JP4365391B2 - ディスプレイパネルの検査装置とこれを利用したディスプレイパネル検査方法 - Google Patents

ディスプレイパネルの検査装置とこれを利用したディスプレイパネル検査方法 Download PDF

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JP4365391B2
JP4365391B2 JP2006197347A JP2006197347A JP4365391B2 JP 4365391 B2 JP4365391 B2 JP 4365391B2 JP 2006197347 A JP2006197347 A JP 2006197347A JP 2006197347 A JP2006197347 A JP 2006197347A JP 4365391 B2 JP4365391 B2 JP 4365391B2
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Japan
Prior art keywords
display panel
inspection
work table
lighting signal
probe unit
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Expired - Fee Related
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JP2006197347A
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English (en)
Japanese (ja)
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JP2007041587A (ja
Inventor
允光 千
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パイコム・コーポレーション
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP2006197347A 2005-07-29 2006-07-19 ディスプレイパネルの検査装置とこれを利用したディスプレイパネル検査方法 Expired - Fee Related JP4365391B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050069571A KR100733276B1 (ko) 2005-07-29 2005-07-29 디스플레이 패널의 검사 장비와 이를 이용한 디스플레이패널 검사 방법

Publications (2)

Publication Number Publication Date
JP2007041587A JP2007041587A (ja) 2007-02-15
JP4365391B2 true JP4365391B2 (ja) 2009-11-18

Family

ID=37673881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006197347A Expired - Fee Related JP4365391B2 (ja) 2005-07-29 2006-07-19 ディスプレイパネルの検査装置とこれを利用したディスプレイパネル検査方法

Country Status (4)

Country Link
JP (1) JP4365391B2 (zh)
KR (1) KR100733276B1 (zh)
CN (1) CN100529713C (zh)
TW (1) TWI328121B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5156970B2 (ja) * 2008-11-10 2013-03-06 株式会社日本マイクロニクス 電気的検査のためのプローブユニット、電気的検査装置および点灯検査装置
CN102591044A (zh) * 2012-01-12 2012-07-18 北京凌云光视数字图像技术有限公司 Tft液晶屏的质量检测方法
CN106124538B (zh) * 2016-08-31 2019-02-12 天津三英精密仪器股份有限公司 一种双工位多任务x射线三维成像检测系统
CN106842641B (zh) * 2016-12-23 2019-11-01 武汉精立电子技术有限公司 显示模组的移动检测图像采集装置
CN108318753A (zh) * 2017-01-16 2018-07-24 研华股份有限公司 检测系统
CN108415095A (zh) * 2018-05-09 2018-08-17 清华大学 车辆检查系统
KR102068560B1 (ko) * 2019-11-20 2020-01-21 금교필 디스플레이 패널 검사장치용 백라이트 유닛
KR102658169B1 (ko) * 2022-03-10 2024-04-19 (주)베러셀 다중 패드 블럭으로 구성된 셀의 원판 점등 신호기

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3673022B2 (ja) * 1996-06-24 2005-07-20 株式会社日本マイクロニクス 液晶表示パネルの検査装置
JPH1010153A (ja) * 1996-06-26 1998-01-16 Nippon Maikuronikusu:Kk プローブユニットの保管庫およびそれを用いる検査システム
JP3999863B2 (ja) * 1997-12-22 2007-10-31 株式会社日本マイクロニクス 被測定基板の検査装置
KR100492638B1 (ko) * 1998-01-12 2005-09-02 이억기 점등검사를 위한 액정패널 장전방법 및 그 장전장치
US6353466B1 (en) * 1999-04-23 2002-03-05 De & T Co., Ltd. Apparatus for testing an LCD
JP3480925B2 (ja) * 2000-09-12 2003-12-22 株式会社双晶テック ディスプレイパネル又はプローブブロックの支持枠体
KR100358707B1 (ko) * 2001-02-05 2002-10-31 메카텍스 (주) 액정디스플레이패널 검사장치의 패널수직반송장치
KR100354105B1 (ko) * 2001-02-05 2002-09-28 메카텍스 (주) 액정디스플레이패널 검사장치의 현미경이송장치
JP2002357626A (ja) * 2001-05-31 2002-12-13 Matsushita Electric Ind Co Ltd 液晶表示素子の検査方法
JP2004170249A (ja) * 2002-11-20 2004-06-17 Gallant Precision Machining Co Ltd 循環式検査システム
TWI231964B (en) * 2003-03-10 2005-05-01 Phicom Corp LCD panel auto gripping apparatus and method for use in a panel carrier for an automatic probe unit
JP3745750B2 (ja) * 2003-06-27 2006-02-15 東芝テリー株式会社 表示パネルの検査装置および検査方法

Also Published As

Publication number Publication date
JP2007041587A (ja) 2007-02-15
KR20070014710A (ko) 2007-02-01
KR100733276B1 (ko) 2007-06-28
TW200706885A (en) 2007-02-16
TWI328121B (en) 2010-08-01
CN100529713C (zh) 2009-08-19
CN1904576A (zh) 2007-01-31

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