JP2001324721A - Liquid crystal display device and its manufacturing method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a liquid crystal display device capable of realizing the dynamic operating inspection of respective monochromatic colors corresponding to colors of a color filter while reducing the number of terminal probes, and to provide its manufacturing method. SOLUTION: Output terminals (leaders) of a drain driver are divided into six systems consisting of positive and negative red electrodes, positive and negative green electrodes and positive and negative blue electrodes (R1, R2, G1, G2, B1, B2) with respect to three colors red, green and blue. Respective systems are collected and connected to a common line of drain lines. The common line of the drain lines is withdrawn to the outside of a region with the mounted drain driver. The inspection is carried out by applying the probe to a terminal for inspection provided on the common line of the drain lines. Also with respect to the gate driver side, output terminals (leaders) of the gate driver are divided into three systems consisting of initial, subsequent and final stages (GA, GB, GC). Respective systems are collected and connected to a common line of gate lines. The common line of the gate lines is withdrawn to the outside of a region with the mounted gate driver. The inspection is carried out by applying the probe to a terminal for inspection provided on the common line of the gate lines.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device, and more particularly to a liquid crystal display device which facilitates a function test of a thin film transistor in a thin film transistor type liquid crystal display device and a disconnection test of a scanning line lead line and a signal line lead line. It relates to the manufacturing method.

[0002]

2. Description of the Related Art A liquid crystal display device has been widely used as a display device capable of high-definition and color display for a notebook computer or a display monitor.

[0003] The liquid crystal display device includes a simple matrix type using a liquid crystal panel in which a liquid crystal layer is sandwiched between a pair of substrates on which parallel electrodes formed so as to cross each other are formed on each inner surface;
2. Description of the Related Art An active matrix type liquid crystal display device using a liquid crystal display element (hereinafter, also referred to as a liquid crystal panel) having a switching element for selecting a pixel in one of a pair of substrates is known.

An active matrix type liquid crystal display device is
A so-called vertical electric field type liquid crystal display device (generally, a TN type active matrix type) using a liquid crystal panel in which an electrode group for pixel selection is formed on a pair of upper and lower substrates as represented by a twisted nematic (TN) type. A liquid crystal panel in which an electrode group for pixel selection is formed only on one of a pair of upper and lower substrates,
There is a so-called in-plane switching mode liquid crystal display device (generally referred to as an IPS mode liquid crystal display device).

A liquid crystal panel constituting the former TN mode active matrix type liquid crystal display device has a structure in which liquid crystal is formed in a pair of substrates (a first substrate (lower substrate) and a second substrate (upper substrate)). The two polarizing plates are arranged so that the absorption axes are arranged in crossed Nicols on the outer surfaces of the upper and lower substrates of the liquid crystal panel and the absorption axes on the incident side are parallel or orthogonal to the rubbing direction. ing.

In such a TN type active matrix type liquid crystal display device, when no voltage is applied, the incident light becomes linearly polarized light on the incident side polarizing plate, and this linearly polarized light propagates along the twist of the liquid crystal layer, and the outgoing side polarized light. When the transmission axis of the plate coincides with the azimuthal angle of the linearly polarized light, all the linearly polarized light is emitted and white display is performed (a so-called normally open mode).

When a voltage is applied, the direction (director) of a unit vector indicating the average alignment direction of the liquid crystal molecular axes constituting the liquid crystal layer is oriented in a direction perpendicular to the substrate surface, and the azimuth of the incident side linearly polarized light. Since the angle does not change, it coincides with the absorption axis of the exit-side polarizing plate, so that black display is performed. (See "Basics and Applications of Liquid Crystals" published by the Industrial Research Council in 1991).

On the other hand, an electrode group for pixel selection and an electrode wiring group are formed only on one of a pair of substrates, and a voltage is applied between adjacent electrodes (between a pixel electrode and a counter electrode) on the substrate by applying a voltage. In an IPS type liquid crystal display device in which layers are switched in a direction parallel to the substrate surface, a polarizing plate is arranged so as to display black when no voltage is applied (a so-called normally closed mode).

The liquid crystal layer of the IPS mode liquid crystal display device is initially in a homogeneous orientation parallel to the substrate surface, and in a plane parallel to the substrate, the director of the liquid crystal layer is parallel or slightly parallel to the electrode wiring direction when no voltage is applied. When the voltage is applied, the direction of the director of the liquid crystal layer shifts in the direction perpendicular to the electrode wiring direction with the application of the voltage, and the director direction of the liquid crystal layer changes to the director direction when no voltage is applied. When tilted in the direction of the electrode wiring by 45 °, the liquid crystal layer at the time of applying the voltage changes the azimuthal angle of the polarized light by 90 ° like a half-wave plate.
By rotating the polarizer, the transmission axis of the exit-side polarizing plate and the azimuth of the polarized light coincide with each other, and a white display is obtained.

This IPS mode liquid crystal display device has a feature that a change in hue and contrast is small even at a viewing angle and a wide viewing angle is achieved (Japanese Patent Laid-Open No. 5-505).
247).

In the above-mentioned full-color liquid crystal display devices, a color filter system is mainly used. In this method, a pixel corresponding to one dot of color display is divided into three, and a color filter corresponding to each of three primary colors, for example, red (R), green (G), and blue (B) is arranged in each unit pixel. This is achieved by doing so.

The present invention can be applied to the above-mentioned various liquid crystal display devices. The outline of the present invention will be described below by taking a TN type active matrix type liquid crystal display device as an example.

As described above, in a liquid crystal display element (liquid crystal panel) constituting a TN type active matrix type liquid crystal display device (hereinafter simply referred to as an active matrix type liquid crystal display device for simplicity), a liquid crystal layer is interposed. One of two transparent insulating substrates made of glass or the like, which are arranged to face each other, extends in the x direction on the surface of the substrate on the liquid crystal layer side;
Scanning signal lines (hereinafter referred to as gate lines) arranged side by side
And a group extending in the y direction while being insulated from the gate line group.
And a group of drain lines (hereinafter, referred to as video signal lines) arranged side by side in the direction.

Each area surrounded by the group of gate lines and the group of drain lines becomes a pixel area. In this pixel area, for example, a thin film transistor (TFT) and a transparent pixel electrode are formed as active elements (switching elements). I have.

When the scanning signal is supplied to the gate line, the thin film transistor is turned on, and a video signal from the drain line is supplied to the pixel electrode via the turned on thin film transistor.

In addition to the drain lines of the drain line group, the gate lines of the gate line group extend to the periphery of the substrate to form external terminals, and are connected to the external terminals. Video driving circuit, gate scanning driving circuit, that is, a plurality of driving ICs constituting them
Chip (semiconductor integrated circuit, hereinafter simply referred to as drive IC or I
C) is externally mounted around the substrate. In other words, a plurality of tape carrier packages (TCP) on which these drive ICs are mounted are externally provided around the substrate.

However, since such a substrate has a structure in which a TCP on which a drive IC is mounted is externally mounted, an intersecting region of a group of gate lines and a group of drain lines of the substrate is provided. The area occupied by the area (usually called a frame) between the outline of the display area and the outer frame of the substrate becomes large, and the liquid crystal display element is integrated with the illumination light source (backlight) and other optical elements. This is contrary to the demand for reducing the outer dimensions of the display module.

Therefore, in order to solve such a problem as much as possible, that is, due to demands for high-density mounting of the liquid crystal display element and miniaturization of the outer shape of the liquid crystal display module, the video drive is performed without using TCP parts. So-called flip-chip type or chip-on-glass (CO) in which a driving IC for scanning and a driving IC for scanning driving are directly mounted on one substrate (lower substrate).
G) The scheme was proposed. The drive IC employs a so-called FCA method in which an electrode formed on the back surface of the drive IC chip is directly connected to a wiring formed on a substrate.

FIG. 10 is a perspective view for explaining the main part of the liquid crystal display device of the FCA mounting type. This liquid crystal display device has one substrate SU on which thin film transistors are formed in a matrix.
A liquid crystal layer is sandwiched between B1 and the other substrate SUB2 on which a color filter is formed.

A scanning line driving IC (hereinafter, gate driver) GDR is mounted on one side of one substrate SUB1 in the FCA system. The other side has a signal line driving circuit I
A C (drain driver) DDR is similarly mounted by the FCA method.

The output of the gate driver GDR is connected to the scanning line lead line GTM, and the input is the flexible printed circuit board F.
It is connected to the wiring of PC1. Drain driver DDR
Is connected to the signal line lead line DTM, and the input is connected to the wiring of the flexible printed circuit board FPC2.

Flexible printed circuit boards FPC1, FP
C2, as indicated by the arrow in the drawing, moves the flexible printed circuit board FPC1 in the BENT1 direction to one of the substrates SUB1.
Folded to the back of the flexible printed circuit board F
The bent part JT2 of PC2 is bent along the folding line BTL.
After folding in one direction, it is folded in the BENT3 direction and folded on the back of the flexible printed circuit board FPC1.

In this state, the flexible printed circuit board F
Connect connector CT4 of PC2 to flexible printed circuit board F
Connected to a connector (not shown) provided on PC1. An adhesive tape BAT is interposed on the inner surface of the bent portion of the flexible printed board FPC2, and is fixed to the flexible printed board FPC2.

Note that CHG and CHD are electronic components such as capacitors, ALMG and ALMD are alignment marks,
OL2 indicates a polarizing plate, and AR indicates a display area.

In the liquid crystal display device having such a structure, the probe of the inspection device is applied to the lead line of the gate line and the lead line of the drain line extending from the thin film transistor formed on the one substrate SUB1, and the characteristics of the thin film transistor and each wiring Inspection such as disconnection, and lighting inspection after bonding with the other substrate.

FIGS. 11A and 11B are diagrams for explaining the arrangement of test terminals in a conventional liquid crystal display device. FIG.
(B) is a schematic diagram showing the wiring on the drain driver side.

In (a), GTM is a gate line lead line, TPC is a test terminal, GDR is a gate driver mounting part (shown by a dotted line), LCT is a laser cutting line, ASCL is a gate line side static electricity suppression common line, GTM Indicates an input terminal of the gate driver GDR.

In one substrate SUB1 (thin film transistor substrate) manufacturing process, the gate line lead line GTM is short-circuited by the static electricity suppressing common line ASCL, thereby preventing damage to the thin film transistor and wiring due to intrusion of static electricity. Thereafter, the gate line lead lines GTM are individually cut along the laser cutting line LCT, a probe is applied to the inspection terminal TPC to perform a disconnection inspection, and a signal is applied to perform a lighting inspection.

In (b), DTM is a lead wire lead line, TPC is a test terminal, DDR is a portion where a drain driver is mounted (shown by a dotted line), LCT is a laser cutting line, ASCL
Denotes an electrostatic suppression common line on the drain line side, and TTB denotes an input terminal of the gate driver GDR.

Similarly, on the drain driver side, in the manufacturing process of the substrate, the drain line lead line DTM is short-circuited by the static suppression common line ASCL, thereby preventing damage to the thin film transistor and wiring due to intrusion of static electricity. Thereafter, the drain line lead lines DTM are individually cut along the laser cutting line LCT, a probe is collectively applied to the inspection terminals TPC to perform a disconnection inspection, and a signal is applied to perform a lighting inspection.

The flip-chip type liquid crystal display device is disclosed in Japanese Patent Application No. 6-256426 filed by the same applicant.
There is a number.

[0032]

In the conventional arrangement of the inspection terminals described above, the number of gate drivers and drain drivers, especially the number of drain drivers, increases as the definition of display increases, and the pitch of the output terminals (see FIG. 11). GTM, DTM pitch) is small.

As a result, the width and length of the inspection terminal (TPC in FIG. 11) cannot be sufficiently set, and it is difficult to contact the probes in a lump as in the conventional case. Therefore, there has been a problem that the inspection accuracy is reduced due to the displacement of the probe when the inspection voltage is applied to the inspection terminal to perform the disconnection inspection and the lighting inspection. Also, it is difficult to produce a probe applicable to such a narrow pitch output terminal.

An object of the present invention is to solve the above-mentioned problems of the prior art, to enable various inspections with all terminal probe collective contacts, and to standardize the inspection terminal pattern to have a probe common to many types. An object of the present invention is to provide a liquid crystal display device having a wiring lead-out wiring structure that enables use of an inspection device.

Another object of the present invention is to provide a liquid crystal display device which facilitates the manufacture of the above-mentioned probe and realizes low cost, and a method of manufacturing the same.

It is a further object of the present invention to provide a liquid crystal display device and a method for manufacturing the same, which can suppress a decrease in detection capability for display defects during inspection.

[0037]

In order to achieve the above-mentioned object, the present invention provides, as a representative means, an output terminal (lead wire) of a drain driver for three colors of red, green, and blue; The system is divided into six systems: a red negative electrode, a green positive electrode, a green negative electrode, a blue positive electrode, and a blue negative electrode, and these are collectively connected to a drain line common line, and the drain line common line is placed outside the drain driver mounting area. The test is performed by applying a probe to an inspection terminal provided on the drain line common line.

On the gate driver side, as a representative means, the output terminals (lead lines) of the gate driver are divided into three systems of a preceding stage, a next stage, and a succeeding stage, or four systems such that the polarity is reversed for each dot. The gate line common line is connected to a gate line common line, the gate line common line is drawn out of the gate driver mounting area, and the inspection is performed by applying a probe to an inspection terminal provided on the gate line common line. .

A typical configuration of the present invention is described as follows. That is, (1) one substrate including a thin film transistor arranged in a matrix, a pixel electrode driven by the thin film transistor, a scanning line for supplying a voltage signal for forming a pixel to the thin film transistor, and a signal line; A liquid crystal layer is sandwiched between the bonding gaps of the other substrates provided with the color filters, and a scanning line lead terminal is provided around one of the substrates, a signal line lead terminal is provided around the other substrate, and the scanning of the liquid crystal panel is performed. An output terminal is connected to each of the line lead-out terminal and the signal line lead-out terminal, and the scanning line drive IC and the signal line drive I are mounted on the one substrate.
A liquid crystal display device having a scanning line driving IC mounting area for directly mounting C and a signal line driving IC mounting area, and having, in a cutting and removing area, an electrostatic suppression common line for commonly connecting the scanning line drawing terminal and the signal line drawing terminal. In the signal line drive IC mounting area of the signal line lead terminal connected to the static electricity suppression common line, the signal line lead terminal is connected to a red positive electrode, a red negative electrode, a green positive electrode, a green negative electrode, a blue negative electrode. And six signal line common lines connected collectively to six systems of a positive electrode and a blue negative electrode. The six signal line common lines are provided on the one substrate outside the signal line driving IC mounting area. Test pads were provided to connect to the wires.

With this configuration, it is possible to increase the width, length, and pitch of the test pad connected to the signal line lead line, so that the manufacture of the probe is facilitated and the contact accuracy is increased. (2) The test pads for the six signal line-side common lines are arranged in the cut-off areas of the one substrate.

It is possible to standardize the pattern of the test pad, and it is possible to test various types of liquid crystal display devices using a test device having a common probe. (3) one substrate having thin film transistors arranged in a matrix, pixel electrodes driven by the thin film transistors, and scanning lines and signal lines for supplying voltage signals for forming pixels to the thin film transistors; A liquid crystal layer is sandwiched between the bonding gaps of the other substrate provided with the color filters, and a scanning line lead terminal is provided on one periphery of the one substrate, a signal line lead terminal is provided on the other periphery, and the scanning line lead terminal of the liquid crystal panel is provided. An output terminal is connected to each of the terminal and the signal line lead-out terminal, and the scanning line drive IC and the signal line drive IC are directly mounted on the one substrate.
A liquid crystal display device having a C mounting area and a signal line driving IC mounting area, and having, in a substrate cutting and removing area, an electrostatic suppression common line for commonly connecting the scanning line lead-out terminal and the signal line lead-out terminal. In the scan line drive IC mounting area of the scan line lead terminal connected to a common line, the polarity of the scan signal line lead terminal is reversed for each of three lines of a preceding stage, a next stage, and a succeeding stage, or for each dot. Therefore, three scanning line side common lines connected collectively to four systems are provided, and the signal line lead terminal is red in the signal line drive IC mounting area of the signal line lead terminal connected to the static electricity suppression common line. And six signal line-side common lines connected together in six systems of a positive electrode, a red negative electrode, a green positive electrode, a green negative electrode, a blue positive electrode, and a blue negative electrode. Signal line drive I On the one even substrate outside the mounting area, equipped with a test pad, each of the three scanning line side common lines and the six signal line side common line.

According to this configuration, the width, length, and pitch of the test pads connected to the signal line lead lines and the scan line lead lines can be increased, so that the probe can be easily manufactured and the contact accuracy can be increased. . (4) The inspection pads for the three or four scanning line-side common lines and the six signal line-side common lines are arranged in the cut removal area of the one substrate. (5) The inspection pads for the three or four scanning line-side common lines and the six signal line-side common lines are arranged at equal intervals in the cut-off area of the one substrate.

It is possible to standardize the inspection pad pattern including the scanning lead lines, and it is possible to inspect various types of liquid crystal display devices using an inspection device having a common probe. (6) The other substrate has a counter electrode, and
The inspection pads for the scanning line side common lines and the six signal line side common lines are arranged in the cut-off area of the one substrate, and the three or four inspection pads for connecting to the lead lines of the counter electrode are provided. And the inspection pads for the scanning line side common lines and the six signal line side common lines.

The standardization of the inspection pad pattern including the scanning lead lines can be further promoted, and the inspection of various types of liquid crystal display devices can be inspected by an inspection device having a common probe. (7) The one or more substrates have a counter electrode, and
The inspection pads for the scanning line side common lines and the six signal line side common lines are arranged in the cut-off area of the one substrate, and the three or four inspection pads for connecting to the lead lines of the counter electrode are provided. And the inspection pads for the scanning line side common lines and the six signal line side common lines.

The lead lines of the counter electrode required for the lighting inspection can be arranged in a standard pattern together with the inspection pads of the scanning line side common line and the signal line side common line, so that the standardization of the inspection pad pattern can be further promoted. It is possible to more easily inspect a variety of liquid crystal display devices using an inspection device having a common probe.

The present application is characterized in that the signal-side common line is separated at least for each color of the color filter as described above. The present application does not exclude a configuration in which only the same signal is always input to the video signal line related to each color to perform the inspection.

However, by separating the signal side common line at least for each color of the color filter as described above,
Probe cost is reduced by reducing the number of test pads.
Inspection by displaying colors can be realized while enabling inspection with high definition products. The color filter is red,
Of course, if the three colors are green and blue, white display by simultaneous lighting of each color is, of course, individual inspection of red, green and blue by lighting of each color, and display by product by controlling the gradation of each color and lighting Inspection can be performed for almost all colors.

This means that the color purity of each color can be inspected, which is a great advantage of the configuration of the present invention. Furthermore, an effect that the inspection accuracy of display unevenness is greatly improved, which cannot be realized only by simultaneous lighting of all colors, is realized. The color filter performs coating, exposure and development individually for each color,
Alternatively, it is formed by impregnating individual colors. Therefore, the in-plane uniformity of the color density or the in-plane distribution of the film thickness occurs for each color.

If the respective colors are lit simultaneously, these effects are usually hard to see. For example, if only the red film thickness changes locally, the effect of the local change in the red film thickness on the brightness when all three colors of red, green, and blue are lit simultaneously is about It becomes 1/3. Therefore, if only all colors are simultaneously lit, the inspection sensitivity for uneven brightness, particularly for uneven color, is reduced, and there is a risk that defective products may be leaked to the market.

In the present invention, the signal-side common line is separated at least for each color of the color filter as described above, so that the individual lighting inspection of each color can be performed, and the probe accuracy can be maintained while maintaining the inspection accuracy for luminance unevenness and color unevenness. Cost reduction, inspection cost reduction, and lighting inspection of high-definition products can be realized.

Although this test method is particularly advantageous for FCA,
Even in the TCP system, the same effect can be realized by separating the signal-side common line at least for each color of the color filter as described above.

Another major feature of the present invention is that the signal-side common line is separated for at least each color of the color filter and for the positive electrode and the negative electrode.

Thus, for example, if the color filters have three colors, the number of signal-side common lines is six. There are two driving methods for liquid crystal display devices: common inversion driving and dot inversion driving.
Many species are known. In the common inversion drive, pixels adjacent to each other in the normal scanning signal line extending direction have the same polarity with respect to the reference signal potential, so that at least three signal-side common lines are required as described above.

However, in the dot inversion driving, the pixels adjacent to each other in the scanning signal line extending direction are driven with a polarity which is generally opposite to the reference signal potential.

Therefore, the signal-side common line becomes 3 due to dot inversion.
In the case of a book, for example, RGBRG adjacent in the scanning line extending direction
Considering the six pixels of B, the polarity is, for example, +-++
− +, And the inversion of the polarity between B and R cannot be realized. Even in this case, the detection sensitivity for the uneven brightness and uneven color can be substantially maintained.

However, flicker to be examined in the lighting inspection,
That is, it is difficult to accurately inspect the flicker of the screen. Usually, this flicker is a problem only in a special pattern or a special timing, and has less influence in actual use than the above-mentioned color unevenness and luminance unevenness, but is defective at a level higher than the specification with the customer. That is no different.

Therefore, in the present application, the signal side common lines are separated for each color of the color filter and for the positive electrode and the negative electrode. For example, if the color filter has three colors, the signal side common lines are made to be six by RGBRGB. It is possible to set the polarity of the six pixels to, for example, + − + − + − and the opposite polarity between the pixels.

Furthermore, since the inspection accuracy of flicker is particularly affected by a small voltage difference between pixels, it is necessary to suppress a delay of a signal waveform at the time of inspection. Therefore,
In the case where the number of test pads for inputting test signals to the signal line side common line is a chip mounting area or an integrated area of signal wiring, and the number is n, (n-1) / 2 for each signal line
It is desirable to provide more than one. In order to suppress an increase in probe cost, the number is preferably 2 × (n + 1) or less.

It is desirable that the number of inspection signal terminals for inputting inspection signals to the scanning signal lines be larger than the number of inspection signal terminals for inputting inspection signals to the video signal lines.

This is because the inspection is performed with the above-described configuration in which the input frequency of the inspection signal that needs to be applied to the video signal line at the time of inspection is equal to or higher than the input frequency of the inspection signal that needs to be applied to the scanning signal line. This is necessary in order to reduce the input resistance on the video signal line side.

The input resistance of the test signal can be reduced by reducing the signal line side common line, the wiring between the signal line side and the test pad, or the scan line side common line, or the scan line side common line and the test pad. By providing a region formed by the wiring layer having the lowest resistance in the liquid crystal display device, the effect of lowering the resistance can be achieved.

Further, in the present application, the number of common lines on the scanning line side is two or more. Simultaneous lighting of all lines is possible even with one line.

However, difficulty arises particularly in the flicker lighting inspection. That is, in either of the common inversion driving and the dot inversion driving, in the actual use state, the driving is performed such that the polarities of two pixels adjacent to each other in the video signal line extending direction are reversed to each other. This is to suppress flicker.

Therefore, in order to inspect for flicker, it is necessary to drive the two pixels adjacent to each other in the video signal line extending direction so that the polarities of the two pixels are opposite to each other at the time of the inspection. If one scanning-side common line is used, the polarities of the two pixels are inevitably the same, so that there is a problem that flicker inspection cannot be performed in a state equivalent to actual use.

Therefore, by setting at least two lines so as to shift the writing timings of two adjacent pixels, it is possible to drive the two adjacent pixels in the video signal line extending direction so that the polarities of the two adjacent pixels are reversed. Inspection becomes possible.

Further, with respect to flicker, there is also an influence of a jump voltage when writing to a TFT. In order to make this closer to the actual use state, in particular, in a so-called Cadd type liquid crystal display device, a capacitor for holding charges written to the pixel electrode is formed between the pixel electrode and a scanning signal line at a subsequent stage. It is desirable that there are three or more common lines.

In this method, the Cadd of the preceding pixel is formed on the scanning signal line of the own stage, and the Cadd of the preceding pixel is further formed.
Since dd is formed on the scanning signal line in the subsequent stage, writing to the pixel according to the actual use is realized by scanning the own stage and the pixels before and after the same in the same order in the actual use.

In a system without Cadd, for example, the Cstg system, writing can be performed according to the actual use even with two scanning line side common lines. Similarly, by using three or more scanning line-side common lines, an effect of approaching the actual use state is shown.

However, in the case of three pixels, the polarities of the respective pixels with respect to the reference signal potential at the six pixels ABCDEF in the video signal line extending direction are, for example, +-++-+, and, for example, the pixels C and D are the same. There is a problem of becoming polar. In order to avoid this, it is desirable that the scanning line side common line be an even number.
It is most effective to configure the minimum number of four lines in the dd system and two or four lines in the Cstg system.

The present invention is not limited to the above configuration or the configuration of the embodiment described later and the ideas disclosed therein, and various modifications can be made without departing from the technical idea of the present invention. Needless to say.

[0071]

Embodiments of the present invention will be described below in detail with reference to the accompanying drawings. The following embodiment describes a so-called TN type liquid crystal display device,
The basic configuration of the portion to which the present invention is applied is also the same for the IPS (transverse electric field) method, except that the counter electrode lead line is led out on the thin film transistor substrate side.
In the following description, the signal line is also referred to as a drain line, and the scanning line is also referred to as a gate line.

FIG. 1 is a plan view for explaining one embodiment of the liquid crystal display device according to the present invention. In this liquid crystal display device, one substrate SUB1 and the other substrate SUB2 are bonded via a liquid crystal layer, and thin film transistors (not shown) are formed in a matrix on the inner surface of one substrate SUB1. On the inner surface of the other substrate SUB2, color filters of three colors of red, green and blue and a counter electrode are formed. A counter voltage is supplied to the counter electrode via a wiring (not shown) formed on the inner surface of one substrate SUB1.

One substrate SUB1 protrudes from the periphery of the other substrate SUB2 on the left and lower sides in the figure, and 11 scan drive ICs (gate drivers) are provided on the left periphery.
GDR, and 11 signal drive ICs on the lower periphery
(Drain driver) The DDR is mounted by the FCA method (in the drawing, the mounting position is shown).

One substrate SUB1 has a test pad formation region TTP. This inspection pad formation region TTP
Are cut off after completion of the liquid crystal display device.
This is a portion cut and removed by L.

FIG. 2 is an enlarged view of a main part for describing in detail the test pad formation region TTP of FIG. The inspection pad formation region TTP is formed in a cutting removal region that is cut along the cutting line CTL in the final product of the one substrate SUB1.
This test pad formation region TTP includes a test pad GLTP on the gate driver side and a test pad D on the drain driver side.
Inspection pad Vcom for LTP and lead wire of counter electrode
Are arranged in a line at equal intervals.

The test pads GLTP on the gate driver side are grouped into three or four systems, and the test pads DLTP on the drain driver side are grouped in six systems, and a total of 10 to 11 test pads Vcom along with the lead lines of the counter electrode. It consists of an inspection pad.

Accordingly, in the present embodiment, 10 to 10
All inspections can be performed collectively using 11 probes.

The test pad GLTP on the gate driver side and the test pad DLTP on the drain driver side are used.
Can be arranged separately from each other, and the inspection on the gate driver side and the inspection on the drain driver side are performed separately by these inspection pads and the inspection pad Vcom of the lead wire of the counter electrode provided at an appropriate position. It is also possible to configure.

As described above, in the above embodiment, the width, length, and pitch of the test pad connected to the signal line lead line can be increased, so that the contact accuracy is improved and the probe is easily manufactured. Become. Further, by standardizing the probe, it is possible to manufacture an inspection apparatus that can support various types.

FIGS. 3A and 3B are schematic diagrams for explaining main wirings of an embodiment of the liquid crystal display device according to the present invention, wherein FIG. 3A shows a gate line side wiring, and FIG. 3B shows a drain line side wiring. In the figure, G
DR is the mounting position of the gate driver, GTM is the output terminal (gate line lead-out terminal) of the gate driver, TTA is the input terminal of the gate driver, ASCL is the common static electricity suppression line, C
Reference numerals 1, C2, and C3 denote three scanning lines connected in common to three systems of a preceding stage, a next stage, and a succeeding stage of the gate line leading lines of a plurality of gate drivers or four systems for changing the polarity for each dot. GLTP (GA, GB, GC) is a test pad formed on each scanning line side common line C1, C2, C3,
PB indicates a probe, and LCT1 and LCT2 indicate laser cutting lines. The test pads GLTP (GA, GB, GC) formed on the scanning line side common lines C1, C2, C3 are arranged at the positions shown in FIG.

In this wiring configuration, in (a) on the gate driver side, after the fabrication of one substrate SUB1 is completed, the scanning line side common lines C1 and C1 are connected by the laser cutting line LCT1.
2 and C3 are disconnected from the static electricity suppression common line ASCL. The scanning line side common lines C1, C2, C3 are replaced with static electricity suppressing common lines AS.
By being separated from CL, each scanning line side common line C1, C
2 and C3 are independent 3 or 4 systems of inspection wiring.

In this state, each scanning line side common line C1, C2,
The test pad GLTP (GA, GB, G
The disconnection inspection and the lighting inspection are executed by applying the probe PB to C).

After the inspection, the scanning line side common line C from the output terminal GTM of the gate driver is connected to the laser cutting line LCT2.
1, C2 and C3 are separated, and a gate driver is mounted by FCA between the output terminal GTM and the input terminal TTA of the gate driver.

Similarly, in (b) on the side of the drain driver, after the fabrication of one substrate SUB1 is completed, the signal line side common lines C4, C5, C6, C
7, C8 and C9 are separated from the static electricity suppression common line ASCL. Signal line side common line C4, C5, C6, C7, C8, C
By disconnecting the common line 9 from the static electricity suppression common line ASCL, the signal line side common lines C4, C5, C6, C7, C8, and C9 become independent six lines of inspection wiring.

In this state, each scanning line side common line C4, C5,
Inspection pad DLTP formed on C6, C7, C8, C9
(B1, B2, G1, G2, R1, R2) with probe P
A disconnection inspection and a lighting inspection are performed by applying B.

After the inspection, the scanning line side common line C is connected to the output terminal DTM of the drain driver by the laser cutting line LCT2.
4, C5, C6, C7, C8, and C9 are separated, and the drain driver is mounted by FCA between the output terminal DTM and the input terminal TTB of the drain driver.

In the lighting inspection, a probe is applied to the inspection pad Vcom of the lead line of the counter electrode shown in FIG. 2 and a predetermined voltage is applied, whereby the liquid crystal is interposed between the pixel electrode connected to the output electrode of the thin film transistor. An electric field for controlling the alignment of the pixels is generated to check whether or not the pixels are lit.

The laser cutting lines LCT1 and LCT
2 may be an etching cutting line separated by an etching process. Other known cutting methods may be used.

FIG. 4 shows a drain test pad DLTP (B1, B2) in a lighting test of one embodiment of the liquid crystal display device according to the present invention.
2, G1, G2, R1, R2) and gate inspection pad GL
FIG. 7 is a waveform diagram illustrating an example of a test signal applied to TP (GA, GB, GC). The inspection signal is a so-called dot inversion driving method, and the illustrated voltage value pulse width, pulse interval, and the like are examples.

By applying the test signal shown in FIG. 4 to each test pad, a lighting test for each system can be executed by lighting a predetermined display pattern.

According to this embodiment, various inspections can be performed by the all terminal probe collective contact, and an inspection terminal pattern can be standardized to use an inspection apparatus having a probe common to a variety of products. And a liquid crystal display device having the same.

FIGS. 5A and 5B are schematic diagrams for explaining main wirings of another embodiment of the liquid crystal display device according to the present invention, wherein FIG. 5A shows a gate line side wiring, and FIG. 5B shows a drain line side wiring. In the figure,
The same reference numerals as those in FIG. 3 correspond to the same functional parts.

In this embodiment, the gate scanning line side common line C
1, C2 and C3 are not the input terminal TTA of the gate driver, but the static electricity suppressing common line ASCL outside the cutting line CTL.
Connected to

Similarly, the drain line side common lines C4, C5,
C6, C7, C8, and C9 are connected not to the input terminal TTB of the drain driver but to the static electricity suppression common line ASCL outside the cutting line CTL.

With this configuration, the substrate SUB1
The gate scanning line side common lines C1, C2, C3 and the drain line side common lines C4, C5, C6, C7, C8, C at the same time as cutting and removing the static electricity suppressing common line ASCL after the fabrication of
9 can be made independent, and the laser cutting (or etching cutting) step can be reduced by one step.

According to the present embodiment, various inspections can be performed with all terminal probe collective contacts, and an inspection terminal having a common probe can be used by standardizing the inspection terminal pattern. A liquid crystal display device having a structure can be provided.

As another embodiment of the present invention, FIG.
, The drain line side common lines C4, C5, C6, C7,
C8 and C9 are separated between the blocks, and test pads are provided between the blocks. As a result, the types of display patterns used in the inspection can be increased.

In each of the above embodiments, the common lines C1, C2, and C3 are grouped into three or four systems on the gate side. However, the gate side terminal has a relatively large terminal width and pitch as compared with the drain side terminal. Therefore, as still another embodiment of the present invention, on the gate line side, a probe can be collectively applied to all the terminals in the same manner as in the prior art to perform the inspection. The configuration is as shown in FIG.

As still another embodiment of the present invention, the gate scanning line side common line C shown in FIG. 3 or FIG.
1, C2, C3 and drain line side common lines C4, C5,
A transistor or a diode is arranged between C6, C7, C8, C9 and the output terminal (gate line lead-out terminal) GTM of the gate driver and the output terminal (drain line lead-out terminal) DTM of the drain driver, and an inspection signal is provided between wirings. It was configured to be separated.

According to each of the above-described embodiments, various inspections can be performed with all terminal probe collective contacts.
In addition, by standardizing the pattern of the inspection terminals, it is possible to provide a liquid crystal display device having a wiring lead-out wiring structure that enables the use of an inspection device having a probe common to various types.

In the above embodiment, only the liquid crystal display device having a gate driver and a drain driver mounted in a so-called FCA mounting method has been described. However, a liquid crystal display device having a conventional driver mounting method using TCP is also described. The inspection circuit of the invention can be applied.

Next, an example of the overall configuration of the liquid crystal display device according to the present invention will be described with respect to a driving system and examples of applicable equipment.

FIG. 6 is a block diagram for explaining the configuration of a drive system for a general active matrix type liquid crystal display device to which the present invention is applied. This liquid crystal display device has a liquid crystal panel PNL in which a liquid crystal layer is sandwiched between two substrates, and a data line (drain signal line or drain line) driving circuit (IC chip) around the liquid crystal panel PNL, that is, the drain driver DDR described above. , A scanning line (gate signal line or gate line) driving circuit (IC chip), that is, the gate driver GDR described above, and display data, a clock signal, and a gradation voltage for image display are provided to the drain driver DDR and the gate driver GDR. And a power supply circuit PWU.

Display data (the above-mentioned display signal) and control signal clock, display timing signal and synchronization signal from an external signal source such as a computer, a personal computer and a television receiving circuit are inputted to the display control device CRL. Display control device CR
L denotes a gradation reference voltage generator, a timing converter T
A CON or the like is provided, and converts external display data into data in a format suitable for display on the liquid crystal panel PNL.

The display data and the clock signal for the gate driver GDR and the drain driver DDR are supplied as shown. The carry output of the previous stage of the drain driver DDR is directly supplied to the carry input of the next stage drain driver. FIG. 7 is a block diagram showing a schematic configuration of each driver of the liquid crystal panel and a signal flow. The drain driver DDR includes a data latch unit for display data (display signal) such as a video (image) signal and an output voltage generation circuit. Further, the gray scale reference voltage generation unit HTV, multiplexer MPX, common voltage generation unit CVD, common driver CDD, level shift circuit LST, gate-on voltage generation unit GOV, gate-off voltage generation unit GFD, and DC-DC converter D / D are shown in FIG. 7 display control device CR
L, provided on a substrate on which the power supply circuit PWU is mounted.

FIG. 8 is a timing chart showing display data input from the signal source (main body) to the display control device and signals output from the display control device to the drain driver and the gate driver. The display control device CRL receives control signals (clock signal, display timing signal,
(A synchronization signal), a clock D1 (CL1) and a shift clock D1 as control signals to the drain driver DDR.
2 (CL2) and display data, and at the same time, a frame start instruction signal FLM, a clock G (CL3) and display data as control signals to the gate driver GDR.

In the system using the low voltage differential signal (LVDS signal) for transmitting the display data from the signal source,
An LVDS signal from the signal source is mounted on a board (interface board) on which the display control device is mounted.
The signal is converted into an original signal by a VDS receiving circuit and then supplied to the gate driver GDR and the drain driver DDR.

As is clear from FIG. 8, the shift clock signal D2 (CL2) of the drain driver is the same as the frequency of the clock signal (DCLK) and display data input from the main body computer or the like. High frequency of 65 MHz (megahertz). The liquid crystal display device having such a configuration has features such as thinness and low power consumption, and tends to be widely used as a display device in various fields in the future.

FIG. 9 is an external view showing an example of a display monitor as an electronic device on which the liquid crystal display device according to the present invention is mounted. It is mounted on the screen of the monitor, that is, on the display unit. Since the liquid crystal display device constituting this display monitor has been subjected to the disconnection inspection and the lighting inspection by the inspection circuit described in the above embodiment, it is possible to obtain a highly reliable and high quality image display for a long period of time. Can be.

Note that the liquid crystal display device according to the present invention is not limited to the above-described display monitor, but can also be used for a monitor of a desktop personal computer, a notebook personal computer, a television receiver, and a display device of other devices.

Next, a more detailed embodiment of the present invention will be described.

First, the scanning line side common line will be described.

FIG. 12A shows a case where C is used as the scanning line side common line.
This is an example in which two C1, C2 are formed. As described above, even if adjacent scanning signal lines are connected to the same scanning line side common line, simultaneous lighting of all lines is possible. However, difficulty arises with respect to flicker lighting inspection.

Therefore, as shown in FIG. 12A, at least two scanning line side common lines are provided.

Note that the same effect can be obtained even in a configuration in which the scanning signal line and the static electricity suppression common line ASCL are not connected as shown in FIG.

Further, the scanning signal line is a scanning line side common line C.
Because it is connected to either one of C1 or C2,
Even when static electricity is applied, the effect can be reduced as compared with the case where the scanning signal line exists alone. In this case, since the ASCL cutting step is not required, low cost can be realized by reducing the number of steps.

The configuration of the storage capacitor of the pixel is Cadd,
Any of Cstg may be used.

FIG. 13A shows the case where C is used as the scanning line side common line.
FIG. 13 shows an example in which three lines C1, C2 and C3 are formed.
(B) is an example without the ASCL.

As described above, flicker is influenced by the jump voltage at the time of writing to the TFT. In order to bring this closer to the actual use state, in particular, a so-called Cadd is formed between the pixel electrode and the scanning signal line at the subsequent stage to form a capacitor for holding the charge written to the pixel electrode.
It is desirable that there be three or more scanning line side common lines in a liquid crystal display device of the system.

Therefore, in the present embodiment, the Cad of the preceding pixel is
d was formed on the scanning signal line of the own stage, and Cadd of the pixel of the own stage was formed on the scanning signal line of the subsequent stage. Of course cS
TG may be used. However, in this configuration, as described above, the six pixels ABCDEF in the video signal line extending direction are used.
The polarity of each pixel with respect to the reference signal potential is, for example, +-
++ − +, for example, there is a problem that the pixels C and D have the same polarity. Therefore, it is desirable to use the following four pixels or the two pixels previously described. The following four liquid crystal display devices are more desirable.

FIG. 14A shows a case where C is used as the scanning line side common line.
This is an example in which four lines 1, 1, C2, C3, and C10 are formed, and FIG. 14B is an example without the ASCL.

As a result, the polarities of the pixels in the extending direction of the video signal line can be made opposite to each other as described above, and an inspection closer to the actual use state can be performed, and the inspection accuracy is improved.

Next, the signal line side common line will be described.

FIG. 15A shows a signal line side common line C
This is an example in which three lines 4, C6 and C8 are formed.

As described in the above solution, the present invention is characterized in that the signal common line is separated at least for each color of the color filter, thereby reducing the probe cost by reducing the number of test pads. The present invention realizes inspection by displaying colors while enabling inspection with high-definition products.

As a test pattern, if the color filters are red, green, and blue, white display by simultaneous lighting of each color is, of course, individual inspection of red, green, and blue by lighting each color, and furthermore, By controlling the gradation and lighting, it becomes possible to inspect almost all colors displayed on the product.

Of course, the colors are not limited to red, green, and blue, but may be cyan (yellow-green), magenta (purple), and yellow (yellow).
The same applies to a liquid crystal display device using a so-called complementary color filter using three colors. In this regard, the present invention and the entire specification are common.

According to the present invention, the inspection of the color purity of each color can be performed, and the inspection accuracy of the display unevenness is greatly improved with respect to the liquid crystal display device which can perform the inspection only for all the colors simultaneously. Color filters are individually applied, exposed,
It is formed by developing or impregnating individual colors.

Therefore, for each color, in-plane uniformity of color density or in-plane distribution of film thickness occurs. If each color is lit simultaneously, these effects are usually less visible. For example, if only the red film thickness changes locally, the effect of the local change in the red film thickness on the brightness when all three colors of red, green, and blue are lit simultaneously is about It becomes 1/3. Therefore, if all the colors are simultaneously turned on, the inspection sensitivity for luminance unevenness, particularly for color unevenness, is reduced.

FIG. 15B shows an example having no ASCL. Similar to the case where the scanning-side common line of FIG. 12B has a constant static electricity suppressing effect, this configuration also has a constant static electricity suppressing effect. And reduce man-hours.

FIG. 16 (a) shows a signal line side common line C
This is an example in which six lines of 4, C5, C6, C7, C8, and C9 are formed. This configuration is characterized in that a signal-side common line is separated at least for each color of the color filter and for the positive electrode and the negative electrode. That is, there are six signal-side common lines for three color filters of red, green, and blue.

As a driving method of the liquid crystal display device, two types of common inversion driving and dot inversion driving are widely known. In the common inversion drive, pixels adjacent to each other in the normal scanning signal line extending direction have the same polarity with respect to the reference signal potential, so that at least three signal-side common lines are required as described above.

In the dot inversion driving, however, the pixels adjacent to each other in the scanning signal line extending direction are generally driven with a polarity opposite to the reference signal potential. For this reason, when there are three signal-side common lines due to dot inversion, for example, considering six pixels of RGBRGB adjacent in the scanning line extending direction, the polarity is, for example, +-++++- Polarity reversal cannot be realized.

For this reason, it is difficult to accurately check for flicker, that is, flickering of the screen in the lighting test. Therefore, by using six signal-side common lines for each color of the color filter and for the positive electrode and the negative electrode, RGBRGB
The polarities of the six pixels are set to, for example, +-++-+-and reversed between the pixels, thereby improving the flicker inspection accuracy.

FIG. 12 showing the configuration of the scanning line side common line,
13 and 14, and FIG. 1 showing the configuration of the signal line side common line.
5 and FIG. 16 are combined to realize both effects.

Next, LCT1 in each of FIGS.
The cutting of LCT2 will be described.

FIG. 17A shows an example of the case of the TCP system. ASCL is formed inside the substrate edge and is electrically connected to the scanning signal line.

In the stage before the inspection, ASCL
And each scanning signal line. This is to perform inspection for each color. This is because a single-color inspection cannot be performed since each scanning signal line is connected via the scanning-line-side signal line when connected to the ASCL.

The separation may be performed by a method using a laser beam, a method using etching, or a method that cuts the substrate in an approximate area. Since the position accuracy is the highest in the method using a laser beam, the distance between the scanning-side signal line and the ASCL can be reduced, and the area of the mother glass substrate can be used effectively, and a larger product can be realized from the same substrate. It has the advantage that.

In the etching method, it is possible to process a large number of substrates simultaneously in an etching solution.
In this case, a structure that exposes a layer to be separated in advance in a region to be separated is necessary, and it is desirable that the conductive layer be a single layer in that portion.

For example, if the terminal portion is formed by covering with a single layer of a transparent conductive material such as ITO or the like, and the etching portion is formed of metal, and the two portions have different etching solutions, the terminal portion may be erroneously formed. Such adverse effects can be prevented. However, a larger area is required than the method using a laser beam.

In the method of cutting the substrate itself, a method of forming a groove with a scribing blade or a laser beam, and then applying pressure to divide the substrate in an approximate area is used. In this case, since they are completely separated physically, the risk of insufficient separation can be minimized.

However, there may be a case where an area which should not be cut at the time of cutting, for example, a scan line side common line is cut. Which method is used mainly depends on the configuration of the production line. However, from the viewpoint of maximizing profit, it is most effective to maximize the number or size of products that can be obtained from one mother glass, and it is appropriate to use a laser cutting method for this purpose.

In a configuration in which the ASCL and the scanning signal line are separated in advance, this step is unnecessary. However, although a certain static electricity suppressing effect is obtained by the scanning line side common line, there is the ASCL for completeness. Is more desirable.

After the separation, the inspection probe PB is brought into contact with the scanning line side inspection terminal GLTP provided to be connected to the scanning line side common line, and an inspection signal is input to perform the inspection. Those which are determined to be defective in this inspection are, for example, those which can be made non-defective by correction with a laser beam or the like, go to the correction process, and then inspect again, and if the defect is corrected, the liquid crystal display element is treated as non-defective Therefore, the defective rate can be reduced.

Here, it is very significant that the present invention is compatible with monochrome inspection. That is, a continuous point defect or the like of two adjacent pixels cannot be detected when only all colors can be lit simultaneously. For example, if a red pixel and a neighboring green pixel are short-circuited, it is determined that there is no abnormality in simultaneous lighting of all colors.

On the other hand, in the single color inspection, when red light is turned on, not only the red pixel but also the adjacent green pixel is turned on at the same time, and it is determined as a defect as a bright spot defect.

If a defect can be determined in this step, for example, by cutting the short-circuited portion between the red and green pixels with a laser beam, the defect can be corrected and a non-defective product can be obtained.
However, if only all-color simultaneous lighting inspection can be performed, this defect is not detected until it is connected to a driving circuit thereafter.

To correct at this stage, it is necessary to remove the polarizing plate once after the polarizing plate is attached, and even if it is not necessary, the drive circuit is destroyed during the transportation process to the correction device, the correction work, etc. In each case, the cost of the correction increases. Alternatively, other defects such as a gap defect are induced in the correction process, and the rate of failure in the correction increases. Therefore, the fact that a single-color inspection is supported at the cell stage has a great significance in terms of yield and cost.

The board determined to be non-defective by the inspection is then separated by the LCT2 between the scanning line side common lines C1, C2, C3 and the TCP connection pad TCPD. This separation is performed by physically cutting the substrate itself. Therefore, LCT2 becomes one end of the substrate in the state of the product on this side. Thereafter, as shown in FIG. 17B, the TCP is mounted, and the external drive circuit and the scanning signal line are connected.

The above description relates to the scanning signal line side. FIG. 18A shows a diagram corresponding to FIG. 17A and FIG. 18B shows a diagram corresponding to FIG.
(B). The basic steps and ideas are the same.

As can be seen from FIG. 17 (b) or FIG. 18 (b), in the state where the liquid crystal display device is completed in the TCP mode, the configuration for performing the inspection by the method or idea disclosed in the present invention is applied. It is possible to configure so as not to remain even if it is performed.

However, the present invention discloses a liquid crystal display device according to the above-described method or a method of manufacturing a liquid crystal display device according to the above-described method, and applies the method or idea disclosed in the present invention without remaining as a component in a product. TC manufactured
A P-mode liquid crystal display device is also an object of the present application.

Although FIGS. 17 and 18 illustrate the TCP method as an example, the difference in the FCA method is that either laser beam or etching is used instead of physical cutting of the substrate for separation in LCT1 or LCT2. It is almost the same except for the point. However, in the case of the FCA method, for example, as shown in FIG. 3, even when the liquid crystal display device is completed, at least a part of the common line remains on a part of the substrate, so that the technique or idea disclosed in the present invention is applied. There is a difference that it is relatively easy to determine whether or not the device is manufactured.

Next, a method of arranging the test pads will be described by taking as an example a case where three common lines are provided on the scanning signal line lead-out side of the FCA. The basic concept is the same in the case of TCP. The same concept can be applied even if the number of common lines is different.

FIG. 19A shows an example in which the inspection pad GLTP on the gate driver side is provided on one side for one chip GDR or one area where terminals are gathered in the case of TCP. Easy to manufacture.

Next, FIG. 19B shows an example in which the test pads GLTP are provided alternately, and the size of each test pad GLTP can be increased, the positioning of the probe PB can be easily performed, and the test time can be shortened.

FIG. 19C shows an example in which the inspection pad PB is provided in an area different from the area where the scanning line side common line is drawn out.
The degree of freedom of design increases in both arrangement and size.

FIG. 19D shows an example provided on both sides, in which the waveform of the inspection signal supplied from the scanning line side common line to the scanning line can be suppressed, and an inspection closer to the actual driving state can be realized. I do.

The idea on the video signal line drawing side is the same as that on the scanning signal line drawing side. FIG. 20 shows an example in which the number of signal line side common lines is six. FIG. 20A shows an example in which an inspection pad PB is formed on one side. FIG. 20 (b)
Is an example of pulling out alternately on both sides.

Since the number of PBs is large, the merit on the positioning accuracy by enlarging the size of the PBs is greater than in the case of FIG. FIG. 20C shows an example in which a PB is constituted by a positive electrode and a negative electrode. FIG. 20D shows an example in which both sides are configured.

Next, in the case of FCA, a plurality of chip mounting areas, and in the case of TCP,
Some examples of the arrangement of the PBs in a plurality of areas will be described, taking the scanning line side area in FCA as an example. Needless to say, the same idea can be applied to the case where the number of common lines is different and the same idea can be applied to the drain side.

FIG. 21A shows an example in which gate driver side inspection pads GLTP are arranged on both sides of each scanning drive IC mounting area GDR. In this case, the power supply resistance can be minimized, and an inspection in a state closer to actual driving can be realized.

FIG. 21 (b) shows a GL in a plurality of GDR units.
This is an example in which a TP is provided. In this case, since the number of probes can be reduced, the manufacturing cost of the probes can be reduced.

FIG. 21C shows an example in which GLTPs are alternately provided for a plurality of signal line side common lines among a plurality of GDRs. In this case, the probe cost is reduced and G per probe is reduced.
The area of LTP can be increased.

FIG. 21D shows that GLTP is formed in a region outside the signal line side common line forming region. This increases the degree of freedom in design and facilitates positioning of the probe. In this configuration, the GLTP is arranged so that the pitch is the same with respect to one end surface on the substrate between multiple products having different terminal pitches, so that the probe can be shared between the products and the number of inspection devices can be reduced. Cost reduction is also realized.

FIG. 21 (e) shows a change in the routing from one end of the GDR signal line side common line to GLTP.
In the configuration of FIG. 21D, only one of the outermost
The arrangement of the terminals inside is reversed with respect to other parts. FIG.
This can be prevented by the configuration of (e), which is particularly effective in realizing a probe applicable to various kinds.

Alternatively, FIG. 21 (d) shows a case where the GLTP itself, which is the reverse of the other parts, is removed.
1 (f), an effect similar to that of FIG.
In addition, although the number of probes can be reduced, since the GDR is supplied with a signal from one side, there is a problem that the inspection accuracy of the pixel area related to the GDR is relatively reduced as compared with the other areas, particularly with respect to flicker.

Next, a further example and idea will be described taking the drain as an example.

FIG. 22A shows a signal drive IC mounting area DD.
9 shows an example of a drain driver side inspection pad for R. DLTPs are arranged so as to be shifted from each other between DDRs.

As a result, each test pad DL
The area of the TP can be increased, and the PB can be easily positioned.

The DLTP on the end face of FIG. 22B has the same arrangement. In this case, since a probe unit can be configured by configuring a plurality of probes having the same configuration, the production cost of the probe can be reduced.

FIG. 22 (c) is obtained by adding the idea of alternately configuring DLTP for each common line on the signal line side to the configuration of FIG. 22 (b), and the DLTP per unit can be further expanded. In particular, the number on the drain side is larger than that on the gate side,
Further, since the increase amount is larger than the increase amount of the aspect ratio of the liquid crystal display device, the interval between the chips becomes narrower than the gate side.

Therefore, in some cases, it is difficult to secure a sufficient area for forming the DLTP. Even in such a case, the arrangement of the DLTP can be made possible by the configuration shown in FIG. FIG. 22D shows FIG.
This is based on the same concept as (d), in which the DLTP is formed in a region outside the scanning line side line side common line forming region.

According to the same concept as that shown in FIG.
FIG. 22E shows a configuration in which the LTP has been removed. FIG.
(F) is based on the same idea as in FIG. 21 (e).

As described in the means for solving the above problems, the inspection accuracy of flicker is affected by a minute voltage difference between pixels, and therefore, it is necessary to suppress a delay of a signal waveform at the time of inspection.

Therefore, when the number of test pads for inputting test signals to the signal line side common line is n in units of chip mounting area or signal wiring consolidation area, the number of test pads is (n−n) for each signal line. 1) It is desirable to provide two or more. In order to suppress an increase in probe cost,
× (n + 1) or less is desirable. The various examples described above are also disclosed with this concept.

It is desirable that the number of inspection signal terminals for inputting inspection signals to the scanning signal lines be larger than the number of inspection signal terminals for inputting inspection signals to the video signal lines. This is because the input frequency of the inspection signal that needs to be applied to the video signal line during inspection is
It is necessary for the above-described configuration to perform the inspection with the input frequency of the inspection signal that needs to be applied to the scanning signal line or higher. Therefore, it is a request to reduce the input resistance on the video signal line side.

The input resistance of the test signal can be reduced by reducing the signal line side common line, the wiring between the signal line side and the test pad, the scan line side common line, or the scan line side common line and the test pad. By providing a region formed by the wiring layer having the lowest resistance in the liquid crystal display device, the effect of lowering the resistance can be achieved.

Next, an example in which the number of test pads is further reduced will be described. Although the gate side will be described as an example, the same idea can be applied to the drain side, and the same idea can be applied to TCP. As a representative thereof, the gate side of the FCA will be described as an example.

FIG. 23 shows an example in which each lead line is connected to another common line by a lead line drawn from the signal line side common line, and GLTP is formed at least at one end. This makes it possible to reduce the number of GLTPs to the number of scanning line side common lines on the gate side and the number of signal line side common lines on the drain side.

Therefore, not only can the probe cost be significantly reduced, but also the positioning can be facilitated, so that the inspection time can be reduced.

However, in this configuration, the deterioration of the waveform delay due to the influence of the wiring resistance is inevitable as compared with the case where a large number of GLTPs are provided. In order to suppress the influence, the other common line is made of the material layer having the lowest resistance in the liquid crystal display device, or even if the same material is used, the line width is widened so that the resistance is lower than the wiring in the pixel. It is desirable that at least a part of the layer be provided.

Next, a method for more efficiently cutting the LCT 1, in particular, a concept of a structure that can be efficiently performed when laser cutting is performed will be described together with one example.

FIG. 24A shows LCT1 in FIG.
Before the connection is cut by the above, it is in a state of being connected to the ASCL. The separation by the laser beam is usually performed by fixing the optical system of the laser beam and moving the substrate. This is because the optical system related to the laser beam is precise, so if you move it frequently, the optical system will shift,
This is because there is a risk that the optical axis of the laser beam is displaced and the outside of a predetermined area is divided.

In addition, since the repair at that time is also time-consuming because of its precision, the laser beam is fixed, and instead moves on the substrate side. At this time, the time required for division can be shortened as there is more room between the region to be cut and the region not to be cut. This is because, since the movement is performed by a mechanical mechanism, when the substrate is moved quickly, the displacement due to the movement is likely to increase.

Therefore, by forming the LCT1 area outside the chip area, the margin area can be expanded, so that the time required for cutting by the laser beam can be reduced by that amount, and the throughput, the yield, and the cost can be improved.
Further, by forming the cutting region on a straight line, higher speed can be realized.

FIG. 24B is an example in which the number of GLTPs is reduced as shown in FIG. Since the length of the region to be cut can be reduced, the time can be significantly reduced. FIG. 24C shows another example of the GLTP position shown in FIG.

FIG. 24D shows the concept of FIG. 23 applied to both the scanning line side and the gate line side.
This is an example in which LTPs are centrally arranged. This can further reduce the time. In particular, when the structure is concentrated on one end of the substrate, only one-dimensional cutting is performed on the entire substrate by LCT.
Since 1 can be separated, the alignment of the substrate for laser cutting only needs to be performed once, and the time can be further reduced.

The configuration in which the inspection pads are concentrated on one side as described above has many advantages, such as easy creation of a probe common to a wide variety of products as shown in FIG. 2 and easy positioning of the probe. .

Next, the concept of the signal waveform at the time of inspection will be described with examples. FIG. 25 shows that the signal line side common line on the drain side is R
This is an example of a case where there is one GB color and two scanning line common lines. The following describes an example of dot inversion driving.

FIG. 25A shows the concept of the drive waveform, and FIG.
(B) and FIG. 25 (c) show the RGB in the first frame and the second frame and the polarities of six pixels composed of the first and second scanning lines with respect to the reference potential Vcom. It is.

As is apparent from a comparison between FIGS. 25B and 25C, in this configuration, a potential of the same polarity is always applied to the pixel, and the liquid crystal deteriorates.

FIG. 26 shows a waveform for inspection to cope with this. As shown in FIG. 26A, the frequency of the signal input to the video signal line is １ ／ of that in FIG. 25A. Thereby, as shown in FIGS. 26 (b) and 26 (c), the polarities of the pixels can be inverted in the first frame and the second frame, and it is possible to prevent DC from being applied to the liquid crystal.

FIG. 27 shows a case where two positive and negative electrodes are formed for each of the RGB as common lines on the signal line side on the drain side, for a total of six lines.

In this configuration, the potentials of the pixels in the first frame and the second frame shown in FIGS. 27B and 27C are inverted each other for each frame, and always inverted between adjacent pixels. Dot inversion drive state can be realized. As a result, flicker inspection can be realized with high accuracy close to the actual use state.

FIG. 28 shows an example of the common inversion.

In this case, the signal line side common line is one for each of RGB.
If there are two scanning lines and two common lines on the scanning line side, FIG.
As shown in FIG. 8C, the first frame and the second frame are respectively shown, and the line inversion drive is realized. Therefore, in the case of common inversion, if there are three signal line side common lines and two scanning line side common lines, flicker inspection can be realized with high accuracy close to the actual use state.

FIG. 29 shows an example in which the configuration shown in FIG. 27 has three scanning line side common lines.

In this case, as described above with respect to Cadd, since driving can be performed with three lines of the former stage, the own stage, and the latter stage, it is possible to inspect the influence of the jump voltage at the TFT as a state closer to the product. However, since the polarity is the same between GA and GC, there is a disadvantage that complete dot inversion is not achieved.

FIG. 30 shows another method of preventing direct current from being applied to the pixel, which is an adverse effect of FIG. 25, and has the same effect as that of FIG. Note that the effect of this item can be achieved with one RGB component. Further, if two components are provided for each of the RGB components, one for the positive electrode and the other for the negative electrode, flicker countermeasures can be realized at the same time.

In this configuration, as shown in FIG. 30A, the frequency of the video signal line is configured earlier than in the case of FIG.
By writing voltages to the pixels by setting GA and GB to high at the timing when signals of opposite polarities are applied to the first frame and the second frame, the first frame and the second frame are respectively shown in FIGS. As shown in the frame, superimposition of direct current is prevented.

FIG. 31 shows an inspection waveform which is considered to be most desirable for dot inversion driving in consideration of inspection accuracy, probe cost, frame area reduction, etc. The drain-side signal line common line has a positive polarity for each of RGB colors. Use, 2 for negative electrode
And a total of six.

Further, the scanning line side common line on the gate side is composed of four lines, so that the relationship between the former stage, the own stage, and the latter stage can be always maintained, and the flicker can be suppressed. The drive waveform is shown in FIG.
Shown in

As a result, the polarities of the pixels in the first frame and the second frame are changed to those shown in FIGS.
As shown in (c), dot inversion driving in which the polarity is inverted between adjacent pixels can be realized. Of course, there is no problem if used for common inversion.

A liquid crystal display device having a common line capable of realizing an inspection using such a waveform, or an inspection method,
In the dot inversion drive, it is possible to realize a sufficient inspection while reducing the number of inspection pads and corresponding to high definition.

Further, by forming the probe in a form corresponding to the present configuration, the probe can be applied not only to dot inversion but also to common inversion, and a highly versatile inspection apparatus can be obtained.

[0208]

As described above, according to the present invention,
The width and length of the test pad connected to the signal line lead line of the liquid crystal display device that connects the drain driver and gate driver,
Since it is possible to increase the pitch, it is easy to manufacture a probe for a disconnection inspection and a lighting inspection even when the above-described driver of high definition display is used. In addition, since the contact between the probe and the test pad can be made highly accurate, the test accuracy is improved, and a highly reliable liquid crystal display device can be provided.

[Brief description of the drawings]

FIG. 1 is a plan view illustrating an embodiment of a liquid crystal display device according to the present invention.

FIG. 2 is an enlarged view of a main part for describing in detail a test pad formation region TTP of FIG. 1;

FIG. 3 is a schematic diagram for explaining main wiring of one embodiment of the liquid crystal display device according to the present invention.

FIG. 4 is a waveform diagram illustrating an example of a test signal applied to a drain test pad and a gate test pad in a lighting test of one embodiment of the liquid crystal display device according to the present invention.

FIG. 5 is a schematic diagram illustrating a main part wiring of another embodiment of the liquid crystal display device according to the present invention.

FIG. 6 is a block diagram illustrating a configuration of a drive system of a general active matrix type liquid crystal display device to which the present invention is applied.

FIG. 7 is a block diagram showing a schematic configuration of each driver of the liquid crystal panel and a signal flow.

FIG. 8 is a timing chart showing display data input from a signal source (main body) to a display control device and signals output from the display control device to a drain driver and a gate driver.

FIG. 9 is an external view showing an example of a display monitor as an electronic device on which the liquid crystal display device according to the present invention is mounted.

FIG. 10 is a perspective view illustrating a main part of an FCA mounting type liquid crystal display device.

FIG. 11 is a diagram illustrating the arrangement of test terminals in a conventional liquid crystal display device.

FIG. 12 is a schematic diagram for explaining main wiring of one embodiment of the liquid crystal display device according to the present invention.

FIG. 13 is a schematic diagram for explaining main wiring of one embodiment of the liquid crystal display device according to the present invention.

FIG. 14 is a schematic diagram illustrating a main part wiring of one embodiment of the liquid crystal display device according to the present invention.

FIG. 15 is a schematic diagram for explaining main wiring of one embodiment of the liquid crystal display device according to the present invention.

FIG. 16 is a schematic diagram for explaining main wiring of one embodiment of the liquid crystal display device according to the present invention.

FIG. 17 is a schematic diagram for explaining main wiring of one embodiment of a liquid crystal display device according to the present invention.

FIG. 18 is a schematic diagram for explaining main wiring of one embodiment of the liquid crystal display device according to the present invention.

FIG. 19 is a schematic view illustrating the arrangement of test pads in one embodiment of the liquid crystal display device according to the present invention.

FIG. 20 is a schematic diagram illustrating the arrangement of test pads in one embodiment of the liquid crystal display device according to the present invention.

FIG. 21 is a schematic diagram illustrating the arrangement of test pads in one embodiment of the liquid crystal display device according to the present invention.

FIG. 22 is a schematic diagram illustrating the arrangement of test pads in one embodiment of the liquid crystal display device according to the present invention.

FIG. 23 is a schematic view illustrating the arrangement of test pads in a liquid crystal display device according to an embodiment of the present invention.

FIG. 24 is a schematic diagram illustrating the arrangement of test pads in one embodiment of the liquid crystal display device according to the present invention.

FIG. 25 is a schematic diagram illustrating a test signal of one embodiment of the liquid crystal display device according to the present invention.

FIG. 26 is a schematic diagram illustrating a test signal of one embodiment of the liquid crystal display device according to the present invention.

FIG. 27 is a schematic diagram illustrating a test signal of one embodiment of the liquid crystal display device according to the present invention.

FIG. 28 is a schematic diagram illustrating a test signal of one embodiment of the liquid crystal display device according to the present invention.

FIG. 29 is a schematic diagram illustrating a test signal of one embodiment of the liquid crystal display device according to the present invention.

FIG. 30 is a schematic diagram illustrating a test signal of one embodiment of the liquid crystal display device according to the present invention.

FIG. 31 is a schematic diagram illustrating a test signal of one embodiment of the liquid crystal display device according to the present invention.

[Explanation of symbols]

SUB1 One substrate SUB2 The other substrate GDR Scan driver IC (gate driver) and its mounting position DDR Signal driver IC (drain driver) and its mounting position TTP Inspection pad formation region CTL Cutting line GLTP Inspection pad on gate driver DLTP Drain driver Inspection pad on the side Vcom Inspection pad for lead wire of counter electrode PB probe GTM Gate driver output terminal (Gate wire lead terminal) DTM Drain driver output terminal TTA Gate driver input terminal TTB Drain driver input terminal ASCL Static electricity suppression common line C1, C2, C3, C10 Scan line side common line GLTP (GA, GB, GC, GD) Inspection pads formed on scan line side common lines C1, C2, C3, C10 LCT1, LCT2 Cutting lines C4, C5, C6 C7, C8, C9 signal line side common line.

 ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Ryoichi Otsu 3300 Hayano, Mobara City, Chiba Prefecture Within Hitachi, Ltd. Display Group (72) Inventor Kazushi Miyata 3300 Hayano, Mobara City, Chiba Prefecture, Hitachi, Ltd. (72) Inventor Susumu Niwa 3300 Hayano, Mobara City, Chiba Prefecture Within the Hitachi Display Group (72) Inventor Shinichi Tsuruoka 3681 Hayano, Mobara City, Chiba Prefecture Hitachi Device Engineering Co., Ltd.

Claims (31)

[Claims] A first substrate having a thin film transistor arranged in a matrix, a pixel electrode driven by the thin film transistor, a scanning line for supplying a voltage signal for forming a pixel to the thin film transistor, and a signal line;
A liquid crystal layer is sandwiched in a bonding gap of the other substrate having a color filter, and a scanning line lead terminal is provided around one of the substrates, a signal line lead terminal is provided around the other substrate, and the scanning of the liquid crystal panel is performed. An output terminal is connected to each of the line lead terminal and the signal line lead terminal, and a scanning line driving IC mounting area and a signal line driving IC mounting area for directly mounting the scanning line driving IC and the signal line driving IC on the one substrate are provided. A liquid crystal display device having, in a cutting and removing area, an electrostatic suppression common line that connects the scanning line extraction terminal and the signal line extraction terminal in common, wherein the signal line extraction terminal is connected to the electrostatic suppression common line. In the signal line drive IC mounting area, the signal line lead terminals were connected together to six systems of a red positive electrode, a red negative electrode, a green positive electrode, a green negative electrode, a blue positive electrode, and a blue negative electrode. A liquid crystal comprising: a plurality of signal line common lines; and an inspection pad connected to the six signal line common lines on the one substrate outside the signal line driving IC mounting area. Display device. 2. The liquid crystal display device according to claim 1, wherein the test pads for the six signal line-side common lines are arranged in the cut-off region of the one substrate. 3. One substrate having a thin film transistor arranged in a matrix, a pixel electrode driven by the thin film transistor, a scanning line for supplying a voltage signal for forming a pixel to the thin film transistor, and a signal line;
A liquid crystal layer is sandwiched in a bonding gap of the other substrate having a color filter, and a scanning line lead terminal is provided around one of the substrates, a signal line lead terminal is provided around the other substrate, and the scanning of the liquid crystal panel is performed. An output terminal is connected to each of the line lead terminal and the signal line lead terminal, and a scanning line driving IC mounting area and a signal line driving IC mounting area for directly mounting the scanning line driving IC and the signal line driving IC on the one substrate are provided. A liquid crystal display device having, in a substrate cutting and removing region, an electrostatic suppression common line that connects the scanning line extraction terminal and the signal line extraction terminal in common, wherein the scanning line extraction terminal is connected to the electrostatic suppression common line. In the scanning line driving IC mounting area, the scanning signal line lead-out terminals were connected to three systems of a preceding stage, a next stage, and a succeeding stage, or to four systems for changing the polarity for each dot. Alternatively, four scanning line side common lines are provided, and in the signal line driving IC mounting area of the signal line drawing terminal connected to the static electricity suppressing common line, the signal line drawing terminal is connected to a red positive electrode, a red negative electrode, and green. 6 common lines connected together in 6 systems of a positive electrode, a green negative electrode, a blue positive electrode, and a blue negative electrode, deviating from the scanning line driving IC mounting area and the signal line driving IC mounting area. A liquid crystal display device, wherein the one of the above-mentioned ones is provided on a substrate with test pads on each of the three to four scanning line side common lines and the six signal line side common lines. 4. The inspection pad for the three or four scanning line side common lines and the six signal line side common lines is arranged in a cut-off area of the one substrate. Liquid crystal display device. 5. The three or four scanning line side common lines and the six
4. The liquid crystal display device according to claim 3, wherein the test pads for the signal line-side common lines are arranged at equal intervals in the cut-off area of the one substrate. 6. The device according to claim 1, further comprising a counter electrode on the other substrate,
Alternatively, the inspection pads for the four scanning line-side common lines and the six signal line-side common lines are arranged in the cut-off area of the one substrate, and the inspection pads for connecting to the lead lines of the counter electrode are arranged in the above-mentioned 3 or 4. The liquid crystal display device according to claim 3, wherein the inspection pads for the four scanning line side common lines and the six signal line side common lines are arranged together. 7. The method according to claim 7, wherein the one substrate has a counter electrode,
Alternatively, the inspection pads for the four scanning line-side common lines and the six signal line-side common lines are arranged in the cut-off area of the one substrate, and the inspection pads for connecting to the lead lines of the counter electrode are arranged in the above-mentioned 3 or 4. The liquid crystal display device according to claim 3, wherein the inspection pads for the four scanning line side common lines and the six signal line side common lines are arranged together. 8. A liquid crystal material layer is provided between a pair of substrates disposed opposite to each other, and one of the substrates or the other substrate is provided with a first color, a second color, and a third color. One of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix, and adjacent one of the plurality of video signal lines. And two
It has a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of scanning signal lines, and each pixel region has at least one thin film transistor. 1st, 2nd or 3rd
A pixel electrode to which a voltage for controlling the display of any one of the colors is input, and the video signal line is integrated with or separated from a region of the one substrate that extends outside the liquid crystal layer. In a liquid crystal display device having a signal line lead terminal at least around one of the substrates, a first signal line common line and a second
A signal line common line, and a third signal line common line, wherein the first signal line common line is provided integrally or separately from the video signal line related to the display of the first color. The second signal line common line is connected to the video signal line lead-out terminal provided integrally with or separated from the video signal line related to the display of the second color, and the third signal line common line is connected to the second signal line common line. A liquid crystal display device having a configuration in which the video signal line is connected to the video signal line lead terminal provided integrally or separately from the video signal line related to the display of the third color. 9. A liquid crystal material layer is provided between a pair of substrates opposed to each other, and a first substrate or a first substrate is provided on one of the substrates.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, A liquid crystal display device, wherein the video signal line is integrated with or separated from a region of the one substrate extending outside the liquid crystal layer, and has a video signal line lead-out terminal on at least one periphery of the substrate; The first signal line common line, the second
, A third signal line common line, a fourth signal line common line, a fifth signal line common line, and a sixth signal line common line, and the first signal line common line is One of the video signal lines related to the display of one color is connected to the video signal line lead-out terminal provided integrally or separately from the other, and a second signal line common line is related to the display of the second color. The video signal line is connected to the video signal line lead-out terminal provided integrally or apart from one of adjacent video signal lines, and the third signal line common line is one of the video signal lines related to the display of the third color. The fourth signal line common line is connected to the adjacent one of the video signal lines related to the display of the first color. To the video signal line lead-out terminal provided separately. It is continued, fifth
Is connected to the video signal line lead-out terminal provided integrally or separately from the other of the video signal lines related to the display of the second color, and the sixth signal line common line is A liquid crystal display device having a configuration connected to the video signal line lead-out terminal provided integrally with or separated from the other of the video signal lines related to the display of the third color. 10. A liquid crystal material layer is provided between a pair of substrates disposed opposite to each other, and a first substrate is provided on one of the substrates or the other substrate.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, A liquid crystal display device, wherein the scanning signal line is integrated with or separated from a region of the one substrate extending outside the liquid crystal layer and has a scanning signal line lead-out terminal on at least one periphery of the substrate; Two, three or four on top
The signal line common line is connected to one of the scanning signal line lead-out terminals provided integrally with or separated from the scanning signal line, and adjacent signal line common lines are connected to each other. A liquid crystal display device, wherein the liquid crystal display device is connected to different scanning signal line lead terminals of adjacent scanning signal lines. 11. A signal line driving I / O for at least one of said video signal line and said scanning signal line on said one substrate.
C in the area where the driving IC is mounted,
11. The liquid crystal display device according to claim 8, wherein the signal line common line is connected to the video signal line lead terminal or the scanning signal line lead terminal. 12. The liquid crystal display device according to claim 8, wherein the signal line common line has a test pad in a region outside a region where the driving IC is mounted. 13. The liquid crystal display device according to claim 8, wherein one end of said signal line common line extends to near an end surface of said one substrate. 14. The method according to claim 1, wherein the plurality of regions provided with the inspection pads are provided, and the arrangement of the inspection pads is substantially equal between the regions provided with at least two inspection pads. Item 13. The liquid crystal display device according to item 12. 15. The liquid crystal display device according to claim 12, wherein regions where the inspection pads are provided are arranged at substantially equal intervals. 16. The method according to claim 16, wherein the test pad is substantially the drive I.
When the number of regions provided in C units and the pads for inspection are provided is n for the number of driving ICs,
16. The liquid crystal display device according to claim 12, wherein the number is (n-1) / 2 or more and 2 × (n + 1) or less. 17. The video signal line or the scanning signal line is separated from the video signal line lead-out terminal or the scanning signal line lead-out terminal, and the separation is performed by laser or etching. Characterized by being cut off,
The liquid crystal display device according to claim 8. 18. The liquid crystal display device according to claim 8, wherein the first color, the second color, and the third color are red, green, and blue, respectively. 19. The liquid crystal display device according to claim 8, wherein the first color, the second color, and the third color are blue-green, purple, and yellow, respectively. 20. The liquid crystal display device according to claim 8, wherein a reference electrode and a reference signal lead-out line are provided on said one substrate. 21. A semiconductor device comprising: a reference electrode and a reference signal lead-out line on the one substrate; and a pad connected to the reference signal lead-out line arranged near the inspection pad. The liquid crystal display according to claim 12. 22. A liquid crystal display device according to claim 8, wherein a reference electrode is provided on said other substrate, and a reference signal lead-out wiring is provided on said one substrate. 23. A reference electrode is provided on the other substrate, a reference signal lead-out line is provided on the one substrate, and a pad connected to the reference signal lead-out line is arranged near the inspection pad. 18. The liquid crystal display device according to claim 12, wherein: 24. A liquid crystal material layer is provided between a pair of substrates arranged opposite to each other, and a first substrate or a first substrate is provided on one of the substrates.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, In a liquid crystal display device, wherein the video signal line has a connection terminal area for connecting to an external drive circuit outside the liquid crystal layer of the one substrate, a first signal line is provided at least far from the connection terminal area on the one substrate. Common line, 2nd signal line common line, 3rd signal line common The first signal line common line is connected to a video signal line related to the display of the first color at a distance beyond the connection terminal area, and the second signal line common line is connected to the second color. The third signal line common line is connected to the video signal line related to the display of the third color and the video signal line related to display of the third color beyond the connection terminal region. The first, second, and third signal line common lines are connected to test pads, respectively, and a lighting test of the liquid crystal display device is performed by inputting a test signal to the pads. A liquid crystal display device formed by cutting and removing a region where is formed. 25. A liquid crystal material layer is provided between a pair of substrates arranged opposite to each other, and a first substrate or a second substrate is provided on one of the substrates.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, In the liquid crystal display device, wherein the video signal line has a terminal area for connection to an external drive circuit outside the liquid crystal layer of the one substrate, a first signal line common line on at least the one substrate, a second signal line
, A third signal line common line, a fourth signal line common line, a fifth signal line common line, and a sixth signal line common line, and the first signal line common line is The second signal line common line is connected to an adjacent one of the video signal lines related to the display of the first color beyond the connection terminal area, and the second signal line common line is one of the video signal lines related to the display of the second color. And the third signal line common line is connected to the adjacent one of the video signal lines related to the display of the third color and further than the connection terminal region. The fourth signal line common line is connected to the adjacent other of the video signal lines related to the display of the first color beyond the connection terminal area, and the fifth signal line common line Is connected to the other adjacent one of the video signal lines related to the display of the second color at a distance beyond the connection terminal area. The sixth signal line common line is connected to an adjacent one of the video signal lines related to the display of the third color at a distance beyond the connection terminal area, and the first, second, third, and Fourth, fifth, and sixth signal line common lines are connected to test pads, respectively, and a signal for test is input to the pads to perform a lighting test on the liquid crystal display device. A liquid crystal display device formed by cutting and removing a formed region. 26. A liquid crystal material layer is provided between a pair of substrates disposed opposite to each other, and a first substrate or a first substrate is provided on one of the substrates.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, In the method for manufacturing a liquid crystal display device having a terminal area for connection to an external drive circuit outside the liquid crystal layer of the one substrate, the scanning signal lines may include at least two, three or four scanning signal lines on the one substrate.
The signal line common line is connected to any of the scanning signal lines beyond the connection terminal area, and adjacent signal line common lines are different from each other in adjacent scanning signal lines. The signal line common line is connected to a test pad, and a lighting signal of the liquid crystal display device is tested by inputting a test signal to the pad. A liquid crystal display device formed by cutting and removing a region where a line is formed. 27. A liquid crystal display device according to claim 24, wherein said external drive circuit is a driver IC mounted on a TCP. 28. A liquid crystal display device having a liquid crystal material layer between a pair of substrates disposed opposite to each other, wherein one of the substrates or the other substrate has a first liquid crystal material layer.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, In the method for manufacturing a liquid crystal display device, wherein the video signal line has a connection terminal region with an external drive circuit outside the liquid crystal layer of the one substrate, Signal line common line, second signal line common line, third signal line The first signal line common line is connected to the video signal line related to the display of the first color at a distance beyond the connection terminal area, and the second signal line common line is the second signal line common line. The third signal line common line is connected to the video signal line related to the display of the third color and the video signal line related to the display of the third color beyond the connection terminal region. The first, second, and third signal line common lines are respectively connected to test pads, and after inputting a test signal to the pads, a lighting test of the liquid crystal display device is performed. A method for manufacturing a liquid crystal display device, wherein a region where a line common line is formed is cut and removed. 29. A liquid crystal material layer between a pair of substrates disposed opposite to each other, and a first substrate or a second substrate is provided with a first liquid crystal material layer.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, In the liquid crystal display device, wherein the video signal line has a terminal area for connection to an external drive circuit outside the liquid crystal layer of the one substrate, a first signal line common line on at least the one substrate, a second signal line
, A third signal line common line, a fourth signal line common line, a fifth signal line common line, and a sixth signal line common line, and the first signal line common line is The second signal line common line is connected to an adjacent one of the video signal lines related to the display of the first color beyond the connection terminal area, and the second signal line common line is one of the video signal lines related to the display of the second color. And the third signal line common line is connected to the adjacent one of the video signal lines related to the display of the third color and further than the connection terminal region. The fourth signal line common line is connected to the adjacent other of the video signal lines related to the display of the first color beyond the connection terminal area, and the fifth signal line common line Is connected to the other adjacent one of the video signal lines related to the display of the second color at a distance beyond the connection terminal area. The sixth signal line common line is connected to an adjacent one of the video signal lines related to the display of the third color at a distance beyond the connection terminal area, and the first, second, third, and Fourth, fifth, and sixth signal line common lines are connected to test pads, respectively, and a signal for test is input to the pads to perform a lighting test on the liquid crystal display device. A method for manufacturing a liquid crystal display device, wherein the formed region is cut and removed. 30. A liquid crystal material layer between a pair of substrates disposed opposite to each other, and a first substrate or a first substrate is provided on one of the substrates.
, A second color, and a third color, and one of the substrates, a plurality of video signal lines and a plurality of scanning signal lines arranged in a matrix. Having a plurality of pixel regions formed by intersecting two adjacent ones of the plurality of video signal lines and two adjacent ones of the plurality of scanning signal lines; each pixel region Has at least one thin film transistor, having a pixel electrode to which a voltage for controlling the display of any one of the first, second or third color from the video signal line by the thin film transistor is input, In the method for manufacturing a liquid crystal display device having a terminal area for connection to an external drive circuit outside the liquid crystal layer of the one substrate, the scanning signal lines may include at least two, three or four scanning signal lines on the one substrate.
The signal line common line is connected to any of the scanning signal lines beyond the connection terminal area, and adjacent signal line common lines are different from each other in adjacent scanning signal lines. The signal line common line is connected to a test pad, and a lighting signal of the liquid crystal display device is tested by inputting a test signal to the pad. A method for manufacturing a liquid crystal display device, wherein a region where a line is formed is cut and removed. 31. The method according to claim 28, wherein said external drive circuit is a driver IC mounted on a TCP.