JP4448493B2 - 走査型プローブ顕微鏡および分子構造変化観測方法 - Google Patents
走査型プローブ顕微鏡および分子構造変化観測方法 Download PDFInfo
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- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q20/00—Monitoring the movement or position of the probe
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- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
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Description
Claims (17)
- 液中の試料をカンチレバーで走査しながら液中または試料中に存在するケージド化合物に解除光を照射する際に、カンチレバー自体への解除光照射の影響を軽減するために、解除光照射のタイミングに合わせて、カンチレバーまたは試料を互いに離れる方向に退避させる、分子構造変化観測方法。
- ケージド化合物の保護基を解除する光が紫外線である、請求項1に記載の分子構造変化観測方法。
- 試料またはカンチレバーまたはカンチレバーの自由端に保持された探針の内、少なくとも一つを観察する、請求項1または請求項2に記載の分子構造変化観測方法。
- 解除光を照射する時間を制御する、請求項1または請求項2に記載の分子構造変化観測方法。
- カンチレバーと、
液中に存在するカンチレバーと試料を相対走査する走査機構と、
走査中に液中または試料中に存在するケージド化合物に解除光を照射する照射機構と、
カンチレバー自体への解除光照射の影響を軽減するために、解除光照射のタイミングに合わせて、カンチレバーまたは試料を互いに離れる方向に退避させる制御機構とを有している、走査型プローブ顕微鏡。 - カンチレバーと試料との間の相互作用によるカンチレバーの変位を光学的に検出する検出機構と、検出機構に用いる検出光とケージド化合物に照射する解除光とを分離する光学機構を有している、請求項5に記載の走査型プローブ顕微鏡。
- 検出機構に解除光が届かないようにする光学素子を有している、請求項6に記載の走査型プローブ顕微鏡。
- 解除光が紫外線である、請求項5ないし請求項7のいずれかひとつに記載の走査型プローブ顕微鏡。
- カンチレバー、または、カンチレバーの自由端に保持された探針に官能基または分子を修飾した、請求項5ないし請求項7のいずれかひとつに記載の走査型プローブ顕微鏡。
- カンチレバーと、
液中に存在するカンチレバーと試料を相対走査する走査機構と、
カンチレバーと試料との間の相互作用によるカンチレバーの変位を光学的に検出する検出機構と、
走査中に液中または試料中に存在するケージド化合物に解除光を照射する照射機構と、
カンチレバー自体への解除光照射の影響を軽減するために、解除光照射のタイミングに合わせて、カンチレバーまたは試料を互いに離れる方向に退避させる制御機構と、
検出機構の光検出素子に解除光が届かないようにする光学素子と、
試料またはカンチレバーまたはカンチレバーの自由端に保持された探針の内、少なくとも一つを観察する光学顕微鏡とを有している、走査型プローブ顕微鏡。 - 光学顕微鏡の対物レンズを介して光学顕微鏡の視野の一部または全部に解除光を照射する、請求項10に記載の走査型プローブ顕微鏡。
- 解除光が紫外線である、請求項10または請求項11に記載の走査型プローブ顕微鏡。
- 解除光を照射する時間を制御する、請求項10または請求項11に記載の走査型プローブ顕微鏡。
- カンチレバーと、
液中に存在するカンチレバーと試料とを相対走査する走査機構と、
走査中に液中または試料中に、時間的または空間的に限られた範囲で作用する作用機構と、
カンチレバー自体への作用機構の作用の影響を軽減するために、作用機構の作用のタイミングに合わせて、カンチレバーまたは試料を互いに離れる方向に退避させる制御機構とを有している、走査型プローブ顕微鏡。 - カンチレバーと、
液中に存在するカンチレバーと試料とを相対走査する走査機構と、
走査中に液中または試料中に存在する分子に変化を起こさせる光照射または作用を行なう機構と、
カンチレバー自体への光照射または作用の影響を軽減するために、光照射または作用のタイミングに合わせて、カンチレバーまたは試料を互いに離れる方向に退避させる制御機構とを有している走査型プローブ顕微鏡。 - 液中に存在するカンチレバーと試料とを相対走査するステップと、
走査中に液中または試料中に存在する分子に変化を起こさせる光照射または作用を行なうステップと、
光照射または作用を行なう際にカンチレバー自体への光照射または作用の影響を軽減するために、光照射または作用のタイミングに合わせて、カンチレバーまたは試料を互いに離れる方向に退避させるステップとを含む分子構造変化観測方法。 - 液中に存在するカンチレバーと試料とを相対走査するステップと、
走査中に液中または試料中に、時間的または空間的に限られた範囲で光照射または作用を行なうステップと、
光照射または作用を行なう際にカンチレバー自体への光照射または作用の影響を軽減するために、光照射または作用のタイミングに合わせて、カンチレバーまたは試料を互いに離れる方向に退避させるステップとを含む分子構造変化観測方法。
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JP2003365072 | 2003-10-24 | ||
JP2003365072A JP2005106790A (ja) | 2003-01-09 | 2003-10-24 | 走査型プローブ顕微鏡および分子構造変化観測方法 |
PCT/JP2004/000110 WO2004063723A1 (ja) | 2003-01-09 | 2004-01-09 | 走査型プローブ顕微鏡および分子構造変化観測方法 |
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US9804193B2 (en) | 2014-03-12 | 2017-10-31 | Oxford Instruments Asylum Research, Inc | Metrological scanning probe microscope |
US10705114B2 (en) | 2014-03-12 | 2020-07-07 | Oxford Instruments Asylum Research Inc | Metrological scanning probe microscope |
WO2016073999A1 (en) * | 2014-11-03 | 2016-05-12 | Oxford Instruments Asylum Research, Inc. | Metrological scanning probe microscope |
US11506877B2 (en) | 2016-11-10 | 2022-11-22 | The Trustees Of Columbia University In The City Of New York | Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees |
CN113711009A (zh) * | 2019-02-04 | 2021-11-26 | 生命科技控股私人有限公司 | 光学读取器和分析生物样品的方法 |
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JP3268797B2 (ja) | 1991-10-09 | 2002-03-25 | オリンパス光学工業株式会社 | 光導入装置 |
JP3371135B2 (ja) * | 1993-07-29 | 2003-01-27 | 独立行政法人産業技術総合研究所 | 蛍光走査型プローブ顕微鏡 |
JP3302216B2 (ja) | 1995-05-10 | 2002-07-15 | オリンパス光学工業株式会社 | 走査型プローブ顕微鏡および光学顕微鏡 |
JP3577141B2 (ja) * | 1995-09-22 | 2004-10-13 | オリンパス株式会社 | プローブ走査機構、および、それを用いた走査型プローブ顕微鏡 |
US5874668A (en) * | 1995-10-24 | 1999-02-23 | Arch Development Corporation | Atomic force microscope for biological specimens |
JPH10123427A (ja) * | 1996-10-22 | 1998-05-15 | Nikon Corp | 顕微鏡装置 |
JPH10142238A (ja) * | 1996-11-08 | 1998-05-29 | Hitachi Constr Mach Co Ltd | 複合型顕微鏡 |
JPH10227738A (ja) | 1997-02-12 | 1998-08-25 | Nikon Corp | ケージド試薬開裂用光照射装置 |
JP3497734B2 (ja) * | 1997-07-24 | 2004-02-16 | オリンパス株式会社 | 走査型プローブ顕微鏡 |
JP4797150B2 (ja) * | 2000-03-14 | 2011-10-19 | オリンパス株式会社 | 走査機構およびこれを用いた機械走査型顕微鏡 |
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EP1582856A1 (en) | 2005-10-05 |
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JPWO2004063723A1 (ja) | 2006-05-18 |
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EP1582856A4 (en) | 2011-06-22 |
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