JP4447970B2 - 物体情報生成装置および撮像装置 - Google Patents

物体情報生成装置および撮像装置 Download PDF

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Publication number
JP4447970B2
JP4447970B2 JP2004176200A JP2004176200A JP4447970B2 JP 4447970 B2 JP4447970 B2 JP 4447970B2 JP 2004176200 A JP2004176200 A JP 2004176200A JP 2004176200 A JP2004176200 A JP 2004176200A JP 4447970 B2 JP4447970 B2 JP 4447970B2
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JP
Japan
Prior art keywords
image
light
shape
spectral
imaging
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Expired - Fee Related
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JP2004176200A
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Japanese (ja)
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JP2005351871A (ja
JP2005351871A5 (enExample
Inventor
保宏 沢田
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2004176200A priority Critical patent/JP4447970B2/ja
Priority to US11/151,883 priority patent/US7189984B2/en
Publication of JP2005351871A publication Critical patent/JP2005351871A/ja
Publication of JP2005351871A5 publication Critical patent/JP2005351871A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2004176200A 2004-06-14 2004-06-14 物体情報生成装置および撮像装置 Expired - Fee Related JP4447970B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004176200A JP4447970B2 (ja) 2004-06-14 2004-06-14 物体情報生成装置および撮像装置
US11/151,883 US7189984B2 (en) 2004-06-14 2005-06-13 Object data input apparatus and object reconstruction apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004176200A JP4447970B2 (ja) 2004-06-14 2004-06-14 物体情報生成装置および撮像装置

Publications (3)

Publication Number Publication Date
JP2005351871A JP2005351871A (ja) 2005-12-22
JP2005351871A5 JP2005351871A5 (enExample) 2007-07-26
JP4447970B2 true JP4447970B2 (ja) 2010-04-07

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JP2004176200A Expired - Fee Related JP4447970B2 (ja) 2004-06-14 2004-06-14 物体情報生成装置および撮像装置

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US (1) US7189984B2 (enExample)
JP (1) JP4447970B2 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006031142B4 (de) * 2006-07-05 2012-02-16 Prüf- und Forschungsinstitut Pirmasens e.V. Verfahren und Vorrichtung zur dreidimensionalen Vermessung und Erfassung der kompletten Objektoberfläche eines kugelförmigen Messobjektes wie eines Sportballs
GB0615956D0 (en) * 2006-08-11 2006-09-20 Univ Heriot Watt Optical imaging of physical objects
TWI414748B (zh) * 2009-01-23 2013-11-11 Univ Nat Taipei Technology 同步色相相移轉換方法以及其三維形貌量測系統
US9128036B2 (en) 2011-03-21 2015-09-08 Federal-Mogul Corporation Multi-spectral imaging system and method of surface inspection therewith
AU2012325242B2 (en) * 2011-10-21 2015-07-16 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Optical device and method for measuring a complexly formed object
JP5862244B2 (ja) * 2011-11-30 2016-02-16 住友電気工業株式会社 対象検出装置および対象検出方法
KR102025716B1 (ko) * 2013-03-21 2019-09-26 삼성전자주식회사 3차원 형상 측정장치
TWI486551B (zh) 2013-10-21 2015-06-01 Univ Nat Taiwan Science Tech 三維資料擷取方法及其系統
CN103575236A (zh) * 2013-11-08 2014-02-12 湖北汽车工业学院 一种基于双芯光纤干涉条纹的微型三维测量系统
US10085013B2 (en) * 2013-12-24 2018-09-25 Lg Electronics Inc. 3D camera module
CN113520301B (zh) * 2016-03-10 2024-11-26 明尼苏达大学董事会 空间-光谱成像方法和视网膜成像设备
JP6688712B2 (ja) * 2016-09-28 2020-04-28 花王株式会社 反射スペクトルの測定方法
JP6457574B2 (ja) * 2017-03-15 2019-01-23 ファナック株式会社 計測装置
CN114513613B (zh) * 2017-09-28 2024-05-14 超威半导体公司 计算用光学器件
KR102400376B1 (ko) * 2019-07-04 2022-05-23 주식회사 히타치하이테크 삼차원 형상 검출 장치, 방법, 및 플라스마 처리 장치
US11788891B2 (en) 2021-06-11 2023-10-17 The United States Of America, As Represented By The Secretary Of Agriculture Method and system for active line scan imaging
JPWO2023243430A1 (enExample) * 2022-06-14 2023-12-21

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2509776B2 (ja) 1992-01-10 1996-06-26 株式会社クボタ 三次元形状計測装置
US6507036B1 (en) * 1999-06-01 2003-01-14 National Research Council Of Canada Three dimensional optical scanning
US6469788B2 (en) * 2000-03-27 2002-10-22 California Institute Of Technology Coherent gradient sensing ellipsometer
JP4031712B2 (ja) * 2003-01-17 2008-01-09 三菱電機株式会社 半導体多層膜の分光計測方法および分光計測装置

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Publication number Publication date
US7189984B2 (en) 2007-03-13
JP2005351871A (ja) 2005-12-22
US20050274913A1 (en) 2005-12-15

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