JP4311952B2 - 3次元座標測定方法 - Google Patents

3次元座標測定方法 Download PDF

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Publication number
JP4311952B2
JP4311952B2 JP2003061070A JP2003061070A JP4311952B2 JP 4311952 B2 JP4311952 B2 JP 4311952B2 JP 2003061070 A JP2003061070 A JP 2003061070A JP 2003061070 A JP2003061070 A JP 2003061070A JP 4311952 B2 JP4311952 B2 JP 4311952B2
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Japan
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shape
test
measured
measurement
edge
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Expired - Fee Related
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JP2003061070A
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Japanese (ja)
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JP2004205478A (ja
JP2004205478A5 (de
Inventor
寿 大出
誠人 安垣
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Olympus Corp
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Olympus Corp
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Publication of JP2004205478A5 publication Critical patent/JP2004205478A5/ja
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  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2003061070A 2002-03-08 2003-03-07 3次元座標測定方法 Expired - Fee Related JP4311952B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003061070A JP4311952B2 (ja) 2002-03-08 2003-03-07 3次元座標測定方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002062993 2002-03-08
JP2002320810 2002-11-05
JP2003061070A JP4311952B2 (ja) 2002-03-08 2003-03-07 3次元座標測定方法

Publications (3)

Publication Number Publication Date
JP2004205478A JP2004205478A (ja) 2004-07-22
JP2004205478A5 JP2004205478A5 (de) 2006-04-13
JP4311952B2 true JP4311952B2 (ja) 2009-08-12

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JP2003061070A Expired - Fee Related JP4311952B2 (ja) 2002-03-08 2003-03-07 3次元座標測定方法

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JP (1) JP4311952B2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5236962B2 (ja) * 2008-02-18 2013-07-17 株式会社ミツトヨ 被測定物の表裏面測定方法
JP2010237054A (ja) * 2009-03-31 2010-10-21 Toyota Motor Corp 組み付け精度測定方法および測定装置
KR20140134703A (ko) * 2012-03-12 2014-11-24 아크테크 게엠베하 주조 몰드에서 몰드 부품을 위치시키고 고정시키기 위한 방법
CN103341929B (zh) * 2013-06-27 2015-07-22 信义汽车玻璃(深圳)有限公司 一体注塑产品模型制作方法
CN107430221B (zh) * 2015-03-11 2020-05-19 纳卢克斯株式会社 具备位置测定部的部件及测定方法
CN110567425B (zh) * 2019-07-26 2024-04-19 赛诺威盛科技(北京)股份有限公司 用于精密对准装调探测器模块与后准直器的装置及方法

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