JP4395475B2 - タグとリーダとの間の認識距離測定装置 - Google Patents
タグとリーダとの間の認識距離測定装置 Download PDFInfo
- Publication number
- JP4395475B2 JP4395475B2 JP2005379671A JP2005379671A JP4395475B2 JP 4395475 B2 JP4395475 B2 JP 4395475B2 JP 2005379671 A JP2005379671 A JP 2005379671A JP 2005379671 A JP2005379671 A JP 2005379671A JP 4395475 B2 JP4395475 B2 JP 4395475B2
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- Prior art keywords
- electromagnetic wave
- antenna
- unit
- electric field
- tag
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
- Radar Systems Or Details Thereof (AREA)
Description
120 セル連結フレーム
200 認識距離測定装置
210 外部コネクタ
220 アンテナ支持台
230 リーダアンテナ
240 ステッピングモータ
250 第1ステッピングモータ
260 第2ステッピングモータ
270 タグ支持台
280 電界プローブ
Claims (9)
- アンテナと、電界プローブとの間の読み取りレンジを測定する装置であって、
2つの側端部単位セルを備えた電磁無反響チャンバであって、各側端部単位セルが1つの開口を持つ内壁を有し、電磁波吸収体が前記内壁に備えられ、各側端部単位セルの開口が他の単位セルの開口に連結可能であり、これにより、前記2つの側端部単位セル間の距離が前記他の単位セルの数を変えることによって調整可能である電磁無反響チャンバと、
前記電磁無反響チャンバの一側端部のセルに位置し、アンテナを通じて電磁波を放出する電磁波発生部と、
前記電磁無反響チャンバ内で移動する電界プローブを通じて前記電磁波発生部から放出された電磁波の電界強度を測定する電磁波測定部と、を備えることを特徴とする装置。 - 前記単位セルは、炭素系列の電磁波吸収体を内壁に備えたことを特徴とする請求項1に記載の装置。
- 前記電磁波発生部は、前記アンテナを上下移動及び一定の半径に回転させることを特徴とする請求項1に記載の装置。
- 電磁波発生部は、
電磁波を放出するアンテナと、
前記アンテナと外部RFIDリーダ器とを連結する外部コネクタと、
所定長さのロッドに位置したアームの端部に前記アンテナを固定し、前記ロッドの上下運動及び前記アームの回転運動を行うアンテナ支持台と、を備えることを特徴とする請求項1に記載の装置。 - 記電磁波測定部は、
前記電界プローブを前記無反響チャンバ内でセルの間を直線移動するか、または上下移動及び一定の半径に回転させることを特徴とする請求項1に記載の装置。 - 前記電磁波測定部は、
前記電磁波発生部から放出された電磁波の電界強度を測定する電界プローブと、
前記電界プローブを所定長さのロッドに位置したアームの端部に固定し、前記ロッドの上下運動及び前記アームの回転運動を行うタグ支持台と、
前記タグ支持台を前記電子波無反響チャンバの両端部のセルの間で移動させるステッピングモータと、を備えることを特徴とする請求項1に記載の装置。 - 前記電磁波発生部のアンテナの上下移動及び回転を制御し、前記電磁波測定部の電界プローブの移動を制御する位置制御部をさらに備えることを特徴とする請求項1に記載の装置。
- 前記アンテナと前記電界プローブとの間の相対的な位置による電界強度を把握する中央制御部をさらに備えることを特徴とする請求項1に記載の装置。
- 前記電磁波測定部にタグ及びリーダを位置させ、前記電磁波発生部に前記タグ及びリーダに適した標準アンテナを位置させた後、近域長アンテナの測定方法を通じて前記タグ及びリーダの放射パターンを測定するパターン分析部をさらに備えることを特徴とする請求項1に記載の装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20050041031 | 2005-05-17 | ||
KR1020050067821A KR100651741B1 (ko) | 2005-05-17 | 2005-07-26 | 태그와 리더 사이의 인식거리 측정장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006322915A JP2006322915A (ja) | 2006-11-30 |
JP4395475B2 true JP4395475B2 (ja) | 2010-01-06 |
Family
ID=36677261
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005379671A Expired - Fee Related JP4395475B2 (ja) | 2005-05-17 | 2005-12-28 | タグとリーダとの間の認識距離測定装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7161357B2 (ja) |
EP (1) | EP1724596B1 (ja) |
JP (1) | JP4395475B2 (ja) |
CN (1) | CN100460881C (ja) |
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TWI390217B (zh) * | 2006-09-28 | 2013-03-21 | Murata Manufacturing Co | 天線特性測定裝置及天線特性測定方法 |
TWI326429B (en) * | 2006-12-15 | 2010-06-21 | Ind Tech Res Inst | Rfid tag testing apparatus |
US7812725B2 (en) * | 2006-12-21 | 2010-10-12 | Tagent 6 Corporation | System for powering and reading RFID tags |
HK1095702A2 (en) * | 2006-12-28 | 2007-05-11 | Univ Hong Kong Polytechnic | Method for optimizing rfid deployment and rfid deployment optimizer of use thereof |
FI121980B (fi) * | 2007-02-16 | 2011-06-30 | Voyantic Oy | Menetelmä radiolinkin karakterisoimiseksi |
US7999676B2 (en) * | 2007-06-20 | 2011-08-16 | The Hong Kong University Of Science And Technology | Method and system for determining the placement of RFID antennas to obtain a readable region for RFID tags |
CA2594076C (en) * | 2007-07-18 | 2016-12-13 | Psion Teklogix Inc. | Method, system and support mechanism for object identification |
KR100932902B1 (ko) * | 2007-08-29 | 2009-12-21 | 한국전자통신연구원 | 이중 감도 모드를 갖는 리더 간 통신 방법 및 장치 |
CN101911093B (zh) * | 2008-01-09 | 2014-04-02 | Nxp股份有限公司 | 评估电磁门装置的电磁场强度 |
JP2009222590A (ja) * | 2008-03-17 | 2009-10-01 | Fujitsu Ltd | 試験装置および試験方法 |
US7978074B2 (en) * | 2008-04-07 | 2011-07-12 | Intermec Ip Corp. | Method and apparatus for RFID tag detection and characterization |
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2005
- 2005-12-07 US US11/296,056 patent/US7161357B2/en not_active Expired - Fee Related
- 2005-12-07 EP EP05111772A patent/EP1724596B1/en not_active Expired - Fee Related
- 2005-12-12 CN CNB2005101380691A patent/CN100460881C/zh not_active Expired - Fee Related
- 2005-12-28 JP JP2005379671A patent/JP4395475B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1724596A1 (en) | 2006-11-22 |
CN1866036A (zh) | 2006-11-22 |
US7161357B2 (en) | 2007-01-09 |
JP2006322915A (ja) | 2006-11-30 |
EP1724596B1 (en) | 2011-02-23 |
US20060261821A1 (en) | 2006-11-23 |
CN100460881C (zh) | 2009-02-11 |
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