurrence data is theTarget product design data,Each that can be used to configure a productParts and, Each of the partsSaid part and,AboveeachHow to assemble parts,As a design condition, a combination of information aboutTheDesign conditionUnderOccurrenceCanThe failure occurrence data corresponding to the design condition represented by the failure phenomenonGenerated byThe main feature is the product inspection content setting method.
  According to the fourth aspect of the present invention, the main feature is a product inspection content setting method that estimates defect occurrence data corresponding to the design condition from the past defect occurrence status and sets the defect occurrence data corresponding to the design condition.
  In the invention of claim 5, from the target product defect occurrence dataIsInspection standard data expressed by defective phenomena that are not inspectedInformation about the same failure phenomenon, Exclude unnecessary testsRemove forThe main feature is the product inspection content setting method.
[0005]
  In invention of Claim 6,The target product defect occurrence data includes a defect rate of a defect phenomenon occurring at each part of the target product,From the target product defect occurrence dataIsInspection standard data expressed by target quality of target productsBased on information about target defect rates forExclude unnecessary testsFor this reason, information on defect phenomena is deleted in ascending order of the defect rate until the total defect rate reaches the target defect rate.The main feature is the product inspection content setting method.
  In invention of Claim 7,The target product detectable data is generated by comparing the target product design data with information on the selected inspection method among the inspection method detectable data.The main feature is the product inspection content setting method.
  In invention of Claim 8,The target product detectable data detects the defective phenomenon that may occur at the parts of the target product and the defective phenomenon by comparing the target product design data and the inspection method detectable data. After generating correspondence data in which information on possible inspection methods is associated, the association data is compared with process design data including information on assembly methods, inspection methods, and their order, The parts whose assembly method order is slower than the inspection method order are generated by rewriting the information of the inspection method capable of detecting a defective phenomenon that may occur at the part into undetectable information.The main feature is the method for changing product inspection contents.
  In invention of Claim 9,In the stage of designing the inspection part of the product or the inspection jig for the inspection of the product, the inspection content for the product is set and the inspection part of the product necessary for the inspection content or Design an inspection part of the inspection jig for inspection of the productThe main feature is the method for changing product inspection contents.
  In invention of Claim 10,From the inspection results of the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, the respective parts in the target product, and the respective parts Collects target product defect occurrence data that correlates information about a part and a defect phenomenon that occurs in the part, and responds to a defect phenomenon that does not occur based on the target product defect occurrence data from the set inspection method Exclude inspection methodsThe main feature is the method for changing product inspection contents.
  In the invention according to claim 11,From the inspection results of the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, the respective parts in the target product, and the respective parts Collecting target product defect occurrence data that correlates information about a part and a defect phenomenon occurring in the part, and analyzing the analysis of the defect occurrence state based on the target product defect occurrence data shows a gradual decrease in the defect phenomenon In this case, the inspection method corresponding to the defect phenomenon that is a gradual decrease is excluded from the set inspection method.The main feature is the method for changing product inspection contents.
[0006]
  In invention of Claim 12,From the final product inspection results including the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, or the inspection results of the subsequent process, the target product Collects target product defect occurrence data in which information related to each part, part of each part, and defect phenomenon occurring in the part is associated, and detects the target product defect occurrence data with the set inspection method When a defect phenomenon that cannot be performed occurs, from the target product detectable data that associates information about a defect phenomenon that can occur in the part of each part of the target product and an inspection method that can detect the defect phenomenon, If an inspection method that can detect a failure phenomenon that cannot be detected is extracted, and the extracted inspection method overlaps the same failure phenomenon in each of the parts By selecting the check rank high inspection method preferentially sets a single inspection method for the defective phenomena which can not be said detectingThe main feature is the method for changing product inspection contents.
  In invention of Claim 13,From the final product inspection results including the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, or the inspection results of the subsequent process, the target product Collects target product defect occurrence data in which information related to each part, part of each part, and defect phenomenon occurring in the part is associated, and detects the target product defect occurrence data with the set inspection method Information regarding a defect phenomenon that can occur at the part of each part of the target product and an inspection method that can detect the defect phenomenon when a defect phenomenon that cannot be performed occurs and there is a gradual increase in the defect phenomenon. From the associated target product detectable data, an inspection method capable of detecting the trending increase defect phenomenon is extracted, and the extracted inspection method is the same for each component. If overlap of the defective phenomena, by selecting a high inspection method of the inspection rank priority, sets the single test method with respect to the tendency increase in failure phenomenaThe main feature is the method for changing product inspection contents.
  In invention of Claim 14,A database unit for storing design data of the product, a plurality of parts constituting a target product to be inspected from the data of the database unit, a part of each part, an assembling method of each part, and a connection part of each part A data collection unit that collects target product design data including information related to the relationship between each part, each part that can be used to configure a product, an inspection method that inspects the part of each part, and the detection method that can detect the part Each inspection method detectable data input / output unit corresponding to the design condition for inputting each inspection method detectable data corresponding to the design condition in which information related to a defect phenomenon that may occur in each part is associated, and each of the inspection methods can be detected By comparing the data and the target product design data, it is possible to detect a defective phenomenon that can occur at the parts of the target product and the defective phenomenon Detectable data creation unit having a target product detectable data creation unit that generates target product detectable data associated with information on the inspection method, and enables inspection with optimal inspection time, inspection cost, and inspection capability Inspection method feature data creation unit having a detection method feature data input unit for inputting an inspection rank for a defect phenomenon represented by each inspection method as detection method feature data, which is determined on the basis of inspection time, inspection cost and inspection capability And when a plurality of inspection methods correspond to the same defect phenomenon in each part in the target product detectable data of the inspection method feature data creation unit, the inspection method with the higher inspection rank is given priority. An inspection content setting unit having a target product inspection content setting unit for setting a single inspection method for each defect phenomenon, Product inspection contents setting system that includes aIs the main feature.
  In invention of Claim 15,The detectable data creation unit includes a target product detectable data input / output unit for inputting the target product detectable data.The product inspection content setting system is the main feature.
[0007]
  In the invention of claim 16,The product inspection content setting system according to claim 14 or 15, further comprising the objectProductIn each of the aboveParts and, Each of the aboveParts and partsThe aboveDefective phenomenon that occurs at the site,Information aboutMappingProvided with a defect occurrence data creation unit having a target product defect occurrence data input / output unit for inputting the target product defect occurrence data,Before selecting an inspection method using the inspection rank,The target product defect occurrence data of the defect occurrence data creation unitOn the basis of the,The target product detectable dataFrom the above, an inspection method capable of detecting a defect phenomenon occurring at the part of each part in the target product is extracted, and the extracted inspection method is duplicated for the same defect phenomenon in each part. In this case, a single inspection method for each defect phenomenon is selected by preferentially selecting an inspection method having a high inspection rank.The main feature is the product inspection content setting system that sets the inspection method.
  In the invention of claim 17,,in frontThe defect occurrence data creation unit includes the target product design data of the data collection unit and each product that can be used to configure a product.Parts and eachThe part of the part and, Each of the aboveHow to assemble parts,As a design condition, a combination of information onUnderOccurrenceCanShow by defect phenomenonSaidDefect occurrence data corresponding to design conditions and,MapSaid byTarget product defect occurrence dataGenerate aThe main feature is a product inspection content setting system having a target product defect occurrence data creation unit.
  In the invention of claim 18,,in frontThe defect occurrence data creation partThe target product design data of the data collection unit;Past defect statusOn the basis of theDefect prediction system that estimates defect occurrence data corresponding to design conditionsThe target product by associating with the defect occurrence data predicted byDefect occurrence dataGenerationThe main feature is a product inspection content setting system having a target product defect occurrence data creation unit.
[0008]
  In the invention of claim 19, the defect occurrence data creation unitThe target product defect occurrence data creation unit generates theInspection standard data expressed by defect phenomenon that does not perform inspection from target product defect occurrence dataInformation about the same failure phenomenon asExclude unnecessary testsRemove forThe main feature is a product inspection content setting system having an inspection unnecessary part deletion part.
  In the invention of claim 20,The target product defect occurrence data includes a defect rate of a defect phenomenon occurring at each part of the target product,The defect occurrence data creation unitThe target product defect occurrence data creation unit generates theInspection standard data expressed by target quality of target product from target product defect occurrence dataBased on information about target defect rates forExclude unnecessary testsFor this reason, information on defect phenomena is deleted in ascending order of the defect rate until the total defect rate reaches the target defect rate.The main feature is a product inspection content setting system having an inspection unnecessary part deletion part.
  In the invention of claim 21,,in frontThe inspection content setting sectionThe inspection method set in the target product inspection content setting unit,The main feature is a product inspection content setting system having a target product inspection content input / output unit for output.
[0009]
  In the invention according to claim 22,The detectable data creation unit includes a product inspection content setting system having a target product inspection method input unit capable of selecting an arbitrary inspection method from the inspection method detectable data.Is the main feature.
  In invention of Claim 23,The target product detectable data creation unit compares the target product design data of the data collection unit with the inspection method detectable data of the inspection method detectable data input / output unit, and After generating association data that associates information related to a defect phenomenon that can occur in each part of the component and an inspection method that can detect the defect phenomenon, the association data, the assembly method, and the inspection Of the inspection method capable of detecting a defective phenomenon that may occur at the part of the part whose assembly method order is slower than the inspection method order. Product inspection content setting system for generating the target product detectable data by rewriting information into undetectable informationIs the main feature.
  In invention of Claim 24, from the database part which memorize | stores the quality data of a product, and the data of the said database part,An inspection method set by the product inspection content setting system according to any one of claims 14 to 23.Based onCarried outA data collection unit that collects target product quality data consisting of the actual product inspection results;The target product design data; andOf data collectionSaidTarget product quality dataAndTarget product defect occurrence dataGenerationA defect occurrence data creation unit having a target product defect occurrence data creation unit,From the set inspection method,Target product defect occurrence dataExclude inspection methods corresponding to defective phenomenaAn inspection content setting unit having a target product inspection content setting unit.RuThe main feature is a product inspection content change system.
[0010]
  In invention of Claim 25, from the data of the database part which stores quality data of a product, and the database part,An inspection method set by the product inspection content setting system according to any one of claims 14 to 23.Based onCarried outA data collection unit that collects target product quality data consisting of the actual product inspection results;The target product design data; andOf data collectionSaidTarget product quality dataAndTarget product defect occurrence dataGenerationA defect occurrence data creation unit having a target product defect occurrence data creation unit,in frontProduct defect occurrence databased onProbability of defects through analysis of defect occurrence statusDecreaseIf you seeIt is a gradual decrease from the set inspection method.BadCorresponding to the phenomenonInspectionExclude methodsA product inspection content changing system including an inspection content setting unit having a target product inspection content setting unit is a main feature.
  In the invention of claim 26,24. Product inspection performed based on an inspection method set by the product inspection content setting system according to any one of claims 14 to 23 from a database unit storing product quality data and data of the database unit. By associating a data collection unit that collects target product quality data consisting of final product inspection results or post-process inspection results including, the target product design data, and the target product quality data of the data collection unit, A defect occurrence data creation unit having a target product defect occurrence data creation unit that generates target product defect occurrence data, and an inspection time, an inspection cost, and an inspection from the viewpoint of enabling inspection with an optimum inspection time, inspection cost, and inspection capability The inspection rank for the defect phenomenon determined based on the capability and expressed for each inspection method is used as the detection method feature data. And an inspection method wherein data creation unit having a detection method wherein a data input unit for inputting, failure phenomena that can not be detected by the inspection method described above settingsIn the target product defect occurrence dataWhen,The undetectable defect phenomenon can be detected from the target product detectable data that associates the defect phenomenon that may occur in the parts of the target product with the inspection method that can detect the defect phenomenon. When an inspection method is extracted and the extracted inspection method is duplicated for the same defect phenomenon in each part, the detection cannot be performed by preferentially selecting an inspection method having a high inspection rank. An inspection content setting unit having a target product inspection content setting unit for setting a single inspection method for a defect phenomenon;The main feature is a product inspection content change system.
  In the invention of claim 27,24. Product inspection performed based on an inspection method set by the product inspection content setting system according to any one of claims 14 to 23 from a database unit storing product quality data and data of the database unit. By associating a data collection unit that collects target product quality data consisting of final product inspection results or post-process inspection results including, the target product design data, and the target product quality data of the data collection unit, A defect occurrence data creation unit having a target product defect occurrence data creation unit that generates target product defect occurrence data, and an inspection time, an inspection cost, and an inspection from the viewpoint of enabling inspection with an optimum inspection time, inspection cost, and inspection capability The inspection rank for the defect phenomenon determined based on the capability and expressed for each inspection method is used as the detection method feature data. When a tendency increase of the defect phenomenon is found by analysis of the defect occurrence state based on the target product defect occurrence data and the inspection method feature data creation section having the detection method feature data input section to be input, the tendency increase defect phenomenon If there is no inspection method corresponding to the above-described inspection method in the set inspection method, a target in which information on a defect phenomenon that can occur in each part of the target product and an inspection method that can detect the defect phenomenon is associated When an inspection method capable of detecting the undetectable defect phenomenon is extracted from the product detectable data, and the extracted inspection method is duplicated for the same defect phenomenon in each of the parts, the inspection rank It has a target product inspection content setting section for setting a single inspection method for the undetectable defect phenomenon by preferentially selecting a high inspection method. And査content setting unit, equipped with aThe main feature is a product inspection content change system.
[0012]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. FIG. 1 shows a configuration of a product inspection content setting system (product inspection content changing system) according to an embodiment of the present invention. The main part of the product inspection content setting system includes a database unit 10 that stores product design data, a data collection unit 20 that collects target product data from the data in the database unit 10, and a target product from data in the data collection unit 20. Detectable data creation unit 30 that creates detectable data, defect prediction system 100 that predicts defects in the target product, defect prediction system 100, data collection unit 20, and the like generate defect occurrence data for the target product. A defect occurrence data creation unit 40, an inspection method feature data creation unit 50 that creates inspection method feature data, a defect occurrence data creation unit 40, and a data that can be detected from the data of the detectable data creation unit 30 can generate Then, an inspection method capable of detecting the defect phenomenon is extracted, and the data of the inspection method feature data creation unit 50 is used as a criterion for determination. It consists examination content setting unit 60 for setting the examination content Te.
The database unit 10 includes product design data for each assembly location of the product, process design data for each process (assembly and inspection) of the product, assembly component design data for each assembly part identification of the product, and connection of the product. It is composed of a product design database 11 storing connection location design data for each location and connection location related data of the product, and a manufacturing quality database 12 storing product defect data and production data.
Product design database 11 includes product identification, line identification, assembly location identification, assembly component identification, assembly method, assembly location characteristics, product design data for each assembly location represented by assembly presence, product identification, line Identification, process identification (assembly method, inspection method), process design data represented in order, assembly part identification, assembly part design data represented by assembly part characteristics, product identification, assembly location identification Connection location design data represented by connection location identification, connection location characteristics, connection location related identification, and connection location related data represented by product identification, connection location related identification, and connection location related characteristics are stored.
Here, the assembly location characteristic represents a combination of characteristics and the like for each assembly location of a part to be assembled or an assembly jig. The assembled part characteristic represents a combination of characteristics and the like for each assembled part. A connection location characteristic represents a combination of characteristics and the like for each connection location. Here, the characteristics represent a combination of structural characteristics, material characteristics, characteristics, and the like. The structural characteristic represents a combination of conditions such as shape, size, angle, weight, and arrangement. The material characteristics represent a combination of conditions such as material and surface treatment. Further, the feature represents a combination of conditions such as type, packing form, and inspection design.
[0013]
The production quality database 12 includes production time, product identification, line identification, inspection method, assembly location identification, connection location identification, defect phenomenon, defect data represented by the number of defects, production time, product identification, line identification, and inspection method. Production data represented by the number of productions is stored.
The data collection unit 20 is a target product identification line identification input unit 21 for inputting product identification and line identification of the target product, a target product design data collection unit 22 for collecting design data of the target product, and a target for storing the design data Product design data storage unit 23, target product design data input / output unit 24 for inputting / outputting the design data, target product quality data collecting unit 25 for collecting quality data of the target product, and target product for storing the quality data It comprises a quality data storage unit 26 and a target product quality data input / output unit 27 for inputting / outputting the quality data.
The target product identification line identification input unit 21 is stored in the product design database 11 as product identification and line identification of the target product for which data is collected by the target product design data collection unit 22 and the target product quality data collection unit 25. Select and input the product identification and line identification. In this case, arbitrary product identification and line identification can be input. Here, the input may be either a range input that delimits a certain range or an ambiguous input that does not delimit.
[0014]
The target product design data collection unit 22 receives the product identification input from the product design database 11 by the target product identification line identification input unit 21, product design data for each assembly location of the line identification, process design data, connection location design data, connection Location related data and assembly part design data for assembly part identification in product design data for each assembly location are collected. The assembly part identification of the product design data and the assembly part design data for each assembly location is compared, and the assembly component design data is associated with the product design data for each assembly location to obtain association data A. The assembly location identification of the association data A and the connection location design data is compared, and the connection location design data is associated with the association data A to obtain association data B. The assembly location identification and the connection location identification of the association data B and the connection location related data are compared, the connection location related data is associated with the association data B, and the product design data is set for each connection location. Product design data and process design data for each connection location are stored in the target product design data storage unit 23.
The association data A is represented by product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, and assembly component characteristics. Correspondence data B is represented by product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location identification, connection location characteristics, connection location related identification The
The target product design data storage unit 23 is product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location identification, connection location characteristics, connection related identification, connection Product design data for each connection location represented by the location-related characteristics, product identification, line identification, process identification (assembly method, inspection method), and process design data represented in order are stored.
The target product design data input / output unit 24 inputs, edits, and outputs data stored in the target product design data storage unit 23. Defect data represented by production time, product identification, line identification, inspection method, assembly location identification, connection location identification, defect phenomenon, number of defects, production time, product identification, line identification, inspection method, number of production Production data to be stored.
The target product design data collection unit 25 collects defect data and production data for product identification and line identification input from the product quality database 12 by the target product identification line identification input unit 21. The production time, product identification, line identification, and inspection method of the defect data and the production data are compared, and the production data is associated with the defect data to obtain association data C. From the association data C, the defect rate (number of defects / number of production) and the tendency of defects are calculated and associated with the association data C to obtain manufacturing quality data for each connection location. Manufacturing quality data for each connection location is stored in the target product design data storage unit 26. The association data C is represented by production time, product identification, line identification, inspection method, assembly location identification, connection location identification, defect phenomenon, number of defects, and number of production.
The target product quality data storage unit 26 is an assembly represented by production time, product identification, line identification, inspection method, assembly location identification, connection location identification, defect phenomenon, number of defects, number of products produced, defect rate, defect tendency. Manufacturing quality data is stored for each location identification. The target product quality data input / output unit 27 inputs, edits, and outputs the data stored in the target product quality data storage unit 26.
[0015]
The detectable data creating unit 30 is a target product detectable data storage unit 31 for storing the detectable data of the target product, a target product detectable data input / output unit 32 for inputting / outputting the detectable data, and design of each inspection method. Each inspection method detectable data storage unit 35 corresponding to a design condition for storing detectable data corresponding to the condition, and each inspection method detectable data input / output unit 36 corresponding to the design condition for inputting / outputting the detectable data The target product inspection method input unit 34 for inputting the inspection method of the target product, the design data of the target product, the detectable data corresponding to the design condition of each inspection method, and the detectable data of the target product from the inspection method of the target product The target product detectable data creation unit 33 for creating
Each inspection method detectable data storage unit 35 corresponding to the design conditions includes an inspection method, an assembling method, assembling location characteristics, assembling presence / absence, assembling component characteristics, connection location characteristics, connection location related characteristics, defect phenomenon, detectability Each inspection method detectable data corresponding to the design condition represented by is stored. Each inspection method detectable data input / output unit 36 corresponding to the design condition inputs, edits, and outputs data stored in each inspection method detectable data storage unit 35 corresponding to the design condition.
The target product inspection method input unit 34 selects and inputs an inspection method for collecting data in the target product detectable data creation unit 33. In this case, a plurality of arbitrary inspection methods can be input. Here, the input may be either a range input that delimits a certain range or an ambiguous input that does not delimit.
The target product detectable data creation unit 33 is configured to select a predetermined inspection method or target from each inspection method detectable data corresponding to the design condition stored in each inspection method detectable data storage unit 35 corresponding to the design condition. Data of the inspection method input by the product inspection method input unit 34 is extracted and set as extracted data A.
[0016]
Compare product design data and extracted data A assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location characteristics, connection location related characteristics for each connection location stored in the target product design data storage unit 23 Then, the product design data and the extracted data A are associated with each other for each connection location, and are defined as association data D. The associating data D and the process product data assembling method stored in the target product design data storage unit 23 are compared, the process design data is associated with the associating data D, and the associating data E is obtained. Here, the order of the process design data is the assembly method order.
The inspection method of the process design data stored in the association data E and the target product design data storage unit 23 is compared, and the process design data is associated with the association data E to obtain association data F. Here, the order of the process design data is the inspection method order. The assembling method order of the association data F is compared with the inspection method order. If the assembling method order is later than the inspection method order, it is determined that detection is not possible and the target product is detectable data. The target product detectable data is stored in the target product detectable data storage unit 31. Correspondence data D includes product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location identification, connection location characteristics, connection related identification, connection location related It is expressed by characteristics, defect phenomenon, inspection method, and detection availability.
Correspondence data E includes product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location identification, connection location characteristics, connection related identification, connection location related It is represented by characteristics, defect phenomenon, inspection method, detectability, and assembly method order.
Correspondence data F includes product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location identification, connection location characteristics, connection-related identification, connection location-related It is represented by characteristics, defect phenomenon, inspection method, detectability, assembly method order, and inspection method order.
[0017]
  The target product detectable data storage unit 31 is product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location identification, connection location characteristics, connection related identification, The target product detectable data represented by the connection location-related characteristics, the defect phenomenon, the inspection method, and the detectability is stored. The target product detectable data input / output unit 32 inputs, edits, and outputs the data stored in the target product detectable data storage unit 31. FIG. 2 shows an example of target product detectable data in which information on a part constituting a product, a part of the part, an inspection method for inspecting the part, and information on a defect phenomenon detectable by the inspection method are compared. . In FIG. 2, it is indicated by ○ when it can be inspected and × when it cannot be inspected.
  The defect occurrence data creation unit 40 corresponds to a target product defect occurrence data storage unit 41 that stores defect occurrence data of the target product, a target product defect occurrence data input / output unit 42 that inputs and outputs the defect occurrence data, and the design conditions. Corresponding to the design condition for inputting / outputting the defect occurrence data and the defect occurrence data storage unit 44 corresponding to the design condition for storing the defect occurrence dataDefect occurrence data input / output unit 45From the inspection execution standard storage unit 47 that stores the inspection execution standard, the inspection execution standard input / output unit 48 that inputs and outputs the inspection execution standard, the design data of the target product, and the defect occurrence data corresponding to the design condition, the target Create defect occurrence data for the product, or extract defect phenomena predicted to occur from the design conditions for the design data of the target product, and use the extracted data as defect occurrence data for the target product. Alternatively, a defect phenomenon that has actually occurred is extracted, and the target product defect occurrence data creation unit 43 that uses the extracted data as the defect occurrence data of the target product and the inspection execution standard data from the defect occurrence data of the target product. As a criterion for the judgment, an inspection unnecessary part deleting unit 46 for deleting a part that does not need to be inspected is configured. FIG. 3 shows an example of target product defect occurrence data in which information on a part constituting a product, a part of the part, and a defect phenomenon occurring at the part are compared. In FIG. 3, the unit ppm is a unit of part par million, and 1 ppm means one millionth.
[0018]
  The defect occurrence data storage unit 44 corresponding to the design conditions is a design expressed by the assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location characteristics, failure phenomenon, number of failures, number of connections, failure rate The defect occurrence data corresponding to the conditions is stored (the number of defects, the number of connection points, and the defect rate may be blank).
  Corresponding to design conditionsDefect occurrence data input / output unit 45Inputs, edits, and outputs data stored in the defect occurrence data storage unit 44 corresponding to the design conditions. The inspection execution standard storage unit 47 includes product identification, line identification, assembly location identification, defect phenomenon, inspection implementation criteria for each product represented as inspection unnecessary, assembly method, assembly location characteristics, assembly presence / absence, assembly Inspection performance standards corresponding to design conditions expressed as part characteristics, connection location characteristics, defect phenomenon, number of defects, number of connections, defect rate, inspection required, and defects represented by product identification, line identification, and target defect rate The rate inspection performance standard is stored.
  The inspection execution standard input / output unit 48 inputs, edits, and outputs data stored in the inspection execution standard storage unit 47. The target product defect occurrence data creating unit 43 generates defects corresponding to the design conditions stored in the defect occurrence data storage unit 44 corresponding to the product design data and design conditions for each connection location stored in the target product design data storage unit 23. Compares the data assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, and connection location characteristics, correlates product design data for each connection location with failure occurrence data corresponding to design conditions, and generates target product failures. Data. Alternatively, the product design data for each connection location stored in the target product design data storage unit 23 and the failure phenomenon predicted from the failure prediction system 100 are extracted, and the extracted data is associated with the target product failure occurrence data. To do. Alternatively, the product design data for each connection location stored in the target product design data storage unit 23 is associated with the data obtained by extracting the defective phenomenon actually generated from the target product quality data storage unit 26, and the target product defect occurrence data To do. Then, the target product defect occurrence data is stored in the target product defect occurrence data storage unit 41.
[0019]
  The target product failure occurrence data storage unit 41 is represented by product identification, line identification, assembly location identification, connection location identification, failure phenomenon, number of failures, number of connections, failure rate, failure tendency.Target product defect occurrence dataIs memorized. In this case, the number of defects, the number of connection points, the defect rate, and the tendency of defects may be blank. The target product defect occurrence data input / output unit 42 inputs, edits, and outputs data stored in the target product defect occurrence data storage unit 41.
  The inspection unnecessary part deleting unit 46 is a method of assembling the target product defect occurrence data stored in the target product defect occurrence data storage unit 41 and the inspection execution standard corresponding to the design conditions stored in the inspection execution standard storage unit 47, Compare assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location characteristics, defect phenomenon, number of defects, number of connections, defect rate, and target product defect occurrence data corresponds to inspection execution standards corresponding to design conditions And association data G.
  Compare the association data G with the product identification, line identification, assembly location identification, connection location identification, and defect phenomenon of the inspection implementation criteria for each product stored in the inspection implementation criteria storage unit 47, and inspect the association data G with each product. Assume that the execution standard is associated with the association data H. From the association data H, the inspection requirement corresponding to the design condition is “unnecessary” and the target product inspection necessity is “unnecessary”, and the inspection requirement corresponding to the design condition is “unnecessary”. Data that is not required is blank and data that is not required for inspection corresponding to design conditions are blank and data that is not required for target product inspection are deleted. Product identification, line identification, assembly location identification, connection Location identification, defect phenomenon, number of defects, number of connection points, defect rate are used as target product defect occurrence data.
  The target product defect occurrence data is stored in the target product defect occurrence data storage unit 41. Further, the target product failure occurrence data stored in the target product failure occurrence data storage unit 41 is deleted in ascending order of the failure rate, and the deletion is performed (those with a small number of connection points are excluded because of low reliability). This is performed until the sum of the defective rates of the data reaches the target defective rate of the defective rate inspection execution standard stored in the inspection execution standard storage unit 47. Here, the blank indicates that it is neither “necessary” nor “unnecessary”.
  The association data G is expressed as product identification, line identification, assembly location identification, connection location identification, defect phenomenon, number of defects, number of connection points, defect rate, and necessity of inspection corresponding to design conditions. Correspondence data H is expressed as product identification, line identification, assembly location identification, connection location identification, defect phenomenon, number of defects, number of connections, defect rate, inspection requirement corresponding to design conditions, and target product inspection unnecessary. The
[0020]
The inspection method feature data creation unit 50 includes an inspection method feature data storage unit 51 that stores the features of the inspection method, and an inspection method feature data input / output unit 52 that inputs and outputs the features. The inspection method feature data storage unit 51 has the inspection method feature data for each inspection method represented by the inspection method and the inspection method feature, the inspection method, the assembly method, the assembly location characteristic, the assembly presence / absence, the assembly component property, and the connection location. Inspection method characteristic data is stored for each inspection method design condition represented by characteristics, defect phenomenon, and inspection rank. The inspection method feature data input / output unit 52 inputs, edits, and outputs data stored in the inspection method feature data storage unit 51. FIG. 4 shows an example of inspection method characteristic data that represents the characteristics of the inspection method for each inspection method. In FIG. 4, A, B, C, and D indicate ranking.
The inspection content setting unit 60 is a target product inspection content setting unit 61 that sets inspection contents from the defect occurrence data of the target product, the detectable data of the target product, and the characteristic data of the inspection method, and the target product inspection that stores the inspection contents A content storage unit 62 and a target product inspection content input / output unit 63 for inputting / outputting the inspection content are configured.
The target product inspection content setting unit 61 extracts the target product detectable data stored in the target product detectable data storage unit 31 to obtain extracted data B. Alternatively, product identification, line identification, and assembly location identification of the target product defect occurrence data stored in the target product defect occurrence data storage unit 41 and the target product detectable data stored in the target product detectable data storage unit 31 The connection location identification and the defect phenomenon are compared, and the target product detectable data in the target product defect occurrence data is extracted as extracted data B.
Compare the extracted data B with the inspection method of the inspection method feature data for each inspection method stored in the inspection method feature data storage unit 51, associate the extracted data B with the inspection method feature data for each inspection method, To do. From the association data I, the identification of the assembly location identification, connection location identification, and defective phenomenon are extracted, and the detection capability is “Yes” and judged from the inspection method characteristics (for example, select the one with a low load) And the contents of the target product inspection. An example of the target product inspection content is as shown in FIG.
[0021]
The target product inspection content storage unit 62 stores the target product inspection content. Alternatively, the inspection method characteristic data inspection method, assembling method, assembling location characteristics, assembling presence / absence, assembling part characteristics, connection for each inspection method design condition stored in the extracted data B and the inspecting method characteristic data storage unit 51 The location characteristics and the defect phenomenon are compared, and the extracted data B and the inspection method feature data are associated with each other according to the inspection method design condition to obtain association data J. From the association data J, extract the assembly location identification, connection location identification, and defective phenomenon duplicates, select the one with the highest detection rank that is “Yes” for detection, and the target product inspection details And
The target product inspection content storage unit 62 stores the target product inspection content. Furthermore, product identification, line identification, and assembly location identification of the target product inspection content stored in the target product inspection content storage unit 62 and the target product failure occurrence data stored in the target product failure occurrence data storage unit 41 The connection part identification and the failure phenomenon are compared, and those that are not in the target product failure occurrence data are deleted, and for some, the data stored in the inspection method feature data storage unit 51 is used as a reference (see ),to add.
Furthermore, when the tendency of the target product quality data stored in the target product quality data storage unit 26 is a gradual decrease, the target product inspection content stored in the target product inspection content storage unit 62, and the data Product identification, line identification, assembly location identification, connection location identification, and defect phenomenon are compared, and if the defect inspection is in the product inspection content, the defect inspection is excluded.
Furthermore, when the tendency of the target product quality data stored in the target product quality data storage unit 26 is a gradual increase, the target product inspection content stored in the target product inspection content storage unit 62, and the data Product identification, line identification, assembly location identification, connection location identification, defect phenomenon, and if the defect inspection is not in the product inspection content, the defect inspection is performed, and the criteria for judging the inspection method characteristic data Add as (see).
A trend decrease means a case in which a decrease in defects is continuously observed, a low defect rate is continuously maintained for a certain period of time / below a reference value. The tendency of the increase in defects refers to a case in which an increase in defects is continuously observed, a high defect rate is continuously maintained over a period of time, or a reference value is exceeded.
[0022]
Extracted data B is product identification, line identification, assembly location identification, assembly method, assembly location characteristics, assembly presence / absence, assembly component characteristics, connection location identification, connection location characteristics, connection-related identification, connection location-related properties , Failure phenomenon, inspection method, detection possibility. The association data I is represented by product identification, line identification, assembly location identification, connection location identification, failure phenomenon, number of failures, number of connections, failure rate, inspection method, detectability, and inspection method characteristics. The association data J is represented by product identification, line identification, assembly location identification, connection location identification, failure phenomenon, number of failures, number of connections, failure rate, inspection method, detection availability, and inspection rank.
The target product inspection content storage unit 62 stores the target product inspection content represented by product identification, line identification, assembly location identification, connection location identification, defect phenomenon, and inspection method. The inspection method feature data input / output unit 63 inputs, edits, and outputs data stored in the target product inspection content storage unit 62. The data is output to the product design system 200 and the inspection jig design system 300.
For example, when each of the above items is exemplified by a printed circuit board (including an electronic component mounted), the “production time” is the production date, the production date, etc., and the “product identification” is the printed circuit board Number, printed circuit board name, etc. “Line identification” is line number, line name, etc. “Assembly location identification” is reference number (address), etc. “Part identification” is mounted part number, product name, manufacturer "Manufacturer model number", "Assembly method" is a combination of mounting method, mounting process (equipment, people, etc.), mounting angle, etc., "Assembly location characteristics" are mounting surface, mounting coordinates, mounting angle, pad shape, Dimension, resist shape, dimensions, solder printing mask opening shape, combination of dimensions, etc., “Assembly part characteristics”, outline of shape (QFP, SOP, CHIP, etc.), outline of pin shape (flat, gull wing, etc.), number of pins Combination of length, width, height, pitch, material, mark, polarity, package outline (embossed tape, tray, stick, etc.), package dimensions, package angle, etc., “inspection method” is an inspection method (appearance) (Inspection machine, in-circuit tester, function tester, visual inspection, etc.) “Connection location identification” is pin number, etc. “Connection location characteristics” is center coordinates, pad shape, dimensions, resist shape, dimensions, solder printing Combination of mask opening shape, dimensions, etc., “connection location related identification” is node number, signal line name, etc. “connection location related characteristics” is an inspection pin for in-circuit tester and function tester. Uses whether or not.
[0023]
6 and 7 show the processing flow in the product inspection content setting system (product inspection content changing system) according to the embodiment of the present invention, that is, the product inspection content setting method (product inspection content changing) according to the embodiment of the present invention. Method). Here, it is assumed that the database unit 10 is prepared in advance and contains new data maintained at any time. As shown in FIG. 6, when the flow starts, a determination is first made at step 201. If the target product defect occurrence data is not created and the target product detectable data is not created from the design conditions, the process proceeds to step 91, the target product defect occurrence data is input, and the target product detectable data is created from the design conditions. If not, the process proceeds to step 911, and the target product defect occurrence data is created from the design condition, or the target product detectable data is created from the design condition, the process proceeds to step 70.
In step 91, the data stored in the target product detectable data storage unit 31 is input and edited using the target product detectable data input / output unit 32. Then, the process proceeds to step 205. In step 911, the same processing as in step 91 is performed, and then the process proceeds to step 101, where the data stored in the target product defect occurrence data storage unit 41 is input using the target product defect occurrence data input / output unit 42. To edit. Then, the process proceeds to Step 205.
In step 70, the target product identification line identification input unit 21 is used to select and input product identification and line identification stored in the product design database 11, or to input arbitrary product identification and line identification. Then, the process proceeds to step 81. In step 81, the target product design data collection unit 22 receives the product identification and line identification input in step 70 from the product design database 11, product design data for each assembly location, process design data, connection location design data, connection Collect location-related data and assembly part design data for assembly part identification in the product design data for each assembly location, associate the data, and store product design data and process design data for each connection location. And stored in the target product design data storage unit 23. At this time, the data stored in the target product design data storage unit 23 may be input, edited, and output using the target product design data input / output unit 24.
[0024]
After step 81, the process proceeds to step 202. When the target product detectable data is input, the process proceeds to step 912. When the target product detectable data is created from the design condition, the process proceeds to step 203. . In step 912, the same process as in step 91 is performed, and then the process proceeds to step 204.
In step 203, if the inspection method of the target product is not input, it is determined to move to step 92. If it is input, it is determined to move to step 94. In step 94, the target product inspection method input unit 34 is used to select and input an inspection method for collecting data, or to input a plurality of arbitrary inspection methods. Then, the process proceeds to step 92.
In step 92, data stored in each inspection method detectable data storage unit 35 corresponding to the design condition is input and edited using each inspection method detectable data input / output unit 36 corresponding to the design condition. Then, the process proceeds to Step 93. In step 93, the target product detectable data creation unit 33 sets each inspection method detectable data corresponding to the design condition stored in each inspection method detectable data storage unit 35 corresponding to the design condition, a previously designated inspection method. Alternatively, the inspection method data input by the target product inspection method input unit 34, the product design data and the process design data for each connection location stored in the target product design data storage unit 23 are extracted, associated, and changed. The target product detectable data is stored in the target product detectable data storage unit 31. At this time, the data stored in the target product detectable data storage unit 31 may be input, edited, and output using the target product detectable data input / output unit 32. Then, the process proceeds to step 204.
[0025]
In step 204, when the target product defect occurrence data is created only from the design conditions, a determination is made to move to step 102, and when estimation is made from a past defect occurrence state, a determination is made to move to step 104. In step 102, data stored in the defect occurrence data storage unit 44 corresponding to the design condition is input and edited using the defect occurrence data input / output unit 45 corresponding to the design condition. Then, the process proceeds to step 103. In step 103, the target product defect occurrence data creation unit 43 sets the design conditions stored in the defect occurrence data storage unit 44 corresponding to the product design data and design conditions for each connection location stored in the target product design data storage unit 23. Corresponding defect occurrence data is associated, and the target product defect occurrence data is stored in the target product defect occurrence data storage unit 41. At this time, the data stored in the target product defect occurrence data storage unit 41 may be input, edited, and output using the target product defect occurrence data input / output unit 42. Thereafter, the process proceeds to step 205.
In step 104, the target product defect occurrence data creation unit 43 extracts and associates the product design data for each assembly location stored in the target product design data storage unit 23 and the defect phenomenon predicted from the defect prediction system 100. The target product defect occurrence data is stored in the target product defect occurrence data storage unit 41. At this time, the data stored in the target product defect occurrence data storage unit 41 may be input, edited, and output using the target product defect occurrence data input / output unit 42. Thereafter, the process proceeds to step 205.
In step 205, if the unnecessary part of the inspection is not deleted, it is determined to proceed to step 206 in FIG. 7, and if it is deleted, the defect not to be inspected is registered. However, when deleting according to the target quality, it is determined to proceed to step 113.
[0026]
In step 111, the inspection execution standard input / output unit 48 is used to input and edit data (inspection standard for each product, inspection execution standard corresponding to design conditions) stored in the inspection execution standard storage unit 47. Then, the process proceeds to step 112. In step 112, the unnecessary inspection part deletion unit 46 performs the target product defect occurrence data stored in the target product defect occurrence data storage unit 41, the inspection execution standard for each product stored in the inspection execution reference storage unit 47, and the inspection execution. The inspection execution standards corresponding to the design conditions stored in the reference storage unit 47 are associated and deleted, and the target product defect occurrence data is stored in the target product defect occurrence data storage unit 41. At this time, the data stored in the target product defect occurrence data storage unit 41 may be input, edited, and output using the target product defect occurrence data input / output unit 42. Then, the process proceeds to Step 206.
On the other hand, in step 113, using the inspection execution standard input / output unit 48, data (target failure rate) stored in the inspection execution standard storage unit 47 is input and edited. Then, the process proceeds to step 114, and the target product defect occurrence data stored in the target product defect occurrence data storage unit 41 is deleted in ascending order of the defect rate (the one with a small number of assembly points is low in reliability). This is performed until the sum of the defective rates of the deleted data reaches the target defective rate of the defective rate inspection execution standard stored in the inspection execution standard storage unit 47. At this time, the data stored in the target product defect occurrence data storage unit 41 may be input, edited, and output using the target product defect occurrence data input / output unit 42. Thereafter, the process proceeds to step 206.
[0027]
In step 206 in FIG. 7, when the inspection rank for the defective phenomenon is set as the target product inspection feature data, it is determined to proceed to step 122, and otherwise, it is determined to proceed to 121. In step 122, the inspection method feature data input / output unit 52 is used to input, edit, and output inspection method feature data for each inspection method design condition stored in the inspection method feature data storage unit 51. Then, the process proceeds to Step 207. On the other hand, in step 121, using the inspection method feature data input / output unit 52, the inspection method feature data for each inspection method stored in the inspection method feature data storage unit 51 is input, edited, and output. Then, the process proceeds to Step 207.
In step 207, if the target product defect occurrence data has not been created, the process proceeds to step 131. If it has been created, the process proceeds to step 132. In step 131, the target product inspection content setting unit 61 extracts and associates target product detectable data stored in the target product detectable data storage unit 31. Then, it progresses to step 208. On the other hand, in step 132, extraction and association of the target product defect occurrence data stored in the target product defect occurrence data storage unit 41 and the target product detectable data stored in the target product detectable data storage unit 31 are performed. carry out. Thereafter, the process proceeds to Step 208.
In step 208, if the inspection rank for the defective phenomenon is the target product inspection feature data, it is determined to proceed to step 142, and otherwise, it is determined to proceed to 141. In step 141, the data extracted and associated in step 131 or 132 and the inspection method feature data for each inspection method stored in the inspection method feature data storage unit 51 are associated with each other. Judging from the characteristics of the inspection method (for example, selecting the one with a low load), the target product inspection content is stored in the target product inspection content storage unit 62. At this time, the data stored in the target product inspection content storage unit 62 may be input, edited, and output using the target product inspection content input / output unit 63. Thereafter, the process proceeds to step 209.
[0028]
In step 142, the data extracted and associated in steps 131 and 132 and the inspection method feature data for each inspection method stored in the inspection method feature data storage unit 51 are associated with each other. Then, the one with the highest inspection rank is selected, and the target product inspection content is stored in the target product inspection content storage unit 62. At this time, the data stored in the target product inspection content storage unit 62 may be input, edited, and output using the target product inspection content input / output unit 63. Then, the process proceeds to Step 209.
In step 209, if the target product inspection content is to be changed using the target product manufacturing quality data, it is determined to proceed to step 701, and otherwise, it is determined to proceed to 211. In step 701, the same process as in step 70 is performed, and then the process proceeds to step 811. In step 811, the same process as in step 81 is performed, and then the process proceeds to step 82. In step 82, the target product design data collection unit 25 collects the product identification and line identification defect data and production data input in step 70 from the product quality database 12, and performs correspondence and calculation of the data. Then, the manufacturing quality data for each connection location is stored in the target product design data storage unit 26. At this time, the target product quality data input / output unit 27 may be used to input, edit, and output data stored in the target product quality data storage unit 26. Then, the process proceeds to step 95.
In step 95, the target product defect occurrence data creation unit 43 extracts the defective phenomenon actually generated from the product design data and target product quality data storage unit 26 for each assembly location stored in the target product design data storage unit 23. The target product failure occurrence data is stored in the target product failure occurrence data storage unit 41. At this time, the data stored in the target product defect occurrence data storage unit 41 may be input, edited, and output using the target product defect occurrence data input / output unit 42. Thereafter, the process proceeds to step 210.
[0029]
In step 210, when the inspection of defectives that do not occur is excluded from the inspection results, a determination is made to proceed to step 151, and when inspections of defects that are decreasing are excluded from the inspection results, the determination is made to proceed to step 152. In the case where a defect inspection that does not occur is added from the inspection results of the post-process, it is determined to proceed to step 153. In the case of adding a defect inspection that tends to increase from the inspection result of the post-process, step 154 is performed. Judge to go to.
In step 151, the target product inspection content stored in the target product inspection content storage unit 62 and the target product failure occurrence data stored in the target product failure occurrence data storage unit 41 are compared, and the target product failure occurrence data is compared. If it is not, delete it. In step 152, the target product inspection content stored in the target product inspection content storage unit 62 and the target product failure occurrence data stored in the target product failure occurrence data storage unit 41 are compared, and the target product failure occurrence data is compared. The data stored in the inspection method feature data storage unit 51 is added (referred to) as a criterion for determination. In step 153, when the tendency of the target product quality data of the final product inspection (or inspection in the subsequent process) stored in the target product quality data storage unit 26 is a gradual decrease, the target product inspection content storage unit 62 The target product inspection content stored in the data is compared with the data, and if the defective inspection is in the product inspection content, the defective inspection is excluded. In step 154, if the tendency of the target product quality data of the final product inspection (or subsequent process inspection) stored in the target product quality data storage unit 26 is a tendency increase, the target product inspection content storage unit 62. If the inspection of the defect is not in the product inspection contents, the inspection of the defect is performed using the inspection method characteristic data as a criterion for determination (see ),to add. After Steps 151, 152, 153, and 154, the process returns to Step 209 (point B in the figure).
In step 211, it is determined whether or not the detectable data of the target product, the defect occurrence data of the target product, and the inspection method characteristic data of the target product are to be corrected. If so, the process returns to the start. Proceed to step 212. In step 212, if the target product is to be output to the product / jig design system, it is determined to proceed to step 160. Otherwise, the process proceeds to the end and the flow process is terminated. In step 160, the inspection method feature data input / output unit 63 outputs the data stored in the target product inspection content storage unit 62 to the product design system 200 and the inspection jig design system 300. And it progresses to an end and complete | finishes a flow process.
[0030]
Therefore, in the above-described product inspection content setting method, since an inspection method for inspecting a part of a part constituting the product is set, it is impossible to make a part that can be inspected by an inspection item for each inspection process in the target part. Corresponding to the case where parts are mixed, duplicate inspection of the same defect is eliminated as a product. Thereby, it is possible to set the inspection contents that can eliminate the duplicate inspection for the same defect and can realize cost reduction and shortening of the inspection time.
In addition, since inspection methods that enable detection of defective phenomena that occur at parts of parts that make up a product are extracted and inspection methods are set to inspect those parts, the inspection of defects that occur as a product, The inspection of the defect which does not do is lost. Accordingly, it is possible to set the inspection content that eliminates the inspection cost increase (inspection time increase, etc.) due to the inspection of the defect that does not occur and the outflow of the next process of the generated defect.
Further, since it is not necessary to register in advance the failure phenomenon that occurs in the target product, knowledge of the failure occurrence condition becomes unnecessary.
In addition, since the estimation is based on the past occurrence status of defects, it is possible to eliminate inspection of defects that do not occur according to actual process capability and the like.
In addition, for example, if a defect that has occurred in a product produced in the past or a target product but does not occur at present is registered as a defect phenomenon in which no inspection is performed, the inspection of a defect that does not currently occur can be excluded. It becomes like this.
In addition, for example, inspections for defects below the quality target can be excluded in total.
Also, at the stage of designing the inspection parts of products and inspection jigs, the inspection details are set, and the inspection parts of the products and inspection jigs necessary for the inspection contents are designed, so the above becomes unnecessary. Costs can be reduced by eliminating inspection parts for products and inspection jigs. For example, when the target product is a printed circuit board (including one on which electrical components are mounted) and the inspection method is an electrical assembly inspection method (hereinafter referred to as an in-circuit tester), An inspection jig inspection portion such as a printed circuit board in-circuit tester pad is an in-circuit tester jig pin. By eliminating the pads and pins, a printed circuit board mounted with high density can be advantageously designed and inspected.
[0031]
In the method for changing the contents of product inspection, since the results are used, it is possible to eliminate the inspection of defects that do not actually occur.
In addition, since the actual results are used, it is possible to eliminate the inspection of defects having a low defect rate.
In addition, since the results are used, it is possible to add inspections for defects that actually occur.
Moreover, since the track record is used, it becomes possible to add a defect inspection with a high defect rate.
In addition, when setting which inspection method to inspect for a defective phenomenon that occurs, since an inspection method with a high inspection rank can be set preferentially, the inspection rank can be set to inspection time, inspection cost, If it is determined and determined based on the inspection capability or the like, the inspection content can be set with the optimal inspection time, inspection cost, and inspection capability.
In addition, since it is not necessary to register in advance a defect phenomenon that can be detected by the target product in each inspection method, it is not necessary to know how the inspection is performed in each inspection method. Furthermore, it corresponds to the case where inspection items are different for each inspection process.
In addition, since the inspection method for inspecting the target product can be selected, after setting the inspection content, the optimal inspection content can be set by changing the inspection method for inspecting the target product, judging from the inspection content Will be able to.
In the product inspection content setting system, the inspection method for inspecting the parts of the parts that make up the product is set, so there are a mixture of parts that can and cannot be inspected in the inspection items for each inspection process. The same defect is not duplicated as a product. Thereby, it is possible to set the inspection contents that can eliminate the duplicate inspection for the same defect and can realize cost reduction and shortening of the inspection time.
In addition, since inspection methods that enable detection of defective phenomena that occur at parts of parts that make up a product are extracted and inspection methods are set to inspect those parts, the inspection of defects that occur as a product, The inspection of the defect which does not do is lost. Accordingly, it is possible to set the inspection content that eliminates the inspection cost increase (inspection time increase, etc.) due to the inspection of the defect that does not occur and the outflow of the next process of the generated defect.
Further, since it is not necessary to register in advance the failure phenomenon that occurs in the target product, knowledge of the failure occurrence condition becomes unnecessary.
[0032]
In addition, since the estimation is based on the past occurrence status of defects, it is possible to eliminate inspection of defects that do not occur according to actual process capability and the like.
In addition, for example, if a defect that has occurred in a product produced in the past or a target product but does not occur at present is registered as a defect phenomenon in which no inspection is performed, the inspection of a defect that does not currently occur can be excluded. It becomes like this.
In addition, for example, inspections for defects below the quality target can be excluded in total.
Also, at the stage of designing the inspection parts of products and inspection jigs, the inspection details are set, and the inspection parts of the products and inspection jigs necessary for the inspection contents are designed, so the above becomes unnecessary. Costs can be reduced by eliminating inspection parts for products and inspection jigs. For example, when the target product is a printed circuit board (including one on which electrical components are mounted) and the inspection method is an electrical assembly inspection method (hereinafter referred to as an in-circuit tester), An inspection jig inspection portion such as a printed circuit board in-circuit tester pad is an in-circuit tester jig pin. By eliminating the pads and pins, a printed circuit board mounted with high density can be advantageously designed and inspected.
In the product inspection content change system, since the results are used, it is possible to eliminate the inspection of defects that do not actually occur.
In addition, since the actual results are used, it is possible to eliminate the inspection of defects having a low defect rate.
In addition, since the results are used, it is possible to add inspections for defects that actually occur.
Moreover, since the track record is used, it becomes possible to add a defect inspection with a high defect rate.
[0033]
In addition, when setting which inspection method to inspect for a defective phenomenon that occurs, since an inspection method with a high inspection rank can be set preferentially, the inspection rank can be set to inspection time, inspection cost, If it is determined and determined based on the inspection capability or the like, the inspection content can be set with the optimal inspection time, inspection cost, and inspection capability.
In addition, since it is not necessary to register in advance a defect phenomenon that can be detected by the target product in each inspection method, it is not necessary to know how the inspection is performed in each inspection method. Furthermore, it corresponds to the case where inspection items are different for each inspection process.
In addition, since the inspection method for inspecting the target product can be selected, after setting the inspection content, the optimal inspection content can be set by changing the inspection method for inspecting the target product, judging from the inspection content Will be able to.
In addition, in the product inspection content setting method, when setting which inspection method to inspect for a defect phenomenon that occurs, it is possible to preferentially set an inspection method with a high inspection rank. If it is determined and determined from the inspection time, inspection cost, inspection ability, etc., the inspection contents can be set with the optimum inspection time, inspection cost, inspection ability.
In addition, since it is not necessary to register in advance a defect phenomenon that can be detected by the target product in each inspection method, it is not necessary to know how the inspection is performed in each inspection method. Furthermore, it corresponds to the case where inspection items are different for each inspection process.
In addition, in the product inspection content setting system, when setting which inspection method to inspect for a defective phenomenon that occurs, it is possible to preferentially set an inspection method with a high inspection rank. If it is determined and determined from the inspection time, inspection cost, inspection ability, etc., the inspection contents can be set with the optimum inspection time, inspection cost, inspection ability.
In addition, since it is not necessary to register in advance a defect phenomenon that can be detected by the target product in each inspection method, it is not necessary to know how the inspection is performed in each inspection method. Furthermore, it corresponds to the case where inspection items are different for each inspection process.
[0034]
【The invention's effect】
  As described above, according to the first aspect, since an inspection method for inspecting a part of a part constituting a product is set, there is no part in the target part that can be inspected by an inspection item for each inspection process. Corresponding to the case where possible parts are mixed, duplicate inspection of the same defect is eliminated as a product. Thereby, it is possible to set the inspection contents that can eliminate the duplicate inspection for the same defect and can realize cost reduction and shortening of the inspection time.
  In addition, when setting which inspection method to inspect for a defective phenomenon that occurs, since an inspection method with a high inspection rank can be set preferentially, the inspection rank can be set to inspection time, inspection cost, If it is determined and determined based on the inspection capability or the like, the inspection content can be set with the optimal inspection time, inspection cost, and inspection capability.
  Furthermore, since it is not necessary to register in advance the defect phenomenon that can be detected by the target product in each inspection method, it is not necessary to know how the inspection is performed in each inspection method. Furthermore, it corresponds to the case where inspection items are different for each inspection process.
  According to the second aspect of the present invention, an inspection method that enables detection of a defect phenomenon occurring at a part of a component that constitutes a product is extracted, and an inspection method for inspecting the part is set. This eliminates the inspection of defects and defects that do not occur. Accordingly, it is possible to set the inspection content that eliminates the inspection cost increase (inspection time increase, etc.) due to the inspection of the defect that does not occur and the outflow of the next process of the generated defect.
  According to the third aspect, since it is not necessary to register in advance the defect phenomenon occurring in the target product, knowledge of the defect occurrence condition becomes unnecessary.
  According to the fourth aspect, since the estimation is based on the past defect occurrence situation, it is possible to eliminate the inspection of the defect that does not occur according to the actual process capability or the like.
  According to claim 5, for example, if a defect that has occurred in a product produced in the past or a target product but does not occur at present is registered as a defect phenomenon in which no inspection is performed, a defect that does not currently occur Can be excluded.
  According to the sixth aspect, for example, it is possible to exclude inspections for defects below the quality target in total.
  According to claim 7,Since the inspection method for inspecting the target product can be selected, the optimal inspection content can be set by changing the inspection method for inspecting the target product after setting the inspection content and judging from the inspection content It becomes like this.
[0035]
ContractAccording to claim 9,At the stage of designing the inspection part of the product and the inspection jig for inspection of the product, the inspection contents for the product are set, and the inspection parts and products required for the inspection contents Since the inspection jig inspection part for the inspection is designed, the unnecessary part for inspection of the product and the inspection jig inspection part can be eliminated, and the cost can be reduced. For example, when the target product is a printed circuit board (including one on which electrical components are mounted) and the inspection method is an electrical assembly inspection method (hereinafter referred to as an in-circuit tester), An inspection jig inspection portion such as a printed circuit board in-circuit tester pad is an in-circuit tester jig pin. By eliminating the pads and pins, a printed circuit board mounted with high density can be advantageously designed and inspected.
  Claim10According to the above, since the results are used, it is possible to eliminate the inspection of defects that do not actually occur.
  Claim11According to the above, since the actual results are used, it becomes possible to eliminate the inspection of defects having a low defect rate.
  Claim12According to the above, since the actual results are used, it becomes possible to add inspection of defects actually occurring.
  Claim13Since the results are used, it is possible to add a defect inspection with a high defect rate.
  Claim14According to the above, since the inspection method for inspecting the parts of the parts that make up the product is set, there are a mixture of parts that can be inspected and parts that cannot be inspected in the inspection items for each inspection process. As a product, duplicate inspection of the same defect is eliminated. Thereby, it is possible to set the inspection contents that can eliminate the duplicate inspection for the same defect and can realize cost reduction and shortening of the inspection time.
[0036]
  According to the sixteenth aspect, since an inspection method capable of detecting a defect phenomenon occurring at a part of a part constituting the product is extracted and an inspection method for inspecting the part is set, an inspection of a defect occurring as a product is performed. This eliminates the inspection of defects and defects that do not occur. Accordingly, it is possible to set the inspection content that eliminates the inspection cost increase (inspection time increase, etc.) due to the inspection of the defect that does not occur and the outflow of the next process of the generated defect.
  According to the seventeenth aspect, since it is not necessary to register in advance a defect phenomenon that occurs in the target product, knowledge of the defect occurrence condition becomes unnecessary.
  According to the eighteenth aspect, since the estimation is based on the past defect occurrence state, it is possible to eliminate the inspection of the defect that does not occur according to the actual process capability and the like.
  According to the nineteenth aspect, for example, if a defect which has occurred in a product produced in the past and a target product but does not occur at present is registered as a defect phenomenon in which no inspection is performed, a defect which does not occur at present. Can be excluded.
  According to the twentieth aspect, for example, it is possible to exclude inspections for defects below the quality target in total.
  According to claim 21, the productParts for inspectionAndFor product inspectionIn designing the inspection part of the inspection jig,For that productSet the inspection contents and the products required for the inspection contentsParts for inspectionAndFor product inspectionSince the inspection part of the inspection jig is designed, the product is no longer necessary.Parts for inspectionIn addition, the inspection part of the inspection jig can be eliminated and the cost can be reduced. For example, when the target product is a printed circuit board (including one on which electrical components are mounted) and the inspection method is an electrical assembly inspection method (hereinafter referred to as an in-circuit tester), An inspection jig inspection portion such as a printed circuit board in-circuit tester pad is an in-circuit tester jig pin. By eliminating the pads and pins, a printed circuit board mounted with high density can be advantageously designed and inspected.
  According to claim 22,Since the inspection method for inspecting the target product can be selected, the optimal inspection content can be set by changing the inspection method for inspecting the target product after setting the inspection content and judging from the inspection content It becomes like this.
  Claim24According to the above, since the results are used, it is possible to eliminate the inspection of defects that do not actually occur.
  Claim25According to the above, since the actual results are used, it becomes possible to eliminate the inspection of defects having a low defect rate.
  Claim26According to the above, since the actual results are used, it becomes possible to add inspection of defects actually occurring.
[0037]
  Claim27According to, because the results are used, it becomes possible to add inspection of defects with a high defect rate.
[Brief description of the drawings]
FIG. 1 is a diagram showing a configuration of a product inspection content setting system (product inspection content changing system) according to an embodiment of the present invention.
FIG. 2 is a diagram illustrating an example of target product detectable data.
FIG. 3 is a diagram illustrating an example of target product defect occurrence data.
FIG. 4 is a diagram illustrating an example of inspection method feature data.
FIG. 5 is a diagram showing an example of target product inspection content.
FIG. 6 is a flowchart showing a processing flow (a product inspection content setting method or a product inspection content changing method according to an embodiment of the present invention) in a product inspection content setting system or a product inspection content changing system according to an embodiment of the present invention; It is.
FIG. 7 is a flowchart showing a processing flow (a product inspection content setting method or a product inspection content changing method according to an embodiment of the present invention) in the product inspection content setting system or the product inspection content changing system following FIG. 6;
FIG. 8 is a diagram showing a general product inspection flow;
[Explanation of symbols]
10 Database section, 11 Product design database, 12 Manufacturing quality database, 20 Data collection section, 21 Target product identification line identification input section, 22 Target product design data collection section, 23 Target product design data storage section, 24 Target product design data input Output unit, 25 Target product quality data collection unit, 26 Target product quality data storage unit, 27 Target product quality data input / output unit, 30 Detectable data creation unit, 31 Target product detectable data storage unit, 32 Target product detectable data Input / output unit, 33 Target product detectable data creation unit, 34 Target product inspection method input unit, 35 Each inspection method detectable data storage unit, 36 Each inspection method detectable data input / output unit, 40 Defect occurrence data creation unit, 41 Defect occurrence data storage unit, 42 Target product defect occurrence data input / output unit, 43 Target product Defect occurrence data creation unit, 44 Defect occurrence data storage unit, 45 Each inspection method detectable data input / output unit, 46 Inspection unnecessary part deletion unit, 47 Inspection execution standard storage unit, 48 Inspection execution standard input / output unit, 50 Inspection method Feature data creation unit, 51 Inspection method feature data storage unit, 52 Inspection method feature data input / output unit, 60 Inspection content setting unit, 61 Target product inspection content setting unit, 62 Target product inspection content storage unit, 63 Target product inspection content input Output unit, 100 defect prediction system, 200 product design system, 300 inspection jig design system

Claims (27)

Target product design data including information on a plurality of parts constituting a target product to be inspected, a part of each part, an assembling method of each part, and a connection location of each part;
A design condition that associates information about each part that can be used to constitute a product, an inspection method that inspects the part of each part, and a defective phenomenon that can occur in each part that can be detected by the inspection method. Each corresponding inspection method detectable data,
By comparing the information on the defect phenomenon that can occur in the parts of each part of the target product and the inspection method that can detect the defect phenomenon,
In the case where a plurality of inspection methods correspond to the same defect phenomenon in each part in the target product detectable data, inspection is performed from the viewpoint of enabling inspection with optimum inspection time, inspection cost, and inspection capability. A single inspection method is set for each defect phenomenon by preferentially selecting an inspection method having a high inspection rank for the defect phenomenon that is determined based on time, inspection cost, and inspection ability and expressed for each inspection method. Product inspection content setting method characterized by the above. Before selecting an inspection method using the inspection rank,
Based on the target product defect occurrence data that associates information on each part in the target product, a part of each part, and a defect phenomenon that occurs in the part,
From the target product detectable data, extract an inspection method that enables detection of a defective phenomenon occurring in the part of each part in the target product,
When the extracted inspection method is duplicated for the same defect phenomenon in each component, a single inspection method for each defect phenomenon is selected by preferentially selecting the inspection method having a high inspection rank. The product inspection content setting method according to claim 1, wherein: The target product defect occurrence data is
The target product design data;
A combination of information regarding each part that can be used to configure a product, each part of each part, and a method for assembling each part is a design condition, and is expressed by a defective phenomenon that can occur under the design condition. 3. The product inspection content setting method according to claim 2, wherein the product inspection content is generated by associating the failure occurrence data corresponding to the design condition.   4. The product inspection content setting method according to claim 3, wherein the defect occurrence data corresponding to the design condition is estimated from a past defect occurrence state, and the defect occurrence data corresponding to the design condition is used.   From the target product defect occurrence data, the information regarding the defect phenomenon that is the same as the defect phenomenon of the inspection performance standard data represented by the defect phenomenon that does not perform the inspection is deleted in order to exclude unnecessary inspections. The product inspection content setting method according to any one of claims 2 to 4. The target product defect occurrence data includes a defect rate of a defect phenomenon occurring at each part of the target product,
From the target product defect occurrence data, in order to exclude unnecessary inspection based on the information on the target defect rate of the inspection performance standard data represented by the target quality of the target product, the sum of the defect rates is the target defect rate. The product inspection content setting method according to any one of claims 2 to 5, wherein the information on the defect phenomenon is deleted in ascending order of the defect rate until the error rate is reached.   7. The target product detectable data is generated by comparing the target product design data with information on a selected inspection method among the inspection method detectable data. The product inspection content setting method according to any one of the above. The target product detectable data is a comparison between the target product design data and each inspection method detectable data, and detects a defective phenomenon that may occur in the parts of the target product and the defective phenomenon. After generating association data that associates information about possible inspection methods and
The correlation data is compared with the process design data including information on the assembly method, the inspection method, and their order, and the part whose assembly method order is later than the inspection method order is generated at that part. The product inspection content setting method according to any one of claims 1 to 7, wherein the product inspection content setting method is generated by rewriting information of an inspection method capable of detecting a possible defect phenomenon into information undetectable. .   In the stage of designing the inspection part of the product or the inspection jig for the inspection of the product, the inspection content for the product is set and the inspection part of the product necessary for the inspection content or The product inspection content setting method according to any one of claims 1 to 8, wherein an inspection part of the inspection jig for the inspection of the product is designed. From the inspection results of the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, the respective parts in the target product, and the respective parts Collect the target product defect occurrence data that correlates information on the part and the defect phenomenon that occurs in the part,
A product inspection content changing method, wherein an inspection method corresponding to a defect phenomenon that does not occur is excluded from the set inspection method based on the target product defect occurrence data. From the inspection results of the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, the respective parts in the target product, and the respective parts Collect the target product defect occurrence data that correlates information on the part and the defect phenomenon that occurs in the part,
In the case where there is a gradual decrease in the defect phenomenon as a result of the analysis of the defect occurrence status based on the defect occurrence data of the target product, the inspection method corresponding to the defect phenomenon that is the gradual decrease is excluded from the set inspection method. Product inspection content change method. From the final product inspection results including the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, or the inspection results of the subsequent process, the target product Collect the target product defect occurrence data that associates information on each part, the part of each part, and the defect phenomenon that occurs in the part,
When a defect phenomenon that cannot be detected by the set inspection method occurs in the target product defect occurrence data, a defect phenomenon that can occur at each part of the target product, and an inspection method that can detect the defect phenomenon, From the target product detectable data associated with the information related to the above, extract the inspection method capable of detecting the undetectable defect phenomenon,
When the extracted inspection method is duplicated for the same defect phenomenon in each of the parts, the inspection method having a high inspection rank is preferentially selected, so that a single failure phenomenon is not detected. A method for changing the contents of product inspection, characterized by setting an inspection method. From the final product inspection results including the product inspection performed based on the inspection method set by the product inspection content setting method according to any one of claims 1 to 9, or the inspection results of the subsequent process, the target product Collect the target product defect occurrence data that associates information on each part, the part of each part, and the defect phenomenon that occurs in the part,
When a defect phenomenon that cannot be detected by the set inspection method occurs in the target product defect occurrence data, and a gradual increase is seen in the defect phenomenon, a defect phenomenon that can occur at each part of the target product, and From the inspection method capable of detecting the defective phenomenon and the target product detectable data associated with the information related to the inspection method, the inspection method capable of detecting the tendency increase defective phenomenon is extracted,
When the extracted inspection method is duplicated for the same defect phenomenon in each part, the inspection method having a higher inspection rank is preferentially selected, so that the trend of increasing defect phenomenon is reduced. Product inspection content changing method, characterized by setting a single inspection method. A database section for storing product design data;
Target product design data including information on a plurality of parts constituting a target product to be inspected from the data in the database section, a part of each part, a method of assembling each part, and a connection location of each part A data collection unit that collects
Each corresponding to the design condition that associates information about each part that can be used to configure a product, an inspection method that inspects the part of each part, and a defect phenomenon that can occur in each part that can be detected by the inspection method Each inspection method detectable data input / output unit corresponding to the design condition for inputting the inspection method detectable data, and each of the inspection product detectable data and the target product design data by comparing each of the inspection method detectable data and the target product design data. A detectable data creation unit having a target product detectable data creation unit that generates target product detectable data that associates information about a defective phenomenon that can occur in a part of a part and an inspection method that can detect the defective phenomenon; ,
From the viewpoint of enabling inspection with the optimal inspection time, inspection cost, and inspection capability, the inspection rank for the defect phenomenon that is determined based on the inspection time, inspection cost, and inspection capability and expressed for each inspection method is used as detection method characteristic data. An inspection method feature data creation unit having a detection method feature data input unit for input; and
When a plurality of inspection methods correspond to the same defect phenomenon in each part in the target product detectable data of the inspection method feature data creation unit, the inspection method having a high inspection rank is preferentially selected. An inspection content setting unit having a target product inspection content setting unit for setting a single inspection method for each defect phenomenon,
A product inspection content setting system characterized by comprising: 15. The product inspection content setting system according to claim 14, wherein the detectable data creation unit includes a target product detectable data input / output unit for inputting the target product detectable data. The product inspection content setting system according to claim 14 or 15,
Further, a target product defect occurrence data input / output unit for inputting target product defect occurrence data in which information on each part in the target product, a part of each part, and a defect phenomenon occurring in the part is associated is provided. A defect occurrence data creation unit having
The inspection content setting unit, based on the target product defect occurrence data of the defect occurrence data creation unit, before selecting an inspection method using the inspection rank, from the target product detectable data in the target product When an inspection method that makes it possible to detect a defective phenomenon occurring at the part of each part is extracted, and the extracted inspection method overlaps with the same defective phenomenon in each part, the inspection rank A product inspection content setting system which sets a single inspection method for each defect phenomenon by preferentially selecting a high inspection method. The defect occurrence data creation unit
The target product design data of the data collection unit;
A combination of information on each part that can be used to constitute a product, the part of each part, and the assembly method of each part is used as a design condition, and is expressed by a defective phenomenon that can occur under the design condition. Defect occurrence data corresponding to the design conditions to be
17. The product inspection content setting system according to claim 16, further comprising a target product defect occurrence data creation unit that generates the target product defect occurrence data by associating the target product defect occurrence data. The defect occurrence data creation unit
The target product design data of the data collection unit;
Defect occurrence data predicted by a defect prediction system that estimates defect occurrence data corresponding to design conditions based on past defect occurrence status,
18. The product inspection content setting system according to claim 16, further comprising: a target product defect occurrence data creation unit that generates the target product defect occurrence data by associating with each other.   The defect occurrence data creation unit relates to a defect phenomenon that is the same as the defect phenomenon of the inspection execution reference data represented by the defect phenomenon that does not perform the inspection from the target product defect occurrence data generated by the target product defect occurrence data creation unit. The product inspection content setting system according to any one of claims 16 to 18, further comprising an inspection unnecessary portion deletion unit that deletes information in order to exclude unnecessary inspections. The target product defect occurrence data includes a defect rate of a defect phenomenon occurring at each part of the target product,
The defect occurrence data creation unit is based on the target product defect occurrence data generated by the target product defect occurrence data creation unit, based on information on the target defect rate of the inspection execution standard data represented by the target quality of the target product, 17. An unnecessary inspection part deletion unit that deletes information on a defect phenomenon in ascending order of the defect rate until the total defect rate reaches a target defect rate in order to exclude unnecessary inspections. The product inspection content setting system according to claim 19.   The said inspection content setting part has the target product inspection content input / output part which outputs the inspection method set in the said target product inspection content setting part, The any one of Claims 14 thru | or 20 characterized by the above-mentioned. Product inspection content setting system described.   The said detectable data creation part has the target product inspection method input part which can select arbitrary inspection methods from each said inspection method detection possible data, The any one of Claim 14 thru | or 21 characterized by the above-mentioned. Product inspection content setting system. The target product detectable data creation unit compares the target product design data of the data collection unit with the inspection method detectable data of the inspection method detectable data input / output unit, and After generating the association data associating the information regarding the defect phenomenon that can occur in the part of each part and the inspection method capable of detecting the defect phenomenon,
The correlation data is compared with the process design data including information on the assembly method, the inspection method, and their order, and the part whose assembly method order is later than the inspection method order is generated at that part. 23. The target product detectable data is generated by rewriting information on an inspection method capable of detecting a defective phenomenon that can be detected into undetectable information. Product inspection content setting system. A database section for storing product quality data;
24. Collecting target product quality data comprising inspection results of product inspection performed based on the inspection method set by the product inspection content setting system according to any one of claims 14 to 23 from the data in the database section. A data collection unit,
A defect occurrence data creation unit having a target product defect occurrence data creation unit that generates the target product defect occurrence data by associating the target product design data with the target product quality data of the data collection unit;
An inspection content setting unit having a target product inspection content setting unit for excluding an inspection method corresponding to a defect phenomenon not included in the target product defect occurrence data from the set inspection method;
A product inspection content change system characterized by comprising: A database section for storing product quality data;
24. Collecting target product quality data comprising inspection results of product inspection performed based on the inspection method set by the product inspection content setting system according to any one of claims 14 to 23 from the data in the database section. A data collection unit,
A defect occurrence data creation unit having a target product defect occurrence data creation unit that generates the target product defect occurrence data by associating the target product design data with the target product quality data of the data collection unit;
Target product inspection content that excludes the inspection method corresponding to the defect phenomenon that is a gradual decrease from the set inspection method when a failure tendency is found by analysis of the defect occurrence status based on the target product failure occurrence data An examination content setting unit having a setting unit;
Product inspection content change system characterized by comprising A database section for storing product quality data;
24. Final product inspection results or post-process inspection including product inspection performed based on the inspection method set by the product inspection content setting system according to any one of claims 14 to 23 from the data in the database section. A data collection unit that collects target product quality data consisting of results,
A defect occurrence data creation unit having a target product defect occurrence data creation unit that generates the target product defect occurrence data by associating the target product design data with the target product quality data of the data collection unit;
From the viewpoint of enabling inspection with the optimal inspection time, inspection cost, and inspection capability, the inspection rank for the defect phenomenon that is determined based on the inspection time, inspection cost, and inspection capability and expressed for each inspection method is used as detection method characteristic data. An inspection method feature data creation unit having a detection method feature data input unit for input; and
A defect phenomenon that cannot be detected by the set inspection method in the target product defect occurrence data, and a defect phenomenon that can occur in each part of the target product, and an inspection method that can detect the defect phenomenon An inspection method capable of detecting the undetectable defect phenomenon is extracted from the target product detectable data associated with the information, and the extracted inspection method is duplicated for the same defect phenomenon in each component. The inspection content setting unit having a target product inspection content setting unit for setting a single inspection method for the undetectable defect phenomenon by preferentially selecting an inspection method having a high inspection rank;
Product inspection content change system characterized by comprising A database section for storing product quality data;
24. Final product inspection results or post-process inspection including product inspection performed based on the inspection method set by the product inspection content setting system according to any one of claims 14 to 23 from the data in the database section. A data collection unit that collects target product quality data consisting of results,
A defect occurrence data creation unit having a target product defect occurrence data creation unit that generates the target product defect occurrence data by associating the target product design data with the target product quality data of the data collection unit;
From the viewpoint of enabling inspection with the optimal inspection time, inspection cost, and inspection capability, the inspection rank for the defect phenomenon that is determined based on the inspection time, inspection cost, and inspection capability and expressed for each inspection method is used as detection method characteristic data. An inspection method feature data creation unit having a detection method feature data input unit for input; and
When a tendency increase of a defect phenomenon is found by analysis of the defect occurrence status based on the defect occurrence data of the target product, the target product is not in the inspection method corresponding to the defect phenomenon of the tendency increase. An inspection method capable of detecting the undetectable defect phenomenon from the target product detectable data in which information relating to the defect phenomenon that can occur in the parts of each part in the method and the inspection method capable of detecting the defect phenomenon is associated. In addition, when the extracted inspection method is duplicated for the same defect phenomenon in each of the parts, the inspection method having a high inspection rank is preferentially selected so that the defect phenomenon cannot be detected. An inspection content setting unit having a target product inspection content setting unit for setting a single inspection method,
Product inspection content change system characterized by comprising

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