JP4199352B2 - 高電圧インターフェースに用いられるカスコード回路用のテスト容易化回路 - Google Patents

高電圧インターフェースに用いられるカスコード回路用のテスト容易化回路 Download PDF

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JP4199352B2
JP4199352B2 JP36566298A JP36566298A JP4199352B2 JP 4199352 B2 JP4199352 B2 JP 4199352B2 JP 36566298 A JP36566298 A JP 36566298A JP 36566298 A JP36566298 A JP 36566298A JP 4199352 B2 JP4199352 B2 JP 4199352B2
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transistor
cascode
test
voltage
bias
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Expired - Fee Related
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JP36566298A
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Japanese (ja)
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JPH11281715A5 (enExample
JPH11281715A (ja
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エイチ．アンドレセン ブレンハード
ジー．ウォル フレデリック
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テキサス インスツルメンツ インコーポレイテツド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
JP36566298A 1997-12-23 1998-12-22 高電圧インターフェースに用いられるカスコード回路用のテスト容易化回路 Expired - Fee Related JP4199352B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US6858297P 1997-12-23 1997-12-23
US068582 1997-12-23

Publications (3)

Publication Number Publication Date
JPH11281715A JPH11281715A (ja) 1999-10-15
JPH11281715A5 JPH11281715A5 (enExample) 2006-02-16
JP4199352B2 true JP4199352B2 (ja) 2008-12-17

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JP36566298A Expired - Fee Related JP4199352B2 (ja) 1997-12-23 1998-12-22 高電圧インターフェースに用いられるカスコード回路用のテスト容易化回路

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US (1) US6211693B1 (enExample)
JP (1) JP4199352B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6487687B1 (en) * 1997-01-02 2002-11-26 Texas Instruments Incorporated Voltage level shifter with testable cascode devices
WO2003083496A1 (en) 2002-04-02 2003-10-09 Philips Intellectual Property & Standards Gmbh Testable cascode circuit and method for testing the same
US7499354B2 (en) * 2005-11-08 2009-03-03 Texas Instruments Incorporated Method for testing transistors having an active region that is common with other transistors and a testing circuit for accomplishing the same
US7843157B2 (en) * 2006-06-30 2010-11-30 Regal Beloit Company Methods and apparatus for providing motor control signals
TW200937841A (en) * 2008-02-29 2009-09-01 Holtek Semiconductor Inc Voltage-to-current converter circuit
CN108469566B (zh) * 2018-03-31 2021-02-09 山东交通职业学院 一种电动汽车高压互锁回路及断路检测方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4680486A (en) * 1984-03-12 1987-07-14 Amdahl Corporation Combinational logic circuits implemented with inverter function logic
US5821799A (en) * 1996-10-25 1998-10-13 Cypress Semiconductor Corporation Low voltage level shifting circuit and low voltage sense amplifier
US5995010A (en) * 1997-01-02 1999-11-30 Texas Instruments Incorporated Output buffer providing testability
US6005415A (en) * 1997-07-18 1999-12-21 International Business Machines Corporation Switching circuit for large voltages

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Publication number Publication date
JPH11281715A (ja) 1999-10-15
US6211693B1 (en) 2001-04-03

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