JP4360944B2 - 試験装置及び制御方法 - Google Patents

試験装置及び制御方法 Download PDF

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Publication number
JP4360944B2
JP4360944B2 JP2004064407A JP2004064407A JP4360944B2 JP 4360944 B2 JP4360944 B2 JP 4360944B2 JP 2004064407 A JP2004064407 A JP 2004064407A JP 2004064407 A JP2004064407 A JP 2004064407A JP 4360944 B2 JP4360944 B2 JP 4360944B2
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JP
Japan
Prior art keywords
signal sequence
output
expected value
shift register
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004064407A
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English (en)
Japanese (ja)
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JP2005249736A5 (enExample
JP2005249736A (ja
Inventor
優 碁石
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Advantest Corp
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Advantest Corp
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Priority to JP2004064407A priority Critical patent/JP4360944B2/ja
Priority to US11/136,335 priority patent/US7236903B2/en
Publication of JP2005249736A publication Critical patent/JP2005249736A/ja
Publication of JP2005249736A5 publication Critical patent/JP2005249736A5/ja
Application granted granted Critical
Publication of JP4360944B2 publication Critical patent/JP4360944B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2004064407A 2004-03-08 2004-03-08 試験装置及び制御方法 Expired - Fee Related JP4360944B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004064407A JP4360944B2 (ja) 2004-03-08 2004-03-08 試験装置及び制御方法
US11/136,335 US7236903B2 (en) 2004-03-08 2005-05-24 Test apparatus and control method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004064407A JP4360944B2 (ja) 2004-03-08 2004-03-08 試験装置及び制御方法

Publications (3)

Publication Number Publication Date
JP2005249736A JP2005249736A (ja) 2005-09-15
JP2005249736A5 JP2005249736A5 (enExample) 2008-12-18
JP4360944B2 true JP4360944B2 (ja) 2009-11-11

Family

ID=35030326

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004064407A Expired - Fee Related JP4360944B2 (ja) 2004-03-08 2004-03-08 試験装置及び制御方法

Country Status (2)

Country Link
US (1) US7236903B2 (enExample)
JP (1) JP4360944B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100517256C (zh) * 2005-10-24 2009-07-22 鸿富锦精密工业（深圳）有限公司 Ieee1394接口功能测试装置及方法
JP4746510B2 (ja) * 2006-02-21 2011-08-10 愛三工業株式会社 負荷駆動系の異常診断システムおよび燃料ポンプ制御システム
JP5113624B2 (ja) * 2007-05-24 2013-01-09 株式会社アドバンテスト 試験装置
JP5532134B2 (ja) 2010-07-29 2014-06-25 富士通株式会社 半導体集積回路装置、その制御方法及び情報処理装置
US20140355658A1 (en) * 2013-05-30 2014-12-04 Avago Technologies General Ip (Singapore) Pte. Ltd. Modal PAM2/PAM4 Divide By N (Div-N) Automatic Correlation Engine (ACE) For A Receiver
CN115437345A (zh) * 2022-08-15 2022-12-06 北京罗克维尔斯科技有限公司 一种测试车机端批量信号处理准确性的方法、装置及系统

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6453435B1 (en) * 1998-12-29 2002-09-17 Fujitsu Network Communications, Inc. Method and apparatus for automated testing of circuit boards
WO2001051940A1 (en) * 2000-01-14 2001-07-19 Parthus Technologies Plc An algorithmic test pattern generator, with built-in-self-test (bist) capabilities, for functional testing of a circuit

Also Published As

Publication number Publication date
US20050270038A1 (en) 2005-12-08
US7236903B2 (en) 2007-06-26
JP2005249736A (ja) 2005-09-15

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