JP4106193B2 - Liquid crystal display device and manufacturing method thereof - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a liquid crystal display device, and more particularly, to a liquid crystal display device and a method of manufacturing the same that facilitate functional inspection of thin film transistors and disconnection inspection of scanning line lead lines and signal line lead lines in thin film transistor type liquid crystal display devices.
[0002]
[Prior art]
Liquid crystal display devices are widely used as display devices capable of high-definition and color display for notebook computers and display monitors.
[0003]
For liquid crystal display devices, a simple matrix type using a liquid crystal panel in which a liquid crystal layer is sandwiched between a pair of substrates with parallel electrodes formed so as to intersect each other on the inner surface, and one of the pair of substrates is selected in units of pixels. There is known an active matrix liquid crystal display device using a liquid crystal display element (hereinafter also referred to as a liquid crystal panel) having a switching element.
[0004]
An active matrix type liquid crystal display device is a so-called vertical electric field type liquid crystal display device using a liquid crystal panel in which pixel selection electrode groups are formed on a pair of upper and lower substrates, as represented by a twisted nematic (TN) method. (Generally referred to as a TN type active matrix liquid crystal display device) and a so-called horizontal electric field type liquid crystal display device using a liquid crystal panel in which an electrode group for pixel selection is formed only on one of a pair of upper and lower substrates (generally, Called IPS liquid crystal display device).
[0005]
The liquid crystal panel constituting the former TN type active matrix type liquid crystal display device has a liquid crystal twisted by 90 ° in a pair of substrates (two substrates comprising a first substrate (lower substrate) and a second substrate (upper substrate)). Two polarizing plates are laminated on the outer surfaces of the upper and lower substrates of the liquid crystal panel, the absorption axis direction being arranged in a crossed Nicol manner, and the incident-side absorption axis being parallel or orthogonal to the rubbing direction.
[0006]
In such a TN type active matrix liquid crystal display device, when no voltage is applied, incident light becomes linearly polarized light by the incident side polarizing plate, and this linearly polarized light propagates along the twist of the liquid crystal layer and is transmitted through the outgoing side polarizing plate. When the axis coincides with the azimuth angle of the linearly polarized light, all the linearly polarized light is emitted and white display is performed (so-called normally open mode).
[0007]
When a voltage is applied, the direction of the unit vector (director) indicating the average orientation direction of the liquid crystal molecular axes constituting the liquid crystal layer is directed to the direction perpendicular to the substrate surface, and the azimuth angle of the incident side linearly polarized light is changed. Since it coincides with the absorption axis of the exit-side polarizing plate, black is displayed. (See “Basics and Applications of Liquid Crystals” published by the Industrial Research Council in 1991).
[0008]
On the other hand, a pixel selection electrode group or an electrode wiring group is formed only on one of a pair of substrates, and a liquid crystal layer is formed by applying a voltage between adjacent electrodes (between the pixel electrode and the counter electrode) on the substrate. In an IPS liquid crystal display device that switches in a direction parallel to the surface, a polarizing plate is arranged so as to display black when no voltage is applied (so-called normally closed mode).
[0009]
The liquid crystal layer of the IPS liquid crystal display device is homogeneously aligned in parallel with the substrate surface in the initial state, and the director of the liquid crystal layer on the plane parallel to the substrate is parallel or somewhat angled with the electrode wiring direction when no voltage is applied. When the voltage is applied, the direction of the director of the liquid crystal layer shifts to a direction perpendicular to the electrode wiring direction as the voltage is applied, and the direction of the director of the liquid crystal layer is 45 compared to the direction of the director when no voltage is applied. When tilted in the direction of electrode wiring, the liquid crystal layer when the voltage is applied rotates the polarization azimuth by 90 ° like a half-wave plate, and the transmission axis of the exit side deflection plate and the polarization azimuth are Match and white display.
[0010]
This IPS liquid crystal display device has a feature that a change in hue and contrast is small even at a viewing angle, and a wide viewing angle can be achieved (see Japanese Patent Application Laid-Open No. 5-505247).
[0011]
The color filter method is the mainstream for full colorization of the various liquid crystal display devices described above. In this case, a pixel corresponding to one dot of color display is divided into three, and color filters corresponding to three primary colors, for example, red (R), green (G), and blue (B) are arranged in each unit pixel. It is realized by doing.
[0012]
The present invention can be applied to the various liquid crystal display devices described above, and the outline thereof will be described below by taking a TN active matrix liquid crystal display device as an example.
[0013]
As described above, in a liquid crystal display element (liquid crystal panel) constituting a TN type active matrix liquid crystal display device (hereinafter simply referred to as an active matrix liquid crystal display device for the sake of simplicity), the liquid crystal display elements are arranged opposite to each other via a liquid crystal layer. A group of scanning signal lines (hereinafter referred to as gate lines) that extend in the x direction and are juxtaposed in the y direction on the liquid crystal layer side surface of one of the two transparent insulating substrates made of glass or the like. And a group of drain lines (hereinafter referred to as video signal lines) that are insulated from the gate line group, extend in the y direction, and are juxtaposed in the x direction.
[0014]
Each region surrounded by the gate line group and the drain line group is a pixel region, and a thin film transistor (TFT) and a transparent pixel electrode, for example, are formed as active elements (switching elements) in the pixel area.
[0015]
When the scanning signal is supplied to the gate line, the thin film transistor is turned on, and the video signal from the drain line is supplied to the pixel electrode through the turned on thin film transistor.
[0016]
It should be noted that each drain line of the drain line group, as well as each gate line of the gate line group, extends to the periphery of the substrate to constitute an external terminal, and is connected to the external terminal to be connected to the video drive circuit. A gate scanning driving circuit, that is, a plurality of driving IC chips (semiconductor integrated circuit, hereinafter, also simply referred to as driving IC or IC) constituting the gate scanning driving circuit is externally attached to the periphery of the substrate. That is, a plurality of tape carrier packages (TCP) mounted with these drive ICs are externally attached to the periphery of the substrate.
[0017]
However, since such a substrate has a configuration in which a TCP having a driving IC mounted on the periphery thereof is externally attached, a display region constituted by an intersection region between a gate line group and a drain line group of the substrate is used. The area between the outline and the outer frame of the substrate (usually called a frame) occupies a large area, and the liquid crystal display module integrated with the liquid crystal display element, the illumination light source (backlight) and other optical elements Contrary to the desire to reduce external dimensions.
[0018]
Therefore, in order to solve such problems as much as possible, that is, due to the demand for high-density mounting of liquid crystal display elements and downsizing of the liquid crystal display module, driving for video driving without using TCP components. A so-called flip chip system or chip on glass (COG) system in which an IC or a driving IC for scanning driving is directly mounted on one substrate (lower substrate) has been proposed. The drive IC employs a so-called FCA method in which an electrode formed on the back surface of the drive IC chip is directly connected to a wiring formed on the substrate.
[0019]
FIG. 10 is a perspective view for explaining a main part of an FCA mounting type liquid crystal display device. In this liquid crystal display device, a liquid crystal layer is sandwiched between one substrate SUB1 in which thin film transistors are formed in a matrix and the other substrate SUB2 in which a color filter is formed.
[0020]
A scanning line driving IC (hereinafter referred to as a gate driver) GDR is mounted on one side of the periphery of one substrate SUB1 by the FCA method. On the other side, a signal line driver circuit IC (drain driver) DDR is similarly mounted by the FCA method.
[0021]
The output of the gate driver GDR is connected to the scanning line lead line GTM, and the input is connected to the wiring of the flexible printed circuit board FPC1. The output of the drain driver DDR is connected to the signal line lead line DTM, and the input is connected to the wiring of the flexible printed circuit board FPC2.
[0022]
As shown by the arrows in the drawing, the flexible printed circuit boards FPC1 and FPC2 are bent on the back surface of the one substrate SUB1 in the BENT1 direction, and then the bent portion JT2 of the flexible printed circuit board FPC2 is folded along the folding line BTL. After folding in the BENT1 direction, it is folded in the BENT3 direction and folded on the back surface of the flexible printed circuit board FPC1.
[0023]
In this state, the connector CT4 of the flexible printed circuit board FPC2 is connected to a connector (not shown) provided on the flexible printed circuit board FPC1. An adhesive tape BAT is interposed on the inner surface of the bent portion of the flexible printed circuit board FPC2, and is fixed to the flexible printed circuit board FPC2.
[0024]
Note that CHG and CHD are electronic components such as capacitors, ALMG and ALMD are alignment marks, POL2 is a polarizing plate, and AR is a display area.
[0025]
In the liquid crystal display device having such a configuration, the probe of the inspection device is applied to the lead line of the gate line and the drain line of the drain line extending from the thin film transistor formed on one substrate SUB1, and the characteristics of the thin film transistor, disconnection of each wiring, etc. And a lighting inspection after being bonded to the other substrate.
[0026]
11A and 11B are explanatory views of the arrangement of inspection terminals in a conventional liquid crystal display device, where FIG. 11A is a schematic diagram showing wiring on the gate driver side, and FIG.
[0027]
In (a), GTM is a gate line lead line, TPC is a test terminal, GDR is a gate driver mounting portion (indicated by a dotted line), LCT is a laser cutting line, ASCL is a static suppression common line on the gate line side, and GTM is a gate driver. The input terminal of GDR is shown.
[0028]
In the manufacturing process of one substrate SUB1 (thin film transistor substrate), the gate line lead line GTM is short-circuited by the static electricity suppression common line ASCL to prevent damage to the thin film transistor and the wiring due to the entry of static electricity. Thereafter, the gate line lead line GTM is individually cut by the laser cutting line LCT, a disconnection inspection is performed by applying a probe to the inspection terminal TPC, and a lighting inspection is performed by applying a signal.
[0029]
In (b), DTM is a drain line lead line, TPC is a test terminal, DDR is a drain driver mounting portion (indicated by a dotted line), LCT is a laser cutting line, ASCL is a common line for suppressing static electricity on the drain line side, and TTB is a gate driver. The input terminal of GDR is shown.
[0030]
Similarly, on the drain driver side, in the manufacturing process of the substrate, the drain line lead line DTM is short-circuited by the static electricity suppression common line ASCL to prevent damage to the thin film transistor and the wiring due to the entry of static electricity. Thereafter, the drain line lead line DTM is individually cut by the laser cutting line LCT, a probe is applied to the inspection terminals TPC collectively to perform a disconnection inspection, and a signal is applied to perform a lighting inspection.
[0031]
As for the flip-chip type liquid crystal display device, there is Japanese Patent Application No. 6-256426 for the same applicant.
[0032]
[Problems to be solved by the invention]
With the above-described conventional arrangement of inspection terminals, the number of gate drivers and drain drivers, particularly drain drivers, increases as the display becomes higher in definition, and the pitch of output terminals (GTM and DTM pitches in FIG. 11) becomes smaller. ing.
[0033]
As a result, the width and length of the inspection terminal (TPC in FIG. 11) cannot be sufficiently obtained, making it difficult to contact the probes in a lump as in the prior art. There has been a problem that the inspection accuracy is lowered due to the displacement of the probe when the disconnection inspection and the lighting inspection are performed by applying the inspection voltage to the terminals. In addition, it is difficult to manufacture a probe to be applied to such a narrow pitch output terminal.
[0034]
The object of the present invention is to solve the above-mentioned problems of the prior art, enable various inspections with all-terminal probe collective contact, and standardize the pattern of inspection terminals to provide an inspection apparatus having probes common to many types. An object of the present invention is to provide a liquid crystal display device having a lead-out wiring structure that can be used.
[0035]
It is another object of the present invention to provide a liquid crystal display device that facilitates the manufacture of the probe and realizes cost reduction, and a method for manufacturing the same.
[0036]
It is a further object of the present invention to provide a liquid crystal display device and a method for manufacturing the liquid crystal display device and a method for manufacturing the liquid crystal display device, which can suppress a decrease in detection capability related to display defects during inspection.
[0037]
[Means for Solving the Problems]
In order to achieve the above object, as a representative means of the present invention, the output terminal (leader) of the drain driver is set to three colors of red, green, and blue, the red positive electrode, the red negative electrode, the green positive electrode, and the green. The negative electrode, the blue positive electrode, and the blue negative electrode are divided into 6 systems, and each is connected to the drain line common line, and the drain line common line is drawn to the outside of the drain driver mounting region, and provided on the drain line common line. Inspection was performed by applying a probe to the inspection terminal.
[0038]
On the gate driver side, as representative means, the gate driver output terminal (leader line) is divided into three systems of the previous stage, the next stage, and the subsequent stage, or 4 systems so that the polarity is reversed for each dot, Are connected to the gate line common line, the gate line common line is drawn outside the gate driver mounting area, and a probe is applied to the inspection terminal provided on the gate line common line for inspection.
[0039]
A typical configuration of the present invention will be described as follows. (1) Thin film transistors arranged in a matrix, pixel electrodes driven by the thin film transistors, one substrate having scanning lines and signal lines for supplying voltage signals for pixel formation to the thin film transistors, red, green, blue 3 A liquid crystal layer is sandwiched in the bonding gap of the other substrate provided with the color filter of the color, a scanning line lead terminal on one periphery of the one substrate, a signal line lead terminal on the other periphery,
An output terminal is connected to each of the scanning line lead terminal and the signal line lead terminal of the liquid crystal panel, and a scanning line driving IC mounting region and a signal for directly mounting the scanning line driving IC and the signal line driving IC on the one substrate It has a line drive IC mounting area,
A liquid crystal display device having a static electricity suppression common line for connecting the scanning line lead terminal and the signal line lead terminal in common in a cut-off region,
In the signal line driver IC mounting region of the signal line lead terminal connected to the static electricity suppression common line, the signal line lead terminal is a red positive electrode, a red negative electrode, a green positive electrode, a green negative electrode, a blue positive electrode, a blue 6 signal line side common lines connected together in 6 systems of negative electrodes,
An inspection pad connected to the six signal line side common lines is provided on the one substrate outside the signal line driver IC mounting region.
[0040]
With this configuration, it is possible to increase the width, length, and pitch of the inspection pad connected to the signal line lead line, so that the probe can be easily manufactured and the contact accuracy is increased.
(2) The six signal line side common line inspection pads are arranged in the cut and removed region of the one substrate.
[0041]
It is possible to standardize the pattern of the inspection pad, and it is possible to inspect various types of liquid crystal display devices with an inspection device having a common probe.
(3) Thin film transistors arranged in a matrix, pixel electrodes driven by the thin film transistors, one substrate having scanning lines and signal lines for supplying voltage signals for pixel formation to the thin film transistors, and three colors of red, green, and blue A liquid crystal layer is sandwiched between the bonding gaps of the other substrate provided with the color filter, a scanning line lead terminal on one periphery of the one substrate, a signal line lead terminal on the other periphery,
An output terminal is connected to each of the scanning line lead terminal and the signal line lead terminal of the liquid crystal panel, and a scanning line driving IC mounting region and a signal for directly mounting the scanning line driving IC and the signal line driving IC on the one substrate It has a line drive IC mounting area,
A liquid crystal display device having a static electricity suppression common line for commonly connecting the scanning line lead terminal and the signal line lead terminal in a substrate cutting and removing region,
In the scanning line drive IC mounting region of the scanning line lead terminal connected to the static electricity suppression common line, the scanning signal line lead terminal has three systems of the previous stage, the next stage, and the subsequent stage, or the polarity is reversed for each dot. In order to do so, it has three scanning line side common lines connected together in four systems,
In the signal line driver IC mounting region of the signal line lead terminal connected to the static electricity suppression common line, the signal line lead terminal is a red positive electrode, a red negative electrode, a green positive electrode, a green negative electrode, a blue positive electrode, a blue 6 signal line side common lines connected together in 6 systems of negative electrodes,
One of the scanning line driving IC mounting region and the one outside the signal line driving IC mounting region is also provided on the substrate with a test pad on each of the three scanning line side common lines and the six signal line side common lines. Equipped.
[0042]
With this configuration, it is possible to increase the width, length, and pitch of the inspection pad connected to the signal line lead line and the scanning line lead line, so that the probe can be easily manufactured and the contact accuracy is increased.
(4) The inspection pads of the three or four scanning line side common lines and the six signal line side common lines are arranged in the cut and removed region of the one substrate.
(5) The inspection pads of the three or four scanning line side common lines and the six signal line side common lines are arranged at equal intervals in the cut and removed region of the one substrate.
[0043]
It is possible to standardize the pattern of the inspection pad including the scanning lead line, and it is possible to inspect various types of liquid crystal display devices with an inspection device having a common probe.
(6) The other substrate has a counter electrode, and the inspection pads of the three or four scanning line side common lines and the six signal line side common lines are arranged in the cut-off region of the one substrate. A test pad connected to the lead line of the counter electrode is disposed together with the test pads of the three or four scanning line side common lines and the six signal line side common lines.
[0044]
Standardization of inspection pad patterns including scanning lead lines can be further promoted, and inspection of various types of liquid crystal display devices can be performed by an inspection device having a common probe.
(7) The one substrate has a counter electrode, and the inspection pads of the three or four scanning line side common lines and the six signal line side common lines are arranged in the cut-off region of the one substrate. A test pad connected to the lead line of the counter electrode is disposed together with the test pads of the three or four scanning line side common lines and the six signal line side common lines.
[0045]
The lead line of the counter electrode necessary for lighting inspection can also be arranged in a standard pattern together with the inspection pad of the scanning line side common line and the signal line side common line, so that the standardization of the inspection pad pattern can be further promoted and easier It is possible to inspect various types of liquid crystal display devices with an inspection device having a common probe.
[0046]
The present application is characterized in that the signal side common line is separated at least for each color of the color filter as described above. The present application does not exclude a configuration in which only the same signal is always input to the video signal line related to each color and the inspection is performed.
[0047]
However, by separating the signal-side common line at least for each color of the color filter as described above, the probe cost can be reduced by reducing the number of test pads, and colors can be displayed while enabling inspection with high-definition products. All inspections can be realized. If the color filter is red, green and blue, the white display when each color is turned on is of course, individual inspection of red, green and blue by lighting for each color, and further controlling the gradation of each color and turning on This makes it possible to inspect almost all colors displayed on the product.
[0048]
This means that the color purity of each color can be inspected, which is a great advantage of the configuration of the present invention. Furthermore, an effect that cannot be realized only by simultaneous lighting of all colors, that is, inspection accuracy of display unevenness is greatly improved is realized. The color filter is formed by individually applying, exposing and developing each color, or impregnating each color. Therefore, for each color, in-plane uniformity of the color density or in-plane distribution of the film thickness occurs.
[0049]
These effects are usually difficult to see when each color is turned on simultaneously. For example, if only the red film thickness changes locally, the effect of the local change in the red film thickness on the brightness when all three colors red, green, and blue are turned on is about the same as when displaying a single red color. 1/3. Therefore, if all the colors are turned on simultaneously, the inspection sensitivity regarding luminance unevenness, particularly color unevenness, is lowered, and a defective product may be leaked to the market.
[0050]
In the present invention, by separating the signal-side common line at least for each color of the color filter as described above, it is possible to perform individual lighting inspection of each color, and to reduce the probe cost while maintaining the inspection accuracy regarding luminance unevenness and color unevenness. Therefore, it is possible to reduce the inspection cost and realize the lighting inspection of the high-definition product.
[0051]
This inspection method is particularly advantageous in FCA, but the same effect can be realized in the TCP method by separating the signal side common line at least for each color of the color filter as described above.
[0052]
Further, the present application is characterized in that the signal side common line is separated for at least each color of the color filter and for the positive electrode and the negative electrode.
[0053]
Thus, for example, if the color filter has three colors, there are six signal side common lines. There are many known methods for driving a liquid crystal display device: common inversion driving and dot inversion driving. In the common inversion driving, the pixels adjacent in the normal scanning signal line extending direction have the same polarity with respect to the reference signal potential. Therefore, at least three signal side common lines are sufficient as described above.
[0054]
However, in the dot inversion driving, the pixels adjacent in the scanning signal line extending direction are normally driven with a reverse polarity with respect to the reference signal potential.
[0055]
For this reason, when there are three signal-side common lines due to dot inversion, for example, when considering six RGB RGB pixels adjacent in the scanning line extending direction, the polarity is, for example, +-++++, and between B and R Polarity inversion cannot be realized. Even in this case, the detection sensitivity of the luminance unevenness and the color unevenness can be substantially maintained.
[0056]
However, it is difficult to accurately inspect flicker to be examined by lighting inspection, that is, flickering of the screen. Normally, this flicker is a problem only with special patterns or special timing, and it has less influence during actual use than the above-mentioned color unevenness and brightness unevenness, but it is a defective product at a level exceeding the standard with customers. That is no different.
[0057]
Therefore, in this application, the signal side common lines are separated for each color of the color filter, and for the positive electrode and the negative electrode. For example, if the color filter has three colors, six signal side common lines are used, so that six RGBRGB lines can be obtained. For example, the polarity of a pixel can be reversed between +-++-+-and the pixel.
[0058]
In particular, the flicker inspection accuracy is affected by a minute voltage difference between pixels, so that it is necessary to suppress a delay in the signal waveform during the inspection. Therefore, when the number of inspection pads for inputting inspection signals to the signal line side common line is n in the chip mounting area or the aggregate area of the signal wirings, (n−1) / It is desirable to provide two or more. In order to suppress an increase in probe cost, it is desirable that the number is 2 × (n + 1) or less.
[0059]
Further, it is desirable that the number of inspection signal terminals for inputting inspection signals to the scanning signal lines is larger than the number of inspection signal terminals for inputting inspection signals to the video signal lines.
[0060]
This is necessary for the inspection with the above configuration that the input frequency of the inspection signal that needs to be applied to the video signal line at the time of inspection is equal to or higher than the input frequency of the inspection signal that needs to be applied to the scanning signal line. Therefore, this is due to a request to reduce the input resistance on the video signal line side.
[0061]
Also, the test signal input resistance is reduced by either the signal line side common line, or the signal line side and the test pad, or the scan line side common line, or the scan line side common line and the test pad. By providing a region formed of the wiring layer with the lowest resistance in the liquid crystal display device, the effect of reducing the resistance can be achieved.
[0062]
Further, in the present application, the number of scanning line side common lines is two or more. Even a single line can be lit simultaneously.
[0063]
However, difficulties arise particularly with respect to the flicker lighting inspection described above. That is, in either the common inversion driving or the dot inversion driving, in the actual use state, the two pixels adjacent in the video signal line extending direction are driven so that the polarities are reversed. This is to suppress flicker.
[0064]
Therefore, in order to inspect flicker, it is necessary to drive so that the polarities of two pixels adjacent to each other in the video signal line extending direction are reversed at the time of inspection. When one scanning side common line is used, the polarities of the two pixels are inevitably the same. Therefore, there is a problem that flicker inspection cannot be performed in a state equivalent to actual use.
[0065]
Therefore, by using at least two so as to shift the writing timing of the adjacent two pixels, it is possible to drive the two pixels adjacent in the video signal line extending direction so that the polarities of the two pixels are reversed with each other. It becomes possible.
[0066]
Further, with respect to flicker, there is an influence of a jump voltage at the time of writing to the TFT. In order to bring this closer to the actual use state, in particular, in the so-called Cadd type liquid crystal display device in which a capacitor for holding charges written in the pixel electrode is formed between the pixel electrode and the scanning signal line in the subsequent stage, the scanning line side It is desirable that there are three or more common lines.
[0067]
In this method, the Cadd of the previous stage pixel is formed on the scanning signal line of the own stage, and the Cadd of the own stage pixel is formed on the scanning signal line of the subsequent stage. By scanning in the same order, writing to the pixels in accordance with actual use is realized.
[0068]
In addition, in a method that does not constitute Cadd, for example, Cstg method, even if two scanning line side common lines are used, writing according to actual use is possible. However, regarding the influence of potential due to capacitive coupling between pixels, scanning is similarly performed. The effect of making it closer to the actual use state is shown by using three or more line side common lines.
[0069]
However, in the case of three pixels, the polarity of each pixel with respect to the reference signal potential is, for example, +-++-+ in the six pixels ABCDEF in the video signal line extending direction, and for example, the pixels C and D have the same polarity. There is a problem. In order to avoid this, it is desirable that the scanning line side common line is an even number, and considering the problems in the Cadd system, the minimum number is 4 in the Cadd system and 2 or 4 in the Cstg system. It is most effective to do.
[0070]
The present invention is not limited to the above-described configuration or the configurations of the embodiments described below and the ideas disclosed therein, and it goes without saying that various modifications can be made without departing from the technical idea of the present invention. Yes.
[0071]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below in detail with reference to the drawings of the embodiments. In the following embodiments, a so-called TN type liquid crystal display device will be described. However, a portion to which the present invention is applied also to an IPS (lateral electric field) method, except that the counter electrode lead line is drawn on the thin film transistor substrate side. The basic configuration is the same.
In the following description, the signal line is also called a drain line, and the scanning line is also called a gate line.
[0072]
FIG. 1 is a plan view for explaining one embodiment of a liquid crystal display device according to the present invention. In this liquid crystal display device, one substrate SUB1 and the other substrate SUB2 are bonded together via a liquid crystal layer, and thin film transistors (not shown) are formed in a matrix on the inner surface of one substrate SUB1. On the inner surface of the other substrate SUB2, color filters of three colors of red, green and blue and a counter electrode are formed. A counter voltage is supplied to the counter electrode through a wiring (not shown) formed on the inner surface of one substrate SUB1.
[0073]
One substrate SUB1 protrudes from the periphery of the other substrate SUB2 on the left side and the lower side in the figure, and 11 scanning drive ICs (gate drivers) GDR are present on the left side periphery and 11 on the lower side periphery. The signal driver IC (drain driver) DDR is mounted by the FCA method (in the figure, it is indicated by its mounting position).
[0074]
One substrate SUB1 has a test pad formation region TTP. The portion where the test pad formation region TTP is disposed is a portion that is cut and removed along the cutting line CTL after the liquid crystal display device is completed.
[0075]
FIG. 2 is an enlarged view of a main part for explaining the inspection pad formation region TTP of FIG. 1 in detail. The inspection pad forming region TTP is formed in a cut and removed region that is cut by a cutting line CTL in the final product of one substrate SUB1. In the test pad formation region TTP, the test pad GLTP on the gate driver side, the test pad DLTP on the drain driver side, and the test pad Vcom of the lead line of the counter electrode are arranged in a line at equal intervals.
[0076]
The test pads GLTP on the gate driver side are grouped into 3 or 4 systems, the test pads DLTP on the drain driver side are grouped into 6 systems, and a total of 10 to 11 test pads together with the test pads Vcom for the lead lines of the counter electrode It is configured.
[0077]
Therefore, in this embodiment, all inspections can be performed at once using 10 to 11 probes at equal intervals.
[0078]
The gate driver side test pad GLTP and the drain driver side test pad DLTP can also be arranged separately from each other, and these test pads and the test pads for the lead lines of the counter electrodes provided at appropriate positions. It is also possible to configure the gate driver side inspection and the drain driver side inspection separately with Vcom.
[0079]
As described above, in the above embodiment, the width, length, and pitch of the test pad connected to the signal line lead line can be increased, so that the contact accuracy is improved and the probe is easily manufactured. In addition, by standardizing the probe, it is possible to manufacture an inspection apparatus that can handle a wide variety of products.
[0080]
3A and 3B are schematic views for explaining the main part wiring of one embodiment of the liquid crystal display device according to the present invention. FIG. 3A shows a gate line side wiring, and FIG. 3B shows a drain line side wiring. In the figure, GDR is a gate driver mounting position, GTM is an output terminal (gate line lead-out terminal) of the gate driver, TTA is an input terminal of the gate driver, ASCL is an electrostatic suppression common line, and C1, C2, and C3 are a plurality of gate drivers. Three scanning line side common lines that are connected in common to three systems of the previous stage, the next stage, and the subsequent stage of the gate line lead line, or four systems in order to change the polarity for each dot, GLTP (GA, GB, GC) is a test pad formed on each scanning line side common line C1, C2, C3, PB is a probe, and LCT1 and LCT2 are laser cutting lines. The inspection pads GLTP (GA, GB, GC) formed on the scanning line side common lines C1, C2, C3 are arranged at the positions shown in FIG.
[0081]
In this wiring configuration, in (a) on the gate driver side, after the fabrication of one substrate SUB1 is finished, the scanning line side common lines C1, C2, C3 are separated from the static electricity suppression common line ASCL by the laser cutting line LCT1. By separating the scanning line side common lines C1, C2, and C3 from the static electricity suppression common line ASCL, each scanning line side common line C1, C2, and C3 becomes independent three or four systems of inspection wiring.
[0082]
In this state, the disconnection inspection and the lighting inspection are executed by applying the probe PB to the inspection pads GLTP (GA, GB, GC) formed on the scanning line side common lines C1, C2, C3.
[0083]
After completion of the inspection, the scanning line side common lines C1, C2, and C3 are separated from the gate driver output terminal GTM by the laser cutting line LCT2, and the gate driver is FCA-mounted between the output terminal GTM and the gate driver input terminal TTA. .
[0084]
Similarly, in (b) on the drain driver side, after the production of one substrate SUB1 is finished, the signal line side common lines C4, C5, C6, C7, C8, and C9 are connected to the static electricity suppression common line ASCL by the laser cutting line LCT1. Disconnect from. By separating the signal line side common lines C4, C5, C6, C7, C8, and C9 from the static electricity suppression common line ASCL, each signal line side common line C4, C5, C6, C7, C8, and C9 has six independent systems. Inspection wiring.
[0085]
In this state, the probe PB is applied to the inspection pad DLTP (B1, B2, G1, G2, R1, R2) formed on each of the scanning line side common lines C4, C5, C6, C7, C8, and C9 to check for disconnection or lighting. Execute.
[0086]
After completion of the inspection, the scanning line side common lines C4, C5, C6, C7, C8, and C9 are separated from the output terminal DTM of the drain driver by the laser cutting line LCT2, and between the output terminal DTM and the input terminal TTB of the drain driver. Install the drain driver in FCA.
[0087]
In the lighting test, a probe is applied to the lead pad test pad Vcom shown in FIG. 2, and a predetermined voltage is applied to align the liquid crystal between the pixel electrode connected to the output electrode of the thin film transistor. An electric field to be controlled is generated to check whether or not the pixel is lit.
[0088]
Further, the laser cutting lines LCT1 and LCT2 may be etching cutting lines that are separated by an etching process. Other known cutting methods may be used.
[0089]
FIG. 4 shows a test applied to the drain test pad DLTP (B1, B2, G1, G2, R1, R2) and the gate test pad GLTP (GA, GB, GC) in the lighting test of one embodiment of the liquid crystal display device according to the present invention. It is a wave form diagram explaining an example of a signal. This inspection signal is a so-called dot inversion driving method, and the illustrated voltage value pulse width, pulse interval, and the like are examples.
[0090]
By applying the inspection signal shown in FIG. 4 to each inspection pad, a lighting inspection for each system can be executed by lighting a predetermined display pattern.
[0091]
According to this embodiment, a wiring lead-out wiring structure that enables various inspections with all terminal probe collective contacts and enables use of inspection devices having probes common to a wide variety of products by standardizing the pattern of inspection terminals. A liquid crystal display device can be provided.
[0092]
5A and 5B are schematic views for explaining the main part wiring of another embodiment of the liquid crystal display device according to the present invention. FIG. 5A shows the gate line side wiring and FIG. 5B shows the drain line side wiring. In the figure, the same reference numerals as those in FIG. 3 correspond to the same functional parts.
[0093]
In this embodiment, the gate scanning line side common lines C1, C2, and C3 are connected to the static electricity suppression common line ASCL outside the cutting line CTL, not the input terminal TTA of the gate driver.
[0094]
Similarly, the drain line side common lines C4, C5, C6, C7, C8, and C9 are connected to the static electricity suppression common line ASCL outside the cutting line CTL, not the input terminal TTB of the drain driver.
[0095]
With this configuration, when the static electricity suppression common line ASCL is cut and removed after the substrate SUB1 is manufactured, the gate scanning line side common lines C1, C2, C3 and the drain line side common lines C4, C5, C6, C7, Each system of C8 and C9 can be made independent, and the laser cutting (or etching cutting) process can be reduced by one process.
[0096]
This embodiment also has a wiring lead-out wiring structure that enables various inspections with all-terminal probe collective contacts, and standardizes the inspection terminal patterns to enable use of inspection apparatuses having probes common to a wide variety of products. A liquid crystal display device can be provided.
[0097]
As another embodiment of the present invention, drain line side common lines C4, C5, C6, C7, C8, and C9 in FIG. 3B are separated between blocks, and test pads are provided between the blocks. Thereby, the kind of display pattern used by a test | inspection can be increased.
[0098]
In each of the above-described embodiments, the common lines C1, C2, and C3 are grouped into three or four systems on the gate side, but the gate side terminal can have a relatively large terminal width and pitch compared to the drain side terminal. As still another embodiment of the present invention, the gate line side can be inspected by applying probes to all terminals at once as in the conventional case. The configuration is as shown in FIG.
[0099]
As still another embodiment of the present invention, the gate scanning line side common lines C1, C2, C3 and the drain line side common lines C4, C5, C6, C7, C8, C9 shown in FIG. A transistor or a diode is arranged between the output terminal (gate line lead-out terminal) GTM of the gate driver and the output terminal (drain line lead-out terminal) DTM of the drain driver, and each wiring is separated from the inspection signal. .
[0100]
Also according to each of the above-described embodiments, all-terminal probe collective contacts enable various inspections, and standardized inspection terminal patterns enable the use of inspection devices having probes common to many types. A liquid crystal display device having a structure can be provided.
[0101]
In the above embodiment, only the liquid crystal display device in which the gate driver and the drain driver are mounted by the so-called FCA mounting method has been described. However, the conventional liquid crystal display device in which the driver is mounted using TCP is also inspected according to the present invention. Application circuit can be applied.
[0102]
Next, an example of a drive system and an applied device will be described for an example of the entire configuration of the liquid crystal display device according to the present invention.
[0103]
FIG. 6 is a block diagram illustrating the configuration of a drive system for a general active matrix type liquid crystal display device to which the present invention is applied. This liquid crystal display device includes a liquid crystal panel PNL having a liquid crystal layer sandwiched between two substrates, and a data line (drain signal line or drain line) drive circuit (IC chip), that is, the drain driver DDR described above around the liquid crystal panel PNL. , A scanning line (gate signal line or gate line) drive circuit (IC chip), that is, the gate driver GDR described above. The drain driver DDR and the gate driver GDR have display data, clock signals, and gradation voltages for image display. The display control device CRL which is a display control means for supplying the power supply circuit PWU and the power supply circuit PWU.
[0104]
Display data from the external signal source such as a computer, a personal computer or a television receiver circuit (the display signal), a control signal clock, a display timing signal, and a synchronization signal are input to the display control device CRL. The display control device CRL includes a gradation reference voltage generation unit, a timing converter TCON, and the like, and converts display data from the outside into data in a format suitable for display on the liquid crystal panel PNL.
[0105]
Display data and clock signals for the gate driver GDR and the drain driver DDR are supplied as shown. The carry output of the previous stage of the drain driver DDR is directly supplied to the carry input of the drain driver of the next stage.
FIG. 7 is a block diagram showing a schematic configuration of each driver of the liquid crystal panel and a signal flow. The drain driver DDR includes a data latch unit for display data (display signal) such as a video (image) signal and an output voltage generation circuit.
The gradation reference voltage generator HTV, multiplexer MPX, common voltage generator CVD, common driver CDD, level shift circuit LST, gate-on voltage generator GOV, gate-off voltage generator GFD, and DC-DC converter D / D are shown in the figure. 7 is provided on a substrate on which the display control device CRL 7 and the power supply circuit PWU are mounted.
[0106]
FIG. 8 is a timing chart showing display data input from the signal source (main body) to the display control device and signals output from the display control device to the drain driver and the gate driver. The display control device CRL receives a control signal (clock signal, display timing signal, synchronization signal) from a signal source, and supplies a clock D1 (CL1), a shift clock D2 (CL2), and display data as control signals to the drain driver DDR. At the same time, a frame start instruction signal FLM, a clock G (CL3), and display data are generated as control signals to the gate driver GDR.
[0107]
In the method using a low-voltage differential signal (LVDS signal) for transmission of display data from a signal source, LVDS reception in which the LVDS signal from the signal source is mounted on a substrate (interface substrate) on which the display control device is mounted. After being converted into the original signal by the circuit, it is supplied to the gate driver GDR and the drain driver DDR.
[0108]
As is apparent from FIG. 8, the shift clock signal D2 (CL2) of the drain driver is the same as the frequency of the clock signal (DCLK) and display data input from the main body computer or the like, and about 65 MHz (megahertz) in the XGA display element. ). The liquid crystal display device having such a configuration has features such as a thin shape and low power consumption, and will be widely adopted as a display device in each field in the future.
[0109]
FIG. 9 is an external view showing an example of a display monitor as an electronic apparatus in which the liquid crystal display device according to the present invention is mounted. The monitor is mounted on the screen, that is, the display unit. Since the liquid crystal display device constituting this display monitor has been subjected to disconnection inspection and lighting inspection by the inspection circuit described in the above embodiment, it is highly reliable and can obtain a high-quality image display over a long period of time. Can do.
[0110]
The liquid crystal display device according to the present invention is not limited to the display monitor as described above, but can be used for a monitor of a desktop personal computer, a notebook personal computer, a television receiver, and other devices.
[0111]
Next, a more detailed description will be given of a configuration example of a main part of the present invention.
[0112]
First, the scanning line side common line will be described.
[0113]
FIG. 12A shows an example in which two lines C1 and C2 are formed as the scanning line side common lines. As described as means, all lines can be lit simultaneously even if adjacent scanning signal lines are connected to the same scanning line side common line. However, difficulties arise with respect to flicker lighting inspection.
[0114]
Therefore, at least two scanning line side common lines are provided as shown in FIG.
[0115]
Note that, as shown in FIG. 12B, the above effect can be obtained even when the scanning signal line and the static electricity suppression common line ASCL are not connected.
[0116]
Further, since a plurality of scanning signal lines are connected to any one of the scanning line side common lines C1 and C2, even when static electricity is applied, the influence can be reduced as compared with the case where the scanning signal line exists alone. In this case, since the ASCL cutting process is not required, the cost can be reduced by reducing the process.
[0117]
The configuration of the storage capacitor of the pixel may be either Cadd or Cstg.
[0118]
FIG. 13A shows an example in which three lines C1, C2, and C3 are formed as the scanning line side common line, and FIG. 13B shows an example that does not have the ASCL.
[0119]
As described as a means, regarding flicker, there is an influence of a jump voltage when writing to the TFT. In order to bring this closer to the actual use state, in particular, in the so-called Cadd type liquid crystal display device in which a capacitor for holding charges written in the pixel electrode is formed between the pixel electrode and the scanning signal line in the subsequent stage, the scanning line side It is desirable that there are three or more common lines.
[0120]
Therefore, in this embodiment, the Cadd of the previous stage pixel is formed on the scanning signal line of the own stage, and the Cadd of the own stage pixel is formed on the scanning signal line of the subsequent stage. Of course, cSTG may be used. However, in this configuration, as described in the means, in the six pixels ABCDEF in the video signal line extending direction, the polarity of each pixel with respect to the reference signal potential is, for example, +-++++, and for example, the pixels C and D are the same. Due to the problem of polarity, the following four or the two shown above are desirable, and the following four are more preferable for a liquid crystal display device having a pixel structure having a Cadd type capacitor. desirable.
[0121]
FIG. 14A shows an example in which four lines C1, C2, C3, and C10 are formed as the scanning line side common lines, and FIG. 14B shows an example that does not have the ASCL.
[0122]
As a result, the pixels can have opposite polarities in the extending direction of the video signal line as described above, and an inspection closer to the actual use state is possible, and the inspection accuracy is improved.
[0123]
Next, the signal line side common line will be described.
[0124]
FIG. 15A shows an example in which three lines C4, C6, and C8 are formed as signal line side common lines.
[0125]
As described in the above solution, the present invention is characterized by the fact that the signal side common line is separated at least for each color of the color filter, thereby reducing the probe cost by reducing the number of test pads, and the high definition product. In this way, it is possible to perform inspection by displaying colors while enabling inspection at the same time.
[0126]
If the color filter has three colors, red, green, and blue, as a test pattern, the white display with simultaneous lighting of each color is of course, individual inspection of red, green, and blue by lighting for each color, and the gradation of each color. By controlling and lighting, it is possible to inspect almost all colors displayed on the product.
[0127]
Of course, the color is not limited to red, green, and blue, but even a liquid crystal display device using a so-called complementary color filter of three colors of cyan (yellow-green), magenta (purple), and yellow (yellow). It is the same. This point is common to the present invention and the entire specification.
[0128]
According to the present invention, it is possible to inspect the color purity of each color and further improve the accuracy of inspecting display unevenness with respect to a liquid crystal display device which can only inspect all colors simultaneously. The color filter is formed by individually applying, exposing and developing each color, or impregnating each color.
[0129]
Therefore, for each color, in-plane uniformity of the color density or in-plane distribution of the film thickness occurs. These effects are usually difficult to see when each color is turned on simultaneously. For example, if only the red film thickness changes locally, the effect of the local change in the red film thickness on the brightness when all three colors red, green, and blue are turned on is about the same as when displaying a single red color. 1/3. Therefore, the inspection sensitivity related to luminance unevenness, particularly color unevenness, is reduced only by lighting all colors simultaneously.
[0130]
FIG. 15B is an example having no ASCL. Similarly to the scanning side common line of FIG. 12B having a certain static electricity suppressing effect, this structure also realizes a certain static electricity suppressing effect. In addition, man-hours can be reduced.
[0131]
FIG. 16A shows an example in which six lines C4, C5, C6, C7, C8, and C9 are formed as signal line side common lines. This configuration is characterized in that the signal-side common line is separated at least for each color of the color filter and for the positive electrode and the negative electrode. That is, there are six signal-side common lines for the three color filters of red, green, and blue.
[0132]
There are many known methods for driving a liquid crystal display device: common inversion driving and dot inversion driving. In the common inversion driving, the pixels adjacent in the normal scanning signal line extending direction have the same polarity with respect to the reference signal potential. Therefore, at least three signal side common lines are sufficient as described above.
[0133]
However, in the dot inversion driving, the pixels adjacent in the scanning signal line extending direction are normally driven with a reverse polarity with respect to the reference signal potential. For this reason, when there are three signal-side common lines due to dot inversion, for example, when considering six RGB RGB pixels adjacent in the scanning line extending direction, the polarity is, for example, +-++++, and between B and R Polarity inversion cannot be realized.
[0134]
For this reason, it becomes difficult to accurately inspect flicker, that is, flickering of the screen in the lighting inspection. Therefore, by setting six signal side common lines for each color of the color filter and for the positive electrode and the negative electrode, the polarities of the six pixels of RGBRGB are reversed between, for example, +-++-+- Improved flicker inspection accuracy.
[0135]
FIGS. 12, 13, and 14 that are the configuration of the scanning line side common line and FIGS. 15 and 16 that are the configuration of the signal line side common line are combined to realize the effects of both.
[0136]
Next, cutting of LCT1 and LCT2 in FIGS. 12 to 16 will be described.
[0137]
FIG. 17A shows an example of the TCP method. An ASCL is formed inside the substrate edge and is electrically connected to the scanning signal line.
[0138]
Before the inspection, the ASCL and each scanning signal line are separated in the region LCT1. This is for performing inspection for each color. This is because, when connected to the ASCL, each scanning signal line is connected via the scanning line side signal line, so that a single color inspection cannot be performed.
[0139]
Separation may be performed by any of a method using a laser beam, a method performed by etching, and a method of cutting the substrate in an approximate region. The laser beam method has the highest positional accuracy, so the distance between the scanning signal line and ASCL can be reduced, and the area of the mother glass substrate can be used effectively, and a larger product can be realized from the same substrate. Has the advantage.
[0140]
In the technique using etching, it is possible to perform batch processing by simultaneously putting a large number of substrates in an etching solution. In this case, it is necessary to have a structure in which a layer to be separated is exposed in advance in a region to be separated, and it is desirable that the conductive layer is one layer in that portion.
[0141]
For example, if the terminal part is formed of a transparent conductive material single layer such as ITO or covered therewith, the etching part is made of metal, and the terminal part is mistakenly removed if the two etching solutions are different. It is possible to prevent such harmful effects. However, a larger area is required than the laser beam method.
[0142]
In the technique performed by cutting the substrate itself, a technique is usually employed in which grooves are formed with a scribing blade or a laser beam, and then the substrate is divided in an approximate region by applying pressure. In this case, since the separation is physically complete, the risk of insufficient separation can be minimized.
[0143]
However, a region that should not be cut at the time of cutting, for example, a scanning line side common line may be cut. Which method is used depends mainly on the configuration of the production line. However, from the viewpoint of maximizing profits, it is most effective to maximize the number or size of products that can be obtained from one mother glass. For this purpose, it is consistent to use a laser cutting technique.
[0144]
Further, in the configuration in which the ASCL and the scanning signal line are separated in advance, this step is not necessary. However, although there is a certain static electricity suppressing effect by the scanning line side common line, it is preferable to have the ASCL for completeness. .
[0145]
After the separation, the inspection probe PB is brought into contact with the scanning line side inspection terminal GLTP provided connected to the scanning line side common line, and an inspection signal is input to perform inspection. What is determined to be defective in this inspection, for example, can be made a non-defective product by correction with a laser beam, etc., goes to the correction process, and then inspects again, and if the defect is corrected, the liquid crystal display element is treated as a non-defective product Therefore, the defect rate can be reduced.
[0146]
Here, it is significant that the present invention is compatible with single color inspection. In other words, continuous point defects between two adjacent pixels may not be detected when all colors can be lit simultaneously. For example, when a green pixel adjacent to a red pixel is short-circuited, it is determined that there is no abnormality in simultaneous lighting of all colors.
[0147]
On the other hand, in the monochromatic inspection, when red is lit, not only the red pixel but also the adjacent green pixel is lit simultaneously, and it is determined as defective as a bright spot defect.
[0148]
If it can be determined as defective in this step, for example, the defect is corrected by cutting the short-circuited portion between the red and green pixels with a laser beam, and the product can be made good. However, when all the colors can be inspected at the same time, this defect is not detected until it is subsequently connected to the drive circuit.
[0149]
To correct at this stage, it is necessary to remove the polarizing plate once after attaching the polarizing plate, and even if it is not necessary, there is a risk that the drive circuit will be destroyed due to the transport process to the correcting device, correction work, etc. In any case, the cost required for correction increases. Alternatively, other defects such as gap defects are induced in the correction process, and the rate of failure in correction increases. Therefore, the yield of supporting single color inspection at the cell stage is significant in terms of both costs.
[0150]
For the substrate determined to be non-defective by inspection, the scanning line side common lines C1, C2, C3 and the TCP connection pad TCPD are separated by LCT2. This separation is performed by physical cutting of the substrate itself. Therefore, LCT2 becomes one end of the substrate in the state of the product on this side. Thereafter, as shown in FIG. 17B, TCP is mounted, and the external drive circuit and the scanning signal line are connected.
[0151]
The above is a description of the scanning signal line side. As for the video signal line side, FIG. 18A shows a diagram corresponding to FIG. 17A and FIG. 18B shows a diagram corresponding to FIG. Shown in The basic process and idea are the same.
[0152]
As can be seen from FIG. 17B or FIG. 18B, in the TCP method, when the liquid crystal display device is completed, the configuration in which the inspection according to the method or the idea disclosed in the present invention is applied is applied. Even in such a case, it can be configured not to remain.
[0153]
However, the present invention discloses a liquid crystal display device according to the above method or a manufacturing method of the liquid crystal display device according to the above method, and is manufactured by applying the method or idea disclosed in the present invention without remaining as a structure in a product. A TCP-type liquid crystal display device is also a subject of the present application.
[0154]
In FIGS. 17 and 18, the TCP method has been described as an example. However, the difference with the FCA method is that either the laser beam or the etching is used instead of the physical cutting of the substrate for the separation in the LCT1 or LCT2. Is almost the same. However, in the case of the FCA method, for example, as shown in FIG. 3, even when the liquid crystal display device is completed, at least a part of the common line remains on a part of the substrate. Therefore, the method or idea disclosed in the present invention is applied. However, there is a difference that it is relatively easy to determine whether or not it has been manufactured.
[0155]
Next, the method of arranging the test pads will be described by taking an example in which there are three common lines on the FCA scanning signal line drawing side. The basic concept is the same in the case of TCP. The same concept can be applied even if the number of common lines is different.
[0156]
FIG. 19A shows an example in which a test pad GLTP on the gate driver side is provided on one side of one chip GDR or one region where terminals are gathered in the case of TCP, and the probe PB can be easily manufactured. It is.
[0157]
Next, FIG. 19B shows an example in which the test pads are alternately provided, so that each test pad GLTP can be configured to be large, the alignment of the probe PB is facilitated, and the test time can be shortened.
[0158]
FIG. 19C shows an example in which the test pad PB is provided in a region different from the lead-out region of the scanning line side common line, and the degree of freedom in design increases in both arrangement and size.
[0159]
FIG. 19D is an example provided on both sides, and the waveform dullness of the inspection signal supplied from the scanning line side common line to the scanning line can be suppressed, and an inspection closer to the actual driving state is realized.
[0160]
The concept of the video signal line drawing side is the same as that of the scanning signal line drawing side. FIG. 20 shows an example in which there are six signal line side common lines. FIG. 20A is an example in which a test pad PB is configured on one side. FIG. 20B shows an example in which the two are alternately drawn on both sides.
[0161]
Since the number of PBs is large, the merit to alignment accuracy by enlarging the size of PB is larger than in the case of FIG. FIG. 20C shows an example in which PB is configured in units of positive and negative electrodes. FIG. 20D shows an example in which both sides are configured.
[0162]
Next, in the case of FCA, an example of the arrangement of PBs in a plurality of chip mounting areas, and in the case of TCP, a plurality of areas of one area where terminals are aggregated. Some examples are described in Examples. Needless to say, the same idea can be applied to the case where the number of common lines is different and to the drain side.
[0163]
FIG. 21A shows an example in which gate driver side inspection pads GLTP are arranged on both sides of each scanning drive IC mounting region GDR. In this case, the feeding resistance can be minimized, and inspection in a state closer to actual driving can be realized.
[0164]
FIG. 21B is an example in which GLTP is provided in a plurality of GDR units. In this case, since the number of probes can be reduced, the manufacturing cost of the probes can be reduced.
[0165]
FIG. 21C shows an example in which GLTPs are alternately provided for a plurality of signal line side common lines between a plurality of GDRs. In this case, the probe cost can be reduced and the area of one GLTP can be increased.
[0166]
FIG. 21D shows a case where GLTP is formed in a region outside the signal line side common line formation region. This increases the degree of design freedom and facilitates positioning of the probe. In addition, with this configuration, it is possible to use probes among different types by arranging the GLTP so that the same pitch is provided with respect to one end surface on the substrate among different types of terminals with different terminal pitches. Cost reduction is also realized.
[0167]
FIG. 21 (e) shows a change in routing from the GDR signal line side common line at one end to the GLTP. In the configuration of FIG. 21 (d), the arrangement of the terminals in the GLTP is reversed with respect to the other parts only at one end. This can be prevented by the configuration shown in FIG. 21 (e), which is particularly effective in realizing a probe compatible with various types.
[0168]
Alternatively, FIG. 21 (f) shows the case where the GLTP itself that is the reverse of the other parts in FIG. 21 (d) is removed, and the same effect as in FIG. 21 (e) can be realized and the number of probes can be reduced. However, since only the GDR is supplied with a signal from one side, there is a problem that the inspection accuracy of the pixel area related to the GDR is relatively lower than that of the other areas, particularly with respect to flicker.
[0169]
Next, the drain is taken as an example, and further examples and ideas are shown.
[0170]
FIG. 22A shows an example of the drain driver side inspection pad for the signal driver IC mounting region DDR. The DLTPs are arranged so as to be shifted from each other between the DDRs.
[0171]
Thereby, the area of the inspection pad DLTP per piece can be enlarged, and the alignment of the PB becomes easy.
[0172]
The DLTP on the end face in FIG. 22 (b) is similarly arranged. In this case, the probe production cost can be reduced because a probe unit can be configured by configuring a plurality of probes having the same configuration.
[0173]
FIG. 22C is a configuration in which DLTP is alternately configured for each signal line side common line to the configuration of FIG. 22B, and the DLTP per unit can be further expanded. In particular, since the drain side has a larger number than the gate side and the increase amount is larger than the increase amount of the aspect ratio of the liquid crystal display device, the distance between the chips is narrower than that on the gate side.
[0174]
Accordingly, it may be difficult to secure a sufficient region for forming DLTP. Even in such a case, the arrangement of DLTP can be made possible by the configuration shown in FIG. FIG. 22D is based on the same idea as FIG. 21D, in which DLTP is formed in a region that is out of the scanning line side common line forming region.
[0175]
FIG. 22E shows a configuration in which the DLTP on the end face is removed based on the same idea as FIG. FIG. 22 (f) is based on the same idea as FIG. 21 (e).
[0176]
As described in the above solution, since the flicker inspection accuracy is affected by a minute voltage difference between pixels, it is necessary to suppress the delay of the signal waveform during the inspection.
[0177]
Therefore, when the number of inspection pads for inputting inspection signals to the signal line side common line is n in the chip mounting area or the aggregate area of the signal wirings, (n−1) / It is desirable to provide two or more. In order to suppress an increase in probe cost, it is desirable that the number is 2 × (n + 1) or less. The various examples described above also disclose this idea.
[0178]
Further, it is desirable that the number of inspection signal terminals for inputting inspection signals to the scanning signal lines is larger than the number of inspection signal terminals for inputting inspection signals to the video signal lines. This is necessary for the inspection with the above configuration that the input frequency of the inspection signal that needs to be applied to the video signal line at the time of inspection is equal to or higher than the input frequency of the inspection signal that needs to be applied to the scanning signal line. Therefore, this is due to a request to reduce the input resistance on the video signal line side.
[0179]
Also, the test signal input resistance is reduced by either the signal line side common line, or the signal line side and the test pad, or the scan line side common line, or the scan line side common line and the test pad. By providing a region formed of the wiring layer with the lowest resistance in the liquid crystal display device, the effect of reducing the resistance can be achieved.
[0180]
Next, an example of further reducing the number of inspection pads will be described. Although the gate side is described as an example, the same idea can be applied to the drain side, and the same idea can be applied to the TCP. As a representative of these, the FCA gate side will be described as an example.
[0181]
FIG. 23 is an example in which each drawn wiring is connected to another common line by wiring drawn from the signal line side common line, and GLTP is configured at least at one end thereof. As a result, the number of GLTPs can be reduced to the number of scanning line side common lines on the gate side and to the number of signal line side common lines on the drain side.
[0182]
Therefore, not only can the probe cost be greatly reduced, but also the alignment can be facilitated, and the inspection time can be reduced.
[0183]
However, in this configuration, the deterioration of the waveform delay due to the influence of the wiring resistance is unavoidable as compared with the case where many GLTPs are provided. In order to suppress the influence, the other common line has a lower resistance than the wiring in the pixel by widening the line width even if it is the lowest resistance material layer in the liquid crystal display device or the same material. It is desirable to constitute the layer having at least a part thereof.
[0184]
Next, a method for performing cutting of LCT 1 more efficiently, particularly a concept of a configuration that can be efficiently performed when performing laser cutting will be described together with an example thereof.
[0185]
FIG. 24A shows a state where FIG. 21F is connected to ASCL before being cut by LCT1. Separation by a laser beam is usually performed by fixing the optical system of the laser beam and moving the substrate. This is because the optical system related to the laser beam is precise, and if it is moved frequently, the optical system is displaced, the optical axis of the laser beam is displaced, and there is a risk of dividing the outside of the predetermined region. .
[0186]
Also, since the repair at that time is precise, it takes time, so the laser beam is fixed and moved on the substrate side instead. At this time, the time required for the division can be shortened as there is a margin between the area to be cut and the area that should not be cut. This is because the movement is performed by a mechanical mechanism, and therefore, when the substrate is moved quickly, the displacement due to the movement is easily increased accordingly.
[0187]
Therefore, since the margin area can be expanded by forming the LCT1 area outside the chip area, it is possible to reduce the time required for the division by the laser beam, thereby improving the throughput, the yield, and the cost. Furthermore, by forming the cutting region on a straight line, higher speed can be realized.
[0188]
FIG. 24B shows an example in which the number of GLTPs is reduced as shown in FIG. Since the length of the region to be cut can be reduced, the time can be greatly shortened. FIG. 24C is another example of the GLTP position in FIG.
[0189]
Further, FIG. 24D shows an example in which the idea of FIG. 23 is applied to both the scanning line side and the gate line side, and GLTP and DLTP are concentratedly arranged. This can further reduce the time. In particular, when it is configured to be concentrated on one end of the substrate, the LCT1 can be separated only for one-dimensional cutting as a whole substrate, so that the alignment of the substrate for laser cutting can be performed only once, and the time can be further reduced. Become.
[0190]
In addition, the configuration in which the inspection pads are concentrated on one side as described above has many advantages such as easy creation of probes for a variety of types as shown in FIG. 2 and easy positioning of the probes.
[0191]
Next, the idea about the signal waveform at the time of inspection will be shown together with an example. FIG. 25 shows an example in which the drain side signal line side common line is one RGB color and the scanning line side common line is two lines. An example of dot inversion driving will be described.
[0192]
FIG. 25 (a) shows the concept of the drive waveform, and FIGS. 25 (b) and 25 (c) show the RGB in the first frame and the second frame and the first and second scanning lines 6 at this time. This shows the polarity of the pixel for the reference potential Vcom.
[0193]
As is apparent from a comparison between FIGS. 25B and 25C, in this configuration, a potential having the same polarity is always applied to the pixel, and the liquid crystal deteriorates.
[0194]
FIG. 26 shows an inspection waveform for countermeasures against this. As shown in FIG. 26 (a), the frequency of the signal input to the video signal line is ½ that in FIG. 25 (a). As a result, as shown in FIGS. 26B and 26C, the polarities of the pixels can be reversed in the first frame and the second frame, and direct current can be prevented from being applied to the liquid crystal.
[0195]
FIG. 27 shows a case in which two positive and negative electrodes are formed for each RGB as signal line side common lines on the drain side, for a total of six lines.
[0196]
In this configuration, the normal dot inversion in which the pixel potentials in the first frame and the second frame shown in FIGS. 27B and 27C are inverted each other for each frame and always inverted between adjacent pixels. A driving state can be realized. As a result, flicker inspection can be realized with high accuracy close to the actual use state.
[0197]
FIG. 28 shows an example of common inversion.
[0198]
In this case, if there are one signal line side common line for each RGB and two scanning line side common lines, the first frame and the second frame are shown in FIGS. 28 (b) and 28 (c), respectively. In addition, line inversion driving is realized. Therefore, in the case of common inversion, if there are three signal line side common lines and two scanning line side common lines, a flicker inspection can be realized with high accuracy close to the actual use state.
[0199]
FIG. 29 shows an example in which there are three scanning line side common lines in the configuration of FIG.
[0200]
In this case, as described above for Cadd, since it can be driven by three lines of the front stage, the own stage, and the rear stage, the influence of the jump voltage in the TFT can be inspected as being closer to the product. However, since the polarity is the same between GA and GC, there is a drawback that the dot inversion is not complete.
[0201]
FIG. 30 shows another method for preventing direct current application to the pixel, which is the harmful effect of FIG. 25, and has the same effect as FIG. Note that the effect of this section can be achieved by one RGB, and if two positive and negative electrodes are provided for each RGB, flicker countermeasures can be realized at the same time.
[0202]
In this configuration, as shown in FIG. 30 (a), the frequency of the video signal line is configured faster than in the case of FIG. 25 (a), and GA, By setting GB to high and writing a voltage to the pixel, as shown in FIGS. 30B and 30C, the first frame and the second frame are prevented, respectively, to prevent direct current superposition.
[0203]
FIG. 31 shows an inspection waveform that is considered to be most desirable in consideration of inspection accuracy, probe cost, frame area reduction, etc. for dot inversion driving. The drain side signal line side common line is for the positive electrode and the negative electrode for each color of RGB. 2 for use, 6 in total.
[0204]
In addition, the scanning line side common line on the gate side is composed of four lines, so that the relationship between the previous stage, the own stage, and the subsequent stage can always be maintained, and flicker can be suppressed. The drive waveform is shown in FIG.
[0205]
Accordingly, the polarities of the pixels of the first frame and the second frame are as shown in FIGS. 31B and 31C, respectively, and dot inversion driving in which the polarity is inverted between adjacent pixels can be realized. Of course, there is no problem even if it is used for common inversion.
[0206]
With a liquid crystal display device having a common line that can realize such a waveform inspection, or an inspection technique, it is possible to reduce the number of inspection pads in dot inversion driving and achieve high precision and realize sufficient inspection.
[0207]
Further, by forming the probe in a shape corresponding to this configuration, it can be applied not only to dot inversion but also to common inversion, and a highly versatile inspection apparatus can be obtained.
[0208]
【The invention's effect】
As described above, according to the present invention, it is possible to increase the width, length, and pitch of the test pad connected to the signal line lead line of the liquid crystal display device to which the drain driver and the gate driver are connected. Even when using the high-definition display driver, it is easy to manufacture probes for disconnection inspection and lighting inspection. Also, contact the probe and inspection pad. correct Therefore, the inspection accuracy is improved and a highly reliable liquid crystal display device can be provided.
[Brief description of the drawings]
FIG. 1 is a plan view for explaining one embodiment of a liquid crystal display device according to the present invention.
FIG. 2 is an enlarged view of a main part for explaining in detail a test pad formation region TTP of FIG.
FIG. 3 is a schematic diagram for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 4 is a waveform diagram for explaining an example of an inspection signal applied to a drain inspection pad and a gate inspection pad in a lighting inspection of one embodiment of the liquid crystal display device according to the present invention;
FIG. 5 is a schematic view for explaining the main wiring of another embodiment of the liquid crystal display device according to the present invention.
FIG. 6 is a block diagram illustrating a configuration of a driving system of a general active matrix type liquid crystal display device to which the present invention is applied.
FIG. 7 is a block diagram showing a schematic configuration and a signal flow of each driver of the liquid crystal panel.
FIG. 8 is a timing chart showing display data input from the signal source (main body) to the display control device and signals output from the display control device to the drain driver and the gate driver.
FIG. 9 is an external view showing an example of a display monitor as an electronic device in which the liquid crystal display device according to the present invention is mounted.
FIG. 10 is a perspective view illustrating a main part of an FCA mounting type liquid crystal display device.
FIG. 11 is an explanatory view of arrangement of inspection terminals in a conventional liquid crystal display device.
FIG. 12 is a schematic diagram for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 13 is a schematic diagram for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 14 is a schematic diagram for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 15 is a schematic view for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 16 is a schematic view for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 17 is a schematic diagram for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 18 is a schematic diagram for explaining the main wiring of one embodiment of the liquid crystal display device according to the present invention.
FIG. 19 is a schematic diagram for explaining a test pad arrangement of one embodiment of a liquid crystal display device according to the present invention.
FIG. 20 is a schematic diagram for explaining a test pad arrangement of one embodiment of a liquid crystal display device according to the present invention.
FIG. 21 is a schematic diagram for explaining a test pad arrangement in one embodiment of a liquid crystal display device according to the present invention;
FIG. 22 is a schematic diagram for explaining a test pad arrangement in one embodiment of a liquid crystal display device according to the present invention.
FIG. 23 is a schematic diagram for explaining a test pad arrangement of one embodiment of a liquid crystal display device according to the present invention.
FIG. 24 is a schematic diagram for explaining a test pad arrangement in one embodiment of a liquid crystal display device according to the present invention.
FIG. 25 is a schematic diagram for explaining inspection signals in one embodiment of the liquid crystal display device according to the present invention;
FIG. 26 is a schematic diagram for explaining inspection signals in one embodiment of the liquid crystal display device according to the present invention;
FIG. 27 is a schematic diagram for explaining inspection signals in one embodiment of the liquid crystal display device according to the present invention;
FIG. 28 is a schematic diagram for explaining inspection signals in one embodiment of the liquid crystal display device according to the present invention;
FIG. 29 is a schematic diagram for explaining inspection signals in one embodiment of the liquid crystal display device according to the present invention;
FIG. 30 is a schematic diagram for explaining inspection signals in one embodiment of the liquid crystal display device according to the present invention;
FIG. 31 is a schematic diagram for explaining inspection signals in one embodiment of the liquid crystal display device according to the present invention;
[Explanation of symbols]
SUB1 One substrate
SUB2 The other board
GDR scan driver IC (gate driver) and mounting position
DDR signal drive IC (drain driver) and mounting position
TTP test pad formation area
CTL cutting line
Inspection pad on the GLTP gate driver side
DLTP drain driver side test pad
Vcom Counter electrode lead pad
PB probe
GTM gate driver output terminal (gate line lead-out terminal)
Output terminal of DTM drain driver
Input terminal of TTA gate driver
TTB Drain driver input terminal
ASCL Static control common line
C1, C2, C3, C10 Scan line side common line
GLTP (GA, GB, GC, GD) Inspection pads formed on the scanning line side common lines C1, C2, C3, C10
LCT1, LCT2 cutting line
C4, C5, C6, C7, C8, C9 Signal line side common line.

Claims (27)

A thin film transistor arranged in a matrix, and one substrate having a pixel electrode driven by the thin film transistor, the scanning line and the signal line for supplying a voltage signal for the pixels formed on the thin film transistor,
The other substrate having the color filters of red, green and blue ,
A liquid crystal layer is sandwiched in a bonding gap between the one substrate and the other substrate ;
A scanning line arguments Extension end element disposed at one periphery of one substrate above, and a signal line lead pin disposed in the other peripheral,
An output terminal is connected to each of the scanning line lead terminal and the signal line lead terminal of the liquid crystal panel, and a scanning line driving IC mounting region and a signal for directly mounting the scanning line driving IC and the signal line driving IC on the one substrate It has a line drive IC mounting area,
A liquid crystal display device having a cut away area static control common line commonly connecting the scanning line arguments Extension end terminal and the signal line lead pin,
In the signal line driver IC mounting region of the signal line lead terminal connected to the static electricity suppression common line, the signal line lead terminal is a red positive electrode, a red negative electrode, a green positive electrode, a green negative electrode, a blue positive electrode, a blue 6 signal line side common lines connected together in 6 systems of negative electrodes,
The liquid crystal display device, characterized in that to the signal line driving IC mounting area deviating said one substrate, and includes a test pad connected to the six signal line side common lines above. The liquid crystal display device according to claim 1, characterized in that the test pad of the six signal line side common lines are arranged in the cutting removal region of the one substrate. A thin film transistor arranged in a matrix, and one substrate having a pixel electrode driven by the thin film transistor, the scanning line and the signal line for supplying a voltage signal for the pixels formed on the thin film transistor,
The other substrate having the color filters of red, green and blue ,
A liquid crystal layer is sandwiched in a bonding gap between the one substrate and the other substrate ;
A scanning wire drawing Extension end terminal to a periphery of one of the substrates described above, and a signal line lead pin in another neighborhood,
An output terminal is connected to each of the scanning line lead terminal and the signal line lead terminal of the liquid crystal panel, and a scanning line driving IC mounting region and a signal for directly mounting the scanning line driving IC and the signal line driving IC on the one substrate It has a line drive IC mounting area,
The static control common line commonly connecting the scanning line arguments Extension end terminal and the signal line lead pin A liquid crystal display device comprising a substrate cutting removal region,
In the scanning line driving IC mounting area of the scanning line leading terminal connected to the static electricity suppression common line, the scanning signal line leading terminal is arranged in three lines of the preceding stage, the next stage and the succeeding stage, or 4 for changing the polarity for each dot. 3 or 4 scanning line side common lines connected together in a system,
In the signal line driver IC mounting region of the signal line lead terminal connected to the static electricity suppression common line, the signal line lead terminal is a red positive electrode, a red negative electrode, a green positive electrode, a green negative electrode, a blue positive electrode, a blue 6 signal line side common lines connected together in 6 systems of negative electrodes,
The one of the scanning line driving IC mounting area and the one out of the signal line driving IC mounting area is also inspected on each of the three to four scanning line side common lines and the six signal line side common lines on the substrate. A liquid crystal display device comprising a pad for use . The liquid crystal display according to claim 3, characterized in that a said test pad of the 3-4 scan line side common line and the six signal line side common lines to cut and removed region of said one substrate apparatus. According to claim 3, characterized in that the test pad of the 3 or 4 scanning line side common line and the six signal line side common lines arranged at equal intervals in the cutting removal region of the one substrate Liquid crystal display device. Has opposing electrode on the other substrate, along with arranging the inspection pads of the three or four scan line side common line and the six signal line side common lines to cut removal region of the one substrate claims, characterized in that said test pads to be connected to pull outgoing of the counter electrodes are arranged together with the inspection pads of the three or four scan line side common line and the six signal line side common lines Item 4. A liquid crystal display device according to Item 3. It has opposing electrodes on the one substrate, together with arranging the inspection pads of the three or four scan line side common line and the six signal line side common lines to cut removal region of the one substrate claims, characterized in that said test pads to be connected to pull outgoing of the counter electrodes are arranged together with the inspection pads of the three or four scan line side common line and the six signal line side common lines Item 4. A liquid crystal display device according to Item 3. Having a liquid crystal material layer between a pair of opposed substrates,
One of the substrates or the other substrate has three color filters of a first color, a second color, and a third color,
One of the substrates has a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix, and two adjacent ones of the plurality of video signal lines and the plurality of scannings. A plurality of pixel regions formed by intersecting two adjacent signal lines;
Each pixel region has at least one thin film transistor, and the thin film transistor has a pixel electrode to which a voltage for controlling display of any one of the first, second, and third colors is input from the video signal line. a, the video signal line in the liquid crystal display device having on at least one peripheral of the substrate of the video signal line lead pin integrally or spaced the extended area in the liquid crystal layer outside of the one substrate,
A first signal line common line, a second signal line common line, a third signal line common line, a fourth signal line common line, a fifth signal line common line, a sixth signal line common line on at least one of the substrates; With signal line common line,
The first signal line common line is connected to the video signal line lead pin which is provided integrally or spaced adjacent ones of the video signal lines related to the display of the first color,
Second signal line common line is connected to the video signal line lead pin which is provided integrally or spaced adjacent ones of the video signal lines related to the display of said second color,
Third signal line common line is connected to the video signal line lead pin which is provided integrally or spaced adjacent ones of the video signal lines related to the display of the third color,
Fourth signal line common line connected to said first of said video signal line lead pin which is provided integrally or spaced adjacent the other of the video signal lines to a display color, a fifth signal line common line is connected to the video signal line lead pin which is provided integrally or spaced to the other adjacent of the video signal lines related to the display of said second color,
Sixth signal line common line of that it has a structure which is connected to the video signal line lead pin which is provided integrally or spaced adjacent the other of the video signal lines related to the display of said third color A characteristic liquid crystal display device. Having a liquid crystal material layer between a pair of opposed substrates,
One of the substrates or the other substrate has three color filters of a first color, a second color, and a third color,
One of the substrates has a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix, and two adjacent ones of the plurality of video signal lines and the plurality of scannings. A plurality of pixel regions formed by intersecting two adjacent signal lines;
Each pixel region has at least one thin film transistor, and the thin film transistor has a pixel electrode to which a voltage for controlling display of any one of the first, second, and third colors is input from the video signal line. Have
In the liquid crystal display device wherein the scanning signal line having on at least one peripheral of the substrate of the integral or apart from the scanning signal line lead-out pin to the extended area in the liquid crystal layer outside of the one substrate,
Comprising two, three, or four signal line common lines on at least one of the substrates;
The signal line common line of said scanning signal lines to be connected to one of the scanning signal line lead-out end element provided with integral or spaced apart, and the adjacent signal line common line adjacent scanning signal lines the liquid crystal display device characterized by being connected to different scanning signal line lead pin. At least one signal line driving IC of the video signal line or the scanning signal line is mounted on the one substrate, and the signal line common line and the video signal line are within a region where the driving IC is mounted. characterized in that the lead-out end element or the scanning signal line lead pin is connected, a liquid crystal display device according to claim 8 or 9. The signal line common line, and having a test path head in a region outside the region where the driving IC is mounted, a liquid crystal display device according to any one of claims 8 to 10. Characterized in that one end of the signal line common line extends to the vicinity of an end face of one substrate, a liquid crystal display device according to any one of claims 8 to 10. A plurality of the inspection for Pas head provided region, and at least two areas between which inspection pads are provided, wherein the correct placement and the like of the test pad of claim 12, wherein Liquid crystal display device. Wherein the area where the inspection for Pas head provided are arranged at substantially equal intervals, the liquid crystal display device according to claim 11. And the video signal lines or said scanning signal lines, the video signal line lead-out end element or the scanning signal line lead pin is separated, and that between該離cuts the video signal line or the scanning signal line by laser or etching characterized in that it is made by a liquid crystal display device according to any one of claims 8 to 14. The liquid crystal display device according to any one of claims 8 to 14 , wherein the first color, the second color, and the third color are red, green, and blue, respectively. The first color, second color, third color, respectively blue-green, purple, characterized in that it is a yellow, a liquid crystal display device according to any one of claims 8 to 15. The liquid crystal display device according to any one of claims 8 to 17 characterized by having a reference electrode and a reference signal lead wiring on the one substrate. It has a reference electrode and a reference signal lead wiring on the substrate of the one, wherein the reference signal connected to pad the lead wiring is arranged in the vicinity of the test pad of claim 11 16. A liquid crystal display device according to any one of items 15 to 15 . It has a reference electrode on the other substrate, a liquid crystal display device according to the reference signal lead wired to one of claims 8 to 17, characterized in that it has on the one substrate. Has a reference electrode on the other substrate, it has a reference signal lead wiring on the substrate of the one, the reference signal connected to pad the lead wiring is arranged in the vicinity of the test pads wherein the liquid crystal display device according to any one of claims 11 to 15. Having a liquid crystal material layer between a pair of opposed substrates,
One of the substrates or the other substrate has three color filters of a first color, a second color, and a third color,
One of the substrates has a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix, and two adjacent ones of the plurality of video signal lines and the plurality of scannings. A plurality of pixel regions formed by intersecting two adjacent signal lines;
Each pixel region has at least one thin film transistor, and the thin film transistor has a pixel electrode to which a voltage for controlling display of any one of the first, second, and third colors is input from the video signal line. In the liquid crystal display device, the video signal line has a terminal region for connection with an external drive circuit outside the liquid crystal layer of the one substrate,
Forming a first signal line common line, a second signal line common line, and a third signal line common line farther than the connection terminal region on at least one of the substrates;
The first signal line common line is connected to the video signal line related to the display of the first color at a distance from the connection terminal region,
The second signal line common line is connected to the video signal line related to the display of the second color at a distance from the connection terminal region,
The third signal line common line is connected to the video signal line related to the display of the third color at a distance from the connection terminal region,
The first, second, and third signal line common lines are respectively connected to test pads;
A liquid crystal display device formed by cutting and removing a region where the signal line common line is formed after performing a lighting test of the liquid crystal display device by inputting a test signal to the pad. Having a liquid crystal material layer between a pair of opposed substrates,
One of the substrates or the other substrate has three color filters of a first color, a second color, and a third color,
One of the substrates has a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix, and two adjacent ones of the plurality of video signal lines and the plurality of scannings. A plurality of pixel regions formed by intersecting two adjacent signal lines;
Each pixel region has at least one thin film transistor, and the thin film transistor has a pixel electrode to which a voltage for controlling display of any one of the first, second, and third colors is input from the video signal line. In the liquid crystal display device, the video signal line has a terminal region for connection with an external drive circuit outside the liquid crystal layer of the one substrate,
A first signal line common line, a second signal line common line, a third signal line common line, a fourth signal line common line, a fifth signal line common line, a sixth signal line common line on at least one of the substrates; With signal line common line,
The first signal line common line is connected to an adjacent one of the video signal lines related to the display of the first color beyond the connection terminal region,
The second signal line common line is connected to an adjacent one of the video signal lines related to the display of the second color at a distance beyond the connection terminal region;
The third signal line common line is connected to an adjacent one of the video signal lines related to the display of the third color at a distance beyond the connection terminal region;
The fourth signal line common line is connected to the other adjacent one of the video signal lines related to the display of the first color beyond the connection terminal region,
The fifth signal line common line is connected to the other adjacent one of the video signal lines related to the display of the second color beyond the connection terminal region,
The sixth signal line common line is connected to the other adjacent one of the video signal lines related to the display of the third color beyond the connection terminal region,
The first, second, third, fourth, fifth, and sixth signal line common lines are connected to test pads, respectively.
A liquid crystal display device formed by cutting and removing a region where the signal line common line is formed after performing a lighting test of the liquid crystal display device by inputting a test signal to the pad. 24. The liquid crystal display device according to claim 22 , wherein the external drive circuit is a driver IC mounted on a TCP. Having a liquid crystal material layer between a pair of opposed substrates,
One of the substrates or the other substrate has three color filters of a first color, a second color, and a third color,
One of the substrates has a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix, and two adjacent ones of the plurality of video signal lines and the plurality of scannings. A plurality of pixel regions formed by intersecting two adjacent signal lines;
Each pixel region has at least one thin film transistor, and the thin film transistor has a pixel electrode to which a voltage for controlling display of any one of the first, second, and third colors is input from the video signal line. In the method of manufacturing a liquid crystal display device, the video signal line has a terminal region for connection with an external drive circuit outside the liquid crystal layer of the one substrate.
Forming a first signal line common line, a second signal line common line, and a third signal line common line farther than the connection terminal region on at least one of the substrates;
The first signal line common line is connected to the video signal line related to the display of the first color at a distance from the connection terminal region,
The second signal line common line is connected to the video signal line related to the display of the second color at a distance from the connection terminal region,
The third signal line common line is connected to the video signal line related to the display of the third color at a distance from the connection terminal region,
The first, second, and third signal line common lines are respectively connected to test pads;
A method of manufacturing a liquid crystal display device, comprising: forming an inspection signal by inputting an inspection signal to the pad; and cutting and removing a region where the signal line common line is formed after performing a lighting inspection of the liquid crystal display device. . Having a liquid crystal material layer between a pair of opposed substrates,
One of the substrates or the other substrate has three color filters of a first color, a second color, and a third color,
One of the substrates has a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix, and two adjacent ones of the plurality of video signal lines and the plurality of scannings. A plurality of pixel regions formed by intersecting two adjacent signal lines;
Each pixel region has at least one thin film transistor, and the thin film transistor has a pixel electrode to which a voltage for controlling display of any one of the first, second, and third colors is input from the video signal line. Have
In the method of manufacturing a liquid crystal display device, the scanning signal line has a terminal region for connection with an external drive circuit outside the liquid crystal layer of the one substrate.
Comprising two, three, or four signal line common lines on at least one of the substrates;
Connecting the signal line common line to either said connected by connection terminal area beyond and adjacent signal lines common line was different ones of the adjacent scanning signal lines to each other scanning signal line lead pin of the scanning signal lines And
The signal line common line is connected to a test pad,
A method of manufacturing a liquid crystal display device, comprising: forming an inspection signal by inputting an inspection signal to the pad; and cutting and removing a region where the signal line common line is formed after performing a lighting inspection of the liquid crystal display device. . 27. The method of manufacturing a liquid crystal display device according to claim 25 or 26 , wherein the external drive circuit is a driver IC mounted on a TCP.

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