JP4480693B2 - Wiring board and manufacturing method thereof - Google Patents

Wiring board and manufacturing method thereof Download PDF

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JP4480693B2
JP4480693B2 JP2006148992A JP2006148992A JP4480693B2 JP 4480693 B2 JP4480693 B2 JP 4480693B2 JP 2006148992 A JP2006148992 A JP 2006148992A JP 2006148992 A JP2006148992 A JP 2006148992A JP 4480693 B2 JP4480693 B2 JP 4480693B2
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insulating resin
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JP2006270119A (en
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英敏 湯川
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Kyocera Corp
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Description

本発明は、有機材料系の多層配線基板およびその製造方法に関するものである。   The present invention relates to an organic material-based multilayer wiring board and a method for manufacturing the same.

従来、半導体素子を搭載するための有機材料系の配線基板として、例えば両面または片面に銅箔から成る配線導体を有するガラス−エポキシ板から成る複数の絶縁層を同じくガラス−エポキシ板から成る接着層を介して積層して成る多層配線基板が用いられている。   Conventionally, as an organic material-based wiring board for mounting a semiconductor element, for example, a plurality of insulating layers made of glass-epoxy plates having wiring conductors made of copper foil on both sides or one side are also adhesive layers made of glass-epoxy plates. A multilayer wiring board is used which is laminated through the two.

この有機材料系の多層配線基板においては、その上面から下面にかけて複数の貫通孔が設けられており、貫通孔内壁には各絶縁層を挟んで上下に位置する配線導体同士を電気的に接続するための銅めっき膜から成る貫通導体が被着形成されており、それにより立体的な高密度配線が可能となっている。   In this organic material-based multilayer wiring board, a plurality of through holes are provided from the upper surface to the lower surface, and the wiring conductors positioned above and below are electrically connected to the inner wall of the through hole with each insulating layer interposed therebetween. For this reason, a through conductor made of a copper plating film is deposited to enable three-dimensional high-density wiring.

なお、このような有機材料系の多層配線基板は、両面または片面に厚みが15〜50μm程度の銅箔から成る配線導体が被着形成された厚みが0.1〜0.5mm程度のガラス−エポキシ板から成る複数の絶縁板を厚みが0.1〜0.2mm程度のガラス−エポキシ板から成る接着層を介して積層した後、その上面から下面にかけて直径が200〜500μm程度の貫通孔をドリル加工により穿孔し、しかる後、貫通孔内壁に厚みが15〜50μm程度の銅めっき膜から成る貫通導体を無電解めっき法および電解めっき法により被着させることによって製作されている。   In addition, such an organic material-based multilayer wiring board is formed from a glass-epoxy plate having a thickness of about 0.1 to 0.5 mm in which wiring conductors made of copper foil having a thickness of about 15 to 50 μm are deposited on both sides or one side. After laminating a plurality of insulating plates through an adhesive layer made of a glass-epoxy plate having a thickness of about 0.1 to 0.2 mm, a through hole having a diameter of about 200 to 500 μm is drilled from the upper surface to the lower surface by drilling, Thereafter, a through conductor made of a copper plating film having a thickness of about 15 to 50 μm is deposited on the inner wall of the through hole by an electroless plating method and an electrolytic plating method.

ところで、このような有機材料系の多層配線基板においては、その配線密度を更に高めるために貫通孔の直径を例えば75〜130μm程度の小さなものとする試みがなされている。このような直径が75〜130μm程度の小さな貫通孔を形成するためには例えばレーザーによる穿孔方法が採用される。   By the way, in such an organic material-based multilayer wiring board, an attempt has been made to make the diameter of the through hole as small as about 75 to 130 μm in order to further increase the wiring density. In order to form such a small through hole having a diameter of about 75 to 130 μm, for example, a laser drilling method is employed.

しかしながら、従来の有機材料系の多層配線基板においては、各絶縁板および接着層の厚みが0.1〜0.5mm程度と厚いことから、各絶縁板および接着層を貫通する貫通孔の直径を例えば75〜130μm程度の小さなものとすると、この貫通孔の内壁に銅めっき膜から成る貫通導体を被着させる際、貫通導体を被着させるためのめっき液が貫通孔内に良好に入り込みにくくなり、そのため貫通導体が良好に被着されずに貫通導体に断線が発生してしまいやすいという問題点を有していた。   However, in the conventional organic material-based multilayer wiring board, since the thickness of each insulating plate and the adhesive layer is as thick as about 0.1 to 0.5 mm, the diameter of the through-hole penetrating each insulating plate and the adhesive layer is, for example, 75 to If it is as small as about 130 μm, when depositing a through conductor made of a copper plating film on the inner wall of this through hole, the plating solution for depositing the through conductor is less likely to penetrate into the through hole. There has been a problem that the conductor is not satisfactorily deposited and breakage of the through conductor is likely to occur.

本発明は、かかる従来の問題点に鑑み案出されたものであり、その目的は、貫通孔の直径を例えば75〜130μm程度の小さいものとしても貫通導体に断線が発生することがない極めて高密度な配線が可能な配線基板およびその製造方法を提供することにある。   The present invention has been devised in view of such conventional problems, and an object of the present invention is extremely high in that no breakage occurs in the through conductor even when the diameter of the through hole is small, for example, about 75 to 130 μm. It is an object of the present invention to provide a wiring board capable of high-density wiring and a manufacturing method thereof.

本発明の配線基板は、絶縁樹脂板と、該絶縁樹脂板の上下両面に被着された、厚みが7〜12μmの銅箔から成る内層導体と、を有する両面銅張板と、前記両面銅張板の上下両面に被着された絶縁樹脂層と、前記絶縁樹脂板、前記内層導体および前記絶縁樹脂層を上下に貫通し、直径が75〜130μmの複数の貫通孔と、前記貫通孔内壁にめっきにより被着形成され、前記内層導体に接続された貫通導体と、前記絶縁樹脂層の表面にめっきにより被着形成され、前記貫通導体に接続された表層導体と、
を備え、前記絶縁樹脂板は厚みが350〜450μmであり、前記絶縁樹脂層は厚みが前記内層導体上で25〜45μmであり、前記貫通孔の直径は、前記絶縁樹脂板において同じ大きさであり、前記絶縁樹脂層において外側に向けて拡径することを特徴とするものである。
A wiring board according to the present invention includes a double-sided copper-clad plate having an insulating resin plate and an inner layer conductor made of copper foil having a thickness of 7 to 12 μm, which is attached to both upper and lower surfaces of the insulating resin plate, and the double- sided copper plate Insulating resin layers deposited on both upper and lower surfaces of the tension plate, a plurality of through holes having a diameter of 75 to 130 μm that vertically penetrate the insulating resin plate, the inner layer conductor and the insulating resin layer, and the inner walls of the through holes is deposited and formed by plating a through conductor connected to the inner conductor, wherein the deposited and formed by plating on the surface of the insulating resin layer, and the surface layer conductor connected to the through conductor,
The insulating resin plate has a thickness of 350 to 450 μm, the insulating resin layer has a thickness of 25 to 45 μm on the inner layer conductor, and the diameter of the through hole is the same as that of the insulating resin plate. And the diameter of the insulating resin layer is increased toward the outside .

また、本発明の配線基板の製造方法は、厚みが350〜450μmの絶縁樹脂板の上下両面に厚みが7〜12μmの銅箔から成る内層導体が被着された両面銅張板の前記上下両面に厚みが前記内層導体上で25〜45μmの絶縁樹脂層を被着させるとともに前記絶縁樹脂板、前記内層導体および前記絶縁樹脂層を上下に貫通すると同時に、前記絶縁樹脂板において同じ大きさであるとともに前記絶縁樹脂層において外側に向けて拡径する直径が75〜130μmの複数の貫通孔を形成し、次に前記貫通孔内壁に前記内層導体に接続された貫通導体および前記絶縁樹脂層の表面に前記貫通導体に接続された表層導体をそれぞれめっきにより被着させることを特徴とするものである。 A method of manufacturing a wiring board of the present invention, the upper and lower surfaces of the double-sided copper clad laminate to the inner conductor made thick thickness on the upper and lower surfaces of the insulating resin plate 350~450μm copper foil of 7~12μm is deposited the insulating resin layer of 25~45μm on the thickness inner conductor with depositing the insulating resin sheet, and at the same time through the inner conductor and the insulating resin layer in the vertical direction, the same size in the insulating resin plate said diameter whose diameter increases toward the outside in the insulating resin layer to form a plurality of through-holes of 75~130Myuemu, then the coupled to the inner conductor inner wall of the through hole is the through conductors and the insulating resin layer with a certain A surface layer conductor connected to the through conductor is deposited on the surface by plating.

本発明の配線基板によれば、上述の構成としたことから、貫通孔内壁に貫通導体を被着させる際、貫通導体を被着させるためのめっき液が貫通孔内に良好に入り込み、その結果、貫通孔内壁に貫通導体が良好に形成される。   According to the wiring board of the present invention, since the above-described configuration is employed, when the through conductor is deposited on the inner wall of the through hole, the plating solution for depositing the through conductor enters the through hole satisfactorily. The through conductor is formed well on the inner wall of the through hole.

また、本発明の配線基板の製造方法によれば、上述の構成としたことから、貫通孔内壁に貫通導体を被着させる際、貫通導体を被着させるためのめっき液が貫通孔内に良好に入り込み、その結果、貫通孔内壁に貫通導体が良好に形成された配線基板を得ることができる。   Further, according to the method for manufacturing a wiring board of the present invention, since the above-described configuration is adopted, when the through conductor is deposited on the inner wall of the through hole, the plating solution for depositing the through conductor is good in the through hole. As a result, it is possible to obtain a wiring board in which through conductors are well formed on the inner walls of the through holes.

次に、本発明の配線基板について詳細に説明する。図1は、本発明の配線基板の実施形態の一例を示す部分断面図である。   Next, the wiring board of the present invention will be described in detail. FIG. 1 is a partial cross-sectional view showing an example of an embodiment of a wiring board according to the present invention.

図1において、1は絶縁樹脂板、2A・2Bは内層導体、3A・3Bは絶縁樹脂層、4は貫通孔、5は貫通導体、6A・6Bは表層導体であり、主として絶縁樹脂板1の上下両面に内層導体2A・2Bおよび絶縁樹脂層3A・3Bが被着されるとともに絶縁樹脂板1および内層導体2A・2Bおよび絶縁樹脂層3A・3Bを貫通して複数の貫通孔4が設けられ、さらに貫通孔4の内壁に貫通導体5が被着形成されるとともに絶縁樹脂層3A・3Bの表面に表層導体6A・6Bが被着形成されることにより本発明の配線基板が構成されている。   In FIG. 1, 1 is an insulating resin plate, 2A and 2B are inner layer conductors, 3A and 3B are insulating resin layers, 4 is a through hole, 5 is a through conductor, and 6A and 6B are surface layer conductors. Inner layer conductors 2A and 2B and insulating resin layers 3A and 3B are attached to both upper and lower surfaces, and a plurality of through holes 4 are provided through insulating resin plate 1, inner layer conductors 2A and 2B, and insulating resin layers 3A and 3B. Furthermore, the through conductor 5 is formed on the inner wall of the through hole 4, and the surface layer conductors 6A and 6B are formed on the surfaces of the insulating resin layers 3A and 3B, whereby the wiring board of the present invention is configured. .

なお、本実施形態例においては、貫通孔4内および絶縁樹脂層3A・3B上にソルダーレジスト7が設けられている。   In this embodiment, a solder resist 7 is provided in the through hole 4 and on the insulating resin layers 3A and 3B.

絶縁樹脂板1は、本発明の配線基板のコア部材として機能し、例えばガラスクロスやアラミドクロスにエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂を含浸させた有機系絶縁材料から成る厚みが0.35〜0.45mmの平板であり、その上下両面に厚みが7〜12μmの銅箔から成る内層導体2A・2Bが被着された、いわゆる両面銅張り板を構成している。   The insulating resin plate 1 functions as a core member of the wiring board of the present invention. For example, a thickness made of an organic insulating material in which a glass cloth or an aramid cloth is impregnated with a resin such as an epoxy resin, a bismaleimide triazine resin, or a polyphenylene ether resin. Is a flat plate having a thickness of 0.35 to 0.45 mm, and constitutes a so-called double-sided copper-clad plate in which inner layer conductors 2A and 2B made of copper foil having a thickness of 7 to 12 μm are deposited on both upper and lower surfaces.

この絶縁樹脂板1は、その厚みが0.35mm未満ではその上下面に絶縁樹脂層3A・3Bを被着させたり、あるいは絶縁樹脂板1および内層導体2A・2Bおよび絶縁樹脂層3A・3Bを貫通して複数の貫通孔4を形成したりする際等に熱や外力等の影響で配線基板に反りや変形が発生して配線基板に要求される平坦度を確保できなくなってしまう危険性が大きなものとなり、他方、0.45mmを超えると、後述するように貫通孔4内壁に貫通導体5を形成するとき、貫通孔4内にめっき液が浸入しにくくなり、貫通導体5を良好に形成することが困難となる。したがって、絶縁樹脂板1の厚みは0.35〜0.45mmの範囲に特定される。 If the thickness of the insulating resin plate 1 is less than 0.35 mm, the insulating resin layers 3A and 3B are attached to the upper and lower surfaces thereof, or the insulating resin plate 1, the inner conductors 2A and 2B, and the insulating resin layers 3A and 3B are penetrated. When the plurality of through holes 4 are formed, the wiring board is warped or deformed due to the influence of heat, external force, etc., and the flatness required for the wiring board cannot be secured. On the other hand, if the thickness exceeds 0.45 mm, when the through conductor 5 is formed on the inner wall of the through hole 4 as will be described later, the plating solution is less likely to enter the through hole 4 and the through conductor 5 is formed well. It becomes difficult. Therefore, the thickness of the insulating resin plate 1 is specified in the range of 0.35 to 0.45 mm.

なお、絶縁樹脂板1は、ガラスクロスやアラミドクロスに含浸させるエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂中にシリカやアルミナあるいはアラミド樹脂等から成るフィラーをガラスクロスやアラミドクロス等の繊維部分と樹脂部分とでレーザー光の透過度が略同等となる程度に含有させておけば、後述するように絶縁樹脂板1にレーザー光で貫通孔4を穿孔する際に、貫通孔4を絶縁樹脂板1に略均一な大きさで良好に形成することが可能となる。   The insulating resin plate 1 is made of a glass cloth, an aramid cloth, or the like made of silica, alumina, an aramid resin or the like in an epoxy resin, bismaleimide triazine resin, polyphenylene ether resin, or the like impregnated into a glass cloth or an aramid cloth. If the fiber portion and the resin portion are contained so that the laser beam transmittance is substantially equal, the through-hole 4 is formed when the through-hole 4 is drilled in the insulating resin plate 1 with the laser beam as described later. It is possible to satisfactorily form the insulating resin plate 1 with a substantially uniform size.

したがって、絶縁樹脂板1のガラスクロスやアラミドクロスに含浸させるエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂中にはシリカやアルミナあるいはアラミド樹脂等から成るフィラーをガラスクロスやアラミドクロス等の繊維部分と樹脂部分とでレーザー光の透過度が略同等となるように含有させておくことが好ましい。   Therefore, a filler made of silica, alumina, aramid resin, or the like is added to a glass cloth, aramid cloth, or the like in an epoxy resin, bismaleimide triazine resin, or polyphenylene ether resin impregnated in the glass cloth or aramid cloth of the insulating resin plate 1. It is preferable that the fiber portion and the resin portion are contained so that the transmittance of the laser beam is substantially equal.

また、絶縁樹脂板1の上下面に被着された内層導体2A・2Bは、銅箔から成り、主として電源層やグランド層として機能する内層配線導体パターンWとこの内層配線導体パターンWから電気的に独立したダミー導体パターンDとを有し、その厚みが7〜12μm、その表面の中心線平均粗さRaが0.2〜2μm程度である。   The inner layer conductors 2A and 2B attached to the upper and lower surfaces of the insulating resin plate 1 are made of copper foil, and are electrically connected to the inner layer wiring conductor pattern W mainly functioning as a power supply layer and a ground layer and the inner layer wiring conductor pattern W. And an independent dummy conductor pattern D, having a thickness of 7 to 12 μm and a center line average roughness Ra of the surface of about 0.2 to 2 μm.

内層導体2A・2Bは、その厚みが7μm未満の場合、電源層やグランド層としての内層配線導体パターンWに対して十分な電気特性を付与することができず、他方、12μmを超える場合、後述するように絶縁樹脂板1と内層導体2A・2Bおよび絶縁樹脂層3A・3Bとを貫通する貫通孔4をレーザー加工により穿孔する場合に、直径が75〜130μmの貫通孔4を安定して形成することが困難となる。したがって、内層導体2A・2Bの厚みは、7〜12μmの範囲に特定される。   When the thickness of the inner layer conductors 2A and 2B is less than 7 μm, sufficient electrical characteristics cannot be imparted to the inner layer wiring conductor pattern W as the power supply layer or the ground layer, and when the thickness exceeds 12 μm, Thus, when the through hole 4 penetrating the insulating resin plate 1 and the inner layer conductors 2A and 2B and the insulating resin layers 3A and 3B is drilled by laser processing, the through hole 4 having a diameter of 75 to 130 μm is stably formed. Difficult to do. Therefore, the thickness of the inner layer conductors 2A and 2B is specified in the range of 7 to 12 μm.

なお、内層導体2A・2Bは、貫通孔4により貫通されるとともに後述する貫通導体5に接する内層配線導体パターンWまたはダミー導体パターンDを全ての貫通孔4に対応して有するように形成しておくと、貫通孔4をレーザー加工により穿孔する際に全ての貫通孔4においてレーザー光の吸収反射を略同じとして全ての貫通孔4を略均一な大きさおよび形状に形成することができる。   The inner layer conductors 2A and 2B are formed so as to have inner layer wiring conductor patterns W or dummy conductor patterns D penetrating through the through holes 4 and in contact with the later described through conductors 5 corresponding to all the through holes 4. In other words, when the through holes 4 are drilled by laser processing, the absorption and reflection of the laser light can be made substantially the same in all the through holes 4 so that all the through holes 4 can be formed in a substantially uniform size and shape.

したがって、内層導体2A・2Bは、貫通孔4により貫通される内層配線導体パターンWまたはダミー導体パターンDを全ての貫通孔4に対応して有するように形成しておくことが好ましい。   Therefore, the inner layer conductors 2 </ b> A and 2 </ b> B are preferably formed so as to have the inner layer wiring conductor pattern W or the dummy conductor pattern D penetrating through the through holes 4 corresponding to all the through holes 4.

この場合、ダミー導体パターンDは、その直径が貫通孔4の直径よりも40〜100μm程度大きな略円形のパターンとすればよく、内層配線導体パターンWとの間に30〜60μm程度の幅の間隔を設ければよい。   In this case, the dummy conductor pattern D may be a substantially circular pattern whose diameter is approximately 40-100 μm larger than the diameter of the through-hole 4, and an interval with a width of approximately 30-60 μm between the inner conductor pattern W. May be provided.

ダミー導体パターンDの直径が貫通孔4の直径よりも40μm未満大きな場合には、レーザー加工により貫通孔4を穿孔する際にダミー導体パターンDを正確に貫通することが困難となり、他方、100μmを超えて大きな場合には、内層配線導体パターンWの面積を広く採ることが困難となる。   When the diameter of the dummy conductor pattern D is larger than the diameter of the through-hole 4 by less than 40 μm, it is difficult to accurately penetrate the dummy conductor pattern D when the through-hole 4 is drilled by laser processing. If it is too large, it is difficult to increase the area of the inner layer wiring conductor pattern W.

また、ダミー導体パターンDと内層配線導体パターンWとの間隔が30μm未満の場合には、ダミー導体パターンDと内層配線導体パターンWとの間の電気的絶縁が良好に保てなくなる傾向にあり、他方、60μmを超えると、内層配線導体パターンWの面積を広く採ることが困難となる。   In addition, when the distance between the dummy conductor pattern D and the inner layer wiring conductor pattern W is less than 30 μm, there is a tendency that electrical insulation between the dummy conductor pattern D and the inner layer wiring conductor pattern W cannot be maintained well. On the other hand, if it exceeds 60 μm, it is difficult to increase the area of the inner layer wiring conductor pattern W.

また、内層導体2A・2Bは、その表面の中心線平均粗さRaが0.2μm未満の場合、内層導体2A・2Bと絶縁樹脂層3A・3Bとが強固に密着せずに内層導体2A・2Bと絶縁樹脂層3A・3Bとの間で剥離が発生しやすくなる傾向にあり、他方2μmを超えると、そのような粗い面を安定かつ効率良く形成することが困難となる傾向にある。したがって、内層導体2A・2B表面の中心線平均粗さRaは0.2〜2μmの範囲が好ましい。   Further, when the inner-layer conductors 2A and 2B have a center line average roughness Ra of less than 0.2 μm, the inner-layer conductors 2A and 2B do not firmly adhere to the inner-layer conductors 2A and 2B and the inner-layer conductors 2A and 2B. And the insulating resin layers 3A and 3B tend to be peeled off. On the other hand, when the thickness exceeds 2 μm, it tends to be difficult to form such a rough surface stably and efficiently. Accordingly, the center line average roughness Ra of the inner layer conductors 2A and 2B is preferably in the range of 0.2 to 2 μm.

また、絶縁樹脂板1の上下面に被着された絶縁樹脂層3A・3Bはエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の熱硬化性樹脂から成り、レーザー光に対する分解度合いが絶縁樹脂板1よりも大きく、その表面に表層導体6A・6Bが被着されている。   The insulating resin layers 3A and 3B attached to the upper and lower surfaces of the insulating resin plate 1 are made of a thermosetting resin such as epoxy resin, bismaleimide triazine resin or polyphenylene ether resin, and the degree of decomposition with respect to laser light is the insulating resin plate. The surface conductors 6A and 6B are deposited on the surface thereof.

絶縁樹脂層3A・3Bは、互いに絶縁すべき内層導体2A・2Bと表層導体6A・6Bとを電気的に絶縁するための絶縁間隔を提供するためのものであり、その厚みが内層導体2A・2B上で25〜45μmである。   The insulating resin layers 3A and 3B are provided to provide an insulating interval for electrically insulating the inner layer conductors 2A and 2B and the surface layer conductors 6A and 6B to be insulated from each other. 25-45 μm on 2B.

この絶縁樹脂層3A・3Bは、その厚みが内層導体2A・2B上で25μm未満の場合、互いに絶縁すべき内層導体2A・2Bと表層導体6A・6Bとを電気的に良好に絶縁することができなくなり、他方、45μmを超えると、絶縁樹脂板1および内層導体2A・2Bならびに絶縁樹脂層3A・3Bを貫通する貫通孔4をレーザー加工により穿孔する際に直径が75〜130μmの貫通孔4を良好に形成することが困難となる。したがって、絶縁層3A・3Bの厚みは内層導体2A・2B上で25〜45μmの範囲に特定される。   When the thickness of the insulating resin layers 3A and 3B is less than 25 μm on the inner layer conductors 2A and 2B, the inner layer conductors 2A and 2B and the surface layer conductors 6A and 6B to be insulated from each other can be electrically well insulated. On the other hand, if the thickness exceeds 45 μm, the through-hole 4 having a diameter of 75 to 130 μm when the through-hole 4 penetrating the insulating resin plate 1 and the inner layer conductors 2A and 2B and the insulating resin layers 3A and 3B is drilled by laser processing. It becomes difficult to form the film well. Therefore, the thickness of the insulating layers 3A and 3B is specified in the range of 25 to 45 μm on the inner layer conductors 2A and 2B.

表層導体6A・6Bは、厚みが8〜30μmの銅めっき膜から成り、電源配線およびグランド配線および信号配線を具備する表層配線パターンを形成している。   The surface conductors 6A and 6B are made of a copper plating film having a thickness of 8 to 30 μm, and form a surface layer wiring pattern including a power supply wiring, a ground wiring, and a signal wiring.

そして、例えば上面側の表層導体6Aの露出する一部に図示しない電子部品の電極が半田を介して接続されるとともに、下面側の表層導体6Bの露出する一部が図示しない他の配線基板等に半田を介して接続される。 For example, an electrode of an electronic component (not shown) is connected to an exposed part of the surface layer conductor 6A on the upper surface side via solder, and an exposed part of the surface layer conductor 6B on the lower surface side is connected to another wiring board (not shown). Connected via solder.

これらの表層導体2A・2Bは、その厚みが8μm未満であると、表層配線パターンの電気抵抗が高いものとなり、他方、30μmを超えると、表層配線パターンを高密度に形成することが困難となる。したがって、表層導体2A・2Bの厚みは、8〜30μmの範囲が好ましい。   When the thickness of the surface conductors 2A and 2B is less than 8 μm, the electrical resistance of the surface layer wiring pattern is high. On the other hand, when the thickness exceeds 30 μm, it is difficult to form the surface layer wiring pattern at a high density. . Therefore, the thickness of the surface conductors 2A and 2B is preferably in the range of 8 to 30 μm.

さらに、本発明の配線基板においては、絶縁樹脂板1および内層導体2A・2Bおよび絶縁樹脂層3A・3Bを貫通して直径が75〜130μmの貫通孔4が形成されており、この貫通孔4の内壁に貫通導体5が被着形成されている。   Further, in the wiring board of the present invention, a through hole 4 having a diameter of 75 to 130 μm is formed through the insulating resin plate 1, the inner layer conductors 2A and 2B, and the insulating resin layers 3A and 3B. A through conductor 5 is formed on the inner wall of the substrate.

貫通孔4は、貫通導体5を絶縁樹脂層3Aの上面から絶縁樹脂層3Bの下面にかけて導出させるための導出路を提供するためのものであり、例えばレーザー加工により穿孔されている。   The through hole 4 is for providing a lead-out path for leading the through conductor 5 from the upper surface of the insulating resin layer 3A to the lower surface of the insulating resin layer 3B, and is drilled by, for example, laser processing.

この貫通孔4は、その直径が絶縁樹脂板1においては75〜115μmで略同じ大きさであり、絶縁樹脂層3A・3Bにおいては開口部で90〜130μmとなるように外側に向かって拡径している。   The diameter of the through-hole 4 is 75 to 115 μm in the insulating resin plate 1 and substantially the same size, and the diameter of the insulating resin layers 3A and 3B is increased toward the outside so as to be 90 to 130 μm at the opening. is doing.

このように、本発明の配線基板によれば、貫通孔4の孔径が75〜130μmと小さいことから、貫通導体5および表層導体6A・6Bを高密度で配置することができ、それにより極めて高密度な配線を有する配線基板を得ることができる。   Thus, according to the wiring board of the present invention, since the through hole 4 has a small hole diameter of 75 to 130 μm, the through conductors 5 and the surface layer conductors 6A and 6B can be arranged with high density, which makes it extremely high. A wiring board having a dense wiring can be obtained.

また、貫通孔4は、その直径が絶縁樹脂層3A・3Bの部位で外側に向かって広がっていることから、後述するように貫通孔4内壁に貫通導体5を被着形成する際に、貫通導体5を形成するためのめっき液が貫通孔4の内部に良好に入り込み、その結果、貫通孔4内に貫通導体5を良好に形成することができる。   Further, since the diameter of the through-hole 4 is widened outward at the portions of the insulating resin layers 3A and 3B, the through-hole 4 is penetrated when the through-conductor 5 is formed on the inner wall of the through-hole 4 as described later. The plating solution for forming the conductor 5 enters the inside of the through hole 4 favorably, and as a result, the through conductor 5 can be formed well in the through hole 4.

なお、貫通孔4の直径が75μm未満の場合、貫通孔4内壁に貫通導体5を被着形成する際に、貫通導体5を形成するためのめっき液が貫通孔4の内部に良好に入り込まずに貫通孔4内壁に貫通導体5を良好に形成することが困難となり、他方、130μmを超えると、貫通導体5および表層導体6A・6Bを高密度で配置することが困難となる。したがって、貫通孔4の直径は、75〜130μmの範囲に特定される。   In addition, when the diameter of the through hole 4 is less than 75 μm, the plating solution for forming the through conductor 5 does not enter the inside of the through hole 4 when the through conductor 5 is deposited on the inner wall of the through hole 4. In addition, it is difficult to satisfactorily form the through conductor 5 on the inner wall of the through hole 4. On the other hand, if it exceeds 130 μm, it is difficult to dispose the through conductor 5 and the surface layer conductors 6A and 6B at high density. Therefore, the diameter of the through hole 4 is specified in the range of 75 to 130 μm.

また、貫通孔4の開口部における直径が絶縁樹脂板1における直径よりも10μm未満大きい場合には、貫通孔4内壁に貫通導体5を被着形成する際に、貫通導体5を形成するためのめっき液が貫通孔4の内部に良好に入り込まずに貫通孔4内壁に貫通導体5を良好に形成することが困難となり、他方、50μmを超えて大きな場合には、そのような形状を有する貫通孔4を安定して形成することが困難となる。したがって、貫通孔4の開口部における直径は、絶縁樹脂板1における直径よりも10〜50μm大きいことが好ましい。   When the diameter of the opening of the through hole 4 is smaller than the diameter of the insulating resin plate 1 by less than 10 μm, the through conductor 5 is formed when the through conductor 5 is deposited on the inner wall of the through hole 4. If the plating solution does not enter the inside of the through-hole 4 and it is difficult to form the through-conductor 5 on the inner wall of the through-hole 4, it is difficult to form the through-conductor 5 on the inner wall. It becomes difficult to form the holes 4 stably. Therefore, the diameter of the opening of the through hole 4 is preferably 10 to 50 μm larger than the diameter of the insulating resin plate 1.

貫通孔4の内壁に被着形成された貫通導体5は、厚みが8〜25μm程度の銅めっき膜から成り、絶縁樹脂板1および絶縁樹脂層3A・3Bを挟んで上下に位置する内層導体2A・2Bおよび表層導体6A・6B同士を互いに電気的に接続する接続導体として機能する。   The through conductor 5 deposited on the inner wall of the through hole 4 is made of a copper plating film having a thickness of about 8 to 25 μm, and the inner layer conductor 2A is positioned above and below the insulating resin plate 1 and the insulating resin layers 3A and 3B. 2B and surface layer conductors 6A and 6B function as connecting conductors that electrically connect each other.

貫通導体5は、その厚みが8μm未満では、貫通導体5の電気抵抗が高いものとなりすぎる傾向にあり、他方、25μmを超えると、この貫通導体5が被着された貫通孔4の内部に後述するソルダーレジスト7を良好に充填することが困難となる。したがって、貫通導体5の厚みは、8〜25μmの範囲であることが好ましい。   When the thickness of the through conductor 5 is less than 8 μm, the electrical resistance of the through conductor 5 tends to be too high. On the other hand, when the thickness exceeds 25 μm, the through conductor 5 is disposed inside the through hole 4 to which the through conductor 5 is attached. It becomes difficult to fill the solder resist 7 to be satisfactorily. Therefore, the thickness of the through conductor 5 is preferably in the range of 8 to 25 μm.

さらに、絶縁樹脂層3A・3Bの表面および貫通孔4の内部には、エポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の熱硬化性樹脂から成るソルダーレジスト7が被着および充填されている。   Furthermore, a solder resist 7 made of a thermosetting resin such as an epoxy resin, a bismaleimide triazine resin, or a polyphenylene ether resin is deposited and filled in the surfaces of the insulating resin layers 3A and 3B and the inside of the through holes 4.

ソルダーレジスト7は、貫通導体5および表層導体6A・6Bを保護するとともに表層導体6A・6Bにおける表層配線パターン同士を電気的に良好に絶縁するための保護層として機能し、表層導体6A・6Bの一部を露出させる所定のパターンに被着形成されている。   The solder resist 7 functions as a protective layer for protecting the through conductor 5 and the surface layer conductors 6A and 6B and electrically insulating the surface layer wiring patterns in the surface layer conductors 6A and 6B. It is formed in a predetermined pattern that exposes a part.

なお、ソルダーレジスト7は、その表層導体6A・6B上における厚みが10μm未満であると、表層導体6を良好に保護することができなくなるとともに表層導体6A・6Bにおける表層配線パターン同士を電気的に良好に絶縁することができなくなる傾向にあり、他方、40μmを超えると、ソルダーレジスト7を所定のパターンに形成することが困難となる傾向にある。   When the thickness of the solder resist 7 on the surface conductors 6A and 6B is less than 10 μm, the surface conductor 6 cannot be protected well and the surface wiring patterns in the surface conductors 6A and 6B are electrically connected to each other. On the other hand, when it exceeds 40 μm, it tends to be difficult to form the solder resist 7 in a predetermined pattern.

したがって、ソルダーレジストの表層導体6A・6B上における厚みは、10〜40μmの範囲が好ましい。   Therefore, the thickness of the solder resist on the surface conductors 6A and 6B is preferably in the range of 10 to 40 μm.

かくして、本発明の配線基板によれば、直径が75〜130μmの貫通孔4内に貫通導体5を良好に形成することができ、それにより貫通導体5に断線が発生することのない極めて高密度な配線の配線基板を提供することができる。   Thus, according to the wiring board of the present invention, it is possible to satisfactorily form the through conductor 5 in the through hole 4 having a diameter of 75 to 130 μm, thereby preventing disconnection of the through conductor 5 and extremely high density. It is possible to provide a wiring board with simple wiring.

次に、図1に示した配線基板を本発明の製造方法により製造する方法について図2(a)〜(f)を参照して説明する。   Next, a method for manufacturing the wiring board shown in FIG. 1 by the manufacturing method of the present invention will be described with reference to FIGS.

まず、図2(a)に部分断面図で示すように、例えばガラスクロスやアラミドクロスにエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の樹脂を含浸させた有機系絶縁材料から成る厚みが0.35〜0.45mmの絶縁樹脂板1の上下面に厚みが7〜12μmの銅箔から成る内層導体2A・2Bが被着形成された両面銅張板を準備する。なお、内層導体2A・2Bはその表面の中心線平均粗さRaが0.2〜2μm程度となるように、その表面を粗化しておく。   First, as shown in a partial cross-sectional view in FIG. 2A, for example, a glass cloth or an aramid cloth made of an organic insulating material impregnated with a resin such as an epoxy resin, a bismaleimide triazine resin, or a polyphenylene ether resin has a thickness of 0.35. A double-sided copper-clad plate is prepared in which inner layer conductors 2A and 2B made of copper foil having a thickness of 7 to 12 μm are deposited on the upper and lower surfaces of an insulating resin plate 1 having a thickness of 0.45 mm. The inner layer conductors 2A and 2B have their surfaces roughened so that the center line average roughness Ra of the surfaces is about 0.2 to 2 μm.

絶縁樹脂板1は、その厚みが0.35mm未満ではその上下面に絶縁樹脂層3A・3Bを被着させたり、あるいは絶縁樹脂板1および内層導体2A・2Bおよび絶縁樹脂層3A・3Bを貫通して複数の貫通孔4を形成する際等に熱や外力等の影響で配線基板に反りや変形が発生して配線基板に要求される平坦度を確保できなくなってしまう危険性が大きなものとなり、他方、0.45mmを超えると、後述するように貫通孔4内壁に貫通導体5を形成するとき、貫通孔4内にめっき液が浸入しにくくなり、貫通導体5に断線が発生しやすくなる。したがって、絶縁樹脂板1の厚みは0.35〜0.45mmの範囲に特定される。   If the thickness of the insulating resin plate 1 is less than 0.35 mm, the insulating resin layers 3A and 3B are attached to the upper and lower surfaces of the insulating resin plate 1 or penetrate the insulating resin plate 1, the inner layer conductors 2A and 2B, and the insulating resin layers 3A and 3B. When the plurality of through holes 4 are formed, the wiring board is warped or deformed due to the influence of heat or external force, and the flatness required for the wiring board cannot be secured. On the other hand, when the thickness exceeds 0.45 mm, when the through conductor 5 is formed on the inner wall of the through hole 4 as will be described later, the plating solution is less likely to enter the through hole 4, and disconnection is likely to occur in the through conductor 5. Therefore, the thickness of the insulating resin plate 1 is specified in the range of 0.35 to 0.45 mm.

また、内層導体2A・2Bは、その厚みが7μm未満の場合、内層導体2A・2Bの導体パターンに電源層やグランド層としての十分な電気特性を付与することができず、他方、12μmを超える場合、後述するように絶縁樹脂板1と内層導体2A・2Bおよび絶縁樹脂層3A・3Bとを貫通する貫通孔4をレーザー加工により穿孔する場合に、直径が75〜130μmの貫通孔4を安定して形成することが困難となる。したがって、内層導体2A・2Bの厚みは、7〜12μmの範囲に特定される。   Further, when the thickness of the inner layer conductors 2A and 2B is less than 7 μm, the conductor pattern of the inner layer conductors 2A and 2B cannot give sufficient electric characteristics as a power supply layer or a ground layer, and on the other hand, the thickness exceeds 12 μm. In this case, as will be described later, when the through hole 4 penetrating the insulating resin plate 1 and the inner conductors 2A and 2B and the insulating resin layers 3A and 3B is drilled by laser processing, the through hole 4 having a diameter of 75 to 130 μm is stabilized. Therefore, it becomes difficult to form. Therefore, the thickness of the inner layer conductors 2A and 2B is specified in the range of 7 to 12 μm.

また、内層導体2A・2Bは、その表面の中心線平均粗さRaが0.2μm未満の場合、後述するように、絶縁樹脂板1の上下面に絶縁樹脂層3A・3Bを被着させる際に内層導体2A・2Bと絶縁樹脂層3A・3Bとが強固に密着せずに内層導体2A・2Bと絶縁樹脂層3A・3Bとの間で剥離が発生しやすくなる傾向にあり、他方2μmを超えると、そのような粗い面を安定かつ効率良く形成することが困難となる傾向にある。したがって、内層導体2A・2B表面の中心線平均粗さRaは0.2〜2μmの範囲が好ましい。   Further, when the center line average roughness Ra of the inner layer conductors 2A and 2B is less than 0.2 μm, the insulating resin layers 3A and 3B are deposited on the upper and lower surfaces of the insulating resin plate 1 as described later. The inner layer conductors 2A and 2B and the insulating resin layers 3A and 3B are not firmly adhered to each other, and the inner layer conductors 2A and 2B and the insulating resin layers 3A and 3B tend to be peeled off, and the other exceeds 2 μm. And it tends to be difficult to form such a rough surface stably and efficiently. Accordingly, the center line average roughness Ra of the inner layer conductors 2A and 2B is preferably in the range of 0.2 to 2 μm.

さらに、内層導体2A・2Bは貫通孔4が形成される位置に貫通孔4により貫通されるとともに後述する貫通導体5に接する導体パターンを全ての貫通孔4に対応して設けておくと、レーザー加工により貫通孔4を形成する際に全ての貫通孔4においてレーザー光の吸収反射が均一となり、全ての貫通孔4を略均一に形成することができる。したがって、内層導体2A・2Bは貫通孔4が形成される位置に貫通孔4により貫通される導体パターンを全ての貫通孔4に対応して設けておくことが好ましい。   Further, the inner layer conductors 2A and 2B are penetrated by the through holes 4 at positions where the through holes 4 are formed, and a conductor pattern in contact with the through conductors 5 to be described later is provided corresponding to all the through holes 4, so that the laser When the through holes 4 are formed by processing, the absorption and reflection of the laser light is uniform in all the through holes 4, and all the through holes 4 can be formed substantially uniformly. Therefore, the inner layer conductors 2 </ b> A and 2 </ b> B are preferably provided with conductor patterns penetrating through the through holes 4 at positions where the through holes 4 are formed corresponding to all the through holes 4.

このような内層導体2A・2Bは、絶縁樹脂板1の上下全面に厚みが8〜16μm程度の銅箔を貼着するとともに、この銅箔上に感光性のドライフィルムレジストを被着させ、次にこの感光性ドライフィルムレジストを従来周知のフォトリソグラフィー技術により露光・現像して導体パターン形成位置にドライフィルムレジストを有するエッチングマスクを形成し、次にエッチングマスクから露出した銅箔を塩化第2銅水溶液もしくは塩化第2鉄水溶液から成るエッチング液を用いてエッチング除去し、最後にエッチングマスクを剥離した後、塩化第2銅水溶液に蟻酸が含有された粗化液を用いてその表面をエッチングして粗化することによって形成される。   Such inner layer conductors 2A and 2B have a copper foil having a thickness of about 8 to 16 μm adhered to the entire upper and lower surfaces of the insulating resin plate 1, and a photosensitive dry film resist is deposited on the copper foil. Then, this photosensitive dry film resist is exposed and developed by a well-known photolithography technique to form an etching mask having the dry film resist at the conductive pattern forming position, and then the copper foil exposed from the etching mask is cupric chloride. Etching is removed using an etching solution composed of an aqueous solution or ferric chloride aqueous solution, and finally the etching mask is peeled off, and then the surface is etched using a roughening solution containing formic acid in a cupric chloride aqueous solution. Formed by roughening.

次に、図2(b)に部分断面図で示すように、両面銅張板11の上下面にその厚みが内層導体2A・2B上で25〜45μmの絶縁樹脂層3A・3Bを被着形成する。   Next, as shown in a partial cross-sectional view in FIG. 2B, the insulating resin layers 3A and 3B having a thickness of 25 to 45 μm are formed on the upper and lower surfaces of the double-sided copper-clad plate 11 on the inner conductors 2A and 2B. To do.

この絶縁樹脂層3A・3Bはエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル樹脂等の熱硬化型の樹脂から成り、炭酸ガスレーザー等のレーザー光に対する分解度合いが絶縁樹脂板1よりも大きい。   The insulating resin layers 3A and 3B are made of a thermosetting resin such as an epoxy resin, a bismaleimide triazine resin, or a polyphenylene ether resin, and the degree of decomposition with respect to a laser beam such as a carbon dioxide laser is larger than that of the insulating resin plate 1.

この絶縁樹脂層3A・3Bは、その厚みが内層導体2A・2B上で25μm未満の場合、互いに絶縁すべき内層導体2A・2Bと表層導体6A・6Bとを電気的に良好に絶縁することができなくなり、他方、45μmを超えると、絶縁樹脂板1および内層導体2A・2Bならびに絶縁樹脂層3A・3Bを貫通する貫通孔4をレーザー加工により穿孔する際に直径が75〜130μmの貫通孔4を良好に形成することが困難となる。したがって、絶縁層3A・3Bの厚みは内層導体2A・2B上で25〜45μmの範囲に特定される。   When the thickness of the insulating resin layers 3A and 3B is less than 25 μm on the inner layer conductors 2A and 2B, the inner layer conductors 2A and 2B and the surface layer conductors 6A and 6B to be insulated from each other can be electrically well insulated. On the other hand, if the thickness exceeds 45 μm, the through-hole 4 having a diameter of 75 to 130 μm when the through-hole 4 penetrating the insulating resin plate 1 and the inner layer conductors 2A and 2B and the insulating resin layers 3A and 3B is drilled by laser processing. It becomes difficult to form the film well. Therefore, the thickness of the insulating layers 3A and 3B is specified in the range of 25 to 45 μm on the inner layer conductors 2A and 2B.

なお、絶縁樹脂板1の上下面に内層導体2A・2Bが被着されて成る両面銅張板の上下面に絶縁樹脂層3A・3Bを被着形成するには、半硬化状態の熱硬化性樹脂のフィルムを両面銅張板の上下両面に真空ラミネーターで仮圧着した後、これを熱処理して硬化させる方法が採用される。   In order to deposit and form the insulating resin layers 3A and 3B on the upper and lower surfaces of the double-sided copper clad plate formed by coating the inner layer conductors 2A and 2B on the upper and lower surfaces of the insulating resin plate 1, the thermosetting property in a semi-cured state is used. A method is adopted in which a resin film is temporarily pressure-bonded on both upper and lower surfaces of a double-sided copper-clad plate with a vacuum laminator and then heat-treated to be cured.

次に図2(c)に部分断面図で示すように、レーザー加工により絶縁樹脂層3A・3Bおよび内層導体2A・2Bおよび絶縁樹脂板1を貫通する直径が75〜130μmの複数の貫通孔4を穿孔する。   Next, as shown in a partial cross-sectional view in FIG. 2C, a plurality of through holes 4 having a diameter of 75 to 130 μm that penetrate the insulating resin layers 3A and 3B, the inner layer conductors 2A and 2B, and the insulating resin plate 1 by laser processing. Perforate.

このとき、絶縁樹脂層3A・3Bのレーザー光に対する分解度合いが絶縁樹脂板1よりも大きいことから、貫通孔4は、絶縁樹脂層3A・3Bにおいて外側に向けて拡径する形状となる。   At this time, since the degree of decomposition of the insulating resin layers 3A and 3B with respect to the laser beam is larger than that of the insulating resin plate 1, the through hole 4 has a shape that expands toward the outside in the insulating resin layers 3A and 3B.

このように、貫通孔4の直径を75〜130μmと小さいものとすることから、後述するように貫通導体5および表層導体6A・6Bを形成する際に貫通導体5および表層導体6A・6Bを高密度で配置することができ、それにより高密度な配線基板を得ることができる。   As described above, since the diameter of the through hole 4 is as small as 75 to 130 μm, the through conductor 5 and the surface layer conductors 6A and 6B are made high when forming the through conductor 5 and the surface layer conductors 6A and 6B as described later. It can arrange | position with a density and, thereby, a high-density wiring board can be obtained.

また、貫通孔4の孔径が絶縁樹脂層3A・3Bの部位で外側に向かって広がっていることから、後述するように貫通孔4内壁に貫通導体5を被着形成する際に、貫通導体5を形成するためのめっき液が貫通孔4の内部に良好に入り込み、その結果、貫通孔4内に貫通導体5を良好に形成することができる。   Further, since the hole diameter of the through hole 4 is widened outward at the portions of the insulating resin layers 3A and 3B, the through conductor 5 is formed when the through conductor 5 is deposited on the inner wall of the through hole 4 as will be described later. The plating solution for forming the metal penetrates into the through holes 4 favorably, and as a result, the through conductors 5 can be satisfactorily formed in the through holes 4.

なお、貫通孔4の孔径が75μm未満の場合、貫通孔4内壁に貫通導体5を被着形成する際に、貫通導体5を形成するためのめっき液が貫通孔4の内部に良好に入り込まず、貫通孔4内壁に貫通導体5を良好に形成することができなくなり、他方、130μmを超えると、貫通導体5および表層導体6A・6Bを高密度で配置することが困難となる。したがって、貫通孔4の直径は、75〜130μmの範囲に特定される。   When the diameter of the through hole 4 is less than 75 μm, the plating solution for forming the through conductor 5 does not enter the inside of the through hole 4 when the through conductor 5 is deposited on the inner wall of the through hole 4. The through conductors 5 cannot be satisfactorily formed on the inner walls of the through holes 4, and on the other hand, when the thickness exceeds 130 μm, it is difficult to arrange the through conductors 5 and the surface layer conductors 6A and 6B at high density. Therefore, the diameter of the through hole 4 is specified in the range of 75 to 130 μm.

また、貫通孔4の開口部における直径が絶縁樹脂板1における直径よりも10μm未満大きい場合には、貫通孔4内壁に貫通導体5を被着形成する際に、貫通導体5を形成するためのめっき液が貫通孔4の内部に良好に入り込まずに貫通孔4内壁に貫通導体5を良好に形成することが困難となり、他方、50μmを超えて大きな場合には、そのような形状を有する貫通孔4を安定して形成することが困難となる。したがって、貫通孔4の開口部における直径は、絶縁樹脂板1における直径よりも10〜50μm大きくしておくことが好ましい。   When the diameter of the opening of the through hole 4 is smaller than the diameter of the insulating resin plate 1 by less than 10 μm, the through conductor 5 is formed when the through conductor 5 is deposited on the inner wall of the through hole 4. If the plating solution does not enter the inside of the through-hole 4 and it is difficult to form the through-conductor 5 on the inner wall of the through-hole 4, it is difficult to form the through-conductor 5 on the inner wall. It becomes difficult to form the holes 4 stably. Therefore, it is preferable that the diameter of the opening of the through hole 4 is 10 to 50 μm larger than the diameter of the insulating resin plate 1.

なお、絶縁樹脂層3A・3Bおよび内層導体2A・2Bおよび絶縁樹脂板1に貫通孔4を形成するには、絶縁樹脂層3A・3B上に例えばレーザー光のエネルギーを良好に吸収する黒色もしくは黒色に近い色を有する樹脂から成るレーザー加工用シートを貼着し、このレーザー加工用シートの上から7〜12mJの出力の炭酸ガスレーザー光を50〜500μ秒のパルス幅で所定の位置に照射して貫通孔4を穿孔する方法が採用される。   In order to form the through holes 4 in the insulating resin layers 3A and 3B, the inner layer conductors 2A and 2B, and the insulating resin plate 1, for example, black or black that absorbs energy of laser light satisfactorily on the insulating resin layers 3A and 3B. A laser processing sheet made of a resin having a color close to that of a laser beam is pasted, and a carbon dioxide laser beam with an output of 7 to 12 mJ is irradiated on a predetermined position with a pulse width of 50 to 500 μsec from the top of the laser processing sheet. Then, a method of drilling the through hole 4 is employed.

このとき、炭酸ガスレーザー光の出力が7mJ未満だと貫通孔4を十分な大きさに穿孔することが困難となる傾向にあり、他方、12mJを超えると絶縁樹脂層3A・3Bにおける貫通孔4の孔径が大きくなりすぎてしまう傾向にある。したがって、照射する炭酸ガスレーザー光は、その出力が7〜12mJでパルス幅が50〜500μ秒の範囲であることが好ましい。なお、レーザー加工用シートは、貫通孔4を穿孔した後に剥離する。   At this time, if the output of the carbon dioxide laser beam is less than 7 mJ, it tends to be difficult to perforate the through hole 4 to a sufficient size, and if it exceeds 12 mJ, the through hole 4 in the insulating resin layers 3A and 3B is likely to be difficult. Tend to be too large. Therefore, the carbon dioxide laser light to be irradiated preferably has an output of 7 to 12 mJ and a pulse width of 50 to 500 μsec. The laser processing sheet is peeled off after the through holes 4 are formed.

このように貫通孔4をレーザー加工により形成することにより、直径が75〜130μmで、絶縁樹脂層3A・3Bにおいて外側に向けて拡径する形状の貫通孔4を容易に形成することができる。   By forming the through hole 4 by laser processing in this way, it is possible to easily form the through hole 4 having a diameter of 75 to 130 μm and a shape that expands outward in the insulating resin layers 3A and 3B.

次に、図2(d)に部分断面図で示すように、貫通孔4内壁および絶縁樹脂層3A・3Bの表面に厚みが1〜3μmの無電解銅めっき膜から成るめっき膜13Aを被着させる。   Next, as shown in a partial sectional view in FIG. 2D, a plating film 13A made of an electroless copper plating film having a thickness of 1 to 3 μm is deposited on the inner wall of the through hole 4 and the surfaces of the insulating resin layers 3A and 3B. Let

なお、無電解めっき膜から成るめっき膜13Aを被着させるには、例えば塩化アンモニウム系酢酸パラジウムを含有するパラジウム活性液を使用して貫通孔4内壁および絶縁樹脂層3A・3Bの表面にパラジウム触媒を付着させるとともに、その上に硫酸銅系の無電解銅めっき液を用いて無電解銅めっき膜を被着させればよい。 In order to deposit the plating film 13A made of an electroless plating film, for example, a palladium catalyst is used on the inner walls of the through holes 4 and the surfaces of the insulating resin layers 3A and 3B by using a palladium active solution containing ammonium chloride-based palladium acetate. And an electroless copper plating film may be deposited thereon using a copper sulfate-based electroless copper plating solution.

このとき、貫通孔4は、絶縁樹脂層3A・3Bにおいて外側に向けて拡径していることから、貫通孔4内に無電解銅めっき液が良好に浸入し、その結果、貫通孔4内壁および絶縁樹脂層3A・3Bの表面に無電解銅めっき膜を略均一な厚みに良好に被着させることができる。   At this time, since the diameter of the through-hole 4 is increased outward in the insulating resin layers 3A and 3B, the electroless copper plating solution satisfactorily enters the through-hole 4, and as a result, the inner wall of the through-hole 4 In addition, the electroless copper plating film can be satisfactorily deposited on the surfaces of the insulating resin layers 3A and 3B with a substantially uniform thickness.

なお、無電解銅めっき膜から成るめっき膜13Aを被着させる前に絶縁樹脂層3A・3B表面および貫通孔4内壁を例えば過マンガン酸カリウム溶液や過マンガン酸ナトリウム溶液から成る粗化液を用いてその中心線平均粗さRaが0.2〜2μm程度になるように粗化しておくと無電解銅めっき膜から成るめっき膜13Aを強固に被着させることができる。   Before the plating film 13A made of an electroless copper plating film is applied, the surface of the insulating resin layers 3A and 3B and the inner wall of the through hole 4 are made of a roughening solution made of, for example, a potassium permanganate solution or a sodium permanganate solution. If the surface roughness is made rough so that the center line average roughness Ra is about 0.2 to 2 μm, the plating film 13A made of an electroless copper plating film can be firmly applied.

したがって、無電解銅めっき膜から成るめっき膜13Aを被着させる前に絶縁樹脂層3A・3B表面および貫通孔4内壁を例えば過マンガン酸カリウム溶液や過マンガン酸ナトリウム溶液から成る粗化液を用いてその中心線平均粗さRaが0.2〜2μm程度になるように粗化しておくことが好ましい。   Therefore, before depositing the plating film 13A made of an electroless copper plating film, the surface of the insulating resin layers 3A and 3B and the inner wall of the through hole 4 are made of a roughening solution made of, for example, a potassium permanganate solution or a sodium permanganate solution. The center line average roughness Ra is preferably roughened to about 0.2 to 2 μm.

次に、図2(e)に部分断面図で示すように、絶縁層3A・3B上の無電解銅めっき膜上にめっき用マスク14を被着させるとともに、めっき用マスク14から露出した無電解銅めっき膜上に厚みが10〜35μm程度の電解銅めっき膜を被着させ、貫通孔4の内壁および絶縁樹脂層3A・3B表面の導体パターン形成部位が選択的に厚く被着された無電解めっき膜と電解銅めっき膜とから成るめっき膜13Bを形成する。   Next, as shown in a partial cross-sectional view in FIG. 2E, a plating mask 14 is deposited on the electroless copper plating film on the insulating layers 3A and 3B, and the electroless exposed from the plating mask 14 is applied. Electroless copper plating film having a thickness of about 10 to 35 μm is deposited on the copper plating film, and the inner wall of the through hole 4 and the conductive pattern formation sites on the surfaces of the insulating resin layers 3A and 3B are selectively deposited thickly. A plating film 13B composed of a plating film and an electrolytic copper plating film is formed.

なお、めっき用マスク14は、例えば感光性ドライフィルムレジストを絶縁樹脂層3A・3B上の無電解銅めっき膜上に被着させるとともに、このドライフィルムレジストをフォトリソグラフィー技術により露光・現像して所定のパターンに加工することによって形成する。   The plating mask 14 is formed by, for example, depositing a photosensitive dry film resist on the electroless copper plating film on the insulating resin layers 3A and 3B, and exposing and developing the dry film resist by a photolithography technique. It is formed by processing into a pattern.

また、電解銅めっき膜を被着させるための電解銅めっき液としては、例えば、硫酸銅系から成る電解銅めっき液を用いればよい。   Moreover, as an electrolytic copper plating solution for depositing an electrolytic copper plating film, for example, an electrolytic copper plating solution made of a copper sulfate system may be used.

このとき、貫通孔4は、絶縁樹脂層3A・3Bにおいて外側に向けて拡径していることから、貫通孔4内に電解銅めっき液が良好に浸入し、その結果、貫通孔4内壁および絶縁樹脂層3A・3Bの表面に電解銅めっき膜が略均一な厚みに良好に被着される。   At this time, since the diameter of the through-hole 4 is increased outward in the insulating resin layers 3A and 3B, the electrolytic copper plating solution satisfactorily penetrates into the through-hole 4, and as a result, the inner wall of the through-hole 4 and An electrolytic copper plating film is satisfactorily deposited on the surfaces of the insulating resin layers 3A and 3B with a substantially uniform thickness.

次に、図2(f)に部分断面図で示すように、めっきマスク14を剥離するとともにめっきマスク14の下にあった無電解銅めっき膜が消滅するまで無電解銅めっき膜および電解銅めっき膜をエッチングし、貫通孔4内壁に貫通導体5を形成するとともに絶縁樹脂層3A・3Bの表面に表層導体6A・6Bを形成する。   Next, as shown in a partial cross-sectional view in FIG. 2 (f), the electroless copper plating film and the electrolytic copper plating are removed until the plating mask 14 is peeled off and the electroless copper plating film under the plating mask 14 disappears. The film is etched to form the through conductor 5 on the inner wall of the through hole 4 and the surface conductors 6A and 6B on the surfaces of the insulating resin layers 3A and 3B.

なお、無電解銅めっき膜および電解銅めっき膜をエッチングするには、塩化第2銅水溶液または塩化第2鉄水溶液から成るエッチング液を用いればよい。   In order to etch the electroless copper plating film and the electrolytic copper plating film, an etching solution made of a cupric chloride aqueous solution or a ferric chloride aqueous solution may be used.

最後に、絶縁樹脂層3A・3Bの表面および貫通孔4の内部にエポキシ樹脂やビスマレイミドトリアジン樹脂・ポリフェニレンエーテル等の熱硬化性樹脂から成るソルダーレジスト7を被着および充填させることにより図1に示す本発明の配線基板が完成する。   Finally, a solder resist 7 made of a thermosetting resin such as epoxy resin, bismaleimide triazine resin, or polyphenylene ether is deposited and filled on the surfaces of the insulating resin layers 3A and 3B and the inside of the through holes 4 as shown in FIG. The wiring board of the present invention shown is completed.

なお、ソルダーレジスト7は、ソルダーレジスト7用の感光性の樹脂ペーストを従来周知のスクリーン印刷法を採用して絶縁層3A側および3B側から貫通孔4を埋めるように印刷塗布し、これを従来周知のフォトリソグラフィー技術を採用して所定のパターンに露光・現像することによって形成される。   Note that the solder resist 7 is printed and applied with a photosensitive resin paste for the solder resist 7 so as to fill the through-holes 4 from the insulating layer 3A side and the 3B side using a conventionally known screen printing method. It is formed by exposing and developing into a predetermined pattern using a well-known photolithography technique.

このとき、貫通孔4は、絶縁樹脂層3A・3Bにおいて外側に向けて拡径していることから、貫通孔4内にソルダーレジスト7用の樹脂ペーストが良好に浸入し、その結果、貫通孔4内をソルダーレジスト7で良好に充填することができる。   At this time, since the diameter of the through-hole 4 is expanded outward in the insulating resin layers 3A and 3B, the resin paste for the solder resist 7 is satisfactorily infiltrated into the through-hole 4, and as a result, the through-hole 4 can be satisfactorily filled with the solder resist 7.

かくして、本発明の配線基板の製造方法によれば、貫通導体5に断線が発生することがなく、極めて高密度な配線が可能な配線基板を得ることができる。   Thus, according to the method for manufacturing a wiring board of the present invention, it is possible to obtain a wiring board capable of extremely high-density wiring without causing disconnection in the through conductor 5.

本発明の配線基板の実施形態の一例を示す部分断面図である。It is a fragmentary sectional view showing an example of an embodiment of a wiring board of the present invention. (a)〜(f)は、本発明の配線基板の製造方法を説明するための工程毎の部分断面図である。(A)-(f) is a fragmentary sectional view for every process for demonstrating the manufacturing method of the wiring board of this invention.

符号の説明Explanation of symbols

1・・・・・・・絶縁樹脂板
2A・2B・・・内層導体
3A・3B・・・絶縁樹脂層
4・・・・・・・貫通孔
5・・・・・・・貫通導体
6A・6B・・・表層導体
1. Insulating resin plates 2A, 2B ... Inner layer conductors 3A, 3B ... Insulating resin layer 4 ... Through holes 5 ... Through conductors 6A 6B ... Surface conductor

Claims (4)

絶縁樹脂板と、該絶縁樹脂板の上下両面に被着された、厚みが7〜12μmの銅箔から成る内層導体と、を有する両面銅張板と、
前記両面銅張板の上下両面に被着された絶縁樹脂層と、
前記絶縁樹脂板、前記内層導体および前記絶縁樹脂層を上下に貫通し、直径が75〜130μmの複数の貫通孔と、
前記貫通孔内壁にめっきにより被着形成され、前記内層導体に接続された貫通導体と、
前記絶縁樹脂層の表面にめっきにより被着形成され、前記貫通導体に接続された表層導体と、
を備え、
前記絶縁樹脂板は厚みが350〜450μmであり、前記絶縁樹脂層は厚みが前記内層導体上で25〜45μmであり、
前記貫通孔の直径は、前記絶縁樹脂板において同じ大きさであり、前記絶縁樹脂層において外側に向けて拡径することを特徴とする配線基板。
A double-sided copper-clad plate having an insulating resin plate, and an inner layer conductor made of copper foil having a thickness of 7 to 12 μm, which is attached to both upper and lower surfaces of the insulating resin plate;
Insulating resin layers deposited on both upper and lower surfaces of the double-sided copper-clad plate;
A plurality of through-holes having a diameter of 75 to 130 μm, vertically penetrating the insulating resin plate, the inner layer conductor and the insulating resin layer;
A through conductor formed by plating on the inner wall of the through hole and connected to the inner layer conductor; and
A surface layer conductor formed by plating on the surface of the insulating resin layer and connected to the through conductor; and
With
The insulating resin plate has a thickness of 350 to 450 μm, the insulating resin layer has a thickness of 25 to 45 μm on the inner layer conductor,
The diameter of the said through-hole is the same magnitude | size in the said insulating resin board, and it expands toward the outer side in the said insulating resin layer, The wiring board characterized by the above-mentioned.
前記絶縁樹脂板は、繊維部分と樹脂部分とから成り、
前記絶縁樹脂層は、熱硬化性樹脂から成ることを特徴とする請求項1記載の配線基板。
The insulating resin plate is composed of a fiber portion and a resin portion,
The wiring board according to claim 1, wherein the insulating resin layer is made of a thermosetting resin.
厚みが350〜450μmの絶縁樹脂板の上下両面に厚みが7〜12μmの銅箔から成る内層導体が被着された両面銅張板の前記上下両面に厚みが前記内層導体上で25〜45μmの絶縁樹脂層を被着させるとともに、前記絶縁樹脂板、前記内層導体および前記絶縁樹脂層を上下に貫通すると同時に、前記絶縁樹脂板において同じ大きさであるとともに前記絶縁樹脂層において外側に向けて拡径する直径が75〜130μmの複数の貫通孔を形成し、次に前記貫通孔内壁に前記内層導体に接続された貫通導体および前記絶縁樹脂層の表面に前記貫通導体に接続された表層導体をそれぞれめっきにより被着させることを特徴とする配線基板の製造方法。   An insulating resin plate having a thickness of 350 to 450 μm has a thickness of 25 to 45 μm on the upper and lower surfaces of the double-sided copper clad plate in which an inner layer conductor made of a copper foil having a thickness of 7 to 12 μm is deposited on both upper and lower surfaces. The insulating resin layer is applied, and the insulating resin plate, the inner layer conductor, and the insulating resin layer are vertically penetrated. At the same time, the insulating resin plate has the same size and spreads outward in the insulating resin layer. A plurality of through holes having a diameter of 75 to 130 μm are formed, and then a through conductor connected to the inner layer conductor on the inner wall of the through hole and a surface layer conductor connected to the through conductor on the surface of the insulating resin layer A method of manufacturing a wiring board, characterized in that each is deposited by plating. 前記両面銅張板の前記貫通孔が形成される各位置の前記上下両面に前記貫通孔により貫通される前記内層導体の導体パターンをそれぞれ配設しておくとともに、該導体パターンを貫通して前記貫通孔を形成するとともにこの導体パターンに接して前記貫通導体を被着させることを特徴とする請求項3記載の配線基板の製造方法。   Conductor patterns of the inner layer conductors that are penetrated by the through holes are respectively disposed on the upper and lower surfaces of each position where the through holes of the double-sided copper-clad plate are formed, 4. The method of manufacturing a wiring board according to claim 3, wherein the through-hole is formed and the through-conductor is deposited in contact with the conductor pattern.
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